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doc. Ing.
Ph.D.
FME, IPE – Associate professor
+420 54114 2708kolibal.m@fme.vutbr.cz
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2024
KUNDRÁT, V.; NOVÁK, L.; BUKVIŠOVÁ, K.; ZÁLEŠÁK, J.; KOLÍBALOVÁ, E.; ROSENTVEIG, R.; SREEDHARA, M.; SHALOM, H.; YADGAROV, L.; ZAK, A.; KOLÍBAL, M.; TENNE, R. Mechanism of WS2 Nanotube Formation Revealed by in Situ/ex Situ Imaging. ACS Nano, 2024, vol. 18, no. 19, p. 12284-12294. ISSN: 1936-0851.Detail | WWW | Full text in the Digital Library
2023
Wang, ZJ.; Kong, X.; Huang, YA.; Li, J.; Bao, LH.; Cao, KC.; Hu, YX.; Cai, J.; Wang, LF.; Chen, H.; Wu, YS.; Zhang, YW.; Pang, F.; Cheng, ZH.; Babor, P.; Kolibal, M.; Liu, ZK.; Chen, YL.; Zhang, Q.; Cui, Y.; Liu, KH.; Yang, HT.; Bao, XH.; Gao, HJ.; Liu, Z.; Ji, W.; Ding, F.; Willinger, MG. Conversion of chirality to twisting via sequential one-dimensional and two-dimensional growth of graphene spirals. Nature Materials, 2023, vol. 1, no. 1, p. 1-205. ISSN: 1476-4660.Detail | WWW
KUNDRÁT, V.; ROSENTVEIG, R.; BUKVIŠOVÁ, K.; CITTERBERG, D.; KOLÍBAL, M.; KEREN, S.; PINKAS, I.; YAFFE, O.; ZAK, A.; TENNE, R. Submillimeter-Long WS2 Nanotubes: The Pathway to Inorganic Buckypaper. Nano Letters, 2023, vol. 23, no. 22, p. 10259-10266. ISSN: 1530-6992.Detail | WWW | Full text in the Digital Library
KACHTÍK, L.; CITTERBERG, D.; BUKVIŠOVÁ, K.; KEJÍK, L.; LIGMAJER, F.; KOVAŘÍK, M.; MUSÁLEK, T.; KRISHNAPPA, M.; ŠIKOLA, T.; KOLÍBAL, M. Chiral Nanoparticle Chains on Inorganic Nanotube Templates. NANO LETTERS, 2023, vol. 23, no. 13, p. 6010-6017. ISSN: 1530-6984.Detail | WWW | Full text in the Digital Library
BAKHSHIKHAH, M.; LIŠKA, J.; MIRDAMADI KHOUZANI, S.; ČERVINKA, O.; MACH, J.; KOLÍBAL, M.; ŠIKOLA, T. Improvement of photoluminescence quality of MoS2 monolayers by an atomic hydrogen beam. International Conference on Metamaterials, Photonic Crystals and Plasmonics. META. 2023. p. 1437-1438. ISSN: 2429-1390.Detail
LIŠKA, P.; MUSÁLEK, T.; ŠAMOŘIL, T.; KRATOCHVÍL, M.; MATULA, R.; HORÁK, M.; NEDVĚD, M.; URBAN, J.; PLANER, J.; ROVENSKÁ, K.; DVOŘÁK, P.; KOLÍBAL, M.; KŘÁPEK, V.; KALOUSEK, R.; ŠIKOLA, T. Correlative Imaging of Individual CsPbBr3 Nanocrystals: Role of Isolated Grains in Photoluminescence of Perovskite Polycrystalline Thin Films. Journal of Physical Chemistry C (print), 2023, vol. 127, no. 25, p. 12404-12413. ISSN: 1932-7447.Detail | WWW | Full text in the Digital Library
UKROPCOVÁ, I.; DAO, R.; ŠTUBIAN, M.; KOLÍBAL, M.; ŠIKOLA, T.; WILLINGER, M.; WANG, Z.; ZLÁMAL, J.; BÁBOR, P. Electron Tractor Beam: Deterministic Manipulation of Liquid Droplets on Solid Surfaces. Advanced Materials Interfaces, 2023, vol. 10, no. 2, ISSN: 2196-7350.Detail | WWW | Full text in the Digital Library
2022
PEJCHAL, T.; BUKVIŠOVÁ, K.; VALLEJOS VARGAS, S.; CITTERBERG, D.; ŠIKOLA, T.; KOLÍBAL, M. Ga interaction with ZnO surfaces: Diffusion and melt-back etching. Applied Surface Science, 2022, vol. 583, no. 1, p. 152475-152475. ISSN: 0169-4332.Detail | WWW
ZHU, K.; MAHMOODI, M.; FAHIMI, Z.; XIAO, Y.; WANG, T.; BUKVIŠOVÁ, K.; KOLÍBAL, M.; ROLDÁN, J.; PEREZ, D.; AGUIRRE, F.; LANZA, M. Memristors with Initial Low-Resistive State for Efficient Neuromorphic Systems. Advanced Intelligent Systems, 2022, vol. 4, no. 3, p. 2200001-220001. ISSN: 2640-4567.Detail | WWW | Full text in the Digital Library
ROTHMAN, A.; BUKVIŠOVÁ, K.; ITZHAK, N. R.; KAPLAN-ASHIRI, I.; KOSSOY, A. E.; SUI, X.; NOVÁK, L.; ŠIKOLA, T.; KOLÍBAL, M.; JOSELEVICH, E. Real-Time Study of Surface-Guided Nanowire Growth by In Situ Scanning Electron Microscopy. ACS Nano, 2022, vol. 16, no. 11, p. 18757-18766. ISSN: 1936-0851.Detail | WWW
Sreedhara, MB.; Bukvisova, K.; Khadiev, A.; Citterberg, D.; Cohen, H.; Balema, V.; Pathak, AK.; Novikov, D.; Leitus, G.; Kaplan-Ashiri, I.; Kolibal, M.; Enyashin, AN.; Houben, L.; Tenne, R. Nanotubes from the Misfit Layered Compound (SmS)(1.)19TaS2: Atomic Structure, Charge Transfer, and Electrical Properties. Chemistry of Materials, 2022, vol. 34, no. 4, p. 1838-1853. ISSN: 1520-5002.Detail | WWW
2021
KRATOCHVÍL, M.; MUSÁLEK, T.; KOLÍBAL, M.; WEITER, M. Cesium halide perovskite as a material for scintillator detectors. Studentská odborná konference CHEMIE JE ŽIVOT 2021 Sborník abstraktů. Brno: Vysoké učení technické v Brně, Fakulta chemická, Purkyňova 464/118, 612 00 Brno, 2021. p. 86-87. ISBN: 978-80-214-6002-7.Detail | WWW
Backes, C., Bartus, S., Casiraghi, C., Ferrari, A., Kamali, A.R., Kolíbal, M., Kumar, V., Molle, A., Oyarzun, A., Palermo, V., Sengupta, A., Silvestri, A., Zhang, H. Applications in opto-electronics: general discussion. Faraday Discussions of the Chemical Society, 2021, vol. 227, no. 0, p. 184-188. ISSN: 1359-6640.Detail | WWW
KRATOCHVÍL, M.; MUSÁLEK, T.; KOLÍBAL, M.; WEITER, M. Cesium perovskite as scintillator for high-energy radiation detection. 2021. p. 155 ( p.)Detail | WWW
Backes, C., Bianco, A., Casiraghi, C., Galembeck, F., Gupta, R.K., Hersam, M.C., Kamali, A.R., Kolíbal, M., Kolosov, V., Kumar, V., Lee, W. H., Martsinovich, N., Melchionna, M., Mullen, K., Oyarzun, A., Palermo, V., Prato, M., Samori, P., Sampath, S., Silvestri, A., Sirbu, D., Sui, R.H., Turchanin, A., Wetzl, C., Wright, I.A., Xia, Z.Y., Zhuang, X.D. 2D materials production and generation of functional inks: general discussion. Faraday Discussions of the Chemical Society, 2021, vol. 227, no. 0, p. 141-162. ISSN: 1359-6640.Detail | WWW
NAZZARI, D., GENZER, J., RITTER, V., BETHGE, O., BERTAGNOLLI, E., RAMER, G., LENDL, B., WATANABE, K., TANIGUCHI, T., RURALI, R., KOLÍBAL, M., LUGSTEIN, A. Highly Biaxially Strained Silicene on Au(111). Journal of Physical Chemistry C (web), 2021, vol. 125, no. 18, p. 9973-9980. ISSN: 1932-7455.Detail | WWW
2020
WANG, T.; SHI, Y.; PUGLISI, F. M.; CHEN, S.; ZHU, K.; ZOU, Y.; LI, X.; JING, X.; HAN, T.; GUO, B.; BUKVIŠOVÁ, K.; KACHTÍK, L.; KOLÍBAL, M.; WEN, CH.; LANZA, M. Electroforming in Metal-Oxide Memristive Synapses. ACS applied materials & interfaces, 2020, vol. 12, no. 10, p. 11806-11814. ISSN: 1944-8252.Detail | WWW
WANG, Y.; ŠIKOLA, T.; KOLÍBAL, M. Collector Droplet Behavior during Formation of Nanowire Junctions. J PHYS CHEM LETT, 2020, vol. 11, no. 16, p. 6498-6504. ISSN: 1948-7185.Detail | WWW
2019
NOVÁK, T.; KOSTELNÍK, P.; KONEČNÝ, M.; ČECHAL, J.; KOLÍBAL, M.; ŠIKOLA, T. Temperature effect on Al predose and AlN nucleation affecting the buffer layer performance for the GaN-on-Si based high-voltage devices. Japanese Journal of Applied Physics, 2019, vol. 58, no. SC, p. SC1018-1 (SC1018-9 p.)ISSN: 0021-4922.Detail | WWW
KOLÍBAL, M.; BUKVIŠOVÁ, K.; KACHTÍK, L.; ZAK, A.; NOVÁK, L.; ŠIKOLA, T. Formation of Tungsten Oxide Nanowires by Electron-Beam-Enhanced Oxidation of WS2 Nanotubes and Platelets. Journal of Physical Chemistry C (print), 2019, vol. 123, no. 14, p. 9552-9559. ISSN: 1932-7447.Detail | WWW
2018
KOLÍBAL, M.; PEJCHAL, T.; MUSÁLEK, T.; ŠIKOLA, T. Catalyst–substrate interaction and growth delay in vapor–liquid–solid nanowire growth. NANOTECHNOLOGY, 2018, vol. 29, no. 20, p. 1-7. ISSN: 0957-4484.Detail | WWW | Full text in the Digital Library
2017
JIANG, L.; XIAO, N.; WANG, B.; GRUSTAN-GUTIERREZ, E.; JING, X.; BÁBOR, P.; KOLÍBAL, M.; LU, G.; WU, T.; WANG, H.; HUI, F.; SHI, Y.; SONG, B.; XIE, X.; LANZA, M. High-resolution characterization of hexagonal boron nitride coatings exposed to aqueous and air oxidative environments. Nano Research, 2017, vol. 10, no. 6, p. 2046-2055. ISSN: 1998-0000.Detail | WWW
2016
DVOŘÁK, P.; KOLÍBAL, M.; SPOUSTA, J.; ŠIKOLA, T. Fotoluminiscence h- BN detekována pomocí rastrovací optické mikroskopie v blízkém poli. Jemná mechanika a optika, 2016, vol. 61, no. 6, p. 149-150. ISSN: 0447-6441.Detail
ELBADAWI, C.; TRAN, T.; KOLÍBAL, M.; ŠIKOLA, T.; SCOTT, J.; CAI, Q.; LI, L.; TANIGUCHI, T.; WATANABE, K.; TOTH, M.; AHARONOVICH, I.; LOBO, C. Electron beam directed etching of hexagonal boron nitride. Nanoscale, 2016, vol. 8, no. 36, p. 16182-16186. ISSN: 2040-3372.Detail | WWW | Full text in the Digital Library
KOLÍBAL, M.; PEJCHAL, T.; VYSTAVĚL, T.; ŠIKOLA, T. The Synergic Effect of Atomic Hydrogen Adsorption and Catalyst Spreading on Ge Nanowire Growth Orientation and Kinking. NANO LETTERS, 2016, vol. 16, no. 8, p. 4880-4886. ISSN: 1530-6984.Detail | WWW
KOLÍBAL, M.; NOVÁK, L.; SHANLEY, T.; TOTH, M.; ŠIKOLA, T. Silicon oxide nanowire growth mechanisms revealed by real-time electron microscopy. NANOSCALE, 2016, vol. 8, no. 1, p. 266-275. ISSN: 2040-3364.Detail | WWW
2014
KOLÍBAL, M.; VYSTAVĚL, T.; VARGA, P.; ŠIKOLA, T. Real-Time Observation of Collector Droplet Oscillations during Growth of Straight Nanowires. NANO LETTERS, 2014, vol. 14, no. 2, p. 1756-1761. ISSN: 1530-6984.Detail
MACH, J.; ŠAMOŘIL, T.; KOLÍBAL, M.; ZLÁMAL, J.; VOBORNÝ, S.; BARTOŠÍK, M.; ŠIKOLA, T. Optimization of ion-atomic beam source for deposition of GaN ultrathin films. Review of Scientific Instruments, 2014, vol. 85, no. 8, p. 083302-1 (083302-5 p.)ISSN: 0034-6748.Detail
LIGMAJER, F.; DRUCKMÜLLEROVÁ, Z.; MĚCH, R.; KOLÍBAL, M.; ŠIKOLA, T. Tvorba uspořádaných souborů kovových nanočástic na polovodičových substrátech a jejich charakterizace pomocí spektroskopické elipsometrie. Jemná mechanika a optika, 2014, vol. 59, no. 6- 7, p. 178-180. ISSN: 0447- 6441.Detail
GLAJC, P.; ZLÁMAL, J.; MACH, J.; KOLÍBAL, M.; ŠIKOLA, T. Návrh iontového zdroje se sedlovým polem a žhavenou katodou. Jemná mechanika a optika, 2014, vol. 59, no. 6- 7, p. 181-183. ISSN: 0447- 6441.Detail
DRUCKMÜLLEROVÁ, Z.; KOLÍBAL, M.; VYSTAVĚL, T.; ŠIKOLA, T. Toward Site-Specific Dopant Contrast in Scanning Electron Microscopy. MICROSCOPY AND MICROANALYSIS, 2014, vol. 20, no. 4, p. 1312-1317. ISSN: 1431-9276.Detail
2012
KOLÍBAL, M.; KALOUSEK, R.; NOVÁK, L.; VYSTAVĚL, T.; ŠIKOLA, T. Controlled faceting in (110) germanium nanowire growth by switching between vapor-liquid-solid and vapor-solid- solid growth. Applied Physics Letters, 2012, vol. 100, no. 20, p. 203102- 1 (203102-4 p.)ISSN: 0003- 6951.Detail
KOLÍBAL, M.; KONEČNÝ, M.; LIGMAJER, F.; ŠKODA, D.; VYSTAVĚL, T.; ZLÁMAL, J.; VARGA, P.; ŠIKOLA, T. Guided Assembly of Gold Colloidal Nanoparticles on Silicon Substrates Prepatterned by Charged Particle Beams. ACS Nano, 2012, vol. 6, no. 11, p. 10098-10106. ISSN: 1936- 0851.Detail
2011
BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; ČECHAL, J.; URBÁNEK, M.; ŠIKOLA, T. Depth resolution enhancement by combined DSIMS and TOF- LEIS profiling. Nuclear Instruments and Methods in Physics Research B, 2011, vol. 269, no. 3, p. 369-373. ISSN: 0168- 583X.Detail
MACH, J.; ŠAMOŘIL, T.; VOBORNÝ, S.; KOLÍBAL, M.; ZLÁMAL, J.; SPOUSTA, J.; DITTRICHOVÁ, L.; ŠIKOLA, T. An ultra-low energy (30–200 eV) ion-atomic beam source for ion-beam- assisted deposition in ultrahigh vacuum. Review of Scientific Instruments, 2011, vol. 82, no. 8, p. 083302- 1 (083302-7 p.)ISSN: 0034- 6748.Detail
KOLÍBAL, M.; VYSTAVĚL, T.; NOVÁK, L.; MACH, J.; ŠIKOLA, T. In-situ observation of <110> oriented Ge nanowire growth and associated collector droplet behavior. Applied Physics Letters, 2011, vol. 99, no. 14, p. 143113- 1 (143113-3 p.)ISSN: 0003- 6951.Detail
KOLÍBAL, M.; MATLOCHA, T.; VYSTAVĚL, T.; ŠIKOLA, T. Low energy focused ion beam milling of silicon and germanium nanostructures. NANOTECHNOLOGY, 2011, vol. 22, no. 10, p. 105304- 1 (105304-8 p.)ISSN: 0957-4484.Detail
2010
ČECHAL, J.; POLČÁK, J.; KOLÍBAL, M.; BÁBOR, P.; ŠIKOLA, T. Formation of copper islands on a native SiO2 surface at elevated temperatures. Applied Surface Science, 2010, vol. 256, no. 11, p. 3636-3641. ISSN: 0169- 4332.Detail
KOLÍBAL, M.; ČECHAL, J.; BARTOŠÍK, M.; MACH, J.; ŠIKOLA, T. Stability of hydrogen- terminated silicon surface under ambient atmosphere. Applied Surface Science, 2010, vol. 256, no. 11, p. 3423-2426. ISSN: 0169- 4332.Detail
MATLOCHA, T.; PRŮŠA, S.; KOLÍBAL, M.; BÁBOR, P.; PRIMETZHOFER, D.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. A study of a LEIS azimuthal scan behavior: Classical dynamics simulation. Surface Science, 2010, vol. 604, no. 21- 22, p. 1906-1911. ISSN: 0039- 6028.Detail
2009
ČECHAL, J.; TOMANEC, O.; ŠKODA, D.; KOŇÁKOVÁ, K.; HRNČÍŘ, T.; MACH, J.; KOLÍBAL, M.; ŠIKOLA, T. Selective growth of Co islands on ion beam induced nucleation centers in a native SiO2 film. Journal of Aplied Physics, 2009, vol. 105, no. 8, p. 084314-1 (084314-6 p.)ISSN: 0021-8979.Detail
BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; KALOUSEK, R.; NEUMAN, J.; URBÁNEK, M.; ŠIKOLA, T. Mechanika iontů jako prostředek k analýze nanosvěta. Jemná mechanika a optika, 2009, vol. 54, no. 7- 8, p. 209-214. ISSN: 0447- 6441.Detail
ČECHAL, J.; MATLOCHA, T.; POLČÁK, J.; KOLÍBAL, M.; TOMANEC, O.; KALOUSEK, R.; DUB, P.; ŠIKOLA, T. Characterization of oxidized gallium droplets on silicon surface: an ellipsoidal droplet shape model for angle resolved X- ray photoelectron spectroscopy analysis. Thin Solid Films, 2009, vol. 517, no. 6, p. 1928-1934. ISSN: 0040- 6090.Detail
BARTOŠÍK, M.; KOLÍBAL, M.; ČECHAL, J.; MACH, J.; ŠIKOLA, T. Selective growth of metallic nanostructures on surfaces patterned by AFM local anodic oxidation. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2009, vol. 9, no. 10, p. 5887-5890. ISSN: 1533- 4880.Detail
2008
MACH, J.; ČECHAL, J.; KOLÍBAL, M.; POTOČEK, M.; ŠIKOLA, T. Atomic hydrogen induced gallium nanocluster formation on the Si(100) surface. Surface Science, 2008, vol. 602, no. 10, p. 1898-1902. ISSN: 0039- 6028.Detail
PRIMETZHOFER, D.; MARKIN, S.; ZEPPENFELD, P.; BAUER, P.; PRŮŠA, S.; KOLÍBAL, M.; ŠIKOLA, T. Quantitative analysis of ultra thin layer growth by time-of- flight low energy ion scattering. Applied Physics Letters, 2008, vol. 92, no. 1, p. 011929- 1 (011929-3 p.)ISSN: 0003-6951.Detail
KOLÍBAL, M.; ČECHAL, T.; KOLÍBALOVÁ, E.; ČECHAL, J.; ŠIKOLA, T. Self-limiting cyclic growth of gallium droplets on Si(111). NANOTECHNOLOGY, 2008, vol. 19, no. 46, p. 475606- 1 (475606-5 p.)ISSN: 0957-4484.Detail
2007
PRŮŠA, S.; KOLÍBAL, M.; BÁBOR, P.; MACH, J.; ŠIKOLA, T. Analysis of thin films by TOF- LEIS. ACTA PHYSICA POLONICA A, 2007, vol. 111, no. 3, p. 335-341. ISSN: 0587- 4246.Detail
ČECHAL, J.; KOLÍBAL, M.; KOSTELNÍK, P.; ŠIKOLA, T. Gallium structure on the Si(111)-(7 x 7) surface: influence of Ga coverage and temperature. Journal of Physics: Condensed Matter, 2007, vol. 19, no. 1, p. 016011 ( p.)ISSN: 0953- 8984.Detail
KOLÍBAL, M.; TOMANEC, O.; PRŮŠA, S.; PLOJHAR, M.; MARKIN, S.; DITTRICHOVÁ, L.; SPOUSTA, J.; BAUER, P.; ŠIKOLA, T. TOF-LEIS spectra of Ga/Si: Peak shape analysis. Nuclear Instruments and Methods in Physics Research B, 2007, vol. 265, no. 2, p. 569-575. ISSN: 0168- 583X.Detail
2006
KOLÍBAL, M.; PRŮŠA, S.; PLOJHAR, M.; BÁBOR, P.; POTOČEK, M.; TOMANEC, O.; KOSTELNÍK, P.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. In situ Analysis of Ga-ultra Thin Films by ToF- LEIS. Nuclear Instruments and Methods in Physics Research B, 2006, vol. 249, no. 1- 2, p. 318-321. ISSN: 0168- 583X.Detail
2005
KOLÍBAL, M.; PRŮŠA, S.; TOMANEC, O.; POTOČEK, M.; ČECHAL, J.; KOSTELNÍK, P.; PLOJHAR, M.; BÁBOR, P.; SPOUSTA, J.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. Application of ToF LEIS for Monitoring the growth and thermal treatment of Ga ultrathin films. 1. Vienna: 2005. p. 191-191. Detail
DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P. High resolution time-of- flight low energy ion scattering. Nuclear Instruments and Methods in Physics Research B, 2005, vol. 230, no. 0, p. 398-401. ISSN: 0168- 583X.Detail
KOLÍBAL, M.; PRŮŠA, S.; PLOJHAR, M.; BÁBOR, P.; POTOČEK, M.; TOMANEC, O.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. In situ Analysis of Ga-ultra Thin Films by TOF- LEIS. 1. Seville: 2005.Detail
2004
KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T. Low energy ion scattering as a method for surface structure analysis. Jemná mechanika a optika, 2004, vol. 9, no. 9, p. 262 ( p.)ISSN: 0447- 6441.Detail
KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BARTOŠÍK, M., TOMANEC, O., ŠIKOLA, T. Growth of gallium on sillicon: A TOF- LEIS and AFM study. In New Trend in Physics. Brno: VUT v Brně, 2004. p. 230 ( p.)ISBN: 80-7355-024- 5.Detail
VOBORNÝ, S.; KOLÍBAL, M.; MACH, J.; ČECHAL, J.; BÁBOR, P.; PRŮŠA, S.; SPOUSTA, J.; ŠIKOLA, T. Deposition and in-situ charakterization of ultra- thin films. Thin Solid Films, 2004, vol. 459, no. 1- 2, p. 17 ( p.)ISSN: 0040- 6090.Detail
VOBORNÝ, S., MACH, J., KOLÍBAL, M., ČECHAL, J., BÁBOR, P., POTOČEK, M., ŠIKOLA, T. A study of Early Periods of GaN Ultrathin Film Growth. In New Trends in Pysics. Brno: VUT v Brně, 2004. p. 270 ( p.)ISBN: 80-7355-024- 5.Detail
KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T. ToF-LEIS Analysis of ultra thin films: Ga and Ga-N layer growth on Si(111). Surface Science, 2004, vol. 566- 568, no. 9, p. 885 ( p.)ISSN: 0039- 6028.Detail
2003
PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T. Analysis of thin films by TOF LEIS. In EVC' 03 Abstracts. Berlin: EVC, 2003. p. 133 ( p.)Detail
VOBORNÝ, S., KOLÍBAL, M., MACH, J., ČECHAL, J., BÁBOR, P., PRŮŠA, S., SPOUSTA, J., ŠIKOLA, T. Deposition and in situ characterization of ultra- thin films. In EVC' 03 Abstracts. Berlin: EVC, 2003. p. 45 ( p.)Detail
BÁBOR, P., KOLÍBAL, M., PRŮŠA, S., ŠIKOLA, T. Application of a simple imaging system in SIMS and TOF LEIS. In ECOSS 22 CD. Praha: FÚ AV ČR, 2003. p. 0 ( p.)Detail
KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BAUER, P., ŠIKOLA, T. TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111). In ECOSS 22 CD. Praha: FÚ AV ČR, 2003. p. 0 ( p.)Detail
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