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Project detail
Duration: 01.01.1996 — 31.12.2000
Funding resources
Ministerstvo školství, mládeže a tělovýchovy ČR - Posílení výzkumu na vysokých školách
- whole funder
Mark
VS96084
Default language
Czech
People responsible
Janča Jan, prof. RNDr., DrSc. - principal person responsible
Units
Faculty of Mechanical Engineering- (1996-01-01 - 2000-12-31)
Results
OHLÍDAL, I., OHLÍDAL, M., FRANTA, D., TYKAL, M. Comparison of optical and non-optical methods for measuring surface roughness. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. Proceedings of SPIE. Washington, USA: SPIE-The International Society for Optical Engineering, 1999. p. 456-467. ISBN: 0-8194-3306-3. ISSN: 0277-786X.Detail
FRANTA, D., OHLÍDAL, I., KLAPETEK, P., POKORNÝ, P., OHLÍDAL, M. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy. Surface and Interface Analysis, 2001, vol. 2001 (32), no. 1, p. 91 ( p.)ISSN: 0142-2421.Detail
OHLÍDAL, I., FRANTA, D., OHLÍDAL, M., NAVRÁTIL, K. Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances. Vacuum, 2001, vol. 61, no. 1, p. 285-289. ISSN: 0042-207X.Detail
OHLÍDAL, I.; FRANTA, D.; PINČÍK, E.; OHLÍDAL, M. Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy. Surface and Interface Analysis, 1999, vol. 28, no. 1, p. 240 ( p.)ISSN: 0142-2421.Detail