Detail publikace

AUGER ELECTRON SPECTRO-MICROSCOPY

HRNČIŘÍK, P.

Originální název

AUGER ELECTRON SPECTRO-MICROSCOPY

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The short escape depth of Auger electrons, the high lateral resolution, the chemical information about superficial elemental composition and the possibility of measuring the in-depth distribution of elements (with utilization of the ion sputtering) are the main advantages of the Auger electron spectroscopy (AES). When combined with the scanning electron microscope, AES can provide with image signal suitable for spectro-micrographs showing distribution of elements over the surface, i.e. the chemical mapping. This mapping can be advantageously compared with other SEM image signals in order to facilitate their interpretation.

Klíčová slova v angličtině

Auger electrons, Auger electron analyser, signal intensity of an Auger transition

Autoři

HRNČIŘÍK, P.

Vydáno

1. 1. 2003

Nakladatel

Ing.Zdeněk Novotný CSc., Ondráčkova 105, Brno

Místo

Brno

ISBN

80-214-2379-X

Kniha

Proceedings of 9th conference and competition Student EEICT 2003

Strany od

450

Strany do

454

Strany počet

5

BibTex

@inproceedings{BUT7278,
  author="Petr {Hrnčiřík}",
  title="AUGER ELECTRON SPECTRO-MICROSCOPY",
  booktitle="Proceedings of 9th conference and competition Student EEICT 2003",
  year="2003",
  pages="5",
  publisher="Ing.Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  address="Brno",
  isbn="80-214-2379-X"
}