Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
KROLÁK, D. HORSKÝ, P. PLOJHAR, J.
Originální název
An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
This article proposes an electromagnetic compatibility improved bandgap voltage reference with a low current consumption of only 3.5 uA in an automotive environment with a wide temperature range from -40 degrees C to 160 degrees C and a high electromagnetic interference (EMI) robustness. The proposed reference is based on the well-known Brokaw bandgap with only five bipolar transistors in the bandgap core including collector current leakage compensation. We analyzed parasitic effects in the bandgap core such as the influence of parasitic capacitances between the substrate and the collectors of these bipolar transistors as well as the impact of the operational amplifier. We made recommendations on how to improve the bandgap EMI robustness. Simulation results were compared with measurements on a test chip. The measurement results showed excellent EMI robustness.
Klíčová slova
Bandgap; Electromagnetic interference; Substrates; Bipolar transistors; Capacitors; Capacitance; Integrated circuits; Bandgap reference; Bandgap voltage reference; Brokaw bandgap voltage reference; Electromagnetic compatibility; Electromagnetic interference (EMI); Voltage reference
Autoři
KROLÁK, D.; HORSKÝ, P.; PLOJHAR, J.
Vydáno
3. 1. 2020
Nakladatel
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Místo
Piscataway
ISSN
0018-9375
Periodikum
IEEE Transaction on Electromagnetic Compatibility
Ročník
62
Číslo
5
Stát
Spojené státy americké
Strany od
2277
Strany do
2284
Strany počet
8
URL
https://ieeexplore.ieee.org/document/8949821
BibTex
@article{BUT157458, author="David {Krolák} and Pavel {Horský} and Jan {Plojhar}", title="An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference", journal="IEEE Transaction on Electromagnetic Compatibility", year="2020", volume="62", number="5", pages="2277--2284", doi="10.1109/TEMC.2019.2958926", issn="0018-9375", url="https://ieeexplore.ieee.org/document/8949821" }