Ing.

Richard Pánek

FIT, DCSY

+420 54114 1362
ipanek@fit.vut.cz

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Ing. Richard Pánek

Publications

  • 2023

    LOJDA, J.; PÁNEK, R.; SEKANINA, L.; KOTÁSEK, Z. Automated Design and Usage of the Fault-Tolerant Dynamic Partial Reconfiguration Controller for FPGAs. Microelectronics Reliability, 2023, vol. 2023, no. 144, p. 1-16. ISSN: 0026-2714.
    Detail | WWW

    PÁNEK, R.; LOJDA, J. The Fault-tolerant Single-FPGA Systems with a Self-repair Reconfiguration Controller. In LASCAS 2023 - 14th IEEE Latin American Symposium on Circuits and Systems, Proceedings. Quito: Institute of Electrical and Electronics Engineers, 2023. p. 104-107. ISBN: 978-1-6654-5705-7.
    Detail | WWW

  • 2021

    LOJDA, J.; PÁNEK, R.; KOTÁSEK, Z. Automatically-Designed Fault-Tolerant Systems: Failed Partitions Recovery. In 2021 IEEE East-West Design and Test Symposium, EWDTS 2021 - Proceedings. Batumi: Institute of Electrical and Electronics Engineers, 2021. p. 26-33. ISBN: 978-1-6654-4503-0.
    Detail | WWW

    LOJDA, J.; PÁNEK, R.; PODIVÍNSKÝ, J.; ČEKAN, O.; KRČMA, M.; KOTÁSEK, Z. Testing Embedded Software Through Fault Injection: Case Study on Smart Lock. In 2021 IEEE 22nd Latin American Test Symposium, LATS 2021. Punta del Este: Institute of Electrical and Electronics Engineers, 2021. p. 80-85. ISBN: 978-1-6654-2057-0.
    Detail | WWW

    LOJDA, J.; PÁNEK, R.; KOTÁSEK, Z. Automatic Design of Fault-Tolerant Systems for VHDL and SRAM-based FPGAs. In Proceedings - 2021 24th Euromicro Conference on Digital System Design, DSD 2021. Palermo: Institute of Electrical and Electronics Engineers, 2021. p. 549-552. ISBN: 978-1-6654-2703-6.
    Detail | WWW

    PÁNEK, R.; LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z. Reliability Analysis of the FPGA Control System with Reconfiguration Hardening. In Proceedings - 2021 24th Euromicro Conference on Digital System Design, DSD 2021. Palermo: Institute of Electrical and Electronics Engineers, 2021. p. 553-556. ISBN: 978-1-6654-2703-6.
    Detail | WWW

  • 2020

    LOJDA, J.; PODIVÍNSKÝ, J.; ČEKAN, O.; PÁNEK, R.; KRČMA, M.; KOTÁSEK, Z. Automatic Design of Reliable Systems Based on the Multiple-choice Knapsack Problem. In Proceedings - 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020. Novi Sad: Institute of Electrical and Electronics Engineers, 2020. p. 1-4. ISBN: 978-1-7281-9938-2.
    Detail | WWW

    PODIVÍNSKÝ, J.; LOJDA, J.; PÁNEK, R.; ČEKAN, O.; KRČMA, M.; KOTÁSEK, Z. Evaluation Platform For Testing Fault Tolerance: Testing Reliability of Smart Electronic Locks. In 2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS). San José: IEEE Circuits and Systems Society, 2020. p. 1-4. ISBN: 978-1-7281-3427-7.
    Detail | WWW

    LOJDA, J.; PÁNEK, R.; PODIVÍNSKÝ, J.; ČEKAN, O.; KRČMA, M.; KOTÁSEK, Z. Analysis of Software-Implemented Fault Tolerance: Case Study on Smart Lock. In 2020 IEEE East-West Design and Test Symposium, EWDTS 2020 - Proceedings. Varna: Institute of Electrical and Electronics Engineers, 2020. p. 24-28. ISBN: 978-1-7281-9899-6.
    Detail | WWW

    PÁNEK, R.; LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z. Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study. In 2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers. Hsinchu: IEEE Computer Society, 2020. p. 121-124. ISBN: 978-1-7281-6083-2.
    Detail | WWW

    LOJDA, J.; PÁNEK, R.; PODIVÍNSKÝ, J.; ČEKAN, O.; KRČMA, M.; KOTÁSEK, Z. Hardening of Smart Electronic Lock Software against Random and Deliberate Faults. In Proceedings - Euromicro Conference on Digital System Design, DSD 2020. Kranj: Institute of Electrical and Electronics Engineers, 2020. p. 680-683. ISBN: 978-1-7281-9535-3.
    Detail | WWW

  • 2019

    ČEKAN, O.; PODIVÍNSKÝ, J.; LOJDA, J.; PÁNEK, R.; KRČMA, M.; KOTÁSEK, Z. Testing Reliability of Smart Electronic Locks: Analysis and the First Steps Towards. In Proceedings of the 2019 22nd Euromicro Conference on Digital System Design. Kalithea: Institute of Electrical and Electronics Engineers, 2019. p. 506-513. ISBN: 978-1-7281-2861-0.
    Detail | WWW

    ČEKAN, O.; PODIVÍNSKÝ, J.; LOJDA, J.; PÁNEK, R.; KRČMA, M.; KOTÁSEK, Z. Smart Electronic Locks and Their Reliability. Proceedings of the 7th Prague Embedded Systems Workshop. Roztoky u Prahy: Czech Technical University, 2019. p. 4-5. ISBN: 978-80-01-06607-2.
    Detail | WWW

  • 2018

    ČEKAN, O.; PÁNEK, R.; KOTÁSEK, Z. Input and Output Generation for the Verification of ALU: a Use Case. In Proceedings of 2018 IEEE East-West Design and Test Symposium, EWDTS 2018. Kazan: IEEE Computer Society, 2018. p. 331-336. ISBN: 978-1-5386-5710-2.
    Detail | WWW

    LOJDA, J.; PODIVÍNSKÝ, J.; ČEKAN, O.; PÁNEK, R.; KOTÁSEK, Z. FT-EST Framework: Reliability Estimation for the Purposes of Fault-Tolerant Systems Design Automation. In Proceedings of the 2018 21st Euromicro Conference on Digital System Design. Praha: IEEE Computer Society, 2018. p. 244-251. ISBN: 978-1-5386-7376-8.
    Detail | WWW

    PÁNEK, R.; LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z. Partial Dynamic Reconfiguration in an FPGA-based Fault-Tolerant System: Simulation-based Evaluation. In Proceedings of IEEE East-West Design & Test Symposium. Kazaň: IEEE Computer Society, 2018. p. 129-134. ISBN: 978-1-5386-5710-2.
    Detail | WWW

    PÁNEK, R. Metodika návrhu řadiče rekonfigurace pro Systémy odolné proti poruchám. Počítačové architektury & diagnostika 2018. Stachy: Západočeská univerzita v Plzni, 2018. p. 21-24. ISBN: 978-80-261-0814-6.
    Detail | WWW

  • 2017

    PÁNEK, R. Systémy odolné proti poruchám - metodika návrhu řadiče rekonfigurace. Počítačové architektury & diagnostika 2017. Smolenice: Slovenská technická univerzita v Bratislavě, 2017. p. 24-27. ISBN: 978-80-972784-0-3.
    Detail | WWW

    PODIVÍNSKÝ, J.; LOJDA, J.; ČEKAN, O.; PÁNEK, R.; KOTÁSEK, Z. Reliability Analysis and Improvement of FPGA-based Robot Controller. In Proceedings of the 2017 20th Euromicro Conference on Digital System Design. Vídeň: IEEE Computer Society, 2017. p. 337-344. ISBN: 978-1-5386-2145-5.
    Detail | WWW

*) Publications are generated once a 24 hours.