Detail publikace

Current and noise characterization of CdTe crystal under monochromatic illumination

SCHAUER, P.

Originální název

Current and noise characterization of CdTe crystal under monochromatic illumination

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Experimental studies of transport and noise characteristics of CdTe (Cl doped) crystals, prepared by travelling heater method (THM), have been carried out. The basic material is of p-type with p = 1.8 x 1014 m-3, mih = 0.0065 m2.V-1.s-1, mie = 0.13 m2.V-1.s-1. The current and noise spectral density was measured as a function of the sample illumination, voltages across the sample and incident light wavelengths. Two types of effective charge carrier mobility are assumed; namely, the effective transport mobility, which is 0.065 m2.V-1.s-1 and the effective noise mobility, which reaches a value of 0.125 m2.V-1.s-1, both for high illumination. Under the same conditions, the density of light generated charge carrier pairs is 1.7 x 1015 m-3. Experimental results are in a good agreement with the four-level recombination model. The values of 1/f noise parameter range from 4 x 10-4 to 2.5 x 10-3. The parameter grows with almost the photocurrent square root. The signal to noise ratio improves if the electric field strength in the CdTe detector is set to a higher value.

Klíčová slova

CdTe, Cadmium telluride, II-VI compounds, Photo-conduction, 1/f noise parameter, Charge carrier density, Charge carrier mobility, Sensor, Detector

Autoři

SCHAUER, P.

Rok RIV

2012

Vydáno

5. 12. 2012

Nakladatel

AKADEMICKÉ NAKLADATELSTVÍ CERM, s.r.o.

Místo

Brno

ISBN

978-80-7204-823-6

Kniha

10 th International Conference NDT 2012 Non-Destructive Testing in Engineering Practice

Edice

1

Číslo edice

1

Strany od

125

Strany do

131

Strany počet

7

BibTex

@inproceedings{BUT96886,
  author="Pavel {Schauer}",
  title="Current and noise characterization of CdTe crystal under monochromatic illumination",
  booktitle="10 th International Conference NDT 2012 Non-Destructive Testing in Engineering Practice",
  year="2012",
  series="1",
  number="1",
  pages="125--131",
  publisher="AKADEMICKÉ NAKLADATELSTVÍ CERM, s.r.o.",
  address="Brno",
  isbn="978-80-7204-823-6"
}