Publications

• 2024

  JAKUB, Z.; TRLLOVÁ SHAHSAVAR, A.; PLANER, J.; HRŮZA, D.; HERICH, O.; PROCHÁZKA, P.; ČECHAL, J. How the Support Defines Properties of 2D Metal-Organic Frameworks: Fe-TCNQ on Graphene versus Au(111). Journal of the American Chemical Society, 2024, vol. 146, no. 5, p. 3471-3482. ISSN: 1520-5126.
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  LI, X.; ČECHAL, J.; ŠPAŇHEL, L.; TOSCANI, S.; MARTINÍK, J.; OBOŘILOVÁ, R.; TRNKOVÁ, L. Intriguing properties of graphite/polysiloxane composite-based pencil electrodes. ELECTROCHIMICA ACTA, 2024, vol. 475, no. 1, ISSN: 1873-3859.
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  Badami-Behjat, A.; Rinkovec, T.; Procházka, P.; Bazylevska, A.; RodríguezGonzález, MC.; Cao, H.; Cechal, J.; De Feyter, S.; Lackinger, M. Reversible Intercalation of Organic Solvents in Graphite and Its Hindrance by a Strongly Adsorbing Supramolecular Monolayer. Advanced Materials Interfaces, 2024, vol. 11, no. 36, ISSN: 2196-7350.
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  PROCHÁZKA, P.; ČECHAL, J. ProLEED Studio: software for modeling low-energy electron diffraction patterns. Journal of Applied Crystallography, 2024, vol. 57, no. 1, p. 187-193. ISSN: 1600-5767.
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  Pinder, JW.; Major, GH.; Baer, DR.; Terry, J.; Whitten, JE.; Cechal, J.; Crossman, JD.; Lizarbe, AJ.; Jafari, S.; Easton, CD.; Baltrusaitis, J.; van Spronsen, MA.; Linford, MR. Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters. Applied Surface Science Advances, 2024, vol. 19, no. 100534, ISSN: 2666-5239.
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  KRAJŇÁK, T.; STARÁ, V.; PROCHÁZKA, P.; PLANER, J.; SKÁLA, T.; BLATNIK, M.; ČECHAL, J. Robust Dipolar Layers between Organic Semiconductors and Silver for Energy-Level Alignment. ACS applied materials & interfaces, 2024, vol. 16, no. 14, p. 18099-18111. ISSN: 1944-8252.
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• 2023

  AVVAL, T.; PRŮŠA, S.; ČECHAL, J.; CUSHMAN, C. V.; HODGES, G. T.; FEARN, S.; KIM, S. H.;ČECHAL, J.; VANÍČKOVÁ, E.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H. H.; LINFORD, M. R. A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering. Applied Surface Science, 2023, vol. 607, no. 154551, p. 154551 ( p.)ISSN: 0169-4332.
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  MAJOR, G.; CLARK, M.; CAYABYAB, K.; ENGEL, N.; EASTON, C.; ČECHAL, J.; BAER, D.; TERRY, J.; LINFORD, M. Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2023, vol. 41, no. 4, ISSN: 1520-8559.
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  REDONDO, J.; MICHALIČKA, J.; KRAUSHOFER, F.; FRANCESCHI, G.; ŠMÍD, B.; KUMAR, N.; MAN, O.; BLATNIK, M.; WRANA, D.; MALLADA, B.; ŠVEC, M.; PARKINSON, G.; SETVÍN, M.; RIVA, M.; DIEBOLD, U.; ČECHAL, J. Hematite α-Fe2O3(0001) in Top and Side View: Resolving Long-Standing Controversies about Its Surface Structure. Advanced Materials Interfaces, 2023, vol. 10, no. 32, ISSN: 2196-7350.
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  Major, GH.; Pinder, JW.; Austin, DE.; Baer, DR.; Castle, SL.; Cechal, J. ; Clark, BM.; Cohen, H.; Counsell, J.; Herrera-Gomez, A.; Govindan, P.; Kim, SH.; Morgan, DJ.; Opila, RL.; Powell, CJ.; Prusa, S.; Roberts, A.; Rocca, M.; Shirahata, N.; Sikola, T.; Smith, EF.; So, RC.; Stovall, JE.; Strunk, J.; Teplyakov, A.; Terry, J.; Weber, S.G.; Linford, M.R.;. Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2023, vol. 41, no. 3, ISSN: 1520-8559.
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  PROCHÁZKA, P.; ČECHAL, J. Visualization of molecular stacking using low-energy electron microscopy. ULTRAMICROSCOPY, 2023, vol. 253, no. 1, ISSN: 1879-2723.
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  SALAMON, D.; BUKVIŠOVÁ, K.; JAN, V.; POTOČEK, M.; ČECHAL, J. Superflux of an organic adlayer towards its local reactive immobilization. Communications Chemistry, 2023, vol. 6, no. 1, ISSN: 2399-3669.
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• 2022

  MAKOVEEV, A.; PROCHÁZKA, P.; BLATNIK, M.; KORMOŠ, L.; SKÁLA, T.; ČECHAL, J. Role of Phase Stabilization and Surface Orientation in 4,4 '-Biphenyl-Dicarboxylic Acid Self-Assembly and Transformation on Silver Substrates. Journal of Physical Chemistry C (web), 2022, vol. 126, no. 23, p. 9989-9997. ISSN: 1932-7455.
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  KRAJŇÁK, T.; ČERNÁ, E.; ŠURÁŇOVÁ, M.; ŠAMOŘIL, T.; ZICHA, D.; VOJTOVÁ, L.; ČECHAL, J. Replica-mold nanopatterned PHEMA hydrogel surfaces for ophthalmic applications. Scientific Reports, 2022, vol. 12, no. 1, p. 14497 ( p.)ISSN: 2045-2322.
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  ŽENÍŠEK, J.; ONDRAČKA, P.; ČECHAL, J.; SOUČEK, P.; HOLEC, D.; VAŠINA, P. W 4f electron binding energies in amorphous W-B-C systems. APPLIED SURFACE SCIENCE, 2022, vol. 586, no. 1, p. 152824-1 (152824-9 p.)ISSN: 1873-5584.
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  JAKUB, Z.; KUROWSKÁ, A.; HERICH, O.; ČERNÁ, L.; KORMOŠ, L.; SHAHSAVAR, A.; PROCHÁZKA, P.; ČECHAL, J. Remarkably stable metal-organic frameworks on an inert substrate: M-TCNQ on graphene (M = Ni, Fe, Mn). Nanoscale, 2022, vol. 14, no. 26, p. 9507-9515. ISSN: 2040-3372.
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  MAKOVEEV, A.; PROCHÁZKA, P.; SHAHSAVAR, A.; KORMOŠ, L.; KRAJŇÁK, T.; STARÁ, V.; ČECHAL, J. Kinetic control of self-assembly using a low-energy electron beam. APPLIED SURFACE SCIENCE, 2022, vol. 600, no. 1, p. 154106 ( p.)ISSN: 1873-5584.
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  CHEN, H.; BLATNIK, M.; RITTERHOFF, C.; SOKOLOVIC, I.; MIRABELLA, F.; FRANCESCHI, G.; RIVA, M.; SCHMID, M.; ČECHAL, J.; MEYER, B.; DIEBOLD, U.; WAGNER, M. Water Structures Reveal Local Hydrophobicity on the In2O3(111) Surface. ACS Nano (e-ISSN), 2022, vol. 16, no. 12, p. 21163-21173. ISSN: 1936-086X.
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  STARÁ, V.; PROCHÁZKA, P.; PLANER, J.; SHAHSAVAR, A.; MAKOVEEV, A.; SKÁLA, T.; BLATNIK, M.; ČECHAL, J. Tunable Energy-Level Alignment in Multilayers of Carboxylic Acids on Silver. Physical Review Applied, 2022, vol. 18, no. 4, ISSN: 2331-7019.
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• 2021

  TRNKOVÁ, L.; TŘÍSKOVÁ, I.; ČECHAL, J.; FARKA, Z. Polymer pencil leads as a porous nanocomposite graphite material for electrochemical applications: The impact of chemical and thermal treatments. ELECTROCHEMISTRY COMMUNICATIONS, 2021, vol. 126, no. 1, p. 1-7. ISSN: 1873-1902.
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  PROCHÁZKA, P.; KORMOŠ, L.; SHAHSAVAR, A.; STARÁ, V.; MAKOVEEV, A.; SKÁLA, T.; BLATNIK, M.; ČECHAL, J. Phase transformations in a complete monolayer of 4,4 '-biphenyl-dicarboxylic acid on Ag(001). APPLIED SURFACE SCIENCE, 2021, vol. 547, no. 1, p. 149115- (149115-7 p.)ISSN: 1873-5584.
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• 2020

  PROCHÁZKA, P.; GOSALVEZ, M.; KORMOŠ, L.; DE LA TORRE, B.; GALLARDO, A.; ALBERDI-RODRIGUEZ, J.; CHUTORA, T.; MAKOVEEV, A.; SHAHSAVAR, A.; ARNAU, A.; JELÍNEK, P.; ČECHAL, J. Multiscale Analysis of Phase Transformations in Self-Assembled Layers of 4,4 '-Biphenyl Dicarboxylic Acid on the Ag(001) Surface. ACS Nano, 2020, vol. 14, no. 6, p. 7269-7279. ISSN: 1936-0851.
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  Vozda, V.; Medvedev, N.; Chalupsky, J.; Cechal, J.; Burian, T.; Hajkova, V.; Juha, L.; Krus, M.; Kunc, J. Detachment of epitaxial graphene from SiC substrate by XUV laser radiation. CARBON, 2020, vol. 161, no. 1, p. 36-43. ISSN: 0008-6223.
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  UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F. Single-layer graphene on epitaxial FeRh thin films. Applied Surface Science, 2020, vol. 514, no. 1, p. 145923-1 (145923-7 p.)ISSN: 0169-4332.
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  KORMOŠ, L.; PROCHÁZKA, P.; MAKOVEEV, A.; ČECHAL, J. Complex k-uniform tilings by a simple bitopic precursor self-assembled on Ag(001) surface. NATURE COMMUNICATIONS, 2020, vol. 11, no. 1, p. 1-6. ISSN: 2041-1723.
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  FIKÁČEK, J.; PROCHÁZKA, P.; STETSOVYCH, V.; PRŮŠA, S.; VONDRÁČEK, M.; KORMOŠ, L.; SKÁLA, T.; VLAIC, P.; CAHA, O.; CARVA, K.; ČECHAL, J.; SPRINGHOLZ, G.; HONOLKA, J. Step-edge assisted large scale FeSe monolayer growth on epitaxial Bi(2)Se(3)thin films. NEW JOURNAL OF PHYSICS, 2020, vol. 22, no. 7, p. 1-12. ISSN: 1367-2630.
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• 2019

  NOVÁK, T.; KOSTELNÍK, P.; KONEČNÝ, M.; ČECHAL, J.; KOLÍBAL, M.; ŠIKOLA, T. Temperature effect on Al predose and AlN nucleation affecting the buffer layer performance for the GaN-on-Si based high-voltage devices. Japanese Journal of Applied Physics, 2019, vol. 58, no. SC, p. SC1018-1 (SC1018-9 p.)ISSN: 0021-4922.
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  VALLEJOS VARGAS, S.; GRÁCIA, I.; PIZÚROVÁ, N.; FIGUERAS, E.; ČECHAL, J.; HUBÁLEK, J.; CANÉ, C. Gas sensitive ZnO structures with reduced humidity-interference. Sensors and Actuators B: Chemical, 2019, vol. 301, no. 1, p. 127054-127054. ISSN: 0925-4005.
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  REDONDO, J.; LAZAR, P.; PROCHÁZKA, P.; PRŮŠA, S.; MALLADA, B.; CAHLÍK, A.; LACHNITT, J.; BERGER, J.; ŠMÍD, B.; KORMOŠ, L.; JELÍNEK, A.; ČECHAL, J.; ŠVEC, M. Identification of Two-Dimensional FeO2 Termination of Bulk Hematite α‑Fe2O3(0001) Surface. Journal of Physical Chemistry C (print), 2019, vol. 123, no. 23, p. 14312-14318. ISSN: 1932-7447.
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• 2018

  KORMOŠ, L.; PROCHÁZKA, P.; ŠIKOLA, T.; ČECHAL, J. Molecular Passivation of Substrate Step Edges as Origin of Unusual Growth Behavior of 4,4′-Biphenyl Dicarboxylic Acid on Cu(001). Journal of Physical Chemistry C (print), 2018, vol. 2018, no. 122, p. 2815-2820. ISSN: 1932-7447.
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  STARÁ, V.; PROCHÁZKA, P.; MAREČEK, D.; ŠIKOLA, T.; ČECHAL, J. Ambipolar remote graphene doping by low-energy electron beam irradiation. Nanoscale, 2018, vol. 10, no. 37, p. 17520-17524. ISSN: 2040-3372.
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  REDONDO, J.; TELYCHKO, M.; PROCHÁZKA, P.; KONEČNÝ, M.; BERGER, J.; VONDRÁČEK, M.; ČECHAL, J.; JELÍNEK, P.; ŠVEC, M. Simple device for the growth of micrometer-sized monocrystalline single-layer graphene on SiC(0001). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2018, vol. 36, no. 3, p. 031401-1 (031401-6 p.)ISSN: 1520-8559.
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• 2017

  PROCHÁZKA, P.; MAREČEK, D.; LIŠKOVÁ, Z.; ČECHAL, J.; ŠIKOLA, T. X- ray induced electrostatic graphene doping via defect charging in gate dielectric. Scientific Reports, 2017, vol. 7, no. 1, p. 1-7. ISSN: 2045-2322.
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  ČECHAL, J.; ŠIKOLA, T. Flexible foils formed by a prolonged electron beam irradiation in scanning electron microscope. Applied Surface Science, 2017, vol. 423, no. 1, p. 538-541. ISSN: 0169-4332.
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  ŠVÁBENSKÁ, E.; ROUPCOVÁ, P.; KRÁL, L.; BULÍN, T.; VONDRÁČEK, M.; FOLDYNA, J.; ČECHAL, J.; SCHNEEWEISS, O. NANOSCALE PHASES ON SURFACE FE-6SI MAGNETIC SHEETS. In NANOCON 2016. 1st Edition. Ostrava: Tanger Ltd., 2017. p. 172-177. ISBN: 978-80-87294-71-0.
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  MANAKHOV, A.; ČECHAL, J.; MICHLÍČEK, M.; SHTANSKY, D. Determination of NH2 concentration on 3-aminopropyl tri-ethoxy silane layers and cyclopropylamine plasma polymers by liquid-phase derivatization with 5-iodo 2-furaldehyde. Applied Surface Science, 2017, vol. 414, no. 1, p. 390-397. ISSN: 0169-4332.
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  VALLEJOS VARGAS, S.; PIZÚROVÁ, N.; ČECHAL, J.; GRÁCIA, I.; CANÉ, C. Aerosol-assisted Chemical Vapor Deposition of Metal Oxide Structures: Zinc Oxide Rods. Journal of visualized experiments : JoVE, 2017, vol. 127, no. 1, p. 1-5. ISSN: 1940-087X.
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• 2016

  ROZBOŘIL, J.; RECHKEMMER, Y.; BLOOS, D.; MÜNZ, F.; WANG, C.; NEUGEBAUER, P.; ČECHAL, J.; NOVÁK, J.; VAN SLAGEREN, J. Magneto-optical investigations of molecular nanomagnet monolayers. DALTON TRANSACTIONS, 2016, vol. 45, no. 18, p. 7555-7558. ISSN: 1477-9226.
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  VALLEJOS VARGAS, S.; PIZÚROVÁ, N.; GRÁCIA, I.; SOTELO-VAZQUEZ, C.; ČECHAL, J.; BLACKMAN, C.; PARKIN, I.; CANÉ, C. ZnO rods with exposed (100) facets grown via a self-catalyst vapor-solid mechanism and their photocatalytic and gas sensing properties. ACS APPL MATER INTER, 2016, vol. 8, no. 48, p. 33335-33342. ISSN: 1944-8244.
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  MANAKHOV, A.; MAKHNEVA, E.; SKLÁDAL, P.; NEČAS, D.; ČECHAL, J.; KALINA, L.; ELIÁŠ, M.; ZAJÍČKOVÁ, L. The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry. Applied Surface Science, 2016, vol. 360, no. Part A, p. 28-36. ISSN: 0169-4332.
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  ŠIMŠÍKOVÁ, M.; BARTOŠ, M.; ČECHAL, J.; ŠIKOLA, T. Decolorization of organic dyes by gold nanoflowers prepared on reduced graphene oxide by tea polyphenols. Catalysis Science and Technology, 2016, vol. 6, no. 9, p. 3008-3017. ISSN: 2044-4753.
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  ČECHAL, J.; KLEY, C.; PÉTUYA, R.; SCHRAMM, F.; RUBEN, M.; STEPANOW, S.; ARNAU, A.; KERN, K. CO2 Binding and Induced Structural Collapse of a Surface-Supported Metal-Organic Network. Journal of Physical Chemistry C (print), 2016, vol. 120, no. 33, p. 18622-18630. ISSN: 1932-7447.
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• 2015

  MANAKHOV, A.; NEČAS, D.; ČECHAL, J.; PAVLIŇÁK, D.; ELIÁŠ, M.; ZAJÍČKOVÁ, L. Deposition of stable amine coating onto polycaprolactone nanofibers by low pressure cyclopropylamine plasma polymerization. Thin Solid Films, 2015, vol. 581, no. 1, p. 7-13. ISSN: 0040-6090.
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  BÁBOR, P.; DUDA, R.; POLČÁK, J.; PRŮŠA, S.; POTOČEK, M.; VARGA, P.; ČECHAL, J.; ŠIKOLA, T. Real-time observation of self-limiting SiO2/Si decomposition catalysed by gold silicide droplets. RSC Advances, 2015, vol. 5, no. 123, p. 101726-101731. ISSN: 2046-2069.
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• 2014

  KLEY, C.; DETTE, C.; RINKE, G.; PATRICK, C.; ČECHAL, J.; JUNG, S.; BAUR, M.; DÜRR, M.; RAUSCHENBACH, S.; GIUSTINO, F.; STEPANOW, S.; KERN, K. Atomic-Scale Observation of Multiconformational Binding and Energy Level Alignment of Ruthenium-Based Photosensitizers on TiO2 Anatase. NANO LETTERS, 2014, vol. 14, no. 2, p. 563-569. ISSN: 1530-6984.
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  PROCHÁZKA, P.; MACH, J.; BISCHOFF, D.; LIŠKOVÁ, Z.; DVOŘÁK, P.; VAŇATKA, M.; SIMONET, P.; VARLET, A.; HEMZAL, D.; PETRENEC, M.; KALINA, L.; BARTOŠÍK, M.; ENSSLIN, K.; VARGA, P.; ČECHAL, J.; ŠIKOLA, T. Ultrasmooth metallic foils for growth of high quality graphene by chemical vapor deposition. NANOTECHNOLOGY, 2014, vol. 25, no. 18, p. 185601-1 (185601-8 p.)ISSN: 0957-4484.
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  ČECHAL, J.; KLEY, C.; KUMAGAI, T.; SCHRAMM, F.; RUBEN, M.; STEPANOW, S.; KERN, K. Convergent and divergent two-dimensional coordination networks formed through substrate-activated or quenched alkynyl ligation. Chemical Communications, 2014, vol. 50, no. 69, p. 9973-9976. ISSN: 1359-7345.
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  ŠIMŠÍKOVÁ, M.; ČECHAL, J.; ZORKOVSKÁ, A.; ANTALÍK, M.; ŠIKOLA, T. Preparation of CuO/ZnO nanocomposite and its application as a cysteine / homocysteine colorimetric and fluorescence detector. Colloids and Surfaces B: Biointerfaces, 2014, vol. 123, no. 1, p. 951-958. ISSN: 0927-7765.
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  MANAKHOV, A.; SKLÁDAL, P.; NEČAS, D.; ČECHAL, J.; POLČÁK, J.; ELIÁŠ, M.; ZAJÍČKOVÁ, L. Cyclopropylamine plasma polymers deposited onto quartz crystal microbalance for biosensing application. physica status solidi (a), 2014, vol. 211, no. 12, p. 2801-2808. ISSN: 1862-6300.
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  MANAKHOV, A.; ZAJÍČKOVÁ, L.; ELIÁŠ, M.; ČECHAL, J.; POLČÁK, J.; HNILICA, J.; BITTNEROVÁ, Š.; NEČAS, D. Optimization of Cyclopropylamine Plasma Polymerization Towards Enhanced Layer Stability in Contact with Water. Plasma Processes and Polymers, 2014, vol. 11, no. 6, p. 532-544. ISSN: 1612-8850.
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  ČECHAL, J.; POLČÁK, J.; ŠIKOLA, T. Detachment Limited Kinetics of Gold Diffusion through Ultrathin Oxide Layers. Journal of Physical Chemistry C (print), 2014, vol. 118, no. 31, p. 17549-17555. ISSN: 1932-7447.
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• 2013

  ČECHAL, J.; KLEY, C.; KUMAGAI, T.; SCHRAMM, F.; RUBEN, M.; STEPANOW, S.; KERN, K. Functionalization of Open Two-Dimensional Metal– Organic Templates through the Selective Incorporation of Metal Atoms. Journal of Physical Chemistry C (print), 2013, vol. 117, no. 17, p. 8871-8877. ISSN: 1932- 7447.
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• 2012

  KLEY, C.; ČECHAL, J.; KUMAGAI, T.; SCHRAMM, F.; RUBEN, M.; STEPANOW, S.; KERN, K. Highly Adaptable Two-Dimensional Metal- Organic Coordination Networks on Metal Surfaces. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2012, vol. 134, no. 14, p. 6072-6075. ISSN: 0002- 7863.
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• 2011

  BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; ČECHAL, J.; URBÁNEK, M.; ŠIKOLA, T. Depth resolution enhancement by combined DSIMS and TOF- LEIS profiling. Nuclear Instruments and Methods in Physics Research B, 2011, vol. 269, no. 3, p. 369-373. ISSN: 0168- 583X.
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• 2010

  ČECHAL, J.; POLČÁK, J.; KOLÍBAL, M.; BÁBOR, P.; ŠIKOLA, T. Formation of copper islands on a native SiO2 surface at elevated temperatures. Applied Surface Science, 2010, vol. 256, no. 11, p. 3636-3641. ISSN: 0169- 4332.
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  POLČÁK, J.; ČECHAL, J.; BÁBOR, P.; URBÁNEK, M.; PRŮŠA, S.; ŠIKOLA, T. Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method. Surface and Interface Analysis, 2010, vol. 42, no. 5- 6, p. 649-652. ISSN: 0142- 2421.
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  KOLÍBAL, M.; ČECHAL, J.; BARTOŠÍK, M.; MACH, J.; ŠIKOLA, T. Stability of hydrogen- terminated silicon surface under ambient atmosphere. Applied Surface Science, 2010, vol. 256, no. 11, p. 3423-2426. ISSN: 0169- 4332.
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• 2009

  POLČÁK, J.; BÁBOR, P.; ČECHAL, J.; ŠIKOLA, T. Manipulátor vzorku pro rentgenovou fotoelekronovou spektroskopii do velmi vysokého vakua. Jemná mechanika a optika, 2009, vol. 54, no. 7- 8, p. 215-216. ISSN: 0447- 6441.
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  ČECHAL, J.; TOMANEC, O.; ŠKODA, D.; KOŇÁKOVÁ, K.; HRNČÍŘ, T.; MACH, J.; KOLÍBAL, M.; ŠIKOLA, T. Selective growth of Co islands on ion beam induced nucleation centers in a native SiO2 film. Journal of Aplied Physics, 2009, vol. 105, no. 8, p. 084314-1 (084314-6 p.)ISSN: 0021-8979.
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  ČECHAL, J.; MATLOCHA, T.; POLČÁK, J.; KOLÍBAL, M.; TOMANEC, O.; KALOUSEK, R.; DUB, P.; ŠIKOLA, T. Characterization of oxidized gallium droplets on silicon surface: an ellipsoidal droplet shape model for angle resolved X- ray photoelectron spectroscopy analysis. Thin Solid Films, 2009, vol. 517, no. 6, p. 1928-1934. ISSN: 0040- 6090.
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  BARTOŠÍK, M.; KOLÍBAL, M.; ČECHAL, J.; MACH, J.; ŠIKOLA, T. Selective growth of metallic nanostructures on surfaces patterned by AFM local anodic oxidation. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2009, vol. 9, no. 10, p. 5887-5890. ISSN: 1533- 4880.
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  ČECHAL, J.; POLČÁK, J.; TOMANEC, O.; ŠIKOLA, T. Řízený růst kobaltových ostrůvků na křemíkovém substrátu. Jemná mechanika a optika, 2009, vol. 54, no. 7- 8, p. 222-224. ISSN: 0447- 6441.
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• 2008

  MACH, J.; ČECHAL, J.; KOLÍBAL, M.; POTOČEK, M.; ŠIKOLA, T. Atomic hydrogen induced gallium nanocluster formation on the Si(100) surface. Surface Science, 2008, vol. 602, no. 10, p. 1898-1902. ISSN: 0039- 6028.
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  DOMBEKOVÁ, J.; VOJTOVÁ, L.; PŘIKRYL, R.; ČECHAL, J.; JANČÁŘ, J. Collagen-grafted ultra- high molecular weight polyethylene for biomedical applications. Chemical Papers, 2008, vol. 62, no. 6, p. 580-588. ISSN: 0366- 6352.
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  DOMBEKOVÁ, J.; JANČÁŘ, J.; VOJTOVÁ, L.; PŘIKRYL, R.; ČECHAL, J. Plasma Treated UHMWPE Modified by Collagen I: Step-by- step Characterization. 8th World Biomaterials Congress 28 May - 1 June 2008 Amsterdam RAI The Netherlands Abstracts2View Abstracts on CD-ROM PC & Mac CD-ROM. 1. Amsterdam: Abstracts2View - Marathon Multimedia, 2008. p. 2553-2553.
  Detail

  ČECHAL, J.; LUKSCH, J.; KOŇÁKOVÁ, K.; URBÁNEK, M.; KOLÍBALOVÁ, E.; ŠIKOLA, T. Morphology of cobalt layers on native SiO2 surfaces at elevated temperatures: formation of Co islands. Surface Science, 2008, vol. 602, no. 15, p. 2693-2698. ISSN: 0039- 6028.
  Detail

  KOLÍBAL, M.; ČECHAL, T.; KOLÍBALOVÁ, E.; ČECHAL, J.; ŠIKOLA, T. Self-limiting cyclic growth of gallium droplets on Si(111). NANOTECHNOLOGY, 2008, vol. 19, no. 46, p. 475606- 1 (475606-5 p.)ISSN: 0957-4484.
  Detail

• 2007

  DOMBEKOVÁ, J.; VOJTOVÁ, L.; PŘIKRYL, R.; ČECHAL, J.; JANČÁŘ, J. Modification of UHMWPE for biomedical applications. 1st Bratislava Young Polymer Scientist workshop, BYPOS Workshop book. 1. Bratislava, SR: Slovenská akademie věd, 2007. p. 19-19. ISBN: 978-80-968433-4- 3.
  Detail

  ČECHAL, J.; KOLÍBAL, M.; KOSTELNÍK, P.; ŠIKOLA, T. Gallium structure on the Si(111)-(7 x 7) surface: influence of Ga coverage and temperature. Journal of Physics: Condensed Matter, 2007, vol. 19, no. 1, p. 016011 ( p.)ISSN: 0953- 8984.
  Detail

  ČECHAL, J.; MACH, J.; VOBORNÝ, S.; KOSTELNÍK, P.; BÁBOR, P.; SPOUSTA, J.; ŠIKOLA, T. A study of Ga layers on Si(100)-(2x1) by SR-PES: influence of adsorbed water. Surface Science, 2007, vol. 601, no. 9, p. 2047-2053. ISSN: 0039- 6028.
  Detail

• 2006

  ČECHAL, J.; ŠIKOLA, T. A study of the formation and oxidation of PtSi by SR- PES. Surface Science, 2006, vol. 600, no. 20, p. 4717-4722. ISSN: 0039- 6028.
  Detail

• 2005

  VOBORNÝ, S.; MACH, J.; POTOČEK, M.; KOSTELNÍK, P.; ČECHAL, J.; BÁBOR, P.; SPOUSTA, J.; ŠIKOLA, T. Analysis of GaN Ultrathin Films grown by Direct Ion Beam Deposition. 1. Vienna: 2005. p. 117-117.
  Detail

  BONAVENTUROVÁ - ZRZAVECKÁ, O.; BRANDEJSOVÁ, E.; ČECHAL, J.; POTOČEK, M.; NEBOJSA, A.; NAVRÁTIL, K.; ŠIKOLA, T.; HUMLÍČEK, J. UV in-situ degradation of PMPSi analysed by spectroscopic ellipsometry, XPS and TDS. 1. Vienna: 2005. p. 294-294.
  Detail

  ČECHAL, J.; BÁBOR, P.; SPOUSTA, J.; ŠIKOLA, T. A Study of Gallium Growth on Si(111) 7x7 by SRPES. 1. Vienna: 2005. p. 259-259.
  Detail

  KOLÍBAL, M.; PRŮŠA, S.; TOMANEC, O.; POTOČEK, M.; ČECHAL, J.; KOSTELNÍK, P.; PLOJHAR, M.; BÁBOR, P.; SPOUSTA, J.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. Application of ToF LEIS for Monitoring the growth and thermal treatment of Ga ultrathin films. 1. Vienna: 2005. p. 191-191.
  Detail

• 2004

  ČECHAL, J.; ŠIKOLA, T. A study of oxygen influence on PtSi formation by SR- PES. In New Trends in Phisics. Brno: VUT v Brně, 2004. p. 218 ( p.)ISBN: 80-7355-024- 5.
  Detail

  VOBORNÝ, S., MACH, J., KOLÍBAL, M., ČECHAL, J., BÁBOR, P., POTOČEK, M., ŠIKOLA, T. A study of Early Periods of GaN Ultrathin Film Growth. In New Trends in Pysics. Brno: VUT v Brně, 2004. p. 270 ( p.)ISBN: 80-7355-024- 5.
  Detail

  VOBORNÝ, S.; MACH, J.; ČECHAL, J.; KOSTELNÍK, P.; TOMANEC, O.; BÁBOR, P.; SPOUSTA, J.; ŠIKOLA, T. Application of Complex UHV Apparaturus in a Study of Low-tepmerature Gallium- nitride Ultrathin Film Growth. Jemná mechanika a optika, 2004, vol. 9, no. 9, p. 265 ( p.)ISSN: 0447- 6441.
  Detail

  ČECHAL, J.; TICHOPÁDEK, P.; NEBOJSA, A.; BONAVENTUROVÁ, O.; URBÁNEK, M.; SPOUSTA, J.; NAVRÁTIL, K.; ŠIKOLA, T. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis, 2004, vol. 38, no. 8, p. 1218 ( p.)ISSN: 0142- 2421.
  Detail

  BRANDEJSOVÁ, E.; ČECHAL, J.; BONAVENTUROVÁ, O.; NEBOJSA, A.; TICHOPÁDEK, P.; URBÁNEK, M.; NAVRÁTIL, K.; ŠIKOLA, T.; HUMLÍČEK, J. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika, 2004, vol. 9, no. 9, p. 260 ( p.)ISSN: 0447- 6441.
  Detail

  VOBORNÝ, S.; KOLÍBAL, M.; MACH, J.; ČECHAL, J.; BÁBOR, P.; PRŮŠA, S.; SPOUSTA, J.; ŠIKOLA, T. Deposition and in-situ charakterization of ultra- thin films. Thin Solid Films, 2004, vol. 459, no. 1- 2, p. 17 ( p.)ISSN: 0040- 6090.
  Detail

• 2003

  VOBORNÝ, S., KOLÍBAL, M., MACH, J., ČECHAL, J., BÁBOR, P., PRŮŠA, S., SPOUSTA, J., ŠIKOLA, T. Deposition and in situ characterization of ultra- thin films. In EVC' 03 Abstracts. Berlin: EVC, 2003. p. 45 ( p.)
  Detail

  VAIS, J., ŽENÍŠEK, J., JURKOVIČ, P., ČECHAL, J., DITTRICHOVÁ, L., SPOUSTA, J., BOCHNÍČEK, Z., ŠIKOLA, T. Interface and depth profile analysis of magnetic ultrathin films. In ECASIA 10 Book of Abstracts. Berlin: ECASIA, 2003. p. 226 ( p.)
  Detail

  ČECHAL, J., TICHOPÁDEK, P., NEBOJSA, A., BONAVENTUROVÁ - ZRZAVECKÁ, O., URBÁNEK, M., NAVRÁTIL, K., ŠIKOLA, T. In- situ analysis of PMPSI by spectroscopic ellipsometry and XPS. In ECASIA 10 Book of Abstracts. Berlin: ECASIA, 2003. p. 226 ( p.)
  Detail

• 2002

  TICHOPÁDEK, P., ŠIKOLA, T., NEBOJSA, A., NAVRÁTIL, K., ČECHAL, J., JURKOVIČ, P., BÁBOR, P. A Study of Thin Oxide Films by Ellipsometry and AR XPS. Surface and Interface Analysis, 2002, vol. 34, no. 1, p. 531 ( p.)ISSN: 0142- 2421.
  Detail

• 2001

  TICHOPÁDEK, P., ŠIKOLA, T., NEBOJSA, A., NAVRÁTIL, K., JURKOVIČ, P., ČECHAL, J. A Study of Thin Oxide Films by Ellipsometry and AR XPS. In 9th European Conference on Applications of Surface and Interface Analysis (ECASIA'01) Book of Abstracts. Avignon, France: P. Marcus, A. Galtayries, N. Frémy, 2001. p. 360 ( p.)
  Detail

  TICHOPÁDEK, P., NEBOJSA, A., ČECHAL, J. Ellipsometry - a tool for surface and thin film analysis. In Juniormat ' 01 sborník. Brno: Fakulta strojního inženýrství VUT v Brně, 2001. p. 102 ( p.)
  Detail

  TICHOPÁDEK, P., NEBOJSA, A., ČECHAL, J. Konstrukce elipsometru pro měření tenkých vrstev a povrchů. Jemná mechanika a optika, 2001, vol. 46, no. 4, p. 136 ( p.)ISSN: 0447- 6441.
  Detail

  JURKOVIČ, P., ŠIKOLA, T., BÁBOR, P., ČECHAL, J. Studium ultratenkých vrstevnatých struktur. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: FEI VUT v Brně, 2001. p. 364 ( p.)ISBN: 80-214-1992- X.
  Detail

  TICHOPÁDEK, P.; ŠIKOLA, T.; NEBOJSA, A.; ČECHAL, J. Application of Spectroscopic Ellipsometry in Ultrathin Film Analysis. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: FEI VUT v Brně, 2001. p. 415 ( p.)ISBN: 80-214-1992- X.
  Detail

  PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J. Application of TOF - LEIS and XPS for Surface Studies. In Materials Structure & Micromechanics of Fracture (MSMF-3). Brno: Vutium, 2001. p. 486 ( p.)ISBN: 80-214-1892- 3.
  Detail

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