Combined study

4 years

prof. RNDr. Tomáš Šikola, CSc.

Chairman :
prof. RNDr. Tomáš Šikola, CSc.
Councillor internal :
prof. RNDr. Petr Dub, CSc.
prof. RNDr. Radim Chmelík, Ph.D.
prof. Ing. Ivan Křupka, Ph.D.
prof. RNDr. Pavel Šandera, CSc.
Councillor external :
RNDr. Antonín Fejfar, CSc.
prof. Mgr. Dominik Munzar, Dr.
prof. RNDr. Pavel Zemánek, Ph.D.

The aim of the doctoral study in the proposed programme is to prepare highly educated experts in the field of physical engineering and nanotechnology with sufficient foreign experience, who will be able to perform independent creative, scientific and research activities in academia or applications in our country and abroad. The study is based on the doctoral students' own creative and research work at the level standardly required at foreign workplaces in the areas of research carried out at the training workplace and supported by national and international projects. These are the following areas of applied physics: physics of surfaces and nanostructures, light and particle optics and microscopy, construction of physical instruments and equipment, micromechanics of materials.

The graduate has knowledge, skills and competencies for their own creative activities in some of the areas in which the research activities of the training workplace are carried out. These are applications of physics especially in the field of physics of surfaces and nanostructures, two-dimensional materials, nanoelectronics, nanophotonics, micromagnetism and spintronics, biophotonics, advanced light microscopy and spectroscopy, electron microscopy, laser nanometrology and spectroscopy, computer controlled X-ray micro and nanotomography, micro and development of technological and analytical equipment and methods for micro/nanotechnologies. The possibility of using the personnel and material background provided by the CEITEC research infrastructure as well as extensive cooperation with important foreign workplaces contributes to the high level of education. This guarantees that the graduate is able to present the results of their work orally and in writing and discuss them in English. Due to high professional competencies and flexibility, graduates find employment both in universities and other research institutions in our country and abroad, and in high-tech companies in the positions of researchers, developers, designers or team leaders.

Due to their high professional competencies and flexibility, graduates find employment in the field of basic and applied research at universities and other research institutions in our country and abroad, as well as in high-tech companies in the positions of researchers, developers, designers and team leaders.

See applicable regulations, DEAN’S GUIDELINE Rules for the organization of studies at FME (supplement to BUT Study and Examination Rules)

The rules and conditions of study programmes are determined by:
BUT STUDY AND EXAMINATION RULES
BUT STUDY PROGRAMME STANDARDS,
STUDY AND EXAMINATION RULES of Brno University of Technology (USING "ECTS"),
DEAN’S GUIDELINE Rules for the organization of studies at FME (supplement to BUT Study and Examination Rules)
DEAN´S GUIDELINE Rules of Procedure of Doctoral Board of FME Study Programmes
Students in doctoral programmes do not follow the credit system. The grades “Passed” and “Failed” are used to grade examinations, doctoral state examination is graded “Passed” or “Failed”.

Brno University of Technology acknowledges the need for equal access to higher education. There is no direct or indirect discrimination during the admission procedure or the study period. Students with specific educational needs (learning disabilities, physical and sensory handicap, chronic somatic diseases, autism spectrum disorders, impaired communication abilities, mental illness) can find help and counselling at Lifelong Learning Institute of Brno University of Technology. This issue is dealt with in detail in Rector's Guideline No. 11/2017 "Applicants and Students with Specific Needs at BUT". Furthermore, in Rector's Guideline No 71/2017 "Accommodation and Social Scholarship“ students can find information on a system of social scholarships.

The presented doctoral study programme represents the highest level of education in the field of physical engineering and nanotechnology. Follows the academic and bachelor's and subsequent master's degree programme of "Physical Engineering and Nanotechnology", which are carried out at FME BUT.

1. Cutting-edge techniques for preparation of cross sections of advanced materials for SEM imaging

   Scanning electron microscopy observation of a specimen cross-section can provide important information for material research and development as well as failure analysis. Typically, a cross-section is prepared using mechanical means like conventional mechanical polishing methods or a microtome. Such methods can be lengthy procedures that require a great deal of skill and can introduce artifacts into soft materials, deform the material around voids, or compress layers of soft and hard materials in composite samples. A Focused Ion Beam (FIB) system is used when precise positioning of the cross-section is required, such as in the case of thin-film or micro area specimen preparation. However, the size of the resulting cross-section is limited, and the heavy gallium ions in the beam can damage the sample surface. A plasma FIB provides an effective solution to prepare large-area cross-sections but this technique is not suitable for sensitive materials. Modern Ar ion beam cross-section polisher simplifies the preparation of samples and makes it possible to prepare truly representative cross-sections of samples almost free of artifacts and distortion. The use of the broad Ar ion beam eliminates the problems associated with conventional polishing and allows for larger specimens to be prepared with precision. On the other hand, establishing the optimal process parameters for artifacts-free polishing is not trivial. Preparation of cross-sectional samples by an ultramicrotomy, laser beam, or water jet cutter is less known but can also provide interesting results. The thesis will provide a comprehensive review of standard and advanced cross-section methods. The goals of the thesis are the experimental comparison of the above-mentioned techniques for cross-sectional sample preparation, discuss their pros and cons, and elucidate the mechanism of sample damage using these techniques. The specimens will be characterized by advanced electron microscopy techniques, including a low voltage STEM with atomic resolution.

   Tutor: Mikmeková Šárka, Ing. Mgr., Ph.D.