Czech

Not applicable.

Knowledge of selected methods used for determination of properties, parameters and structure of electrotechnic materials and material systems in relation to dependability and quality.

Knowlwedge on level of finished master study program at technical type university.

Not applicable.

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

Written examination from individual parts.

Investigations of electrochemical power sources and related systems

Electrochemical systems: the usage of electrochemical processes in ionic conductors and on their boundaries with electronic conductors.
The principles of ionic conductivity. Ionic conductors, movement of ions in solutions. Liquid and solid electrolytes.
Measurements of conductivity of an electrolyte. Elimination of parasitic components. The influence of temperature.
The electrode processes at the boundary of electrode with electrolyte. Separation of ionic and electronic charges. Principle of electrode reactions.
Butler – Volmer reaction. Electrocatalysis. Fuel cells.
Investigations in frequency domain. Impedance, admittance, imittance. Steady state of a.c. Immitance as transfer function. Fourier integral transform. Relation of both domains.
Polarized (blocking) electrode. Space scharge on the boundaries. Electrochemical supercapacitors. Their measurement.
Conductometers. Measurement of conductivities by general – purpose instruments. Potentiostats: principle of negative feedback. Stability of feedback systems. Criterion of stability.

Electrical measurements methods of semiconductor materials and structures

Four point probe methods, spreading resistance, sheet resistance. Electron and hole mobility and life time measurement methods. Capacitance –voltage measurement of junctions and MIS structures. B-T test.

Methods of scanning electron microscopy

Electron beams, electron optics. Resolution, depth of focus. Interaction of electrons with solid. Electron range, information volume. Signals, signal detection. Cathodoluminescence, voltage contrast, EBIC. Environmental scanning electron microscopy.


Special diagnostic methods

Methods of X-ray diffractography. X-ray diffraction topography. Electron diffraction. Neutron diffraction.
Spectrometry diagnostic methods. UV absorption spectrometry, emission spectrometry, X-ray spectrometry. MR spectrometry, mass spectrometry.

Electron spectroscopies

Basic terms and principles, types of electron spectroscopy methods. Scattering of electrons inside a solid, emission of electrons. The Auger phonomenon and its utilisation in the spectral analysis. Instrumentation for electron spectroscopies. Photoelectron spectroscopies. Microscopy with very slow electrons. Spectroscopy of electron energy losses, spectroscopy of backscattered electrons, non-traditional spectroscopical methods.


Dependability and quality

Dependability, quality, quality process management. Dependability and quality relation. Availability and influence several components on numeric value of availability ratio. Methods and analysis procedure of dependability. Proposal and quality process management.
Risk management. Risk, fundamentals terms. Categories of risk, risk numeric value. Methods and risk assessment procedure. Method of risk management, risk optimization.

Not applicable.

The aim of the course is to acquaint students with selected methods for evaluation of properties, parameters and structure of some electrotechnic materials and material systems and with dependability, quality, and quality process management.

Not applicable.

Not applicable.

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Bard,A.J.:Electroanalytical Chemistry, Marcel Dekker,N.Y.,1970. (EN)
Brett,C.M.A.,Brett,A.M.O.: Electrochemistry, Oxford, 1993. (EN)
Eckertová,L., Frank,L.: Elektronová mikroskopie a difrakce, Academia, Praha,1996. (CS)
Frank,L., Král,J.: Metody analýzy povrchů, Academia, Praha, 2002. (CS)
Kececioglu,D.: Maintainability, Availability and Operational Readiness Engineering Handbook, Vol.1. Prentice Hall, Englewood Cliffs, New Jersey, 1995. (EN)
Reimer,L.: Scanning electron microscopy, Springer Verlag Berlin,1999. (EN)
Van Zant,P.:Microchip Fabrication. McGraw-Hill New York, 2000. (EN)

Not applicable.