Publications

• 2024

  PRŮŠA, S.; LINFORD, M.; VANÍČKOVÁ, E.; BÁBÍK, P.; PINDER, J. W:; ŠIKOLA, T.; BRONGERSMA, H. A practical guide to interpreting low energy ion scattering (LEIS) spectra. Applied Surface Science, 2024, vol. 657, no. 1, ISSN: 0169-4332.
  Detail | WWW

  VANÍČKOVÁ, E.; PRŮŠA, S.; ŠIKOLA, T. Signal oscillations in helium scattering by bismuth atoms in the low energy range. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIO, 2024, vol. 553, no. August, ISSN: 1872-9584.
  Detail | WWW

• 2023

  MOTYČKOVÁ, L.; ARREGI URIBEETXEBARRIA, J.; STAŇO, M.; PRŮŠA, S.; ČÁSTKOVÁ, K.; UHLÍŘ, V. Preserving Metamagnetism in Self-Assembled FeRh Nanomagnets. ACS applied materials & interfaces, 2023, vol. 15, no. 6, p. 8653-8665. ISSN: 1944-8252.
  Detail | WWW | Full text in the Digital Library

  AVVAL, T.; PRŮŠA, S.; ČECHAL, J.; CUSHMAN, C. V.; HODGES, G. T.; FEARN, S.; KIM, S. H.;ČECHAL, J.; VANÍČKOVÁ, E.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H. H.; LINFORD, M. R. A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering. Applied Surface Science, 2023, vol. 607, no. 154551, p. 154551 ( p.)ISSN: 0169-4332.
  Detail | WWW

  VANÍČKOVÁ, E.; PRŮŠA, S.; ŠIKOLA, T. Bismuth, by high-sensitivity low energy ion scattering. Surface Science Spectra, 2023, vol. 30, no. 2, p. 1-15. ISSN: 1520-8575.
  Detail | WWW | Full text in the Digital Library

  Moeini, B.; Pinder, JW.; Avval, TG.; Jacobsen, C.; Brongersma, HH.; Prusa, S.; Bábik, P.; Vanicková, E.; Argyle, MD.; Strohmeier, BR.; Jones, B.; Shollenberger, D.; Bell, DS.; Linford, MR. Controlling the surface silanol density in capillary columns and planar silicon via the self-limiting, gas-phase deposition of tris(dimethylamino) methylsilane, and quantification of surface silanols after silanization by low energy ion scattering. JOURNAL OF CHROMATOGRAPHY A, 2023, vol. 1707, no. 464248, ISSN: 1873-3778.
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  Major, GH.; Pinder, JW.; Austin, DE.; Baer, DR.; Castle, SL.; Cechal, J. ; Clark, BM.; Cohen, H.; Counsell, J.; Herrera-Gomez, A.; Govindan, P.; Kim, SH.; Morgan, DJ.; Opila, RL.; Powell, CJ.; Prusa, S.; Roberts, A.; Rocca, M.; Shirahata, N.; Sikola, T.; Smith, EF.; So, RC.; Stovall, JE.; Strunk, J.; Teplyakov, A.; Terry, J.; Weber, S.G.; Linford, M.R.;. Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2023, vol. 41, no. 3, ISSN: 1520-8559.
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  Moeini, B.; Avval, TG.; Brongersma, HH.; Prusa, S.; Babik, P.; Vanickova, E.; Strohmeier, BR.; Bell, DS.; Eggett, D.; George, SM.; Linford, MR. Area-Selective Atomic Layer Deposition of ZnO on Si\SiO₂ Modified with Tris(dimethylamino)methylsilane. Materials, 2023, vol. 16, no. 13, ISSN: 1996-1944.
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• 2021

  AVVAL, T. G.; PRŮŠA, S.; CHAPMAN, S. C.; LINFORD, M. R.; ŠIKOLA, T.; BRONGERSMA, H. H. Zinc and copper, by high sensitivity-low energy ion scattering. Surface Science Spectra, 2021, vol. 28, no. 1, p. 1-8. ISSN: 1055-5269.
  Detail | WWW

• 2020

  PRŮŠA, S.; BÁBÍK, P.; MACH, J.; STRAPKO, T.; ŠIKOLA, T.; BRONGERSMA, H. Calcium and fluorine signals in HS-LEIS for CaF2(111) and powder-Quantification of atomic surface concentrations using LiF(001), Ca, and Cu references. Surface Science Spectra, 2020, vol. 27, no. 2, p. 1-13. ISSN: 1055-5269.
  Detail | WWW | Full text in the Digital Library

  PRŮŠA, S.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H. Quantitative analysis of calcium and fluorine by high-sensitivity low-energy ion scattering: Calcium fluoride. Surface and Interface Analysis, 2020, vol. 52, no. 1, p. 1000-1003. ISSN: 0142-2421.
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  FIKÁČEK, J.; PROCHÁZKA, P.; STETSOVYCH, V.; PRŮŠA, S.; VONDRÁČEK, M.; KORMOŠ, L.; SKÁLA, T.; VLAIC, P.; CAHA, O.; CARVA, K.; ČECHAL, J.; SPRINGHOLZ, G.; HONOLKA, J. Step-edge assisted large scale FeSe monolayer growth on epitaxial Bi(2)Se(3)thin films. NEW JOURNAL OF PHYSICS, 2020, vol. 22, no. 7, p. 1-12. ISSN: 1367-2630.
  Detail | WWW | Full text in the Digital Library

  UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F. Single-layer graphene on epitaxial FeRh thin films. Applied Surface Science, 2020, vol. 514, no. 1, p. 145923-1 (145923-7 p.)ISSN: 0169-4332.
  Detail | WWW | Full text in the Digital Library

• 2019

  REDONDO, J.; LAZAR, P.; PROCHÁZKA, P.; PRŮŠA, S.; MALLADA, B.; CAHLÍK, A.; LACHNITT, J.; BERGER, J.; ŠMÍD, B.; KORMOŠ, L.; JELÍNEK, A.; ČECHAL, J.; ŠVEC, M. Identification of Two-Dimensional FeO2 Termination of Bulk Hematite α‑Fe2O3(0001) Surface. Journal of Physical Chemistry C (print), 2019, vol. 123, no. 23, p. 14312-14318. ISSN: 1932-7447.
  Detail | WWW

  PRAJZLER, V.; PRŮŠA, S.; MACA, K. Rapid pressure-less sintering of fine grained zirconia ceramics: Explanation and elimination of a core-shell structure. Journal of the European Ceramic Society, 2019, vol. 39, no. 16, p. 5309-5319. ISSN: 0955-2219.
  Detail | WWW

• 2015

  PRŮŠA, S.; PROCHÁZKA, P.; BÁBOR, P.; ŠIKOLA, T.; TER VEEN, R.; FARTMANN, M.; GREHL, T.; BRÜNER, P.; ROTH, D.; BAUER, P.; BRONGERSMA, H. Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS. Langmuir, 2015, vol. 31, no. 35, p. 9628-9635. ISSN: 0743-7463.
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  BÁBOR, P.; DUDA, R.; POLČÁK, J.; PRŮŠA, S.; POTOČEK, M.; VARGA, P.; ČECHAL, J.; ŠIKOLA, T. Real-time observation of self-limiting SiO2/Si decomposition catalysed by gold silicide droplets. RSC Advances, 2015, vol. 5, no. 123, p. 101726-101731. ISSN: 2046-2069.
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• 2012

  TOPINKA, S.; PRŮŠA, S. Posílení experimentální činnosti žáků při výuce tématického celku - magnetismus. Československý časopis pro fyziku, 2012, vol. 62, no. 5- 6, p. 413-415. ISSN: 0009- 0700.
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  SPOUSTA, J.; PRŮŠA, S.; TROJÁNEK, A.; DUB, P. Kvalitní učebnice fyziky - důležitá opora výuky. Československý časopis pro fyziku, 2012, vol. 62, no. 5- 6, p. 421-425. ISSN: 0009- 0700.
  Detail

• 2011

  JULIŠ, M.; KUSMIČ, D.; POSPÍŠILOVÁ, S.; PRŮŠA, S.; OBRTLÍK, K.; DLUHOŠ, J.; PODRÁBSKÝ, T. Study of Surface Relief Evolution in Cyclically Strained Superalloy IN738LC Using advanced Experimental Techniques. Chemické listy, 2011, vol. 105, no. S, p. 814-815. ISSN: 0009- 2770.
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  BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; ČECHAL, J.; URBÁNEK, M.; ŠIKOLA, T. Depth resolution enhancement by combined DSIMS and TOF- LEIS profiling. Nuclear Instruments and Methods in Physics Research B, 2011, vol. 269, no. 3, p. 369-373. ISSN: 0168- 583X.
  Detail

  JULIŠ, M.; KUSMIČ, D.; ŠMÍD, M.; PRŮŠA, S.; POSPÍŠILOVÁ, S.; OBRTLÍK, K.; PODRÁBSKÝ, T. Surface relief observation in fatigued cast superalloy Inconel 738LC using CSLM, SEM- FEG and AFM. In International Conference on Military Technology ICMT' 11. 1. Brno: University of Defence (Univerzita obrany), 2011. p. 1493-1499. ISBN: 978-80-7231-787- 5.
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• 2010

  MATLOCHA, T.; PRŮŠA, S.; KOLÍBAL, M.; BÁBOR, P.; PRIMETZHOFER, D.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. A study of a LEIS azimuthal scan behavior: Classical dynamics simulation. Surface Science, 2010, vol. 604, no. 21- 22, p. 1906-1911. ISSN: 0039- 6028.
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  POLČÁK, J.; ČECHAL, J.; BÁBOR, P.; URBÁNEK, M.; PRŮŠA, S.; ŠIKOLA, T. Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method. Surface and Interface Analysis, 2010, vol. 42, no. 5- 6, p. 649-652. ISSN: 0142- 2421.
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• 2009

  BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; KALOUSEK, R.; NEUMAN, J.; URBÁNEK, M.; ŠIKOLA, T. Mechanika iontů jako prostředek k analýze nanosvěta. Jemná mechanika a optika, 2009, vol. 54, no. 7- 8, p. 209-214. ISSN: 0447- 6441.
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• 2008

  MARKIN, S.; PRIMETZHOFER, D.; PRŮŠA, S.; BRUNMAYR, M.; KOWARIK, G.; AUMAYR, F.; BAUER, P. Electronic interaction of very slow light ions in Au: Electronic stopping and electron emission. PHYSICAL REVIEW B, 2008, vol. 78, no. 19, p. 195122- 1 (195122-6 p.)ISSN: 1098-0121.
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  HOLÁ, M.; -KONEČNÁ, V.; -MIKUŠKA, P.; -KAISER, J.; -PÁLENÍKOVÁ, K.; -PRŮŠA, S.; -HANZLÍKOVÁ, R.; -KANICKÝ, V. Study of aerosols generated by 213 nm laser ablation of cobalt- cemented hard metals. Journal of Analalytical Atomic Spectrometry, 2008, vol. 23, no. 10, p. 1341-1349. ISSN: 0267- 9477.
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  PRIMETZHOFER, D.; MARKIN, S.; ZEPPENFELD, P.; BAUER, P.; PRŮŠA, S.; KOLÍBAL, M.; ŠIKOLA, T. Quantitative analysis of ultra thin layer growth by time-of- flight low energy ion scattering. Applied Physics Letters, 2008, vol. 92, no. 1, p. 011929- 1 (011929-3 p.)ISSN: 0003-6951.
  Detail

• 2007

  PRŮŠA, S.; KOLÍBAL, M.; BÁBOR, P.; MACH, J.; ŠIKOLA, T. Analysis of thin films by TOF- LEIS. ACTA PHYSICA POLONICA A, 2007, vol. 111, no. 3, p. 335-341. ISSN: 0587- 4246.
  Detail

  KOLÍBAL, M.; TOMANEC, O.; PRŮŠA, S.; PLOJHAR, M.; MARKIN, S.; DITTRICHOVÁ, L.; SPOUSTA, J.; BAUER, P.; ŠIKOLA, T. TOF-LEIS spectra of Ga/Si: Peak shape analysis. Nuclear Instruments and Methods in Physics Research B, 2007, vol. 265, no. 2, p. 569-575. ISSN: 0168- 583X.
  Detail

• 2006

  KOLÍBAL, M.; PRŮŠA, S.; PLOJHAR, M.; BÁBOR, P.; POTOČEK, M.; TOMANEC, O.; KOSTELNÍK, P.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. In situ Analysis of Ga-ultra Thin Films by ToF- LEIS. Nuclear Instruments and Methods in Physics Research B, 2006, vol. 249, no. 1- 2, p. 318-321. ISSN: 0168- 583X.
  Detail

• 2005

  DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P. High resolution time-of- flight low energy ion scattering. Nuclear Instruments and Methods in Physics Research B, 2005, vol. 230, no. 0, p. 398-401. ISSN: 0168- 583X.
  Detail

  KOLÍBAL, M.; PRŮŠA, S.; PLOJHAR, M.; BÁBOR, P.; POTOČEK, M.; TOMANEC, O.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. In situ Analysis of Ga-ultra Thin Films by TOF- LEIS. 1. Seville: 2005.
  Detail

  KOLÍBAL, M.; PRŮŠA, S.; TOMANEC, O.; POTOČEK, M.; ČECHAL, J.; KOSTELNÍK, P.; PLOJHAR, M.; BÁBOR, P.; SPOUSTA, J.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. Application of ToF LEIS for Monitoring the growth and thermal treatment of Ga ultrathin films. 1. Vienna: 2005. p. 191-191.
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• 2004

  KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T. Low energy ion scattering as a method for surface structure analysis. Jemná mechanika a optika, 2004, vol. 9, no. 9, p. 262 ( p.)ISSN: 0447- 6441.
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  VOBORNÝ, S.; KOLÍBAL, M.; MACH, J.; ČECHAL, J.; BÁBOR, P.; PRŮŠA, S.; SPOUSTA, J.; ŠIKOLA, T. Deposition and in-situ charakterization of ultra- thin films. Thin Solid Films, 2004, vol. 459, no. 1- 2, p. 17 ( p.)ISSN: 0040- 6090.
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  KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BARTOŠÍK, M., TOMANEC, O., ŠIKOLA, T. Growth of gallium on sillicon: A TOF- LEIS and AFM study. In New Trend in Physics. Brno: VUT v Brně, 2004. p. 230 ( p.)ISBN: 80-7355-024- 5.
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  KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T. ToF-LEIS Analysis of ultra thin films: Ga and Ga-N layer growth on Si(111). Surface Science, 2004, vol. 566- 568, no. 9, p. 885 ( p.)ISSN: 0039- 6028.
  Detail

• 2003

  VOBORNÝ, S., KOLÍBAL, M., MACH, J., ČECHAL, J., BÁBOR, P., PRŮŠA, S., SPOUSTA, J., ŠIKOLA, T. Deposition and in situ characterization of ultra- thin films. In EVC' 03 Abstracts. Berlin: EVC, 2003. p. 45 ( p.)
  Detail

  KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BAUER, P., ŠIKOLA, T. TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111). In ECOSS 22 CD. Praha: FÚ AV ČR, 2003. p. 0 ( p.)
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  BÁBOR, P., KOLÍBAL, M., PRŮŠA, S., ŠIKOLA, T. Application of a simple imaging system in SIMS and TOF LEIS. In ECOSS 22 CD. Praha: FÚ AV ČR, 2003. p. 0 ( p.)
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  PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T. Analysis of thin films by TOF LEIS. In EVC' 03 Abstracts. Berlin: EVC, 2003. p. 133 ( p.)
  Detail

• 2001

  PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J. Application of TOF - LEIS and XPS for Surface Studies. In Materials Structure & Micromechanics of Fracture (MSMF-3). Brno: Vutium, 2001. p. 486 ( p.)ISBN: 80-214-1892- 3.
  Detail

  PRŮŠA, S., ŠIKOLA, T., BÁBOR, P. Application of ToF - LEIS for Analysis of Surfaces and Ultra Thin Films. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: FEI VUT v Brně, 2001. p. 404 ( p.)ISBN: 80-214-1992- X.
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  PRŮŠA, S., ŠIKOLA, T., VOBORNÝ, S., BÁBOR, P. Ion Scattering Spectrosopy - A Tool for Surface Analysis. In Juniormat ' 01 sborník. Brno: Fakulta strojního inženýrství VUT v Brně, 2001. p. 86 ( p.)
  Detail

  VOBORNÝ, S., ŠIKOLA, T., PRŮŠA, S., ZLÁMAL, J., BÁBOR, P. Diagnostics and optimization of ion source parameters. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: FEI VUT v Brně, 2001. p. 304 ( p.)ISBN: 80-214-1992- X.
  Detail

• 2000

  PRŮŠA, S. Monitorování povrchů pevných vzorků a ultratenkých vrstev pomocí ToF spektroskopie. In II. sborník příspěvků doktorandů, konference u příležitosti 100. výročí založení FSI. Brno: Vutium, 2000. p. 263 ( p.)
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