Detail projektu

Výzkum moderních součástek pro globální komunikace

Období řešení: 01.01.1998 — 31.12.2000

Zdroje financování

Ministerstvo školství, mládeže a tělovýchovy ČR - KONTAKT

- plně financující

O projektu

Popis anglicky
The project is oriented on theoretical and experimental study of quality and reliability indicators of active and passive components for global communications. These indicators are determined from transport and noise characteristics. On the base of theoretical analysis the choice of excess current and excess noise parameters was made. Experiments are performed on submicron HEMT devices, thick film resistors and miniature tantalum and ceramic capacitors.

Označení

ME 285

Originální jazyk

čeština

Řešitelé

Šikula Josef, prof. Ing. RNDr., DrSc. - hlavní řešitel

Útvary

Fakulta stavební
- odpovědné pracoviště (01.01.1989 - nezadáno)

Výsledky

ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. p. 89 ( p.)ISBN: 80-214-143.
Detail

PAVELKA, J., TANUMA, N., TACANO, M., ŠIKULA, J., MUSHA, T. Temperature dependence of 1/f noise in p- and n-InGaAs/InAlAs heterostructures. Research Bulletin of Meisei University – Physical Sciences and Engineering, 2004, vol. 40, no. 1, p. 87 ( p.)ISSN: 1346-7239.
Detail

ŠIKULA, J. Chybí název. In CARTS-EUROPE 99. East Sussex,England: ECII Ltd., 1999. p. 147 ( p.)ISBN: 80-01-0195.
Detail

ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. p. 130 ( p.)ISBN: 1-874612-2.
Detail

ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. p. 218 ( p.)ISBN: 1-874612-2.
Detail

PAVELKA, J. Self-Healing Processes in Tantalum Capacitors. In Proceedings of Student EEICT 2002. Student EEICT 2002 vol.2. Brno: FEKT VUT Brno, 2002. p. 239 ( p.)ISBN: 80-214-2116-9.
Detail

HÁJEK, K., ŠIKULA, J. Passive Component Non-Linearity and a Quality of Electrical filters. In Proceedings of CARTS 2002. Huntsville, Alabama: Components Technology Institute, Inc., 2002. p. 95 ( p.)ISBN: 0887-7491.
Detail

TACANO, M., TANUMA, N., YOKOKURA, S., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T. Evaluation of Ni/n-SiC ohmic contacts by current noise measurements. In Proceedings of the 16th Int Conf Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, USA: World Scientific, 2001. p. 119 ( p.)ISBN: 981-02-4677-3.
Detail

YOKOKURA, S., TANUMA, N., TACANO, M., HASHIGUCHI, S., ŠIKULA, J. Fully computer-controlled battery power source for low-frequency noise measurements. In Proceedings of the 16th Int. Conf. Noise in Physical Systems and 1/f Noise Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 721 ( p.)ISBN: 981-02-4677-3.
Detail

ALIWI, I., CHOBOLA, Z., ŠIKULA, J. Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells. In Proceedings of the 16th Int. Conf. Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 739 ( p.)ISBN: 981-02-4677-3.
Detail

VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J. Failure Modes of Tantalum Capacitors Made by Different Technologies. In Proceedings of CARTS-Europe 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. p. 76 ( p.)
Detail

ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. In Proceedings of CARTS-Euro 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. p. 81 ( p.)
Detail

PAVELKA, J. Burst noise in thin amorphous films. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. p. 105 ( p.)ISBN: 80-214-1992-X.
Detail

PAVELKA, J., ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Thin Ta2O5 Amorphous Films. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 91 ( p.)ISBN: 981-02-4677-3.
Detail

ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. The Tantalum Capacitor as a MIS Structure in Reverse Mode. In Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. p. 289 ( p.)ISBN: 0887-7491.
Detail

REYNOLDS, C., VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J. Failure Modes of Tantalum Capacitors Made by Different Technologies. In Proceedings of 21st Capacitor and Resistor Technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. p. 271 ( p.)ISBN: 0887-7491.
Detail

HRUŠKA, P. Noise reliability indicators for PN junction devices. In Nové trendy ve fyzice. Vysoké učení technické v Brně, Fakulta elektrotechniky a informatiky, Ústav fyziky,Brno: VUT Brno, 2001. p. 80 ( p.)ISBN: 80-214-1992-X.
Detail

TANUMA, N., YASUKAWA, S., YOKOKURA, S., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T., TACANO, M. Electron Cyclotron Resonance Plasma Etching of n-SiC and Evaluation of Ni/n-SiC Contacts by Current Noise Measurements. Japanese Journal of Applied Physics, 2001, vol. 40, no. 6A, p. 3979 ( p.)ISSN: 0021-4922.
Detail

PAVELKA, J., ŠIKULA, J., GRMELA, L., TACANO, M., HASHIGUCHI, S. Noise and Self-Healing of Tantalum Capacitors. Capacitor and Resistor Technology, 2002, vol. 2002, no. 4/2002, p. 181 ( p.)ISSN: 0887-7491.
Detail

ANDO, M., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T. Dependence of Hooge parameter of InAs heterostructure on temperature. Microelectronics Reliability, 2000, vol. 40, no. 11, p. 1921 ( p.)ISSN: 0026-2714.
Detail

ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. p. 93 ( p.)ISBN: 80-214-143.
Detail

Odpovědnost: Šikula Josef, prof. Ing. RNDr., DrSc.