Detail publikace

Near-field optical microscopy diagnostics

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P.

Originální název

Near-field optical microscopy diagnostics

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

A simple experimental set-up with SNOM allows obtain the photoluminescence spectra, integrated photoluminescence intensity, electroluminescence intensity and photocurrent spectroscopy only by a simple changing of connection. We used here a combination of reflection SNOM and of internal photoemission as well as of photoluminescence to investigate one of the major problems in today solid state physics: the lateral variations of solid interface properties. The method is well-founded to reach the spatially resolved photoemission on the Au/GaAs Schottky barrier or the spectral photoluminescent intensity on the nanometer scale. The preliminary experimental results of the multidiagnostic of semiconductor surface will be presented in this paper.

Klíčová slova v angličtině

near-field optics, near-field optical microscope, multidiagnostics, semiconductor interaface

Autoři

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P.

Rok RIV

2001

Vydáno

28. 6. 2001

Nakladatel

Faculty of Physics, Warszaw University

Místo

Warszaw

ISBN

83-913171-4-5

Kniha

From quantum optics to photonics

Strany od

90

Strany do

90

Strany počet

1

BibTex

@inproceedings{BUT6603,
  author="Pavel {Tománek} and Dana {Otevřelová} and Lubomír {Grmela} and Pavel {Dobis}",
  title="Near-field optical microscopy diagnostics",
  booktitle="From quantum optics to photonics",
  year="2001",
  pages="1",
  publisher="Faculty of Physics, Warszaw University",
  address="Warszaw",
  isbn="83-913171-4-5"
}