Detail publikace

Characterization of thick-film interdigitated electrodes

HUBÁLEK, J., BULVA, J., KREJČÍ, J.

Originální název

Characterization of thick-film interdigitated electrodes

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

A sensor miniaturization brings many problems e.g. an effect of the double layer capacitance, a serial resistance of electrodes, a cell constant, a roughness of electrodes etc. Nowadays, an interdigitated electrodes (IDES) are used in many sensor's applications [3,4,5]. Interdigitated electrodes have a comb structure of electrode system and are deposited on an substrate in planar technology as the thick-film or the thin-film. In most cases good results were achieved using differential or transient measurements. Measurement of frequency characteristics is not possible without a correction of the cell constant. Results of our current research show many problems with the behavioural of chemical cells if the comb structure with small sizes is used. Our results show that conductivity measurements need corrections of the cell constant for each concentration of a liquid solution. This paper investigates how sizes of IDES electrodes influence the interface impedance. Variation of the cell size can show possibilities to find cross relations of all factors and their influence to the cell constant correction.

Klíčová slova v angličtině

Interface impedance, Double layer capacitance, cell constant correction

Autoři

HUBÁLEK, J., BULVA, J., KREJČÍ, J.

Rok RIV

2001

Vydáno

13. 9. 2001

Nakladatel

Ing.Zdeněk Novotný,CSc.

Místo

Brno

ISBN

80-214-1960-1

Kniha

8th Electronic Devices and Systems Conference 2001 and Noise and Non-linearity Testing of modern Electronics Component

Strany od

264

Strany do

268

Strany počet

5

BibTex

@inproceedings{BUT4864,
  author="Jaromír {Hubálek} and Jindřich {Bulva} and Jan {Krejčí}",
  title="Characterization of thick-film interdigitated electrodes",
  booktitle="8th Electronic Devices and Systems Conference 2001 and Noise and Non-linearity Testing of modern Electronics Component",
  year="2001",
  pages="5",
  publisher="Ing.Zdeněk Novotný,CSc.",
  address="Brno",
  isbn="80-214-1960-1"
}