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Detail publikace
KLAPETEK, P. BURŠÍK, J. MARTINEK, J.
Originální název
Near-field scanning optical microscope probe analysis
Typ
článek v časopise - ostatní, Jost
Jazyk
angličtina
Originální abstrakt
In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.
Klíčová slova
NSOM, artifacts
Autoři
KLAPETEK, P.; BURŠÍK, J.; MARTINEK, J.
Rok RIV
2008
Vydáno
12. 11. 2007
ISSN
0304-3991
Periodikum
Ultramicroscopy
Ročník
2007
Číslo
1
Stát
Nizozemsko
Strany od
Strany do
Strany počet
4
BibTex
@article{BUT44372, author="Petr {Klapetek} and Jiří {Buršík} and Jan {Martinek}", title="Near-field scanning optical microscope probe analysis", journal="Ultramicroscopy", year="2007", volume="2007", number="1", pages="1--1", issn="0304-3991" }