Detail publikace

Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode

HYLSKÝ, J. STRACHALA, D. VYROUBAL, P. ČUDEK, P. VANĚK, J. VANÝSEK, P.

Originální název

Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

This paper deals with Potential Induced Degradation (PID) of p-type monocrystalline PV modules (Evergreen) from a photovoltaic power plant that has been in operation mode for 7 years. Within the PV module affected by the PID degradation, the effect of the electric field on individual PV cells is studied. The distribution of the electric field was simulated by SolidWorks software. The results show a random distribution of affected PV cells not related to the size and distribution of the electric field intensity. Furthermore, the dependencies of negative voltage potential on the range of PID degradation of individual PV modules located in the negative pole of the PV string is made. From measured current voltage characteristics (measured at STC), it is evident that the value of negative voltage potential is not directly proportional to the PID occurrence. These results are supplemented by electroluminescence images which confirm this finding.

Klíčová slova

Potential induced degradation; Negative voltage potential; Photovoltaic power plant; SolidWorks simulation; Photovoltaic modules

Autoři

HYLSKÝ, J.; STRACHALA, D.; VYROUBAL, P.; ČUDEK, P.; VANĚK, J.; VANÝSEK, P.

Vydáno

11. 4. 2018

Nakladatel

Elsevier

Místo

United Kingdom

ISSN

0026-2714

Periodikum

Microelectronics Reliability

Číslo

85

Stát

Spojené království Velké Británie a Severního Irska

Strany od

12

Strany do

18

Strany počet

7

URL

https://www.sciencedirect.com/science/article/pii/S0026271418301653

BibTex

@article{BUT146960,
  author="Josef {Hylský} and Dávid {Strachala} and Petr {Vyroubal} and Pavel {Čudek} and Jiří {Vaněk} and Petr {Vanýsek}",
  title="Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode",
  journal="Microelectronics Reliability",
  year="2018",
  number="85",
  pages="12--18",
  doi="10.1016/j.microrel.2018.04.003",
  issn="0026-2714",
  url="https://www.sciencedirect.com/science/article/pii/S0026271418301653"
}

Dokumenty

1-s2.0-S0026271418301653-main.pdf