Detail publikace

Complex Visual Analysis of SMD Devices

KALOVÁ, I. HORÁK, K. HONEC, P.

Originální název

Complex Visual Analysis of SMD Devices

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The aim of this article is to introduce possibilities of using of computer vision methods for inspection of SMD devices production. Several partial applications of device dimensions measuring and inspection of individual production processes are presented. Most of mentioned tasks require some specialized technique like 3D measuring, double exposure, particular way of lighting.

Klíčová slova

SMD device, computer vision, visual system, production inspection

Autoři

KALOVÁ, I.; HORÁK, K.; HONEC, P.

Rok RIV

2009

Vydáno

25. 11. 2009

Nakladatel

DAAAM International

Místo

Vienna, Austria 2009

ISBN

978-3-901509-70-4

Kniha

Annals of DAAAM for 2009 & Proceedings of the 20th International DAAAM Symposium

Strany od

233

Strany do

234

Strany počet

2

BibTex

@inproceedings{BUT29772,
  author="Ilona {Janáková} and Karel {Horák} and Peter {Honec}",
  title="Complex Visual Analysis of SMD Devices",
  booktitle="Annals of DAAAM for 2009 & Proceedings of the 20th International DAAAM Symposium",
  year="2009",
  pages="233--234",
  publisher="DAAAM International",
  address="Vienna, Austria 2009",
  isbn="978-3-901509-70-4"
}