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SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D.
Originální název
Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The noise spectroscopy measurement and third harmonic testing was used to investigate effect of the contact electrode geometry and material composition on the thick film resistor quality. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of the current distribution for two different shapes of metallic contact cross sections was performed. The electrode geometry plays dominant role for current distribution. The lower value of metallic contact angle, the higher current density peak appears in the vicinity of the contact edge. Effect of cracks, which are found near the contact electrode, also play important role in current distribution, noise sources and non-linearity.
Klíčová slova
Thick film, noise, non-linearity
Autoři
Rok RIV
2002
Vydáno
1. 12. 2002
Místo
Lipica, Slonenia
ISBN
961-91023-0-4
Kniha
Proc. of 38th International Conference on Microelectronics, Devices and Materials
Strany od
245
Strany do
251
Strany počet
7
BibTex
@inproceedings{BUT5175, author="Vlasta {Sedláková} and František {Melkes} and Josef {Šikula} and Pavel {Dobis} and Dubravka {Ročak} and Darko {Belavič}", title="Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity", booktitle="Proc. of 38th International Conference on Microelectronics, Devices and Materials", year="2002", pages="7", address="Lipica, Slonenia", isbn="961-91023-0-4" }