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Project detail
Duration: 01.01.2001 — 31.12.2003
Funding resources
Czech Science Foundation - Standardní projekty
- whole funder (2001-01-01 - 2003-12-31)
On the project
Realizace laboratorního vzoru původního zařízení, umožňujícícho měřit nedestruktivně a bez apriorních předpokladů o studovaném povrchu, jeho drsnost.
Description in EnglishThe target of the project is a realisation of a laboratory instrument enabling us to measure surface roughness in a non-destructive way in the range from tens of nanometers to tens of micrometers without a priori assumptions concerning a character of the
Mark
GA101/01/1104
Default language
Czech
People responsible
Lazar Josef, prof. Ing., Dr. - fellow researcherOhlídal Ivan, prof. RNDr., DrSc. - fellow researcherOhlídal Miloslav, prof. RNDr., CSc. - principal person responsible
Units
Faculty of Mechanical Engineering- beneficiary (2001-01-01 - 2003-12-31)
Results
PRAŽÁK, D., OHLÍDAL, M. Laser speckle correlation and surface roughness. In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001. p. 339 ( p.)ISBN: 0-8194-4047-7. ISSN: 0277-786X.Detail
OHLÍDAL, M.; PRAŽÁK, D. Surface roughness determination by digital laser speckle spectral correlation-Fresnel approximation of scalar Kirchhoff theory. In ICO XIX, Optics for the Quality of Life. Washington: SPIE - The InternationalSociety for Optical Engineering, 2002. p. 495-496. ISBN: 0-8194-4569-7.Detail
PRAŽÁK, D., OHLÍDAL, M. Autocorrelation function of sum of two laser spectrally decorrelated speckle fields-comparison of Fresnel and Fraunhofer approximation. 2002.Detail
PRAŽÁK, D.; OHLÍDAL, M. Autocorrelation function of sum of two spectrally decorrelated laser speckle fields - Comparison of Fresnel and Fraunhofer approximation. In Proceedings of SPIE. 13th Polish-Czech-Slovak on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE-The International Society for Optical Engineering, 2003. p. 113-120. ISBN: 0-8194-5146-0.Detail
OHLÍDAL, I.; OHLÍDAL, M.; KLAPETEK, P.; ČUDEK, V.; JÁKL, M. Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry. In Proceedings of SPIE. Proceedings of SPIE. Wave-Optical Systems Engineering II. Bellingham, Washington, USA: SPIE-The International Society for Optical Engineering, 2003. p. 260-271. ISBN: 0-8194-5055-3. ISSN: 0277-786X.Detail
PÁLENÍKOVÁ, K.; OHLÍDAL, M. Potentialities of optical profilometer MicroProf FRT for surface quality measurement. In 14 th Slovak-Czech Polish Conference on Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. Bellingham, Washington, USA: SPIE - The internationalSociety for Optical Engineering, 2005. p. 59451O-1 (59451O-6 p.)ISBN: 0-8194-5951-8. ISSN: 0277-786X.Detail
OHLÍDAL, M.; ŠÍR, L.; JÁKL, M.; OHLÍDAL, I. Digital two-wavelength holographic interference microscopy for surface roughness measurement. In 14 th Slovak-Czech Polish Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005. p. 59450I-1 (59450I-8 p.)ISBN: 0-8194-5951-8.Detail
OHLÍDAL, M. COMPARISON OF THE 2-DIMENSIONAL FRAUNHOFER AND THE 2-DIMENSIONAL FRESNEL APPROXIMATIONS IN THE ANALYSIS OF SURFACE-ROUGHNESS BY ANGLE SPECKLE CORRELATION .1. THEORY. Journal of Modern Optics, 1991, vol. 42, no. 10, p. 2115-2135. ISSN: 0950-0340.Detail
OHLÍDAL, M., OHLÍDAL, I., FRANTA, D., KRÁLÍK, T., JÁKL, M., ELIÁŠ, M. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method. Surface and Interface Analysis, 2002, vol. 34, no. 1, p. 660 ( p.)ISSN: 0142-2421.Detail
OHLÍDAL, M., OHLÍDAL, I., KLAPETEK, P., JÁKL, M., ČUDEK, V., ELIÁŠ, M. New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters. Japanese Journal of Applied Physics, 2003, vol. 2003, no. 7B, p. 4760 ( p.)ISSN: 0021-4922.Detail
OHLÍDAL, M., PRAŽÁK, D. Digital laser speckle spectral correlation within the famework of the Fresnel approximation of the scalar Kirchhoff theory and its application in surface roughness measurement. Journal of Modern Optics, 2003, vol. 2003, no. 14, p. 2133 ( p.)ISSN: 0950-0340.Detail
VALÍČEK, J.; HLOCH, S.; DRŽÍK, M.; OHLÍDAL, M.; MÁDR, V.; LUPTÁK, M.; RADVANSKÁ, A. An Investigation of Surfaces Generated by Abrasive Waterjets Using Optical Detection. STROJNISKI VESTNIK-JOURNAL OF MECHANICAL ENGINEERING, 2007, vol. 53, no. 4/07, p. 1-9. ISSN: 0039-2480.Detail
OHLÍDAL, M., PÁLENÍKOVÁ, K. Možnosti optického profilometru MicroProf FRT při 3D hodnocení kvality povrchu. 2004, roč. 49, č. 9, s. 251 ( s.)ISSN: 0447-6411.Detail
FRANTA, D., OHLÍDAL, I., KLAPETEK, P.,OHLÍDAL, M. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis, 2004, vol. 36, no. 8, p. 1203-1206. ISSN: 0142-2421.Detail
OHLÍDAL, M.; JÁKL, M.; KRŠEK, J.; LENK, J.; ŠÍR, L.: DLHIM; Digitální laserový holografický interferenční mikroskop. ÚFI, laboratoř koherenční optiky, A2/218. (funkční vzorek)Detail
ŠŤASTNÝ, J.: Regression; Regresní analýza. VUT FSI ÚAI. URL: http://www.uai.fme.vutbr.cz/~stastny/. (software)Detail