Project detail

Design and construction of an Ultra-violet optical apparatus for in situ measurements of areal optical homogeneity of thin films prepared by IBAD

Duration: 01.01.2002 — 31.12.2004

Funding resources

Czech Science Foundation - Standardní projekty

- whole funder (2002-01-01 - 2004-12-31)

Mark

GA102/02/0506

Default language

Czech

People responsible

Spousta Jiří, prof. RNDr., Ph.D. - principal person responsible

Units

Institute of Physical Engineering
- (2002-11-28 - not assigned)

Results

URBÁNEK, M., SPOUSTA, J., NAVRÁTIL, K., FIEDOR, M., CHMELÍK, R., BUČEK, M., ŠIKOLA, T. Instrument for Thin Films Diagnostics by UV Spectroscopic Reflectometry. In ECASIA '03 Book of abstracts. Berlin: ECASIA, 2003. p. 284 ( p.)
Detail

ČECHAL, J., TICHOPÁDEK, P., NEBOJSA, A., BONAVENTUROVÁ - ZRZAVECKÁ, O., URBÁNEK, M., NAVRÁTIL, K., ŠIKOLA, T. In-situ analysis of PMPSI by spectroscopic ellipsometry and XPS. In ECASIA 10 Book of Abstracts. Berlin: ECASIA, 2003. p. 226 ( p.)
Detail

URBÁNEK, M.; SPOUSTA, J.; NAVRÁTIL, K.; SZOTKOWSKI, R.; CHMELÍK, R.; BUČEK, M.; ŠIKOLA, T. Instrument for thin film diagnostics by UV spectroscopic reflectometry. Surface and Interface Analysis, 2004, vol. 36, no. 8, p. 1102 ( p.)ISSN: 0142-2421.
Detail

SPOUSTA, J., ŠIKOLA, T., ZLÁMAL, J., URBÁNEK, M., NAVRÁTIL, K., JIRUŠE, J., CHMELÍK, R., NEBOJSA, A. In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films. Surface and Interface Analysis, 2002, vol. 34, no. 1, p. 664 ( p.)ISSN: 0142-2421.
Detail

URBÁNEK, M., SPOUSTA, J., NAVRÁTIL, K., BUČEK, M., NEUGEBAUER, P., ŠIKOLA, T. Systém pro měření homogenity optických vlastností tenkých vrstev. 2003, roč. 48, č. 6, s. 163 ( s.)ISSN: 0447-6411.
Detail

VAIS, J., ŽENÍŠEK, J., JURKOVIČ, P., ČECHAL, J., DITTRICHOVÁ, L., SPOUSTA, J., BOCHNÍČEK, Z., ŠIKOLA, T. Interface and depth profile analysis of magnetic ultrathin films. In ECASIA 10 Book of Abstracts. Berlin: ECASIA, 2003. p. 226 ( p.)
Detail