Project detail

Noise of HEMT for global communication

Duration: 22.02.2002 — 31.12.2002

Funding resources

Ministerstvo školství, mládeže a tělovýchovy ČR - KONTAKT

- part funder (2002-11-07 - not assigned)

Mark

ME 605

Default language

Czech

People responsible

Šikula Josef, prof. Ing. RNDr., DrSc. - principal person responsible

Units

Department of Physics
- (2002-11-07 - 2004-12-31)

Results

GRMELA, L., MAJZNER, J., PAVELKA, J. Automatic noise spectral density measuring set-up. In Electronic Devices and Systems 2002. Brno: VUT v Brně, 2002. p. 114 ( p.)ISBN: 80-214-2180-0.
Detail

SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., ROČAK, D., BELAVIČ, D., TACANO, M. Effect of Contact Electrode on Noise and Nonlinearity of Thick-Film Resistor. In Proc. of 16th Symp. CARTS Europe 2002. Nice, France: 2002. p. 171 ( p.)ISBN: 0887-7491.
Detail

SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D. Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity. In Proc. of 38th International Conference on Microelectronics, Devices and Materials. Lipica, Slonenia: 2002. p. 245 ( p.)ISBN: 961-91023-0-4.
Detail

GRMELA, L., MAJZNER, J., PAVELKA, J., ŠIKULA, J. Automatic noise spectral density measuring set-up. In Electronic devices and systems 02 - proceedings. Brno: Zdeněk Novotný, 2002. p. 114 ( p.)ISBN: 80-214-2180-0.
Detail

SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non-linearity of thick film resistors. In Proceedings of 14th European Microelectronics and Packaging Conference. Německo: IMAPS Germany, 2003. p. 127 ( p.)
Detail

SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D. The effect of silver diffusion from contact electrode into thick film resistors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 201 ( p.)ISBN: 0887-7491.
Detail

ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T. Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 281 ( p.)ISBN: 0887-7491.
Detail

ŠIKULA, J., DOBIS, P. Noise and Non-linearity as Reliability Indicators of Electronic Devices. In MIDEM Cenference 2003 Proceedings. Slovenia: MIDEM - Society for Microelectronics, Electronic components and Materials, 2003. p. 3 ( p.)ISBN: 961-91023-1-2.
Detail

HASHIGUCHI, S., TAKI, C., KITAHARA, A., OHKI, M., TACANO, M., ŠIKULA, J. Active Shielding fo Low Frequency Magnetic Field. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. p. 44 ( p.)ISBN: 80-238-9094-8.
Detail

YOKOKURA, S., TANUMA, N., TACANO, M., HASHIGUCHI, S., ŠIKULA, J. Fully Computer-controlled Battery Power Source for Low-frequency Noise Measurements. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. p. 48 ( p.)ISBN: 80-238-9094-8.
Detail

TACANO, M., TANUMA, N., PAVELKA, J., TANIZAKI, H., YAGI, S., TOMISAWA, K., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T., MUSHA, T. Transport Properties and Hooge Noise Parameter of N-GaN. In Noise and Fluctuations. Prague: CNRL, 2003. p. 117 ( p.)ISBN: 80-239-1005-1.
Detail

PAVELKA, J., TANUMA, N., TACANO, M., ŠIKULA, J., MUSHA, T. Hooge Parameter of InGaAs Heterostructures Experimental Support for 1/f Energy Patrition Model. In Noise and Fluctuations. Prague: CNRL, 2003. p. 123 ( p.)ISBN: 80-239-1005-1.
Detail

ŠIKULA, J., DOBIS, P., PAVELKA, J., TACANO, M., HASHIGUCHI, S. Stochastic model for random tegraph signals in MOSFETS. In Proceeding of the 18th Forum of Science and Technology of Fluctuations. Tokyo: Meisei University Tokyo, 2003. p. 1 ( p.)
Detail

ŠIKULA, J., DOBIS, P., SEDLÁKOVÁ, V. Noise and non-linearity as reliability indicators of electronic devices. In MIDEM 2003 Conference Proceedings. Slovenia: MIDEM Slovenia, 2003. p. 3 ( p.)ISBN: 961-91023-1-2.
Detail

SEDLÁKOVÁ, V., SEDLÁK, P., ŠIKULA, J., ROČAK, D., HROVAT, M., SANTO-ZARNIK, M., BELAVIC, D. Analysis of silver diffusion into thick film resistor layers. In Proceedings of 3rd European Microelectronics and Packaging Symposium with Table-Top Exhibition. Lanskroun: IMAPS CZ&SK Chapter, 2004. p. 660 ( p.)ISBN: 80-239-2835-X.
Detail

HÁJEK, K., SEDLÁKOVÁ, V., MAJZNER, J., HEFNER, Š., ŠIKULA, J. Non-linearity and noise characterisation of thick-film resistors after high voltage stress. In Proceedings of the 3rd European Microelectronics and Packaging Symposium with Table Top Exhibition. Lanskroun: IMAPS CZ&SK Chapter, 2004. p. 421 ( p.)ISBN: 80-239-2835-X.
Detail

SEDLÁKOVÁ, V., ŠIKULA, J. Thick film resistor characterisation by non-linearity and resistance change after high voltage stress. In New Trends in Physics - Proceedings of the Conference. Brno: Department of Physics FEEC, Brno University of Technology, 2004. p. 88 ( p.)ISBN: 80-7355-024-5.
Detail

ŠIKULA, J., PAVELKA, J., SEDLÁKOVÁ, V., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in submicron MOSFETs and quantum dots. In Proceedings of SPIE - Noise and Information in Nanoelectronics, Sensors, and Standards II. United States of America: The Society of Photo-Optical Instrumentation Engineers, 2004. p. 64 ( p.)ISBN: 0-8194-5394-3.
Detail

SEDLÁKOVÁ, V., MELKES, F., DOBIS, P., ŠIKULA, J., TACANO, M., HASHIGUCHI, S. Non-lineartiy changes induced by current stress in thick film resistors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. p. 154 ( p.)ISSN: 0887-7491.
Detail

ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P. Noise and Non-Linearity as Reliability Indicators of Electronic Devices. Informacije MIDEM, 2004, vol. 2003, no. 4, p. 213-221. ISSN: 0352-9045.
Detail

PAVELKA, J.; TANUMA, N.; TACANO, M.; ŠIKULA, J. Low frequency noise and trap spectroscopy of InGaAs/InAlAs heterostructures. Research Bulletin of Meisei University – Physical Sciences and Engineering, 2005, vol. 41, no. 1, p. 147 ( p.)ISSN: 1346-7239.
Detail

The 18th Forum of Science and Technology of Fluctuations. Tokyo (28.11.2003)
Detail