Detail publikace

Nanooptics of locally induced photocurrent in monocrystalline Si solar cells

ŠKARVADA, P. GRMELA, L. ABUETWIRAT, I. TOMÁNEK, P.

Originální název

Nanooptics of locally induced photocurrent in monocrystalline Si solar cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper presents the results of our experimental study of high resolution map of induced photocurrent in monocrystalline silicon solar cells. Photovoltaic solar cells are evaluated by Near-field Optical Beam Induced photocurrent (NOBIC), as well as by Scanning Near-field Optical Microscope (SNOM) topography and reflection. The correlation between reflection and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM and NOBIC represent the coupling of very useful methods to provide a non-destructive local characterization on silicon semiconductor solar cells.

Klíčová slova

monocrystalline Si, solar cell, locally induced photocurrent

Autoři

ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P.

Rok RIV

2008

Vydáno

17. 11. 2008

Nakladatel

SPIE

Místo

Bellingham, USA

ISBN

978-0-8194-7379-0

Kniha

Photonics, Devices and Systems - Proceedings of SPIE vol.7138

Číslo edice

7138

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

7138

Číslo

7138

Stát

Spojené státy americké

Strany od

2901

Strany do

2906

Strany počet

6

BibTex

@inproceedings{BUT29806,
  author="Pavel {Škarvada} and Lubomír {Grmela} and Inas Faisel {Abuetwirat} and Pavel {Tománek}",
  title="Nanooptics of locally induced photocurrent in monocrystalline Si solar cells",
  booktitle="Photonics, Devices and Systems - Proceedings of SPIE vol.7138",
  year="2008",
  journal="Proceedings of SPIE",
  volume="7138",
  number="7138",
  pages="2901--2906",
  publisher="SPIE",
  address="Bellingham, USA",
  isbn="978-0-8194-7379-0",
  issn="0277-786X"
}