The proposed project is dealing with up-to-date research topics of fluctuation phenomena in Schottky and cold-field emission cathodes. Methodology consists in experimental study of measurable quantities, as the noise voltage or current and theirs spectral density dependence on temperature, light illumination and electric field intensity. The main sources of noise are: 1/f noise, generation recombination noise with its component - RTS noise, shot and thermal noise. The 1/f noise is dominant in ultra low frequency range (mHz region). New experimental results of noise spectral density and the relation to charge carriers mean free path, its mobility, dependence on temperature, light illumination and electric field intensity in this frequency range will be obtained. Achieving these results requires an electron source with the following ideal properties: Small source size, low electron emission energy spread, high brightness (beam current per solid angle), low noise and long-term stability, simple and low-cost operation. The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive characterisation of semiconductor materials and devices.

Popis anglicky
The proposed project is dealing with up-to-date research topics of fluctuation phenomena in Schottky and cold-field emission cathodes. Methodology consists in experimental study of measurable quantities, as the noise voltage or current and theirs spectral density dependence on temperature, light illumination and electric field intensity. The main sources of noise are: 1/f noise, generation recombination noise with its component - RTS noise, shot and thermal noise. The 1/f noise is dominant in ultra low frequency range (mHz region). New experimental results of noise spectral density and the relation to charge carriers mean free path, its mobility, dependence on temperature, light illumination and electric field intensity in this frequency range will be obtained. Achieving these results requires an electron source with the following ideal properties: Small source size, low electron emission energy spread, high brightness (beam current per solid angle), low noise and long-term stability, simple and low-cost operation. The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive characterisation of semiconductor materials and devices.

Klíčová slova
noise, spectral density, mobility, afinity

Klíčová slova anglicky
noise, spectral density, mobility, afinity

GA102/07/0113

čeština

Grmela Lubomír, prof. Ing., CSc. - hlavní řešitel
Brüstlová Jitka, Ing., CSc. - spoluřešitel
Dobis Pavel, RNDr., CSc. - spoluřešitel
Holcman Vladimír, doc. Ing., Ph.D. - spoluřešitel
Hruška Pavel, doc. RNDr., CSc. - spoluřešitel
Koktavý Pavel, prof. Ing., CSc. Ph.D. - spoluřešitel
Liedermann Karel, doc. Ing., CSc. - spoluřešitel
Majzner Jiří, Ing., Ph.D. - spoluřešitel
Pavelka Jan, doc. Mgr., CSc. Ph.D. - spoluřešitel
Sadovský Petr, Ing., Ph.D. - spoluřešitel
Sedláková Vlasta, doc. Ing., Ph.D. - spoluřešitel
Šikula Josef, prof. Ing. RNDr., DrSc. - spoluřešitel
Tománek Pavel, prof. RNDr., CSc. - spoluřešitel

Ústav fyziky
- odpovědné pracoviště (30.3.2006 - nezadáno)
Ústav fyziky
- příjemce (30.3.2006 - nezadáno)

TOMÁNEK, P.: International Symposium on Optomechatronic Technologies - ISOT 2014. Seattle (05.09.2014)
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DOBIS, P., BRÜSTLOVÁ, J.: New Trends in Physics 2007. Brno (15.11.2007)
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TOMÁNEK, P.: International Symposium on Optomechatronic Technologies - ISOT 2007. Lausanne (08.10.2007)
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HOLCMAN, V.; GRMELA, L.; KNÁPEK, A.; ANDREEV, A.: KR1; Vakuový systém pro měření studenoemisních aktod. UFYZ FEKT VUT v Brně. (prototyp)
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KNÁPEK, A.; HOLCMAN, V.; GRMELA, L.: LE01; Automatizovaný leptací systém. UFYZ FEKT VUT v Brně. URL: http://www.ufyz.feec.vutbr.cz. (prototyp)
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MACKŮ, R.: Spectrum v. 1.3; Software pro měření spektrálních výkonových hustot. Laboratoř UFYZ. URL: http://www.ufyz.feec.vutbr.cz/index.php?lang=1&page=86. (software)
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HOLCMAN, V.; LIEDERMANN, K.; STRÁNÍK, R.: Diel 01; Systému pro měření tekutých dielektrik. UFYZ FEKT VUT v Brně. (funkční vzorek)
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HOLCMAN, V.: SOFT01; Měřicí a vyhodnocovací software "Dielectric 2006". VUT Brno FEKT, UFYZ. URL: http://fyzika.feec.vutbr.cz. (software)
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SADOVSKÝ, P.: s200701; Virtuální laboratoř - měření optoelektronických součástek. Brno. (software)
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HOLCMAN, V. Dielektrická relaxační spektroskopie kompozitních soustav. Brno: 2008. s. 1-32.
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KNÁPEK, A.; GRMELA, L. Fabrication and Noise Diagnostics of Schottky Nanotip Cathodes. Book of Abstracts, IMA 2009 Conference, Athens, October 2009. National and Kapodistrian University of Athens, 2009. p. 53-53.
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SADOVSKÝ, P. Analýza spánkového EEG. Brno: Petr Sadovský, 2007. 120 s.
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GRMELA, L.; TOMÁNEK, P. Near-field study of hot luminescence centers in ZnS:Mn nanocrystals. Brno: VUTIUM Brno, 2007. p. 158-158.
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HRUŠKA, P.; GRMELA, L. Silicon-silicon dioxide nanostructure in electrostatic field. Acta Electrotechnica et Informatica, 2010, vol. 10, no. 3, p. 22-25. ISSN: 1335-8243.
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HOLCMAN, V.; LIEDERMANN, K. New mixing rule of polymer composite systems. WSEAS Transactions on Electronics, 2008, vol. 4, no. 1, p. 181-185. ISSN: 1109-9445.
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ANDREEV, A.; GRMELA, L.; RAŠKA, M.; ŠIKULA, J. Experimental Analysis of Noise in CdTe Radiation Detectors. AIP conference proceedings, 2009, vol. 1129, no. 1, p. 313-317. ISSN: 0094-243X.
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GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS:Mn nanoparticles. Materials Science Forum, 2007, vol. 2007, no. 567, p. 241-244. ISSN: 0255-5476.
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GRMELA, L.; DOBIS, P.; BRÜSTLOVÁ, J.; TOMÁNEK, P. Optoelectronic noise and photocurrent measurement on GaAs/AlGaAs laser diode with single quantum well. International Journal of Optomechatronics, 2007, vol. 1, no. 1, p. 73-80. ISSN: 1559-9612.
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ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; CHVÁTAL, M.; RAŠKA, M. Bulk Resistance Decay in CdTe. In IEEE EUROCON 2009. St. Petersburg, Russia: Institute of Electrical and Electronics Engineers, St. Petersburg, 2009. p. 1181-1185. ISBN: 978-1-4244-3861-7.
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HRUŠKA, P.; GRMELA, L. EMISSION OF QD IN ELECTROSTATIC FIELDS. In International Conference Technical Computing Prague 2009T - The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze. Praha: The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze, 2009. p. 39-44. ISBN: 978-80-7080-733-0.
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Odpovědnost: Grmela Lubomír, prof. Ing., CSc.