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OHLÍDAL, I., OHLÍDAL, M., FRANTA, D.
Originální název
Influence of technological conditions on mechanical stresses inside diamond-like carbon films
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
The influences of the technological conditions on the values of the intrinsic mechanical stresses inside DLC thin films prepared by PECVD method onto silicon subtrates are studied. These stresses are measured by two-beam interferometry and optical profilometry based on chromatic aberration through the neasurements of deformations of the silicon substrates originating in consequence of the film stresses. It is shown that the influence of the deposition time (i.e film thickness) on the film stress is relatively slight in contrast to the influence of the hydrogen flow rate on this quantity. It is namely shown that the film stresses are influenced by the hydrogen flow rate values in a pronounced way within the the interval 1-7 sccm. Moreover, it is shown that the method of optical profilometry used can be competitive to the method of two-beam interferometry from the practical point of view.
Klíčová slova
Mechanical stress, DLC, Optical methods
Autoři
Rok RIV
2005
Vydáno
1. 11. 2005
Nakladatel
ELSEVIER SCIENCE SA
Místo
LAUSANNE, SWITZERLAND
ISSN
0925-9635
Periodikum
Diamond and Related Materials
Ročník
14
Číslo
11-12
Stát
Nizozemsko
Strany od
1835
Strany do
1838
Strany počet
4
BibTex
@article{BUT45891, author="Ivan {Ohlídal} and Miloslav {Ohlídal} and Daniel {Franta} and Vladimír {Čudek} and Vilma {Buršíková} and Petr {Klapetek} and Kateřina {Brillová}", title="Influence of technological conditions on mechanical stresses inside diamond-like carbon films", journal="Diamond and Related Materials", year="2005", volume="14", number="11-12", pages="1835--1838", issn="0925-9635" }