Detail publikace

Low frequency noise and trap spectroscopy of InGaAs/InAlAs heterostructures

PAVELKA, J. TANUMA, N. TACANO, M. ŠIKULA, J.

Originální název

Low frequency noise and trap spectroscopy of InGaAs/InAlAs heterostructures

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

The low frequency noise of InGaAs/InAlAs heterostructures with various In concentration was measured in wide temperature range of 15K up to 300K and experimental characteristics compared with theoretical models of mobility fluctuations due to various scattering processes. Several p-type and n-type doped lattice-matched In0.53Ga0.47As/In0.52Al0.48As samples prepared by NTT reveal Hooge parameter alfaH ~ 1 and alfaH ~ 2x10-3, respectively, which is consistent with the 1/f energy partition fluctuations model. However, most of the n-type samples give alfaH values of 4x10-6 to 3x10-5 or slightly higher in case of pseudomorphic In0.7Ga0.3As/In0.52Al0.48As structures, which is closer to the quantum 1/f noise theory prediction of Hooge parameter about alfaH ~ 10-6. Whereas p-type heterostructure noise spectral density was 1/f type in whole temperature range, in case of all n-type samples we observed generation-recombination noise component for temperatures above 200K with trap activation energy of about 0.6eV. At the lowest temperatures, RTS noise given by shallow trap levels was observed too. Using the TLM structures noise analysis we determined, that contact noise was almost negligible.

Klíčová slova

InGaAs, 1/f noise

Autoři

PAVELKA, J.; TANUMA, N.; TACANO, M.; ŠIKULA, J.

Rok RIV

2005

Vydáno

1. 1. 2005

ISSN

1346-7239

Periodikum

Research Bulletin of Meisei University – Physical Sciences and Engineering

Ročník

41

Číslo

1

Stát

Japonsko

Strany od

147

Strany do

154

Strany počet

8

BibTex

@article{BUT45791,
  author="Jan {Pavelka} and Nobuhisa {Tanuma} and Munecazu {Tacano} and Josef {Šikula}",
  title="Low frequency noise and trap spectroscopy of InGaAs/InAlAs heterostructures",
  journal="Research Bulletin of Meisei University – Physical Sciences and Engineering",
  year="2005",
  volume="41",
  number="1",
  pages="8",
  issn="1346-7239"
}