Ministerstvo školství, mládeže a tělovýchovy ČR - KONTAKT

- částečně financující (2002-11-07 - nezadáno)

ME 605

čeština

Šikula Josef, prof. Ing. RNDr., DrSc. - hlavní řešitel

Ústav fyziky
- příjemce (07.11.2002 - 31.12.2004)

GRMELA, L., MAJZNER, J., PAVELKA, J. Automatic noise spectral density measuring set-up. In Electronic Devices and Systems 2002. Brno: VUT v Brně, 2002. p. 114 ( p.)ISBN: 80-214-2180-0.
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SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., ROČAK, D., BELAVIČ, D., TACANO, M. Effect of Contact Electrode on Noise and Nonlinearity of Thick-Film Resistor. In Proc. of 16th Symp. CARTS Europe 2002. Nice, France: 2002. p. 171 ( p.)ISBN: 0887-7491.
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SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D. Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity. In Proc. of 38th International Conference on Microelectronics, Devices and Materials. Lipica, Slonenia: 2002. p. 245 ( p.)ISBN: 961-91023-0-4.
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GRMELA, L., MAJZNER, J., PAVELKA, J., ŠIKULA, J. Automatic noise spectral density measuring set-up. In Electronic devices and systems 02 - proceedings. Brno: Zdeněk Novotný, 2002. p. 114 ( p.)ISBN: 80-214-2180-0.
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SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non-linearity of thick film resistors. In Proceedings of 14th European Microelectronics and Packaging Conference. Německo: IMAPS Germany, 2003. p. 127 ( p.)
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SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D. The effect of silver diffusion from contact electrode into thick film resistors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 201 ( p.)ISBN: 0887-7491.
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ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T. Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 281 ( p.)ISBN: 0887-7491.
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ŠIKULA, J., DOBIS, P. Noise and Non-linearity as Reliability Indicators of Electronic Devices. In MIDEM Cenference 2003 Proceedings. Slovenia: MIDEM - Society for Microelectronics, Electronic components and Materials, 2003. p. 3 ( p.)ISBN: 961-91023-1-2.
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HASHIGUCHI, S., TAKI, C., KITAHARA, A., OHKI, M., TACANO, M., ŠIKULA, J. Active Shielding fo Low Frequency Magnetic Field. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. p. 44 ( p.)ISBN: 80-238-9094-8.
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YOKOKURA, S., TANUMA, N., TACANO, M., HASHIGUCHI, S., ŠIKULA, J. Fully Computer-controlled Battery Power Source for Low-frequency Noise Measurements. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. p. 48 ( p.)ISBN: 80-238-9094-8.
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TACANO, M., TANUMA, N., PAVELKA, J., TANIZAKI, H., YAGI, S., TOMISAWA, K., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T., MUSHA, T. Transport Properties and Hooge Noise Parameter of N-GaN. In Noise and Fluctuations. Prague: CNRL, 2003. p. 117 ( p.)ISBN: 80-239-1005-1.
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PAVELKA, J., TANUMA, N., TACANO, M., ŠIKULA, J., MUSHA, T. Hooge Parameter of InGaAs Heterostructures Experimental Support for 1/f Energy Patrition Model. In Noise and Fluctuations. Prague: CNRL, 2003. p. 123 ( p.)ISBN: 80-239-1005-1.
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ŠIKULA, J., DOBIS, P., PAVELKA, J., TACANO, M., HASHIGUCHI, S. Stochastic model for random tegraph signals in MOSFETS. In Proceeding of the 18th Forum of Science and Technology of Fluctuations. Tokyo: Meisei University Tokyo, 2003. p. 1 ( p.)
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ŠIKULA, J., DOBIS, P., SEDLÁKOVÁ, V. Noise and non-linearity as reliability indicators of electronic devices. In MIDEM 2003 Conference Proceedings. Slovenia: MIDEM Slovenia, 2003. p. 3 ( p.)ISBN: 961-91023-1-2.
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SEDLÁKOVÁ, V., SEDLÁK, P., ŠIKULA, J., ROČAK, D., HROVAT, M., SANTO-ZARNIK, M., BELAVIC, D. Analysis of silver diffusion into thick film resistor layers. In Proceedings of 3rd European Microelectronics and Packaging Symposium with Table-Top Exhibition. Lanskroun: IMAPS CZ&SK Chapter, 2004. p. 660 ( p.)ISBN: 80-239-2835-X.
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HÁJEK, K., SEDLÁKOVÁ, V., MAJZNER, J., HEFNER, Š., ŠIKULA, J. Non-linearity and noise characterisation of thick-film resistors after high voltage stress. In Proceedings of the 3rd European Microelectronics and Packaging Symposium with Table Top Exhibition. Lanskroun: IMAPS CZ&SK Chapter, 2004. p. 421 ( p.)ISBN: 80-239-2835-X.
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SEDLÁKOVÁ, V., ŠIKULA, J. Thick film resistor characterisation by non-linearity and resistance change after high voltage stress. In New Trends in Physics - Proceedings of the Conference. Brno: Department of Physics FEEC, Brno University of Technology, 2004. p. 88 ( p.)ISBN: 80-7355-024-5.
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ŠIKULA, J., PAVELKA, J., SEDLÁKOVÁ, V., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in submicron MOSFETs and quantum dots. In Proceedings of SPIE - Noise and Information in Nanoelectronics, Sensors, and Standards II. United States of America: The Society of Photo-Optical Instrumentation Engineers, 2004. p. 64 ( p.)ISBN: 0-8194-5394-3.
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SEDLÁKOVÁ, V., MELKES, F., DOBIS, P., ŠIKULA, J., TACANO, M., HASHIGUCHI, S. Non-lineartiy changes induced by current stress in thick film resistors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. p. 154 ( p.)ISSN: 0887-7491.
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ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P. Noise and Non-Linearity as Reliability Indicators of Electronic Devices. Informacije MIDEM, 2004, vol. 2003, no. 4, p. 213-221. ISSN: 0352-9045.
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PAVELKA, J.; TANUMA, N.; TACANO, M.; ŠIKULA, J. Low frequency noise and trap spectroscopy of InGaAs/InAlAs heterostructures. Research Bulletin of Meisei University – Physical Sciences and Engineering, 2005, vol. 41, no. 1, p. 147 ( p.)ISSN: 1346-7239.
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The 18th Forum of Science and Technology of Fluctuations. Tokyo (28.11.2003)
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