Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

článek ve sborníku ve WoS nebo Scopus

angličtina

Recently, various versions of Scanning Near-Field Optical Microscopes (SNOM) have been developed, pushing the limits of lateral resolution beyond the Rayleigh criterion: the value of /30 instead /2 have been reached. Unfortunately, images obtained by SNOM depend strongly on the experimental conditions (angle of incidence, polarization, incidence plane direction, sample nature,…). Theoretical studies are thus necessary for interpreting experimental data. Here, we present a model of complex samples (multilayers) and to the general tip geometry. Moreover, this model can be used for various SNOM configurations and to take the sample-electromagnetic coupling into account.

scanning near-field optical microscopy, probe, sample, coating, resolution

BENEŠOVÁ, M., LIŠKA, M.

2002

19. 10. 2000

STU Bratislava

Trnava

80-227-1413-5

CO-MAT-TECH 2000

svazek 4

85

90

6