Publications

• 2021

  ŘIHÁČEK, T.; HORÁK, M.; SCHACHINGER, T.; MIKA, F.; MATĚJKA, M.; KRÁTKÝ, S.; FOŘT, T.; RADLIČKA, T.; JOHNSON, C.; NOVÁK, L.; SEĎA, B.; MCMORRAN, B.; MÜLLEROVÁ, I. Beam shaping and probe characterization in the scanning electron microscope. Ultramicroscopy, 2021, vol. 225, no. 1, p. 1-9. ISSN: 0304-3991.
  Detail | WWW

• 2020

  MATERNA MIKMEKOVÁ, E.; MÜLLEROVÁ, I.; FRANK, L.; POLČÁK, J.; SLUYTERMAN, S.; LEJEUNE, M.; KONVALINA, I. Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2020, vol. 241, no. 1, p. 1-7. ISSN: 0368-2048.
  Detail | WWW | Full text in the Digital Library

• 2019

  KONVALINA, I.; MIKA, F.; KRÁTKÝ, S.; MATERNA MIKMEKOVÁ, E.; MÜLLEROVÁ, I. In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM. Materials, 2019, vol. 12, no. 14, ISSN: 1996-1944.
  Detail

• 2013

  MIKMEKOVÁ, E.; POLČÁK, J.; SOBOTA, J.; MÜLLEROVÁ, I.; PEŘINA, V.; CAHA, O. Humidity resistant hydrogenated carbon nitride films. Applied Surface Science, 2013, vol. 275, no. 1, p. 7-13. ISSN: 0169- 4332.
  Detail

• 2011

  MIKMEKOVÁ, Š.; MAN, O.; PANTĚLEJEV, L.; HOVORKA, M.; MÜLLEROVÁ, I.; FRANK, L.; KOUŘIL, M. Strain mapping by Scanning Low Energy Electron Microscopy. Key Engineering Materials, 2011, vol. 465, no. 1, p. 338-341. ISSN: 1013- 9826.
  Detail

• 2010

  MIKMEKOVÁ, Š.; HOVORKA, M.; MÜLLEROVÁ, I.; MAN, O.; PANTĚLEJEV, L.; FRANK, L. Grain Contrast Imaging in UHV SLEEM. MATERIALS TRANSACTIONS, 2010, vol. 51, no. 2, p. 292-296. ISSN: 1345- 9678.
  Detail

  MIKMEKOVÁ, Š.; MAN, O.; PANTĚLEJEV, L.; HOVORKA, M.; MÜLLEROVÁ, I.; FRANK, L.; KOUŘIL, M. Strain mapping by scanning low energy electron microscopy. 6th International Conference on Materials Structure & Micromechanics of Fracture. MSMF. Brno: VUTIUM Brno, 2010. p. 177-177. ISBN: 978-80-214-4112- 5.
  Detail

• 2009

  MIKMEKOVÁ, Š.; HOVORKA, M.; MÜLLEROVÁ, I.; FRANK, L.; MAN, O.; PANTĚLEJEV, L. Study of the microstructure of UFG copper in UHV SLEEM. Mikroscopia 2009. Brno, CZ: Tribun EU s.r.o., 2009. p. 8-8. ISBN: 978-80-7399-739- 7.
  Detail

  MIKMEKOVÁ, Š.; HOVORKA, M.; MÜLLEROVÁ, I.; FRANK, L.; MAN, O.; PANTĚLEJEV, L. Microstructure of ultra- fine grained Cu by UHV SLEEM. MC 2009 GRATZ. Materials Science. Gratz: Verlag der TU Gratz, 2009. p. 515-516. ISBN: 978-3-85125-062- 6.
  Detail

  MIKMEKOVÁ, Š.; HOVORKA, M.; MÜLLEROVÁ, I.; FRANK, L.; MAN, O.; PANTĚLEJEV, L. Study of the microstructure of the UFG Copper in UHV SLEEM. Nanostructure of Advanced Materials and Nanotechnology. Brno, CZ: Institute of Scientific Instruments ASCR, v.v.i., 2009. p. 19-19. ISBN: 978-80-254-4535- 8.
  Detail

• 2007

  FRANK, L.; MIKA, F.; HOVORKA, M.; VALDAITSEV, D.; SCHÖNHENSE, G.; MÜLLEROVÁ, I. Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons. 2007, vol. 48, no. 5, p. 936 ( p.)
  Detail

• 2006

  P. Wandrol, I. Müllerová. Detection of Signal Electrons in the Low Voltage SEM. In Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Ústav přístrojové techniky AV ČR, 2006. p. 71 ( p.)ISBN: 80-239-6285- X.
  Detail

  MÜLLEROVÁ, I., KONVALINA I. Multi-Channel Detection of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope. MICROSCOPY AND MICROANALYSIS, 2006, vol. 12, no. 2, p. 1438 ( p.)ISSN: 1431- 9276.
  Detail

  MÜLLEROVÁ, I.; KONVALINA, I.; POKORNÁ, Z. Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope. In 6th Japanese- Polish Joint Seminar on Materials Analysis. Toyama: 2006. p. 13 ( p.)ISBN: 4-9903248-0- 3.
  Detail

• 2005

  KÁŇOVÁ, J.; ZOBAČ, M.; ORAL, M.; MÜLLEROVÁ, I.; FRANK, L. Corrections of Magnification and Focusing in a Cathode Lens- Equipped Scanning Electron Microscope. SCANNING, 2005, vol. 28, no. 3, p. 155-163. ISSN: 0161- 0457.
  Detail

  KONVALINA, I.; MÜLLEROVÁ, I. Factors affecting the Collection Efficiency of Secondary Electrons in SEM. In Proceedings - Microscopy Conference 2005 - Dreiländertagung /6./. Microscopy Conference 2005. DAVOS: 2005. p. 48 ( p.)ISSN: 1019- 6447.
  Detail

  KONVALINA, I.; MÜLLEROVÁ, I. Sběrová účinnost ET detektoru sekundárních elektronů v REM. 2005.
  Detail

• 2004

  HRNČIŘÍK, P., MULLEROVÁ, I. Very Low Energy Scanning Electron Microscope. GIT Imaging& Microscopy, 2004, vol. 6, no. 4, p. 47 ( p.)ISSN: 1439- 4243.
  Detail

  HRNČIŘÍK, P., MULLEROVÁ, I. Very low energy scanning transmission electron microscopy. In Proceedings of EMC 2004. Antwerpy, Belgie: EMC 2004, 2004. p. P02 ( p.)
  Detail

  HRNČIŘÍK, P., MULLEROVÁ, I. Very Low Energy Scanning Electron Microscopy. In Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Ústav přístrojové techniky AV ČR, 2004. p. 33 ( p.)ISBN: 80-239-3246- 2.
  Detail

  HRNČIŘÍK, P., MULLEROVÁ, I. EXAMINATION OF NANOSTRUCTURES BY ELECTRON BEAM. Electron Probe Microanalysis Today. Slovinsko: Department for Nanostructured Materials, Jožef Stefan Institute, 2004. p. 139 ( p.)
  Detail

  KONVALINA, I., MÜLLEROVÁ, I. Collection Efficiency of the Detector of Secondary Electrons in SEM. In Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: 2004. p. 41 ( p.)ISBN: 80-239-3246- 2.
  Detail

  KONVALINA, I.; MÜLLEROVÁ, I.; FRANK, L. Influence of magnetic and electrostatic fields in the specimen vicinity on trajectories of secondary electrons in SEM. In Autumn School on Materials Science and Electron Microscopy 2004 - Emerging Microscopy for Advanced Materials Development: Imaging and Spectroscopy on Atomic Scale. BERLIN: 2004. p. 24 ( p.)
  Detail

  KONVALINA, I.; MÜLLEROVÁ, I. Účinnost sběru sekundárních elektronů v REM. In 2004.
  Detail

  FRANK, L.; MÜLLEROVÁ, I.; NOVÁK, L.; HORÁČEK, M.; KONVALINA, I. A method for objective quantification of the efficiency of electron detectors. In In EMC 2004 - Proceedings of the 13th European Microscopy Congress. Antwerpy: 2004. p. 67 ( p.)
  Detail

  KONVALINA, I.; MÜLLEROVÁ, I.; FRANK, L. The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM. In EMC 2004 - Proceedings of the 13th European Microscopy Congress. Antwerpy: 2004. p. 79 ( p.)
  Detail

• 2003

  MIKA, F.; RYŠÁVKA, J.; LOPOUR, F.; ZADRAŽIL, M.; MÜLLEROVÁ, I.; FRANK, L. Computer Controlled Low Energy SEM. 2003, vol. 9, no. 3, p. 116 ( p.)
  Detail

  FRANK, L., MATSUDA, K., HRNČIŘÍK, P., MULLEROVÁ, I. Low Energy Contrasts of a Metal Matrix Composite in SEM. 2003, vol. 9, no. 3, p. 328 ( p.)
  Detail

  KONVALINA, I.; MÜLLEROVÁ I. Efficiency of Collection of the Secondary Electrons in SEM. MICROSCOPY AND MICROANALYSIS, 2003, vol. 9, no. 3, p. 108 ( p.)ISSN: 1431- 9276.
  Detail

*) Publications are generated once a 24 hours.