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LENCOVÁ, B. ZLÁMAL, J.
Originální název
A new program for the design of electron microscopes
Typ
článek v časopise - ostatní, Jost
Jazyk
angličtina
Originální abstrakt
The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from the results of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno.
Klíčová slova
Finite element method; Electron lenses and deflectors; Computer-aided design; User interface
Autoři
LENCOVÁ, B.; ZLÁMAL, J.
Rok RIV
2008
Vydáno
29. 8. 2008
Nakladatel
Elsevier
ISSN
1875-3892
Periodikum
Physics Procedia
Ročník
1
Číslo
Stát
Nizozemsko
Strany od
315
Strany do
324
Strany počet
10
BibTex
@article{BUT48562, author="Bohumila {Lencová} and Jakub {Zlámal}", title="A new program for the design of electron microscopes", journal="Physics Procedia", year="2008", volume="1", number="1", pages="315--324", issn="1875-3892" }