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AHMED, M. TOMÁNEK, P.
Originální název
Influence of charged centers on transport characteristics of alternating current thin film electroluminescent devices
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
Charged centers exist in the phosphor layer of common alternating current thin film electroluminescent devices. In this article, the electron scattering process by these centers is studied through phase shift analysis. The scattering rates in different cases are gained and compared with other important scattering processes. The electron transport process is simulated by means of the Monte Carlo method. Quantitative results about the influence of charged centers on electron kinetic energy are gained.
Klíčová slova
electroluminescence, thin film, alternating current, charge center, transport characteristics
Autoři
AHMED, M.; TOMÁNEK, P.
Rok RIV
2006
Vydáno
1. 2. 2006
Nakladatel
SPIE
Místo
Bellimgham, USA
ISSN
0277-786X
Periodikum
Proceedings of SPIE
Ročník
6018
Číslo
Stát
Spojené státy americké
Strany od
61
Strany do
65
Strany počet
5
BibTex
@article{BUT45822, author="Mustafa M. Abdalla {Ahmed} and Pavel {Tománek}", title="Influence of charged centers on transport characteristics of alternating current thin film electroluminescent devices", journal="Proceedings of SPIE", year="2006", volume="6018", number="6018", pages="61--65", issn="0277-786X" }