Project detail

Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry

Duration: 01.01.2001 — 31.12.2003

Funding resources

Czech Science Foundation - Standardní projekty

- whole funder (2001-01-01 - 2003-12-31)

On the project

Realizace laboratorního vzoru původního zařízení, umožňujícícho měřit nedestruktivně a bez apriorních předpokladů o studovaném povrchu, jeho drsnost.

Description in English
The target of the project is a realisation of a laboratory instrument enabling us to measure surface roughness in a non-destructive way in the range from tens of nanometers to tens of micrometers without a priori assumptions concerning a character of the

Mark

GA101/01/1104

Default language

Czech

People responsible

Lazar Josef, prof. Ing., Dr. - fellow researcher
Ohlídal Ivan, prof. RNDr., DrSc. - fellow researcher
Ohlídal Miloslav, prof. RNDr., CSc. - principal person responsible

Units

Faculty of Mechanical Engineering
- (2001-01-01 - 2003-12-31)

Results

PRAŽÁK, D., OHLÍDAL, M. Laser speckle correlation and surface roughness. In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001. p. 339 ( p.)ISBN: 0-8194-4047-7. ISSN: 0277-786X.
Detail

OHLÍDAL, M.; PRAŽÁK, D. Surface roughness determination by digital laser speckle spectral correlation-Fresnel approximation of scalar Kirchhoff theory. In ICO XIX, Optics for the Quality of Life. Washington: SPIE - The InternationalSociety for Optical Engineering, 2002. p. 495-496. ISBN: 0-8194-4569-7.
Detail

PRAŽÁK, D., OHLÍDAL, M. Autocorrelation function of sum of two laser spectrally decorrelated speckle fields-comparison of Fresnel and Fraunhofer approximation. 2002.
Detail

PRAŽÁK, D.; OHLÍDAL, M. Autocorrelation function of sum of two spectrally decorrelated laser speckle fields - Comparison of Fresnel and Fraunhofer approximation. In Proceedings of SPIE. 13th Polish-Czech-Slovak on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE-The International Society for Optical Engineering, 2003. p. 113-120. ISBN: 0-8194-5146-0.
Detail

OHLÍDAL, I.; OHLÍDAL, M.; KLAPETEK, P.; ČUDEK, V.; JÁKL, M. Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry. In Proceedings of SPIE. Proceedings of SPIE. Wave-Optical Systems Engineering II. Bellingham, Washington, USA: SPIE-The International Society for Optical Engineering, 2003. p. 260-271. ISBN: 0-8194-5055-3. ISSN: 0277-786X.
Detail

PÁLENÍKOVÁ, K.; OHLÍDAL, M. Potentialities of optical profilometer MicroProf FRT for surface quality measurement. In 14 th Slovak-Czech Polish Conference on Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. Bellingham, Washington, USA: SPIE - The internationalSociety for Optical Engineering, 2005. p. 59451O-1 (59451O-6 p.)ISBN: 0-8194-5951-8. ISSN: 0277-786X.
Detail

OHLÍDAL, M.; ŠÍR, L.; JÁKL, M.; OHLÍDAL, I. Digital two-wavelength holographic interference microscopy for surface roughness measurement. In 14 th Slovak-Czech Polish Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005. p. 59450I-1 (59450I-8 p.)ISBN: 0-8194-5951-8.
Detail

OHLÍDAL, M. COMPARISON OF THE 2-DIMENSIONAL FRAUNHOFER AND THE 2-DIMENSIONAL FRESNEL APPROXIMATIONS IN THE ANALYSIS OF SURFACE-ROUGHNESS BY ANGLE SPECKLE CORRELATION .1. THEORY. Journal of Modern Optics, 1991, vol. 42, no. 10, p. 2115-2135. ISSN: 0950-0340.
Detail

OHLÍDAL, M., OHLÍDAL, I., FRANTA, D., KRÁLÍK, T., JÁKL, M., ELIÁŠ, M. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method. Surface and Interface Analysis, 2002, vol. 34, no. 1, p. 660 ( p.)ISSN: 0142-2421.
Detail

OHLÍDAL, M., OHLÍDAL, I., KLAPETEK, P., JÁKL, M., ČUDEK, V., ELIÁŠ, M. New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters. Japanese Journal of Applied Physics, 2003, vol. 2003, no. 7B, p. 4760 ( p.)ISSN: 0021-4922.
Detail

OHLÍDAL, M., PRAŽÁK, D. Digital laser speckle spectral correlation within the famework of the Fresnel approximation of the scalar Kirchhoff theory and its application in surface roughness measurement. Journal of Modern Optics, 2003, vol. 2003, no. 14, p. 2133 ( p.)ISSN: 0950-0340.
Detail

VALÍČEK, J.; HLOCH, S.; DRŽÍK, M.; OHLÍDAL, M.; MÁDR, V.; LUPTÁK, M.; RADVANSKÁ, A. An Investigation of Surfaces Generated by Abrasive Waterjets Using Optical Detection. STROJNISKI VESTNIK-JOURNAL OF MECHANICAL ENGINEERING, 2007, vol. 53, no. 4/07, p. 1-9. ISSN: 0039-2480.
Detail

OHLÍDAL, M., PÁLENÍKOVÁ, K. Možnosti optického profilometru MicroProf FRT při 3D hodnocení kvality povrchu. 2004, roč. 49, č. 9, s. 251 ( s.)ISSN: 0447-6411.
Detail

FRANTA, D., OHLÍDAL, I., KLAPETEK, P.,OHLÍDAL, M. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis, 2004, vol. 36, no. 8, p. 1203-1206. ISSN: 0142-2421.
Detail

OHLÍDAL, M.; JÁKL, M.; KRŠEK, J.; LENK, J.; ŠÍR, L.: DLHIM; Digitální laserový holografický interferenční mikroskop. ÚFI, laboratoř koherenční optiky, A2/218. (funkční vzorek)
Detail

ŠŤASTNÝ, J.: Regression; Regresní analýza. VUT FSI ÚAI. URL: http://www.uai.fme.vutbr.cz/~stastny/. (software)
Detail

Responsibility: Ohlídal Miloslav, prof. RNDr., CSc.