Detail publikace

Characterization of surface corrugation by near-field techniques

TOMÁNEK, P., DOBIS, P., GRMELA, L.

Originální název

Characterization of surface corrugation by near-field techniques

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

When a surface of illuminated object is scanned at a very small distance (a few nanometers) by means of subwavelength nanodetector probe like the very tip of extremity of chemical etched or pulled fiber, topographic images of surface corrugations could be recontructed with a superresolution beyond the diffraction limit. This opportunity due to near field characteristics can be explained in terms of nonradiating field detection that is of optical tunnel effect. Such a nanodetection principle is the basis of near field microscopy techniques.

Klíčová slova

surface corrugations, topography, near-field techniques, scanning probe microscopy, nanoprobes, nanodetectors, superresolving imagery

Autoři

TOMÁNEK, P., DOBIS, P., GRMELA, L.

Rok RIV

1995

Vydáno

26. 8. 1995

ISSN

1022-0151

Periodikum

EOS Annual Meeting

Ročník

2A

Číslo

2A

Stát

Česká republika

Strany od

101

Strany do

102

Strany počet

2

BibTex

@article{BUT38445,
  author="Pavel {Tománek} and Pavel {Dobis} and Lubomír {Grmela}",
  title="Characterization of surface corrugation by near-field techniques",
  journal="EOS Annual Meeting",
  year="1995",
  volume="2A",
  number="2A",
  pages="101--102",
  issn="1022-0151"
}