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TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P.
Originální název
Near-field optical microscopy diagnostics
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
A simple experimental set-up with SNOM allows obtain the photoluminescence spectra, integrated photoluminescence intensity, electroluminescence intensity and photocurrent spectroscopy only by a simple changing of connection. We used here a combination of reflection SNOM and of internal photoemission as well as of photoluminescence to investigate one of the major problems in today solid state physics: the lateral variations of solid interface properties. The method is well-founded to reach the spatially resolved photoemission on the Au/GaAs Schottky barrier or the spectral photoluminescent intensity on the nanometer scale. The preliminary experimental results of the multidiagnostic of semiconductor surface will be presented in this paper.
Klíčová slova v angličtině
near-field optics, near-field optical microscope, multidiagnostics, semiconductor interaface
Autoři
Rok RIV
2001
Vydáno
28. 6. 2001
Nakladatel
Faculty of Physics, Warszaw University
Místo
Warszaw
ISBN
83-913171-4-5
Kniha
From quantum optics to photonics
Strany od
90
Strany do
Strany počet
1
BibTex
@inproceedings{BUT6603, author="Pavel {Tománek} and Dana {Otevřelová} and Lubomír {Grmela} and Pavel {Dobis}", title="Near-field optical microscopy diagnostics", booktitle="From quantum optics to photonics", year="2001", pages="1", publisher="Faculty of Physics, Warszaw University", address="Warszaw", isbn="83-913171-4-5" }