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Project detail
Duration: 01.01.2007 — 31.12.2009
Funding resources
Czech Science Foundation - Standardní projekty
- whole funder (2006-03-30 - not assigned)
On the project
The proposed project is dealing with up-to-date research topics of fluctuation phenomena in Schottky and cold-field emission cathodes. Methodology consists in experimental study of measurable quantities, as the noise voltage or current and theirs spectral density dependence on temperature, light illumination and electric field intensity. The main sources of noise are: 1/f noise, generation recombination noise with its component - RTS noise, shot and thermal noise. The 1/f noise is dominant in ultra low frequency range (mHz region). New experimental results of noise spectral density and the relation to charge carriers mean free path, its mobility, dependence on temperature, light illumination and electric field intensity in this frequency range will be obtained. Achieving these results requires an electron source with the following ideal properties: Small source size, low electron emission energy spread, high brightness (beam current per solid angle), low noise and long-term stability, simple and low-cost operation. The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive characterisation of semiconductor materials and devices.
Description in EnglishThe proposed project is dealing with up-to-date research topics of fluctuation phenomena in Schottky and cold-field emission cathodes. Methodology consists in experimental study of measurable quantities, as the noise voltage or current and theirs spectral density dependence on temperature, light illumination and electric field intensity. The main sources of noise are: 1/f noise, generation recombination noise with its component - RTS noise, shot and thermal noise. The 1/f noise is dominant in ultra low frequency range (mHz region). New experimental results of noise spectral density and the relation to charge carriers mean free path, its mobility, dependence on temperature, light illumination and electric field intensity in this frequency range will be obtained. Achieving these results requires an electron source with the following ideal properties: Small source size, low electron emission energy spread, high brightness (beam current per solid angle), low noise and long-term stability, simple and low-cost operation. The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive characterisation of semiconductor materials and devices.
Keywordsnoise, spectral density, mobility, afinity
Key words in Englishnoise, spectral density, mobility, afinity
Mark
GA102/07/0113
Default language
Czech
People responsible
Brüstlová Jitka, Ing., CSc. - fellow researcherDobis Pavel, RNDr., CSc. - fellow researcherHolcman Vladimír, doc. Ing., Ph.D. - fellow researcherHruška Pavel, doc. RNDr., CSc. - fellow researcherKoktavý Pavel, prof. Ing., CSc. Ph.D. - fellow researcherLiedermann Karel, doc. Ing., CSc. - fellow researcherMajzner Jiří, Ing., Ph.D. - fellow researcherPavelka Jan, doc. Mgr., CSc. Ph.D. - fellow researcherSadovský Petr, Ing., Ph.D. - fellow researcherSedláková Vlasta, doc. Ing., Ph.D. - fellow researcherŠikula Josef, prof. Ing. RNDr., DrSc. - fellow researcherTománek Pavel, prof. RNDr., CSc. - fellow researcherGrmela Lubomír, prof. Ing., CSc. - principal person responsible
Units
Department of Physics- beneficiary (2006-03-30 - not assigned)
Results
HOLCMAN, V. Dielectric characteristics of composite systems. In ISSE 2008 31st International Spring Seminar on Electronics Technology. 1. Budapest: 31st International Spring Seminar on Electronics Technology, 2008. p. 77-81. ISBN: 978-963-06-4915-5.Detail
HOLCMAN, V.; ANDREEV, A.; RAŠKA, M. New Mixed Rules. In ISSE 2008 31st International Spring Seminar on Electronics Technology. 1. Budapest: 31st International Spring Seminar on Electronics Technology, 2008. p. 82-85. ISBN: 978-963-06-4915-5.Detail
HOLCMAN, V. Dielektrická relaxační spektroskopie kompozitních soustav. Brno: 2008. s. 1-32.Detail
KNÁPEK, A.; GRMELA, L. Fabrication and Noise Diagnostics of Schottky Nanotip Cathodes. Book of Abstracts, IMA 2009 Conference, Athens, October 2009. National and Kapodistrian University of Athens, 2009. p. 53-53.Detail
SADOVSKÝ, P. Analýza spánkového EEG. Brno: Petr Sadovský, 2007. 120 s.Detail
GRMELA, L.; TOMÁNEK, P. Near-field study of hot luminescence centers in ZnS:Mn nanocrystals. Brno: VUTIUM Brno, 2007. p. 158-158.Detail
HRUŠKA, P.; GRMELA, L. Silicon-silicon dioxide nanostructure in electrostatic field. Acta Electrotechnica et Informatica, 2010, vol. 10, no. 3, p. 22-25. ISSN: 1335-8243.Detail
HOLCMAN, V.; LIEDERMANN, K. New mixing rule of polymer composite systems. WSEAS Transactions on Electronics, 2008, vol. 4, no. 1, p. 181-185. ISSN: 1109-9445.Detail
ANDREEV, A.; GRMELA, L.; RAŠKA, M.; ŠIKULA, J. Experimental Analysis of Noise in CdTe Radiation Detectors. AIP conference proceedings, 2009, vol. 1129, no. 1, p. 313-317. ISSN: 0094-243X.Detail
GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS:Mn nanoparticles. Materials Science Forum, 2007, vol. 2007, no. 567, p. 241-244. ISSN: 0255-5476.Detail
ANDREEV, A. Analysis of Fermi Level Position the CdTe Single Crystal. In Proceedings of the 13th Conference Student EEICT 2007, Volume 3. Brno, Czech Republic: Ing. Zdeněk NovotnýCsc, Ondračkova 105 Brno, 2007. p. 215 ( p.)ISBN: 978-80-214-3409-7.Detail
AHMED, M. Electroluminescence brightness and luminous efficiency of ZnS:Mn doped with KCl. In Proceedings of the 13th Conference STUDENT EEICT 2007. vol. 3. Brno: Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno, 2007. p. 210-214. ISBN: 978-80-214-3409-7.Detail
AHMED, M.; TOMÁNEK, P.; DOBIS, P.; BRÜSTLOVÁ, J. Local investigation on alternating current ZnS:Mn thin-film electroluminescent devices. In CoPhys 2006. Nitra: Constantine the Philosopher University, 2007. p. 53-63. ISBN: 978-80-8094-084-3.Detail
AHMED, M.; TOMÁNEK, P. Local opto-electronic characteristics of alternating current ZnS:Mn thin-film electroluminescent devices. In Nové trendy v mikroelektronických systémech a nanotechnologiích: moderní diagnostika materiálů a součástek Mikrosyn-2006. Brno: Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno, 2007. p. 93-102. ISBN: 978-80-7355-075-2.Detail
STRÁNÍK, R.; HOLCMAN, V. DIELECTRIC RELAXATION IN GLYCEROL AT LONG-TIME EXPOSURE TO LOW TEMPERATURE. In 6th international conference of phd students. Miskolc, Hungary: University of Miskolc, 2007. p. 379-384. ISBN: 978-963-661-783-7.Detail
GRMELA, L.; ZAJAČEK, J. The Sub-Band Decomposition of Fluctuated Signal for the Estimation of Power Spectra. In Conference Proceeeding Book. J.U Urena, J.U.Dominguez. New York: IEEE Spain, 2007. p. 327-332. ISBN: 1-4244-0829-6.Detail
GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Noise Sources in the CdTe radiation detectors. In Noise and Fluctuation - 19-th International Conference on Noise and Fluctuations - ICNF 2007. M.Tacano, Y.Yamamoto, M.Nakao. Melville, USA: American Institute of Physics, 2007. p. 302-305. ISBN: 978-0-7354-0432-8.Detail
HOLCMAN, V.; LIEDERMANN, K. Dielectric characteristic of composites polymer system. In Materialstoday Asia 2007. 1. Wokingham, Berkshire, RG41 3HA, UK: Claire Norris, 2007. s. 150-151.Detail
ANDREEV, A.; ZAJAČEK, J.; ŠIKULA, J.; GRMELA, L.; HOLCMAN, V. The Effect of Contacts Metal - Semiconductor on Low Frequency Noise. In 6th International Conference of PhD Students. 1. Miskolc, Hungary: Jozsef Vesza, 2007. p. 173-178. ISBN: 978-963-661-779-0.Detail
ANDREEV, A.; GRMELA, L. Fermi Level Position in the Cadmium Telluride Detrector. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 84-85. ISBN: 978-973-713-174-4.Detail
ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J. Analysis of the CdTe Hole Concentration and the Hole Mobility. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 86-87. ISBN: 978-973-713-174-4.Detail
ANDREEV, A.; GRMELA, L. Investigation of 1/f Noise of p-type CdTe Detectors. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 88-89. ISBN: 978-973-713-174-4.Detail
HRUŠKA, P.; GRMELA, L. The LambertW function and semiconductor diode I-U curve. In EDS 07 IMAPS CS International Conference Proceedings. Brno: Ing. Zdeněk Novotný, CSc. Brno, Ondráčkova 105, 2007. p. 126-128. ISBN: 978-80-214-3470-7.Detail
STRÁNÍK, R.; LIEDERMANN, K. Změny dielektrického spektra glycerolu při dlouhodobé expozici při nízkých teplotách. In Diagnostika 07. 1. Plzeň: ZČU v Plzni, 2007. s. 299-302. ISBN: 978-80-7043-557-1.Detail
EL-FAKHRI, S.; LIEDERMANN, K. DIELECTRIC AND IMPEDANCE SPECTROSCOPY OF HYALURONIC ACID AND ITS SALTS. In new trends in physics 2007. 1. Brno: Ing. Novotny, CSc., Brno, 2007. p. 23-26. ISBN: 978-80-7355-078-3.Detail
SADOVSKÝ, P.; KOKTAVÝ, P. Study of Noise Current in Large Area PN Junctions Measurement. In New Trends in Physics. 1. Brno: Ing. Zdeněk Novotný, CSc. Ondráčkova 105, Brno, 2007. p. 126-129. ISBN: 978-80-7355-078-3.Detail
SADOVSKÝ, P. Grading Scale Experiment. In New Trends in Physics. 1. Brno: Ing. Zdeněk Novotný, CSc. Ondráčkova 105, Brno, 2007. p. 332-335. ISBN: 978-80-7355-078-3.Detail
ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Skenování materiálů lokální optickou sondou v blízkém poli. In 5th Workshop NDT 2007. Non-destructive testing in engineering practice. Brno: Brno University of Technology, 2007. s. 150-154. ISBN: 978-80-7204-549-5.Detail
GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS:Mn nanoparticles. In Materials Structure and Micromechanics of Fracture V. 567-568. Zurich, Switzerland: ttp Trans Tech Publications, 2008. p. 421-424. ISBN: 978-0-87849-469-9.Detail
HOLCMAN, V.; STRÁNÍK, R. Dielectric relaxation in Glycerol at long-time exposure to low temperatures. In ISSE 2008 31st International Spring Seminar on Electronics Technology. 1. Budapest: 31st International Spring Seminar on Electronics Technology, 2008. p. 86-90. ISBN: 978-963-06-4915-5.Detail
HOLCMAN, V.; LIEDERMANN, K.; GRMELA, L.; RAŠKA, M. NEW MIXED RULES ON COMPOSITE MATERIALS. In Proceedings of 2008 International Symposium on Electrical Insulating Materials. IEEJ Transactions on Electrical and Electronic Engineering. 1. Japonsko, Yokkaichi: Proceedings of 2008 International Symposium on Electrical Insulating, 2008. p. 71-74. ISBN: 978-4-88686-006-4. ISSN: 1931-4973.Detail
LIEDERMANN, K.; HOLCMAN, V.; EL-FAKHRI, S. Dielectric Spectroscopy of Hyaluronic Acid and its Salts. In Proceedings of 2008 International Symposium on Electrical Insulating Materials. Yokkaichi, Japonsko: IEE Japan, 2008. p. 234-237. ISBN: 978-4-88686-006-4.Detail
ŠKARVADA, P.; MACKŮ, R. SNOM fotoluminiscence a topografické měření kvantových teček InAs/GaAs. In Elektrotechnika a informatika 2007. Plzeň: Západočeská universita, 2007. s. 105-108. ISBN: 978-80-7043-572-4.Detail
TOMÁNEK, P.; BRÜSTLOVÁ, J.; DOBIS, P. The use of fiber Bragg gratings in sensing. In New trends in Physics 2007. Brno: Department of Physics FEEC, Brno University of Technology, 2007. p. 278-281. ISBN: 978-80-7355-078-3.Detail
HOLCMAN, V.; LIEDERMANN, K. DIELECTRIC RELAXATION SPECTRA OF A POLYMER-NICKEL COMPOSITE. In New trends in Physics. Brno: Ing. Zdeněk Novotný CSc., 2007. p. 43-46. ISBN: 978-80-7355-078-3.Detail
HOLCMAN, V. Měřicí systéme v dielektrické spektroskopii. In Non-destructive testing in engineering practicle. 1. Brno: Marta Kořenská and Luboš Pazdera, 2007. s. 24-27. ISBN: 978-80-7204-549-5.Detail
ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V. Low Frequency Noise Measuring in Semiconductor Devices. In 6th International Conference of PhD Students. Dr. Laszlo Lehoczky. Miskolc, Hungary: Dr. Laszlo Lehoczky, 2007. p. 179-184. ISBN: 978-963-661-783-7.Detail
ŠKARVADA, P. Scanning near-field optical microscopy. In New Trends in Physics. Brno: Ing. Zdeněk Novotný Csc., 2007. p. 274-277. ISBN: 978-80-7355-078-3.Detail
KNÁPEK, A. Automatized Schottky Cathode Fabrication and Noise Analysis. In Sborník příspěvků konfernece KRÁLÍKY 2009. 2009. p. 141-144. ISBN: 978-80-214-3938-2.Detail
HRUŠKA, P.; GRMELA, L. Behaviour of silicon nanostructure in electric field. In Proceedings of Physics of Materials 09, V. Lisý, D. Olčák (Eds). Košice, SK: Faculty of Electrical Engineering and Informatics, Technical University of Košice, 2009. p. 34-37. ISBN: 978-80-8086-122-3.Detail
HRUŠKA, P.; GRMELA, L. EMISSION OF QD IN ELECTROSTATIC FIELDS. In International Conference Technical Computing Prague 2009T - The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze. Praha: The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze, 2009. p. 39-44. ISBN: 978-80-7080-733-0.Detail
ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; CHVÁTAL, M.; RAŠKA, M. Bulk Resistance Decay in CdTe. In IEEE EUROCON 2009. St. Petersburg, Russia: Institute of Electrical and Electronics Engineers, St. Petersburg, 2009. p. 1181-1185. ISBN: 978-1-4244-3861-7.Detail
GRMELA, L.; DOBIS, P.; BRÜSTLOVÁ, J.; TOMÁNEK, P. Optoelectronic noise and photocurrent measurement on GaAs/AlGaAs laser diode with single quantum well. International Journal of Optomechatronics, 2007, vol. 1, no. 1, p. 73-80. ISSN: 1559-9612.Detail
HOLCMAN, V.; LIEDERMANN, K.; STRÁNÍK, R.: Diel 01; Systému pro měření tekutých dielektrik. UFYZ FEKT VUT v Brně. (funkční vzorek)Detail
SADOVSKÝ, P.: s200701; Virtuální laboratoř - měření optoelektronických součástek. Brno. (software)Detail
HOLCMAN, V.: SOFT01; Měřicí a vyhodnocovací software "Dielectric 2006". VUT Brno FEKT, UFYZ. URL: http://fyzika.feec.vutbr.cz. (software)Detail
HOLCMAN, V.; GRMELA, L.; KNÁPEK, A.; ANDREEV, A.: KR1; Vakuový systém pro měření studenoemisních aktod. UFYZ FEKT VUT v Brně. (prototyp)Detail
KNÁPEK, A.; HOLCMAN, V.; GRMELA, L.: LE01; Automatizovaný leptací systém. UFYZ FEKT VUT v Brně. URL: http://www.ufyz.feec.vutbr.cz. (prototyp)Detail
MACKŮ, R.: Spectrum v. 1.3; Software pro měření spektrálních výkonových hustot. Laboratoř UFYZ. URL: http://www.ufyz.feec.vutbr.cz/index.php?lang=1&page=86. (software)Detail
TOMÁNEK, P.: International Symposium on Optomechatronic Technologies - ISOT 2014. Seattle (05.09.2014)Detail
DOBIS, P., BRÜSTLOVÁ, J.: New Trends in Physics 2007. Brno (15.11.2007)Detail
TOMÁNEK, P.: International Symposium on Optomechatronic Technologies - ISOT 2007. Lausanne (08.10.2007)Detail