Publications

• 2024

  POLÁŠKOVÁ, K.; DREXLER, P.; KLÍMA, M.; MACHÁČ, J.; NEČAS, D.; ŠVANDA, M.; ZAJÍČKOVÁ, L. Electric field and higher harmonics of RF plasma slit jet measured by antennas and VI probes. PLASMA SOURCES SCIENCE & TECHNOLOGY, 2024, vol. 33, no. 5, p. 1-16. ISSN: 0963-0252.
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  KLAPETEK, P.; NEČAS, D.; HEAPS, E.; SAUVET, B.; KLAPETEK, V.; VALTR, M.; KORPELAINEN, V.; YACOOT, A. Stitching accuracy in large area scanning probe microscopy. Measurement Science and Technology, 2024, vol. 35, no. 12, p. 125026-125037. ISSN: 1361-6501.
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  NEČAS, D. Self-consistent autocorrelation for finite-area bias correction in roughness measurement. Engineering Research Express, 2024, vol. 6, no. 2, ISSN: 2631-8695.
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  ROY, R.; HOLEC, D.; MICHAL, L.; HEMZAL, D.; SARKAR, S.; KUMAR, G.; NEČAS, D.; DHANKHAR, M.; KAUSHIK, P.; GOMEZ PEREZ, I.; ZAJÍČKOVÁ, L. Possible charge ordering and anomalous transport in graphene/graphene quantum dot heterostructure. Journal of Physics Condensed Matter, 2024, vol. 36, no. 26, p. 265601 ( p.)ISSN: 1361-648X.
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• 2023

  JANŮ, L.; DVOŘÁKOVÁ, E.; POLÁŠKOVÁ, K.; BUCHTELOVÁ, M.; RYŠÁNEK, P.; CHLUP, Z.; KRUML, T.; GALMIZ, O.; NEČAS, D.; ZAJÍČKOVÁ, L. Enhanced Adhesion of Electrospun Polycaprolactone Nanofibers to Plasma-Modified Polypropylene Fabric. Polymers, 2023, vol. 15, no. 7, p. 1-17. ISSN: 2073-4360.
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  BUCHTELOVÁ, M.; JANŮ, L.; NEČAS, D.; KŘÍŽKOVÁ, P.; BARTOŠÍKOVÁ, J.; MEDALOVÁ, J.; KOLSKÁ, Z.; HEGEMANN, D.; ZAJÍČKOVÁ, L. Insight into peculiar adhesion of cells to plasma-chemically prepared multifunctional "amino-glue" surfaces. Plasma Processes and Polymers, 2023, vol. 20, no. 6, p. 1-15. ISSN: 1612-8869.
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  VALTR, M.; KLAPETEK, P.; MARTINEK, J.; NOVOTNY, O.; JELINEK, Z.; HORTVÍK, V.; NEČAS, D. Scanning Probe Microscopy controller with advanced sampling support. HardwareX, 2023, vol. 15, no. e00451, ISSN: 2468-0672.
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  NEČAS, D.; YACOOT, A.; VALTR, M.; KLAPETEK, P. Demystifying data evaluation in the measurement of periodic structures. Measurement Science and Technology, 2023, vol. 34, no. 5, p. 1-21. ISSN: 1361-6501.
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• 2022

  MANAKHOV, A.; PERMYAKOVA, E.; SITNIKOVA, N.; TSYGANKOVA, A.; ALEKSEEV, A.; SOLOMATINA, M.; BAIDYSHEV, V.; POPOV, Z.; JANŮ, L.; ELIÁŠ, M.; ZAJÍČKOVÁ, L.; KOVALSKII, A.; SHEVEYKO, A.; KIRYUKHANTSEV-KORNEEV, P.; SHTANSKY, D.; NEČAS, D.; SOLOVIEVA, A. Biodegradable Nanohybrid Materials as Candidates for Self-Sanitizing Filters Aimed at Protection from SARS-CoV-2 in Public Areas. MOLECULES, 2022, vol. 27, no. 4, ISSN: 1420-3049.
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  KOVAČ, J.; EKAR, J.; ČEKADA, M.; ZAJÍČKOVÁ, L.; NEČAS, D.; BLAHOVÁ, L.; WANG, J.; MOZETIČ, M. Depth profiling of thin plasma-polymerized amine films using GDOES in an Ar-O-2 plasma. APPLIED SURFACE SCIENCE, 2022, vol. 581, no. 1, p. 1-10. ISSN: 1873-5584.
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  MICHAL, L.; ROY, R.; HOLEC, D.; GOMEZ PEREZ, I.; PIZÚROVÁ, N.; NEČAS, D.; DOLEČKOVÁ, A.; MEDALOVÁ, J.; LEPCIO, P.; ZAJÍČKOVÁ, L. Long-Range Magnetic Order in Nickel Hydroxide-Functionalized Graphene Quantum Dots. J PHYS CHEM LETT, 2022, vol. 13, no. prosinec, p. 11536-11542. ISSN: 1948-7185.
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  GOMEZ PEREZ, I.; SULLEIRO, M.; DOLEČKOVÁ, A.; PIZÚROVÁ, N.; MEDALOVÁ, J.; BEDNAŘÍK, A.; PREISLER, J.; NEČAS, D.; ZAJÍČKOVÁ, L. Structure elucidation of multicolor emissive graphene quantum dots towards cell guidance. MATERIALS CHEMISTRY FRONTIERS, 2022, vol. 6, no. 2, p. 145-154. ISSN: 2052-1537.
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  POLÁŠKOVÁ, K.; NEČAS, D.; DOSTÁL, L.; KLÍMA, M.; FIALA, P.; ZAJÍČKOVÁ, L. Self-organization phenomena in cold atmospheric pressure plasma slit jet. Plasma Sources Science and Technology, 2022, vol. 31, no. 12, p. 1-13. ISSN: 1361-6595.
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• 2021

  NEČAS, D.; KLAPETEK, P. Synthetic Data in Quantitative Scanning Probe Microscopy. Nanomaterials, 2021, vol. 11, no. 7, p. 1-26. ISSN: 2079-4991.
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  ROY, R.; NEČAS, D.; ZAJÍČKOVÁ, L. Evidence of flexoelectricity in graphene nanobubbles created by tip induced electric field. CARBON, 2021, vol. 179, no. 1, p. 677-682. ISSN: 0008-6223.
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  KLAPETEK, P.; GROLICH, P.; NEZVAL, D.; VALTR, M.; ŠLESINGER, R.; NEČAS, D. GSvit - An open source FDTD solver for realistic nanoscale optics simulations. COMPUTER PHYSICS COMMUNICATIONS, 2021, vol. 265, no. 1, p. 1-11. ISSN: 1879-2944.
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  GOMEZ PEREZ, I.; SULLEIRO, M.; DOLEČKOVÁ, A.; PIZÚROVÁ, N.; MEDALOVÁ, J.; ROY, R.; NEČAS, D.; ZAJÍČKOVÁ, L. Exploring the Emission Pathways in Nitrogen-Doped Graphene Quantum Dots for Bioimaging. Journal of Physical Chemistry C (web), 2021, vol. 125, no. 38, p. 21044-21054. ISSN: 1932-7455.
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  KODAMA, J.; HARUMNINGTYAS, A.; ITO, T.; MICHLÍČEK, M.; SUGIMOTO, S.; KITA, H.; CHIJIMATSU, R.; UKON, Y.; KUSHIOKA, J.; OKADA, R.; KAMATANI, T.; HASHIMOTO, K.; TATEIWA, D.; TSUKAZAKI, H.; NAKAGAWA, S.; TAKENAKA, S.; MAKINO, T.; SAKAI, Y.; NEČAS, D.; ZAJÍČKOVÁ, L.; HAMAGUCHI, S.; KAITO, T. Amine modification of calcium phosphate by low-pressure plasma for bone regeneration. Scientific Reports, 2021, vol. 11, no. 1, p. 1-15. ISSN: 2045-2322.
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  MICHLÍČEK, M.; BLAHOVÁ, L.; DVOŘÁKOVÁ, E.; NEČAS, D.; ZAJÍČKOVÁ, L. Deposition penetration depth and sticking probability in plasma polymerization of cyclopropylamine. APPLIED SURFACE SCIENCE, 2021, vol. 540, no. 1, p. 1-10. ISSN: 1873-5584.
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• 2020

  KLAPETEK, P.; YACOOT, A.; HORTVÍK, V.; DUCHOŇ, V.; DONGMO, H.; ŘEŘUCHA, Š.; VALTR, M.; NEČAS, D. Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy. Measurement Science and Technology, 2020, vol. 31, no. 9, p. 1-11. ISSN: 0957-0233.
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  NEČAS, D.; KLAPETEK, P.; VALTR, M. Estimation of roughness measurement bias originating from background subtraction. Measurement Science and Technology, 2020, vol. 31, no. 9, p. 094010-1 (094010-15 p.)ISSN: 0957-0233.
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  NEČAS, D.; VALTR, M.; KLAPETEK, P. How levelling and scan line corrections ruin roughness measurement and how to prevent it. Scientific Reports, 2020, vol. 10, no. 1, p. 1-15. ISSN: 2045-2322.
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  HU, X.; PUTTOCK, R.; KAZAKOVA, O.; ULVR, M.; KLAPETEK, P.; NEČAS, D.; NEU, V. Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2020, vol. 511, no. 1, p. 166947-1 (166947-11 p.)ISSN: 1873-4766.
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  Garnaes, J.; Necas, D.; Nielsen, L.; Madsen, MH.; Torras-Rosell, A.; Zeng, G.; Klapetek, P.; Yacoot, A. Algorithms for using silicon steps for scanning probe microscope evaluation. METROLOGIA, 2020, vol. 57, no. 6, p. 064002-1 (064002-14 p.)ISSN: 0026-1394.
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  ČERNOCHOVÁ, P.; BLAHOVÁ, L.; MEDALOVÁ, J.; NEČAS, D.; MICHLÍČEK, M.; KAUSHIK, P.; PŘIBYL, J.; BARTOŠÍKOVÁ, J.; MANAKHOV, A.; BAČÁKOVÁ, L.; ZAJÍČKOVÁ, L. Cell type specific adhesion to surfaces functionalised by amine plasma polymers. Scientific Reports, 2020, vol. 10, no. 1, p. 1-14. ISSN: 2045-2322.
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  ONDRAČKA, P.; NEČAS, D.; CARETTE, M.; ELISABETH, S.; HOLEC, D.; GRANIER, A.; GOULLET, A.; ZAJÍČKOVÁ, L.; RICHARD-PLOUET, M. Unravelling local environments in mixed TiO2-SiO2 thin films by XPS and ab initio calculations. Applied Surface Science, 2020, vol. 510, no. 1, p. 145056-1 (145056-11 p.)ISSN: 0169-4332.
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• 2019

  KAUSHIK, P.; ELIÁŠ, M.; MICHALIČKA, J.; HEGEMANN, D.; PYTLÍČEK, Z.; NEČAS, D.; ZAJÍČKOVÁ, L. Atomic layer deposition of titanium dioxide on multi-walled carbon nanotubes for ammonia gas sensing. Surface and Coatings Technology, 2019, vol. 370, no. 370, p. 235-243. ISSN: 0257-8972.
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  NEČAS, D.; KLAPETEK, P.; NEU, V.; HAVLÍČEK, M.; PUTTOCK, R.; KAZAKOVA, O.; HU, X.; ZAJÍČKOVÁ, L. Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method. Scientific Reports, 2019, no. 9, p. 1-15. ISSN: 2045-2322.
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• 2018

  OHLÍDAL, M.; VODÁK, J.; NEČAS, D. Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry. In Optical Charaterization of Thin Solid Films. Springer Nature. Cham, Switzerland: Springer International Publishing AG, 2018. p. 107-141. ISBN: 978-3-319-75324-9.
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  OHLÍDAL, M.; VODÁK, J.; NEČAS, D. Optical Characterization Of Thin Films by Means of Imaging Spectroscopic Reflectometry. In Optical Characterization of Thin Solid Films. Cham, Switzerland: Springer International Publishing AG Part of Springer Nature, 2018. p. 107-141. ISBN: 978-3-319-75324-9.
  Detail

• 2017

  BANNOV, A.; JAŠEK, O.; MANAKHOV, A.; MÁRIK, M.; NEČAS, D.; ZAJÍČKOVÁ, L. High-Performance Ammonia Gas Sensors Based on Plasma Treated Carbon Nanostructures. IEEE SENSORS JOURNAL, 2017, vol. 17, no. 7, p. 1964-1970. ISSN: 1530-437X.
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  VODÁK, J.; NEČAS, D.; PAVLIŇÁK, D.; MACÁK, J.; ŘIČICA, T.; JAMBOR, R.; OHLÍDAL, M. Application of imaging spectroscopic reflectometry for characterization of gold reduction from organometallic compound by means of plasma jet technology. Applied Surface Science, 2017, no. 396, p. 284-290. ISSN: 0169-4332.
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  NEČAS, D.; KLAPETEK, P. Study of user influence in routine SPM data processing. Measurement Science and Technology, 2017, vol. 28, no. 3, p. 1-11. ISSN: 1361-6501.
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  VODÁK, J.; NEČAS, D.; OHLÍDAL, M.; OHLÍDAL, I. Determination of local thickness values of non- uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution. Measurement Science and Technology, 2017, vol. 28, no. 2, p. 025205 (025205-6 p.)ISSN: 0957-0233.
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• 2016

  NEČAS, D.; OHLÍDAL, I.; FRANTA, D.; OHLÍDAL, M.; VODÁK, J. Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. JOURNAL OF OPTICS, 2016, vol. 18, no. 1, p. 2-11. ISSN: 2040-8978.
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  MANAKHOV, A.; MICHLÍČEK, M.; NEČAS, D.; POLČÁK, J.; MAKHNEVA, E.; ELIÁŠ, M.; ZAJÍČKOVÁ, L. Carboxyl-rich coatings deposited by atmospheric plasma co-polymerization of maleic anhydride and acetylene. Surface and Coatings Technology, 2016, vol. 295, no. 1, p. 37-45. ISSN: 0257-8972.
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• 2015

  MANAKHOV, A.; NEČAS, D.; ČECHAL, J.; PAVLIŇÁK, D.; ELIÁŠ, M.; ZAJÍČKOVÁ, L. Deposition of stable amine coating onto polycaprolactone nanofibers by low pressure cyclopropylamine plasma polymerization. Thin Solid Films, 2015, vol. 581, no. 1, p. 7-13. ISSN: 0040-6090.
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  OHLÍDAL, M.; OHLÍDAL, I.; NEČAS, D.; VODÁK, J.; FRANTA, D.; NÁDASKÝ, P.; VIŽĎA, F. Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films. In Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V. Proceedings of SPIE. 2015. p. 0R- 1 (0R-13 p.)ISBN: 9781628418170. ISSN: 0277- 786X.
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  NEČAS, D.; VODÁK, J.; OHLÍDAL, I.; OHLÍDAL, M.; MAJUMDAR, A.; ZAJÍČKOVÁ, L. Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry. Applied Surface Science, 2015, no. 350, p. 149-155. ISSN: 0169-4332.
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  NEČAS, D.; OHLÍDAL, I.; VODÁK, J.; OHLÍDAL, M.; FRANTA, D. Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry. In Optical Systems Design 2015: Advances in Optical Thin Films V. Proceedings of SPIE. 2015. p. 0C- 1 (0C-9 p.)ISBN: 9781628418170. ISSN: 0277-786X.
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• 2014

  MANAKHOV, A.; ZAJÍČKOVÁ, L.; ELIÁŠ, M.; ČECHAL, J.; POLČÁK, J.; HNILICA, J.; BITTNEROVÁ, Š.; NEČAS, D. Optimization of Cyclopropylamine Plasma Polymerization Towards Enhanced Layer Stability in Contact with Water. Plasma Processes and Polymers, 2014, vol. 11, no. 6, p. 532-544. ISSN: 1612-8850.
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  NEČAS, D.; ČUDEK, V.; VODÁK, J.; OHLÍDAL, M.; KLAPETEK, P.; ZAJÍČKOVÁ, L. Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry. Measurement Science and Technology, 2014, vol. 25, no. 11, p. 1-9. ISSN: 0957-0233.
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  NEČAS, D.; OHLÍDAL, I.; FRANTA, D.; ČUDEK, V.; OHLÍDAL, M.; VODÁK, J. Measurement of thickness distribution, optical constants and roughness parameters of rough non-uniform ZnSe thin films. Applied Optics, 2014, vol. 53, no. 25, p. 5606-5614. ISSN: 1559-128X.
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  MANAKHOV, A.; SKLÁDAL, P.; NEČAS, D.; ČECHAL, J.; POLČÁK, J.; ELIÁŠ, M.; ZAJÍČKOVÁ, L. Cyclopropylamine plasma polymers deposited onto quartz crystal microbalance for biosensing application. physica status solidi (a), 2014, vol. 211, no. 12, p. 2801-2808. ISSN: 1862-6300.
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  NEČAS, D.; OHLÍDAL, I.; FRANTA, D.; ČUDEK, V.; OHLÍDAL, M.; VODÁK, J.; SLÁDKOVÁ, L.; ZAJÍČKOVÁ, L.; ELIÁŠ, M.; VIŽĎA, F. Assessment of non_uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry. Thin Solid Films, 2014, vol. 571, no. 3, p. 573-578. ISSN: 0040-6090.
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  KLAPETEK, P.; NEČAS, D. Independent analysis of mechanical data from atomic force microscopy. Measurement Science and Technology, 2014, vol. 25, no. 4, p. 1-8. ISSN: 0957-0233.
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• 2013

  NEČAS, D.; KLAPETEK, P. One-dimensional autocorrelation and power spectrum density functions of irregularregions. Ultramicroscopy, 2013, vol. 124, no. 1, p. 13-19. ISSN: 0304-3991.
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• 2012

  NEČAS, D.; KLAPETEK, P. Gwyddion: an open-source software for SPM data analysis. CENTRAL EUROPEAN JOURNAL OF PHYSICS, 2012, vol. 10, no. 1, p. 181-188. ISSN: 1644-3608.
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• 2011

  KLAPETEK, P.; VALTR, M.; NEČAS, D.; SALYK, O.; DZIK, P. Atomic force microscopy analysis of nanoparticles in non-ideal conditions. Nanoscale Research Letters, 2011, vol. 6, no. 1, p. 1-9. ISSN: 1931-7573.
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  OHLÍDAL, M.; OHLÍDAL, I.; KLAPETEK, P.; NEČAS, D.; MAJUMDAR, A. Measurement of the thickness distribution and optical constants of non- uniform thin films. Measurement Science and Technology, 2011, vol. 22, no. 8, p. 1-7. ISSN: 0957- 0233.
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  OHLÍDAL, I.; OHLÍDAL, M.; NEČAS, D.; FRANTA, D.; BURŠÍKOVÁ, V. Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry. Thin Solid Films, 2011, vol. 519, no. 9, p. 2874-2876. ISSN: 0040- 6090.
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• 2010

  KLAPETEK, P.; VALTR, M.; PORUBA, A.; NEČAS, D.; OHLÍDAL, M. Rough surface scattering simulations using graphics cards. Applied Surface Science, 2010, vol. 2010, no. 256, p. 5640-5643. ISSN: 0169- 4332.
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• 2009

  OHLÍDAL, M.; OHLÍDAL, I.; KLAPETEK, P.; NEČAS, D.; BURŠÍKOVÁ, V. Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond- like carbon films. Diamond and Related Materials, 2009, vol. 2009 (18), no. 1, p. 384-387. ISSN: 0925- 9635.
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  OHLÍDAL, M.; OHLÍDAL, I.; NEČAS, D.; KLAPETEK, P. Complete Optical Characterization of Non- Uniform SiOx Thin Films Using Imaging Spectroscopic Reflectometry. e- Journal of Surface Science and Nanotechnology, 2009, vol. 7, no. 4, p. 409-412. ISSN: 1348- 0391.
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  FRANTA, D.; NEČAS, D.; OHLÍDAL, I.; HRDLIČKA, M.; PAVLIŠTA, M.; FRUMAR, M.; OHLÍDAL, M. Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films. Journal of Optoelectronics and Advanced Materials, 2009, vol. 11, no. 12, p. 1891-1898. ISSN: 1454- 4164.
  Detail

  OHLÍDAL, M.; OHLÍDAL, I.; KLAPETEK, P.; NEČAS, D. PRECISE MEASUREMENT OF THICKNESS DISTRIBUTION OF NON- UNIFORM THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY. In Proceedings of IMEKO 2009. Lisabon: IMEKO, 2009. p. 100-105. ISBN: 978-963-88410-0- 1.
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• 2008

  OHLÍDAL, I.; NEČAS, D.; BURŠÍKOVÁ, V.; FRANTA, D.; OHLÍDAL, M. Optical characterization of diamond-like carbon thin films non- uniform in thickness using spectroscopic reflectometry. Diamond and Related Materials, 2008, vol. 17, no. 4, 5, p. 709-712. ISSN: 0925- 9635.
  Detail

  OHLÍDAL, M.; OHLÍDAL, I.; KLAPETEK, P.; NEČAS, D. Complete optical characterization of non- uniform SiOx thin films using imaging spectroscopic reflectometry. Dublin: Trinity College Dublin, 2008. p. M- P43 (M-P43 p.)
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• 2007

  FRANTA, D.; BURŠÍKOVÁ, V.; OHLÍDAL, I.; ŠŤAHEL, P.; OHLÍDAL, M.; NEČAS, D. Correlation of thermal stability of the mechanical and optical properties of diamond- like carbon films. Diamond and Related Materials, 2007, vol. 16, no. 4- 7, p. 1331-1335. ISSN: 0925- 9635.
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