Detail publikace

Optical nanoscale investigation of surface characterics

TOMÁNEK, P.

Originální název

Optical nanoscale investigation of surface characterics

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

In the paper some basic near field theoretical approaches will be explained as well as the principles of microsocpe set-ups. Application items as nanoscale topography with lateral superresolution, local spectroscopy of semiconductors, local fluorescence of dielectric films and achieving of higher data density of the recording medium will be also presented.

Klíčová slova v angličtině

near field optics, scanning probe microscopy, nanoscale characterization, topography, local spectroscopy, local fluorescence

Autoři

TOMÁNEK, P.

Rok RIV

1999

Vydáno

11. 5. 1999

Nakladatel

SPIE

Místo

Bellingham, USA

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

3904

Číslo

1

Stát

Spojené státy americké

Strany od

398

Strany do

406

Strany počet

9

BibTex

@article{BUT37584,
  author="Pavel {Tománek}",
  title="Optical nanoscale investigation of surface characterics",
  journal="Proceedings of SPIE",
  year="1999",
  volume="3904",
  number="1",
  pages="9",
  issn="0277-786X"
}