Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
CHOBOLA, Z. LUŇÁK, M. VANĚK, J. DOLENSKÝ, J. BAŘINKA, R.
Originální název
Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper deals with comparisons of noise spectroscopy and I-V characteristic of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generationrecombination types. G-r noise and burst noise is not fundamental noise and therefore can by use as quality indicator. For the determination of a possible noise source there was used the microplasma detection method and ESEM displaying.
Klíčová slova
Concentrators, Crystalline, Epitaxy, Solar cell, ESEM displaying
Autoři
CHOBOLA, Z.; LUŇÁK, M.; VANĚK, J.; DOLENSKÝ, J.; BAŘINKA, R.
Rok RIV
2015
Vydáno
18. 9. 2015
Nakladatel
WIP
Místo
Hamburg
ISBN
3-936338-39-6
Kniha
Proceedings of 31st European PV Solar Energy Conference and Exhibition
ISSN
2196-0992
Periodikum
EU PVSEC 2014 Proceedings DVD
Ročník
1
Číslo
20515
Stát
Spolková republika Německo
Strany od
2449
Strany do
2452
Strany počet
4
BibTex
@inproceedings{BUT118906, author="Zdeněk {Chobola} and Miroslav {Luňák} and Jiří {Vaněk} and Jan {Dolenský} and Radim {Bařinka}", title="Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency ", booktitle="Proceedings of 31st European PV Solar Energy Conference and Exhibition", year="2015", journal="EU PVSEC 2014 Proceedings DVD", volume="1", number="20515", pages="2449--2452", publisher="WIP", address="Hamburg", doi="10.4229/EUPVSEC20152015-5BV.4.25", isbn="3-936338-39-6", issn="2196-0992" }