Projekt cílí na propracování metod pro charakterizaci a diagnostiku zkoumaných organických a anorganických materiálů a struktur. Soustředí se na detekci lokálních defektů na povrchu a v objemu, analýzu jejich vzniku, a dále na sledování degradace celého vzorku vlivem stárnutí či vystavením podmínkám umělého stárnutí. Budou popsány fyzikální mechanismy zkoumaných procesů a vytvořeny popisy a modely jak vlastních vzorků, tak i defektů. Koncentrace fyzikálně různorodých metod nabízí neobyčejný pohled s mimořádným aplikačním potenciálem.

FEKT-S-17-4626

Czech

Sedlák Petr, doc. Ing., Ph.D. - principal person responsible
Bartlová Milada, doc. RNDr., Ph.D. - fellow researcher
Gajdoš Adam, Ing. - fellow researcher
Grmela Lubomír, prof. Ing., CSc. - fellow researcher
Jurčík Michal, Ing. - fellow researcher
Kaspar Pavel, Ing., Ph.D. - fellow researcher
Koktavý Pavel, prof. Ing., CSc. Ph.D. - fellow researcher
Kuparowitz Tomáš, Ing., Ph.D. - fellow researcher
Liedermann Karel, doc. Ing., CSc. - fellow researcher
Macků Robert, Ing., Ph.D. - fellow researcher
Papež Nikola, Ing., Ph.D. - fellow researcher
Podshivalov Aleksandr - fellow researcher
Pokorný Josef, Ing. - fellow researcher
Sobola Dinara, doc. Mgr., Ph.D. - fellow researcher
Spohner Milan, Ing., Ph.D. - fellow researcher
Škarvada Pavel, Ing., Ph.D. - fellow researcher
Škvarenina Ľubomír, Ing., Ph.D. - fellow researcher

Department of Physics
- responsible department (31.10.2018 - not assigned)
Department of Physics
- internal (1.1.2017 - 31.12.2019)
Faculty of Electrical Engineering and Communication
- beneficiary (1.1.2017 - 31.12.2019)

DALLAEV, R.; PAPEŽ, N.; SOBOLA, D.; RAMAZANOV, S.; SEDLÁK, P. Investigation of structure of AlN thin films using Fourier-transform infrared spectroscopy. In Procedia Structural Integrity. Procedia Structural Integrity. Elsevier, 2020. p. 601-606. ISSN: 2452-3216.
Detail

PAPEŽ, N.; DALLAEV, R.; SOBOLA, D.; MACKŮ, R.; ŠKARVADA, P. Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method. In Procedia Structural Integrity. Procedia Structural Integrity. Elsevier, 2020. p. 595-600. ISSN: 2452-3216.
Detail

PAPEŽ, N.; GAJDOŠ, A.; DALLAEV, R.; SOBOLA, D.; SEDLÁK, P.; MOTÚZ, R.; NEBOJSA, A.; GRMELA, L. Performance analysis of GaAs based solar cells under gamma irradiation. Applied Surface Science, 2020, no. 510, p. 265-272. ISSN: 0169-4332.
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STACH, S.; TALU, S.; DALLAEV, R.; ARMAN, A.; SOBOLA, D.; SALERNO, M. Evaluation of the Topographical Surface Changes of Silicon Wafers after Annealing and Plasma Cleaning. Silicon, 2020, vol. 11, no. 1, p. 2563-2570. ISSN: 1876-990X.
Detail

PAPEŽ, N. Advanced structural analysis of silicon solar cells. In Proceedings of the 25th Conference STUDENT EEICT 2019. Brno: 2019. p. 723-727. ISBN: 978-80-214-5735-5.
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SOBOLA, D.; PAPEŽ, N.; DALLAEV, R.; RAMAZANOV, S.; HEMZAL, D.; HOLCMAN, V. Characterization of nanoblisters on HOPG surface. In Journal of ELECTRICAL ENGINEERING. Journal of Electrical Engineering. FEI STU Bratislava: De Gruyter OPEN, 2019. p. 132-136. ISSN: 1335-3632.
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KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L. Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. Applied Surface Science, 2019, vol. 493, no. 1, p. 673-678. ISSN: 0169-4332.
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VANĚK, J.; JANDOVÁ, K.; VANÝSEK, P. SEKUNDÁRNÍ VYUŽITÍ KOMUNÁLNÍHO ODPADU VE ZDROJÍCH SUROVIN A ENERGIE. In ZBORNÍK MEDZINÁRODNEJ VEDECKEJ KONFERENCIE RESpect 2019. 1. 2019. s. 80-86. ISBN: 978-80-553-3308-3.
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DALLAEV, R.; ORLOVA, L.; SOBOLA, D. Imaging of structures at butterfly wings by atomic force microscopy. In PROSPECTS FOR THE DEVELOPMENT OF THE AUTOMIBLE TRANSPORT: INNOVATIONS, PROJECTS, STAFF. 2019. p. 241-245. ISBN: 978-5-00128-244-0.
Detail

DALLAEV, R. Characterization of aln thin films deposited on thermally processed silicon substrates using pe-ald. In Proceedings of the 25 th Conference STUDENT EEICT 2019. doc. Ing. Vítězslav Novák, Ph.D. 2019. p. 704-709. ISBN: 978-80-214-5735-5.
Detail

DALLAEV, R.; STACH, S.; TALU, S.; SOBOLA, D.; MÉNDEZ-ALBORES, A.; TREJO, G.; GRMELA, L. Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals. Silicon, 2019, vol. 11, no. 1, p. 1-15. ISSN: 1876-990X.
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POKORNÝ, J. Silicon in spectroscopic data of world databases. Plasma Physics and Technology, 2018, vol. 5, no. 3, p. 117-121. ISSN: 2336-2626.
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GAJDOŠ, A.; ŠKARVADA, P.; MACKŮ, R.; PAPEŽ, N.; ŠKVARENINA, Ľ.; SOBOLA, D. Isolation and optoelectronic characterization of Si solar cells microstructure defects. Journal of Physics: Conference Series, 2018, vol. 1124, no. 4, p. 1-6. ISSN: 1742-6596.
Detail

PAPEŽ, N.; HOLCMAN, V. Efektivní zpracování dat z mikroskopie skenující sondou. Jemná mechanika a optika, 2018, č. 63, s. 180-182. ISSN: 0447-6441.
Detail

PAPEŽ, N.; SOBOLA, D.; GAJDOŠ, A.; ŠKVARENINA, Ľ.; MACKŮ, R.; ELIÁŠ, M.; NEBOJSA, A.; MOTÚZ, R. Surface morphology after reactive ion etching of silicon and gallium arsenide based solar cells. Journal of Physics: Conference Series, 2018, vol. 1124, no. 4, p. 165-171. ISSN: 1742-6596.
Detail

PAPEŽ, N.; SOBOLA, D.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Applied Surface Science, 2018, no. 461, p. 212-220. ISSN: 0169-4332.
Detail

ŢĂLU, Ş.; SOBOLA, D.; PAPEŽ, N.; DALLAEV, R.; SEDLÁK, P. Efficient processing of data acquired using microscopy techniques. In DEStech Transactions on Social Science, Education and Human Science. DEStech Transactions on Social Science Education and Human Science. Lancaster, Pennsylvania 17602 U.S.A.: DEStech Publications, Inc., 2018. p. 202-207. ISBN: 978-1-60595-566-7. ISSN: 2475-0042.
Detail

ŞTEFAN ŢĂLU, RASHID DALLAEV, DINARA SOBOLA. Evaluation of Surface Characteristics of Highly Oriented Pyrolitic Graphite. In 2018 2nd International Conference on Advances in Management Science and Engineering (AMSE 2018). 2018. p. 150-154. ISBN: 978-1-60595-566-7.
Detail

MÍVALT, F. EVALUATION OF FLOW-INDUCED VOLTAGE FLUCTUATIONS OF GAS CHEMIRESISTORS BY PARAMETRIC EMPIRICAL MODEL. In Proceedings of the 24th Conference STUDENT EEICT 2018. Brno: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních, 2018. s. 267-269. ISBN: 978-80-214-5614-3.
Detail

TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O. How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2018, no. 85, p. 15-23. ISSN: 1369-8001.
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Responsibility: Sedlák Petr, doc. Ing., Ph.D.