Detail publikace

Time-Domain Finite Elements for Virtual Testing of Electromagnetic Compatibility

ŠEDĚNKA, V. CIGÁNEK, J. KADLEC, P. RAIDA, Z. WIKTOR, M. SARTO, M. GRECO, S.

Originální název

Time-Domain Finite Elements for Virtual Testing of Electromagnetic Compatibility

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

The paper presents a time-domain finite-element solver developed for simulations related to solving electromagnetic compatibility issues. The software is applied as a module integrated into a computational framework developed within a FP7 European project High Intensity Radiated Field – Synthetic Environment (HIRF SE) able to simulate a large class of problems. In the paper, the mathematical formulation is briefly presented, and special emphasis is put on the user point of view on the simulation tool-chain. The functionality is demonstrated on the computation of shielding effectiveness of two composite materials. Results are validated through experimental measurements and agreement is confirmed by automatic feature selective algorithms.

Klíčová slova

Amelet-HDF, electromagnetic compatibility (EMC), high intensity radiated field synthetic environment (HIRF SE), shielding effectiveness (SE), time domain finite elements (TDFE), composite materials.

Autoři

ŠEDĚNKA, V.; CIGÁNEK, J.; KADLEC, P.; RAIDA, Z.; WIKTOR, M.; SARTO, M.; GRECO, S.

Rok RIV

2013

Vydáno

1. 4. 2013

Nakladatel

SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI, CZECH TECHNICAL UNIVERSITY, DEPT OF ELECTROMAGNETIC FIELD

Místo

TECHNICKA 2, PRAHA, CZ-16627, CZECH REPUBLIC

ISSN

1210-2512

Periodikum

Radioengineering

Ročník

22

Číslo

1

Stát

Česká republika

Strany od

309

Strany do

317

Strany počet

9

BibTex

@article{BUT99152,
  author="Vladimír {Šeděnka} and Jan {Cigánek} and Petr {Kadlec} and Zbyněk {Raida} and Michal {Wiktor} and Maria Sabrina {Sarto} and Sandra {Greco}",
  title="Time-Domain Finite Elements for Virtual Testing of Electromagnetic Compatibility",
  journal="Radioengineering",
  year="2013",
  volume="22",
  number="1",
  pages="309--317",
  issn="1210-2512"
}