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Detail projektu
Období řešení: 01.09.2018 — 28.02.2022
Zdroje financování
Evropská unie - Horizon 2020
- plně financující (2018-09-01 - 2022-02-28)
O projektu
Strengthening Nanoscience and Nanotechnology Research at CEITEC
Klíčová slovaKey enabling technologies, upgrading scientific excellence, Nanotechnology, Nanophotonics, Nanoelectronics, Plasmonics, Nanodevices
Označení
810626
Originální jazyk
angličtina
Řešitelé
Šikola Tomáš, prof. RNDr., CSc. - hlavní řešitel
Útvary
Příprava a charakterizace nanostruktur- příjemce (19.04.2018 - nezadáno)
Výsledky
BITTON, O.; GUPTA, S.; HOUBEN, L.; KVAPIL, M.; KŘÁPEK, V.; ŠIKOLA, T.; HARAN, G. Vacuum Rabi splitting of a dark plasmonic cavity mode revealed by fast electrons. NATURE COMMUNICATIONS, 2020, vol. 11, no. 1, p. 1-7. ISSN: 2041-1723.Detail
Zhang, ZH.; Zhou, LW.; Chen, ZX.; Jaros, A.; Kolíbal, M.; Bábor, P.; Zhang, QZ.; Yan, CL.; Qiao, RX.; Zhang, Q.; Zhang, T.; Wei, W.; Cui, Y.; Qiao, JS.; Liu, LW.; Bao, LH; Yang, HT.; Cheng, ZH.; Wang, YL.; Wang, EG.; Liu, Z.; Willinger, M.; Gao, HJ.; Liu, KH.; Ji, W.; Wang, ZJ. Layer-by-layer growth of bilayer graphene single-crystals enabled by proximity catalytic activity. Nano Today, 2024, vol. 59, no. 102482, ISSN: 1878-044X.Detail
UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F. Single-layer graphene on epitaxial FeRh thin films. Applied Surface Science, 2020, vol. 514, no. 1, p. 145923-1 (145923-7 p.)ISSN: 0169-4332.Detail
SCHOVÁNEK, P.; BOUCHAL, P.; BOUCHAL, Z. Optical topography of rough surfaces using vortex localization of fluorescent markers. Optics Letters, 2020, vol. 45, no. 16, p. 4468-4471. ISSN: 1539-4794.Detail
LIŠKA, J.; LIGMAJER, F.; PINHO NASCIMENTO, P.; KEJÍK, L.; KVAPIL, M.; DVOŘÁK, P.; HORKÝ, M.; LEITNER, N.; REIMHULT, E.; ŠIKOLA, T. Effect of deposition angle on fabrication of plasmonic gold nanocones and nanodiscs. MICROELECTRONIC ENGINEERING, 2020, vol. 228, no. 1, p. 1-6. ISSN: 0167-9317.Detail
HORÁK, M.; KŘÁPEK, V.; ŠIKOLA, T. Imaging of Electric and Magnetic Near Field. GIT Imaging&Microscopy, 2020, vol. 3, no. 1, p. 31-33. ISSN: 1439-4243.Detail
STÖGER-POLLACH, M.; LÖFFLER, S.; MAURER, N.; BUKVIŠOVÁ, K. Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence. Ultramicroscopy, 2020, vol. 214, no. 1, p. 1-5. ISSN: 0304-3991.Detail
WANG, Y.; ŠIKOLA, T.; KOLÍBAL, M. Collector Droplet Behavior during Formation of Nanowire Junctions. J PHYS CHEM LETT, 2020, vol. 11, no. 16, p. 6498-6504. ISSN: 1948-7185.Detail
HORÁK, M.; KŘÁPEK, V.; HRTOŇ, M.; KONEČNÁ, A.; LIGMAJER, F.; STÖGER-POLLACH, M.; ŠIKOLA, T. Magnetic Near Field Imaging with Electron Energy Loss Spectroscopy Based on Babinet's Principle. Microscopy and Microanalysis, 2020, vol. 26, no. S2, p. 2628-2630. ISSN: 1435-8115.Detail
BARTOŠÍK, M.; MACH, J.; PIASTEK, J.; NEZVAL, D.; KONEČNÝ, M.; ŠVARC, V.; ENSSLIN, K.; ŠIKOLA, T. Mechanism and Suppression of Physisorbed-Water-Caused Hysteresis in Graphene FET Sensors. ACS Sensors, 2020, vol. 5, no. 9, p. 2940-2949. ISSN: 2379-3694.Detail
SCHMIDT, F.; HORÁK, M.; STÖGER-POLLACH, M.; KRENN, J.; LOSQUIN, A.; HOHENESTER, U. Fundamental Limit of Plasmonic Cathodoluminescence. NANO LETTERS, 2021, vol. 21, no. 1, p. 590-596. ISSN: 1530-6984.Detail
HORÁK, M.; KŘÁPEK, V.; ŠIKOLA, T. Charakterizace plazmonických antén s využitím elektronové mikroskopie a spektroskopie. Jemná mechanika a optika, 2021, roč. 66, č. 3, s. 65-69. ISSN: 0447-6441.Detail
FORDEY, T.; BOUCHAL, P.; SCHOVÁNEK, P.; BARÁNEK, M.; BOUCHAL, Z.; DVOŘÁK, P.; HRTOŇ, M.; ROVENSKÁ, K.; LIGMAJER, F.; CHMELÍK, R.; ŠIKOLA, T. Single-Shot Three-Dimensional Orientation Imaging of Nanorods Using Spin to Orbital Angular Momentum Conversion. Nano Letters, 2021, vol. 21, no. 17, p. 7244-7251. ISSN: 1530-6992.Detail
ROTHMAN, A.; MANIŠ, J.; DUBROVSKII, V.; ŠIKOLA, T.; MACH, J.; JOSLEVICH, E. Kinetics of Guided Growth of Horizontal GaN Nanowires on Flat and Faceted Sapphire Surfaces. Nanomaterials, 2021, vol. 11, no. 3, p. 1-9. ISSN: 2079-4991.Detail
PEJCHAL, T.; BUKVIŠOVÁ, K.; VALLEJOS VARGAS, S.; CITTERBERG, D.; ŠIKOLA, T.; KOLÍBAL, M. Ga interaction with ZnO surfaces: Diffusion and melt-back etching. Applied Surface Science, 2022, vol. 583, no. 1, p. 152475-152475. ISSN: 0169-4332.Detail
Stoger-Pollach, M.; Pichler, CF.; Dan, T.; Zickler, GA.; Bukvisova, K.; Eibl, O.; Brandstatter, F. Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope. ULTRAMICROSCOPY, 2021, vol. 224, no. 1, p. 113260-1 (113260-6 p.)ISSN: 1879-2723.Detail
PIASTEK, J.; MACH, J.; BÁRDY, S.; ÉDES, Z.; BARTOŠÍK, M.; MANIŠ, J.; ČALKOVSKÝ, V.; KONEČNÝ, M.; SPOUSTA, J.; ŠIKOLA, T. Correlative Raman Imaging and Scanning Electron Microscopy: The Role of Single Ga Islands in Surface-Enhanced Raman Spectroscopy of Graphene. Journal of Physical Chemistry C (web), 2022, vol. 126, no. 9, p. 4508-4514. ISSN: 1932-7455.Detail
Sreedhara, MB.; Bukvisova, K.; Khadiev, A.; Citterberg, D.; Cohen, H.; Balema, V.; Pathak, AK.; Novikov, D.; Leitus, G.; Kaplan-Ashiri, I.; Kolibal, M.; Enyashin, AN.; Houben, L.; Tenne, R. Nanotubes from the Misfit Layered Compound (SmS)(1.)19TaS2: Atomic Structure, Charge Transfer, and Electrical Properties. Chemistry of Materials, 2022, vol. 34, no. 4, p. 1838-1853. ISSN: 1520-5002.Detail
MANIŠ, J.; MACH, J.; BARTOŠÍK, M.; ŠAMOŘIL, T.; HORÁK, M.; ČALKOVSKÝ, V.; NEZVAL, D.; KACHTÍK, L.; KONEČNÝ, M.; ŠIKOLA, T. Low temperature 2D GaN growth on Si(111) 7 x 7 assisted by hyperthermal nitrogen ions. NANOSCALE ADVANCES, 2022, vol. 1, no. 1, p. 1-8. ISSN: 2516-0230.Detail
KARTCI, A.; VANČÍK, S.; PRÁŠEK, J.; HRDÝ, R.; SCHNEIDER, M.; SCHMID, U.; HUBÁLEK, J. Comparison of on-chip MIS capacitors based on stacked HfO2/Al2O3 nanolaminates. Materials Today Communications, 2022, vol. 33, no. 1, p. 1-8. ISSN: 2352-4928.Detail
ROTHMAN, A.; BUKVIŠOVÁ, K.; ITZHAK, N. R.; KAPLAN-ASHIRI, I.; KOSSOY, A. E.; SUI, X.; NOVÁK, L.; ŠIKOLA, T.; KOLÍBAL, M.; JOSELEVICH, E. Real-Time Study of Surface-Guided Nanowire Growth by In Situ Scanning Electron Microscopy. ACS Nano, 2022, vol. 16, no. 11, p. 18757-18766. ISSN: 1936-0851.Detail
CHEN, H.; BLATNIK, M.; RITTERHOFF, C.; SOKOLOVIC, I.; MIRABELLA, F.; FRANCESCHI, G.; RIVA, M.; SCHMID, M.; ČECHAL, J.; MEYER, B.; DIEBOLD, U.; WAGNER, M. Water Structures Reveal Local Hydrophobicity on the In2O3(111) Surface. ACS Nano (e-ISSN), 2022, vol. 16, no. 12, p. 21163-21173. ISSN: 1936-086X.Detail
GALLINA, P.; KVAPIL, M.; LIŠKA, J.; KONEČNÁ, A.; KŘÁPEK, V.; KALOUSEK, R.; ZLÁMAL, J.; ŠIKOLA, T. Strong coupling in an Au plasmonic antenna-SiO2 layer system: A hybrid-mode analysis. PHYSICAL REVIEW B, 2023, vol. 107, no. 12, p. 125144 ( p.)ISSN: 2469-9969.Detail
GALLINA, P.; KONEČNÁ, A.; LIŠKA, J.; IDROBO, J.; ŠIKOLA, T. Strongly Coupled Plasmon and Phonon Polaritons as Seen by Photon and Electron Probes. Physical Review Applied, 2023, vol. 19, no. 2, p. 024042 ( p.)ISSN: 2331-7019.Detail
KUNDRÁT, V.; BUKVIŠOVÁ, K.; NOVÁK, L.; PRŮCHA, L.; HOUBEN, L.; ZÁLEŠÁK, J.; VUKUSIC, A.; HOLEC, D.; TENNE, R.; PINKAS, J. W18O49 Nanowhiskers Decorating SiO2 Nanofibers: Lessons from In Situ SEM/TEM Growth to Large Scale Synthesis and Fundamental Structural Understanding. Crystal Growth and Design, 2023, vol. 24, no. 1, p. 378-390. ISSN: 1528-7505.Detail
STÖGER-POLLACH, M.; BUKVIŠOVÁ, K.; ZENZ, K.; STÖGER, L.; SCALES, Z. Important aspects of investigating optical excitations in semiconductors using a scanning transmission electron microscope. Journal of Microscopy, 2023, vol. 1, no. 1, p. 1-8. ISSN: 1365-2818.Detail
KORMOŠ, L.; PROCHÁZKA, P.; MAKOVEEV, A.; ČECHAL, J. Complex k-uniform tilings by a simple bitopic precursor self-assembled on Ag(001) surface. NATURE COMMUNICATIONS, 2020, vol. 11, no. 1, p. 1-6. ISSN: 2041-1723.Detail