Detail publikace

Nanometric applications of the Scanning Near-field Optical Microscopy

TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D.

Originální název

Nanometric applications of the Scanning Near-field Optical Microscopy

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Scaning near-field optical microscopy elucidates to the interaction of light with a sample close to an aperture, which constrains the lateral extent of the light beam. The aperture is held in place in a manner similar to those used for other scanning proximal probe microscopes. Advantages of the near-field interactions are: improved spatial resolution, simultaneous topographic image, surface enhancement, rapidly varying electric fields, and the presence of an electric field normal to the surface. some practical applications, e.g. single molecule detection, Raman scattering, polarization, magnetic imaging, data storage, biological imaging, quantum dots and quantum lines, nanolithography, photonic devices characterization are presented.

Klíčová slova

scanning near-field optical microscopy, nanometrology, applications

Autoři

TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D.

Rok RIV

2002

Vydáno

19. 11. 2002

Nakladatel

Akademické nakladatelství, CERM

Místo

Brno

ISBN

80-7204-258-0

Kniha

NANO´02

Strany od

53

Strany do

53

Strany počet

1

BibTex

@inproceedings{BUT5658,
  author="Pavel {Tománek} and Pavel {Dobis} and Markéta {Benešová} and Dana {Otevřelová}",
  title="Nanometric applications of the Scanning Near-field Optical Microscopy",
  booktitle="NANO´02",
  year="2002",
  pages="53--53",
  publisher="Akademické nakladatelství, CERM",
  address="Brno",
  isbn="80-7204-258-0"
}