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2023
KASPAR, P.; KOKTAVÝ, P.; GRMELA, L.; SEDLÁK, P.; TRČKA, T.; MAJZNER, J. Physics 1 - Laboratory Exercise Manual. Brno: 2023.Detail
2020
PAPEŽ, N.; GAJDOŠ, A.; DALLAEV, R.; SOBOLA, D.; SEDLÁK, P.; MOTÚZ, R.; NEBOJSA, A.; GRMELA, L. Performance analysis of GaAs based solar cells under gamma irradiation. Applied Surface Science, 2020, no. 510, p. 265-272. ISSN: 0169-4332.Detail | WWW
KASPAR, P.; SOBOLA, D.; ČÁSTKOVÁ, K.; KNÁPEK, A.; BURDA, D.; ORUDZHEV, F.; DALLAEV, R.; TOFEL, P.; TRČKA, T.; GRMELA, L.; HADAŠ, Z. Characterization of Polyvinylidene Fluoride (PVDF) Electrospun Fibers Doped by Carbon Flakes. Polymers, 2020, vol. 12, no. 12, p. 2766-1 (2766-15 p.)ISSN: 2073-4360.Detail | WWW | Full text in the Digital Library
MOUSA, M.; KNÁPEK, A.;GRMELA, L. Similarities and Differences between Two Researches in Field Electron Emission: A Way to Develop a More Powerful Electron Source. JORDAN JOURNAL OF PHYSICS, 2020, vol. 13, no. 2, p. 171-179. ISSN: 1994-7607.Detail | WWW
MOUSA, M.; KNÁPEK, A.; GRMELA, L. Similarities and Differences between Two Researches in Field Emission of Electrons: A Way to Develop More Powerful Electron Source. Jordan Journal of Physics, 2020, vol. 13, no. 2, p. 171-179. ISSN: 1994-7615.Detail | WWW
PAPEŽ, N.; GAJDOŠ, A.; SOBOLA, D.; DALLAEV, R.; ŠKARVADA, P.; MACKŮ, R.; GRMELA, L. Effect of gamma radiation on properties and performance of GaAs based solar cells. Applied Surface Science, 2020, vol. 527, no. 146766, p. 135-146. ISSN: 0169-4332.Detail | WWW
2019
KASPAR, P.; SOBOLA, D.; SEDLÁK, P.; HOLCMAN, V.; GRMELA, L. Analysis of Color Shift on Butterfly Wings by Fourier Transform of Images from Atomic Force Microscopy. MICROSCOPY RESEARCH AND TECHNIQUE, 2019, no. 1, p. 1-7. ISSN: 1097-0029.Detail | WWW
SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S. Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE-POLAND, 2019, vol. 37, no. 2, p. 206-211. ISSN: 2083-134X.Detail | WWW | Full text in the Digital Library
DALLAEV, R.; STACH, S.; TALU, S.; SOBOLA, D.; MÉNDEZ-ALBORES, A.; TREJO, G.; GRMELA, L. Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals. Silicon, 2019, vol. 11, no. 1, p. 1-15. ISSN: 1876-990X.Detail | WWW
KASPAR, P.; ŠKARVADA, P.; HOLCMAN, V.; GRMELA, L. Characterization of argon etched Ta2O5 thin films. Applied Physics A, 2019, vol. 125, no. 820, p. 1-7. ISSN: 0947-8396.Detail | WWW
KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L. Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. Applied Surface Science, 2019, vol. 493, no. 1, p. 673-678. ISSN: 0169-4332.Detail | WWW
2018
ŠIK, O.; ŠKVARENINA, Ľ.; CAHA, O.; MORAVEC, P.; ŠKARVADA, P.; BELAS, E.; GRMELA, L. Determining the sub-surface damage of CdTe single crystals after lapping. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, vol. 29, no. 11, p. 9652-9662. ISSN: 0957-4522.Detail | WWW
ŠIK, O.; BÁBOR, P.; POLČÁK, J.; BELAS, E.; MORAVEC, P.; GRMELA, L.; STANĚK, J. Low Energy Ion Scattering as a depth profiling tool for thin layers - Case of bromine Methanol etched CdTe. Vacuum, 2018, no. 152, p. 138-144. ISSN: 0042-207X.Detail | WWW
PAPEŽ, N.; SOBOLA, D.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Applied Surface Science, 2018, no. 461, p. 212-220. ISSN: 0169-4332.Detail
2017
SOBOLA, D.; TALU, S.; SOLAYMANI, S.; GRMELA, L. INFLUENCE OF SCANNING RATE ON QUALITY OF AFM IMAGE: STUDY OF SURFACE STATISTICAL METRICS. Microscopy research and technique, 2017, vol. 80, no. 7, p. 1-11. ISSN: 1059-910X.Detail | WWW
PAPEŽ, N.; SOBOLA, D.; ŠKARVADA, P.; ŠKVARENINA, Ľ.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Progress in Applied Surface, Interface and Thin Film Science - Solar Renewable Energy News 2017. Bratislava: Comenius University, 2017. p. 105-105. ISBN: 978-80-223-4411-1.Detail
SOBOLA, D.; TALU, S.; SADOVSKÝ, P.; PAPEŽ, N.; GRMELA, L. Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures. Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk), 2017, vol. 3, no. 15, p. 569-576. ISSN: 1804-3119.Detail | WWW
KUPAROWITZ, M.; SEDLÁKOVÁ, V.; GRMELA, L. LEAKAGE CURRENT DEGRADATION DUE TO ION DRIFT AND DIFFUSION IN TANTALUM AND NIOBIUM OXIDE CAPACITORS. METROL MEAS SYST, 2017, vol. 24, no. 2, p. 255-264. ISSN: 0860-8229.Detail | WWW
2016
JURČÍK, M.; GRMELA, L. Automated Electrochemical Etching Prototype for Cold Field Emission Cathodes. In Proceedings of the 22nd Conference STUDENT EEICT 2016. Brno: VUTIUM, 2016. p. 300-305. ISBN: 978-80-214-5350- 0.Detail
ŠKARVADA, P.; ŠKVARENINA, Ľ.; TOMÁNEK, P.; SOBOLA, D.; MACKŮ, R.; BRÜSTLOVÁ, J.; GRMELA, L.; SMITH, S. Multiscale experimental characterization of solar cell defects. In 20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. SPIE Proceedings. Bellingham, USA: SPIE, 2016. p. 101420U1 (101420U7 p.)ISBN: 9781510607330. ISSN: 0277-786X.Detail
ŠIK, O.; BÁBOR, P.; ŠKARVADA, P.; POTOČEK, M.; TRČKA, T.; GRMELA, L.; BELAS, E. Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties. Surface and Coatings Technology, 2016, vol. 306, no. A, p. 75-81. ISSN: 0257-8972.Detail | WWW
KASPAR, P.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Changes in Optical Properties of Biological Tissue: Experiment and Monte Carlo Simulation. In Proceedings of SPIE 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. Bellingham, USA: SPIE, 2016. p. 101420R1 (101420R6 p.)ISBN: 9781510607330. ISSN: 0277-786X.Detail | WWW
KASPAR, P.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Angular absorption of light used for evaluation of structural damage to porcine meat caused by aging, drying and freezing. MEAT SCIENCE, 2016, no. 126, p. 22-28. ISSN: 0309-1740.Detail | WWW
2015
DALLAEVA, D.; RAMAZANOV, S.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Local topography of optoelectronic substrates prepared by dry plasma etching process. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 9442081-9442086. ISSN: 0277-786X.Detail
DALLAEVA, D.; TOMANEK, P.; PROKOPYEVA, E.; KASPAR, P.; GRMELA, L.; SKARVADA, P. AFM imaging of natural optical structures. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 944209-1 (944209-8 p.)ISSN: 0277-786X.Detail
DALLAEVA, D.; TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Realization of microscale detection and localization of low light emitting spots in monocrystalline silicon solar cells. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 94501O-1 (94501O-7 p.)ISSN: 0277-786X.Detail
KASPAR, P.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Optical scattering in muscle tissue and its utilisation. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 94420I1 (94420I7 p.)ISSN: 0277-786X.Detail | WWW
PROKOPYEVA, E.; KASPAR, P.; TOMÁNEK, P.; GRMELA, L. Optical properties of metal nanoparticles used in biosensors. Proceedings of SPIE, 2015, vol. 9442, no. 944217, p. 944217-1 (944217-7 p.)ISSN: 0277-786X.Detail | WWW
KUBERSKÝ, P.; SEDLÁK, P.; HAMÁČEK, A.; NEŠPŮREK, S.; KUPAROWITZ, T.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V.; GRMELA, L.; SYROVÝ, T. Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors. Chemical Physics, 2015, vol. 456, no. 1, p. 111-117. ISSN: 0301-0104.Detail | WWW
STACH, S.; DALLAEVA, D.; TALU, S.; KASPAR, P.; TOMÁNEK, P.; GIOVANZANA, S.; GRMELA, L. Morphological features in aluminum nitride epilayers prepared by magnetron sputtering. MATERIALS SCIENCE-POLAND, 2015, vol. 33, no. 1, p. 175-184. ISSN: 0137-1339.Detail | WWW | Full text in the Digital Library
TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L. Microscale localization and detection of defects in crystalline silicon solar cells. DGaO- PROCEEDINGS, 2015, vol. 2015, no. 2015, p. 1-2. ISSN: 1614- 8436.Detail | WWW
ŠKARVADA, P.; ŠKVARENINA, Ľ.; SOBOLA, D.; MACKŮ, R.; TOMÁNEK, P.; GRMELA, L. Multiscale characterization of solar cells. In Progress in Applied Surface, Interface and Thin-film Science 2015. Bratislava, Slovensko: Comenius University, 2015. p. 148-151. ISBN: 978-80-223-3975-9.Detail
JURČÍK, M.; GRMELA, L. TUNGSTEN WIRE SURFACE CLEANING USING ELECTROPOLISHING PROCESS. In Proceedings of the 21st Competition Conference STUDENT EEICT 2015. Brno: VUTIUM, 2015. p. 516-520. ISBN: 978-80-214-5148- 3.Detail | WWW
ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P. SEM and AFM imaging of solar cells defects. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 1-6. ISSN: 0277-786X.Detail
2014
ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; SMITH, S.; GRMELA, L. A variety of microstructural defects in crystalline silicon solar cells. Applied Surface Science, 2014, vol. 312, no. 312, p. 50-56. ISSN: 0169-4332.Detail | WWW
DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; RAMAZANOV, S. Interferometry and Atomic force microscopy of substrates for optoelectronics proceeded by dry plasma etching. In 2014 International Symposium on Optomechatronic Technologies (ISOT 2014). Proceedings. The Computer Security Foundations Workshop III. Los Alamitos, CA, USA: IEEE Computer Society Press, 2014. p. 283-287. ISBN: 978-1-4799-6666-0. ISSN: 1063-6900.Detail
DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Applied Surface Science, 2014, vol. 312, no. 312, p. 81-86. ISSN: 0169-4332.Detail
2013
ANDREEV, A.; ŠIK, O.; GRMELA, L.; ŠIKULA, J. Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise. METROL MEAS SYST, 2013, vol. 2013, no. 3, p. 385-394. ISSN: 0860- 8229.Detail | WWW
TOMÁNEK, P.; MACKŮ, R.; ŠKARVADA, P.; GRMELA, L. Kalibrační přístroj regulačních systémů digitálně řízených pohonů. Brno: UFYZ FEKT VUT, 2013. p. 1-6. Detail
TOMÁNEK, P.; ŠKARVADA, P.; DALLAEVA, D.; GRMELA, L.; MACKŮ, R.; SMITH, S. Cold field emission electrode as a local probe of proximal microscopes- Investigation of defects in monocrystalline silicon solar cells. WORLD JOURNAL OF ENGINEERING, 2013, vol. 10, no. 2, p. 119-124. ISSN: 1708- 5284.Detail
ŠIK, O.; GRMELA, L.; ŠIKULA, J. Contacts charge transport and additional noise properties of semiconductor CdTe sensors. In Proceedings of the 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC). Bangkok, Thailand: IEEE Thailand Section, 2013. p. 1-4. ISBN: 978-1-4673-5694- 7.Detail | WWW
ŠIK, O.; ŠKARVADA, P.; GRMELA, L.; ELHADIDY, H.; VONDRA, M.; ŠIKULA, J.; FRANC, J. Contact Quality Analysis and Noise Sources Determination of CdZnTe- Based High Energy Photon Detectors. Physica Scripta, 2013, vol. 85, no. 03, p. 1-5. ISSN: 0031- 8949.Detail | WWW
ŠIK, O.; GRMELA, L.; ELHADIDY, H.; DĚDIČ, V.; ŠIKULA, J.; GRMELA, P.; FRANC, J.; ŠKARVADA, P.; HOLCMAN, V. Study of Electric Field Distribution and Low Frequency Noise of CdZnTe Radiation Detectors. Journal of Instrumentation, 2013, vol. 6, no. 23, p. 1-6. ISSN: 1748-0221.Detail | WWW
PROKOPYEVA, E.; TOMÁNEK, P.; KOCOVÁ, L.; PALAI-DANY, T.; BALÍK, Z.; ŠKARVADA, P.; GRMELA, L. Comparison of optical and electrical investigations of meat ageing. Proceedings of SPIE, 2013, vol. 8774, no. 8774, p. 84471L1 (84471L8 p.)ISSN: 0277-786X.Detail
KNÁPEK, A.; SERGEEV, E.; GRMELA, L. Electrical Characterization of Cold Field-Emission Cathodes based on Fowler- Nordheim Analysis. In Electronic Devices and Systems - IMAPS CS International Conference 2013. Brno: Vysoké učení technické v Brně, 2013. p. 104-108. ISBN: 978-80-214-4754- 7.Detail
GRMELA, L.; ŠIK, O. Metal- Semiconductor Junction Role in CdTe Detectors. Acta Electrotechnica et Informatica, 2013, vol. 13, no. 1, p. 22-25. ISSN: 1335- 8243.Detail | WWW
KNÁPEK, A.; GRMELA, L. Technologie výroby studenoemisních katod na bázi wolframu s tenkou povrchovou vrstvou epoxidu. Chemické listy, 2013, vol. 2013, no. 107, p. 545-549. ISSN: 1213- 7103.Detail | WWW
ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; TOFEL, P.; ŠEVČÍK, M.; MACKŮ, R. Fluctuations of ultrasonic transducer vibration measurement. In 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N- USB. Montpellier: 2013. p. Th-P-48- 1 (Th-P-48-4 p.)ISBN: 978-1-4799-0670- 3.Detail
SERGEEV, E.; KNÁPEK, A.; GRMELA, L.; ŠIKULA, J. Noise Diagnostic Method of Experimental Cold Field- Emission Cathodes. 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N- USB. Montpellier: 2013. p. Th-P- 9 (Th-P-9 p.)ISBN: 978-1-4799-0670- 3.Detail
ŠIK, O.; TRČKA, T.; GRMELA, L.; VONDRA, M. " Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors. In Proc. of the Second Intl. Conf. on Advances in Electronic Devices and Circuits. 1. Kuala Lumpur, Malaisie: Institute of Research Engineers and Doctors, 2013. p. 60-63. ISBN: 978-981-07-6261- 2.Detail
ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Optical and electrical detection and localization of solar cell defects on microscale. Proceedings of SPIE, 2013, vol. 8825, no. 8825, p. 8825071-88255077. ISSN: 0277- 786X.Detail
ŠIK, O.; TRČKA, T.; GRMELA, L.; VONDRA, M. Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors. International Journal of Advancements in Electronics and Electrical Engineering, 2013, vol. 3, no. 1, p. 60-63. ISSN: 2319- 7498.Detail
ŠKARVADA, P.; KOKTAVÝ, P.; SMITH, S.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; TOMÁNEK, P.; GRMELA, L. Microstructure defects in silicon solar cells. In Proceedings of 8th Solid state surfaces and intefaces. 1. Bratislava: Comenius University Bratislava, 2013. p. 168-169. ISBN: 978-80-223-3501- 0.Detail
DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; TALU, M.; GRMELA, L. AFM imaging and fractaí analysis of surface roughness of AlN epilayers deposited on saphire substrate. In Proceedings of 8th Solid State Surfaces and Interfaces. Bratislava: Comenius University, 2013. p. 33-34. ISBN: 978-80-223-3501- 0.Detail
PAVELKA, J.; ŠIKULA, J.; TACANO, M.; CHVÁTAL, M.; DALLAEVA, D.; GRMELA, L. Noise sources in interface between mono- crystalline and amorphous semiconductors. In Proceedings of 8th solid state surfaces and interfaces. Bratislava: Comenius University, 2013. p. 128-129. ISBN: 978-80-223-3501- 0.Detail
ŠIK, O.; GRMELA, L. Photoconductivity of CdTe Semiconductor Radiation Detectors. International Journal of Computer Science and Electronics Engineering, 2013, vol. 1, no. 5, p. 31-34. ISSN: 2320- 401X.Detail
SITA, Z.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J.; GRMELA, L. Analysis of noise and non-linearity of I- V characteristics of positive temperature coefficient chip thermistors. METROL MEAS SYST, 2013, vol. XX, no. 4, p. 635-644. ISSN: 0860- 8229.Detail
TOMÁNEK, P.; MACKŮ, R.; ŠKARVADA, P.; GRMELA, L. Optimalizace řešení měniče DC/ AC pro podmínky většího počtu DC vstupů. Brno: UFYZ FEKT VUT, 2013. p. 1-6. Detail
ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; DALLAEVA, D. Lokální optoelektronická diagnostika mikroskopických vad v solárním křemíkovém článku. Jemná mechanika a optika, 2013, vol. 2013, no. 3, p. 81-84. ISSN: 0447- 6441.Detail
2012
GRMELA, L.; ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R.; SMITH, S. Local investigation of thermal dependence of light emission from reverse- biased monocrystalline silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2012, vol. 96, no. 1, p. 108-111. ISSN: 0927- 0248.Detail
ŠIK, O.; GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; BELAS, E. Influence of CdTe material ageing on relaxation time and noise. Book of abstracts. Taipei: Academia Sinica, 2012. p. 1 (1 s.). Detail | WWW
KNÁPEK, A.; GRMELA, L.; ŠIKULA, J.; ŠIK, O. Cold field- emission cathode noise analysis. METROL MEAS SYST, 2012, vol. 2012, no. 2, p. 417-422. ISSN: 0860- 8229.Detail | WWW
SERGEEV, E.; KNÁPEK, A.; GRMELA, L. Ultrasharp Field- Emission Cathodes with Epoxy Coating. In New Trends in Physics, NTF 2012, Proceedings of the conference. první. Brno: 2012. p. 161-165. ISBN: 978-80-214-4594- 9.Detail
TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; DALLAEVA, D. Optoelectronic diagnostics of defects in solar cell structures. In Optica and Measurement 2012. Prague: Institute of plasma Physics, 2012. p. 137-140. ISBN: 978-80-87026-02- 1.Detail
SERGEEV, E.; KNÁPEK, A.; MIKMEKOVÁ, Š.; GRMELA, L.; KLAMPÁR, M. Material Characterization of the Epoxy-Coated Cold-Field- Emission Cathodes. In Proceedings of the Scientific Conference Physics of Materials 2012. první. Košice, Slovensko: 2012. p. 109-112. ISBN: 978-80-553-1175- 3.Detail
GRMELA, L. Souhrnná výzkumná zpráva k HS: Vývoj nedestruktivních metod zjišťování poruch ve speciálních polovodičových součástkách v širokém teplotním rozsahu. Brno: 2012. p. 1-5. Detail
GRMELA, L.; HRUŠKA, P. Simulation of quantum dot in electrostatic fields. In Mathematical Methods in Electromagnetic Theory. Kharkiv, Ukraine: 2012. p. 193-196. ISBN: 978-1-4673-4479- 1.Detail
GRMELA, L.; HRUŠKA, P. Simulation of electrostatic field near the surface of very thin tungsten microcathode. In Mathematical Methods in Electromagnetic Theory. Kharkiv, Ukraine: 2012. p. 353-356. ISBN: 978-1-4673-4479- 1.Detail
ŠIK, O.; GRMELA, L.; ELHADIDY, H.; ŠIKULA, J.; FRANC, J. CONTACT QUALITY ANALYSIS AND NOISE SOURCES DETERMINATION OF CDTE BASED DETECTORS DETERMINATION OF CDTE BASED DETECTORS. The 3rd International Conference on the Physics of Optical Materials and Devices BOOK OF ABSTRACTS. 1. Belgrade: Agencija FORMAT, 2012. p. 120-120. ISBN: 978-86-7306-116- 0.Detail | WWW
GRMELA, L.; ŠIK, O.; ŠIKULA, J. Noise Contact Study of CdTe Radiation Detectors. In Proceedings of the Scientific Conference Physics of Materials 2012. první. Košice, Slovensko: 2012. p. 99-104. ISBN: 978-80-553-1175- 3.Detail
ANDREEV, A.; ŠIK, O.; GRMELA, L. Optimization of signal-to- noise ratio in CdTe radiation detectors. In ICNF2011: 2011 21st International Conference on Noise and Fluctuations. 1. Rio de Janeiro, Brazil: IEEE, 2012. p. 1-3. ISBN: 978-1-4577-0191- 7.Detail
GRMELA, L. Nedestruktivní spektroskopické metody testování optoelektronických součástek a materiálů. Vědecké spisy Vysokého učení technického v Brně Edice Habilitační a inaugurační spisy, 2012, vol. 2012, no. 401, p. 1-35. ISSN: 1213- 418X.Detail
TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S. Local investigation of defects in monocrystalline silicon solar cells. Conference Record of the IEEE Photovoltaic Specialists Conference, 2012, vol. 2012, no. 1, p. 1686-1690. ISSN: 0160- 8371.Detail
2011
KNÁPEK, A.; GRMELA, L.; ŠIKULA, J. Noise Characterization of Cold Emission Cathodes with Epoxy Coating. In Proceedings of 5th Annual Internation Travelling Conference for Young Researchers and PhD Students. Prešov: Harmony Apeiron, 2011. p. 521-526. ISBN: 978-80-89347-05- 6.Detail
ŠIK, O.; GRMELA, L. Charge transport properties and low frequency noise of Cadmium- Telluride based radiation detectors. In Proceedings of 5th Annual International Travelling Conference for Young Researchers and PhD Students. Prešov: Harmony Apeiron, 2011. p. 179-184. ISBN: 978-80-89347-05- 6.Detail
ŠKARVADA, P.; GRMELA, L.; TOMÁNEK, P. Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency. Key Engineering Materials, 2011, vol. 465, no. 1, p. 239-242. ISSN: 1013- 9826.Detail
ABUBAKER, H.; TOMÁNEK, P.; GRMELA, L. Measurement of dynamic variations of polarized light in processed meat due to aging. Proceedings of SPIE, 2011, vol. 8073, no. 8073, p. 807331-807336. ISSN: 0277- 786X.Detail
GRMELA, L.; ŠKARVADA, P.; MACKŮ, R.; TOMÁNEK, P. Near- field Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Inventi Rapid: Energy & Power, 2011, vol. 2011, no. 2, p. 1-4. ISSN: 2229- 7774.Detail
KNÁPEK, A.; GRMELA, L.; ŠIKULA, J.; HOLCMAN, V.; DELONG, A. Noise of Cold Emission Cathode. In ICNF2011: 2011 21st International Conference on Noise and Fluctuations. 1. Toronto, Kanada: IEEE, 2011. p. 84-87. ISBN: 978-1-4577-0191- 7.Detail
TOFEL, P.; ŠIKULA, J.; GRMELA, L.; SEDLÁK, P.; MAJZNER, J. Diagnostic of billet surface. In 9 th International Conference NDT 2011. Brno: 2011. p. 1-6. ISBN: 978-80-7204-774- 1.Detail
ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Influence of laser cutting on p- n junction behavior of solar cell. VDI Berichte, 2011, vol. 2156, no. 2156, p. 291-296. ISSN: 0083- 5560.Detail
ANDREEV, A.; ŠIK, O.; GRMELA, L. Transport characteristics of CdTe radiation detectors. In 34nd International Spring Seminar on Electronics Technology. 1. Košice, Slovakia: Prof. Alena Pietriková, 2011. p. 1-3. ISBN: 978-80-553-0646- 9.Detail
ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Local measurement of solar cell emission characteristics. Proceedings of SPIE, 2011, vol. 8036, no. 8306, p. 1H1 (1H6 p.)ISSN: 0277- 786X.Detail
ELHADIDY, H.; ŠIKULA, J.; ŠIK, O.; GRMELA, L.; ZAJAČEK, J. Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals. In 21st International Conference on Noise and Fluctuations. Kanada: IEEE, 2011. p. 1-4. ISBN: 978-1-4577-0191- 7.Detail
HRUŠKA, P.; GRMELA, L. Simulování chování kvantové tečky v elektrostatickém poli. Jemná mechanika a optika, 2011, vol. 56, no. 7- 8, p. 216-219. ISSN: 0447- 6441.Detail
KNÁPEK, A.; GRMELA, L. Stability Analysis of Cold- Emission Cathodes with Epoxy Coating. ElectroScope - http://www.electroscope.zcu. cz, 2011, vol. 2011, no. 2, p. 1-5. ISSN: 1802- 4564.Detail | WWW
2010
TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Local optical and electric characteristics of solar cells. In Ninth International Conference on Correlation Optics. Proceedings of SPIE. Bellingham, USA: SPIE, 2010. p. 73880L1 (73880L9 p.)ISBN: 978-0-8194-7671- 5. ISSN: 0277-786X.Detail
ANDREEV, A.; ŠIK, O.; GRMELA, L. Noise spectroscopy of high resistance CdTe detectors. In 33rd International Spring Seminar on Electronics Technology. Warsaw: Piotr Firek, 2010. p. 63-64. ISBN: 978-83-7207-874-2.Detail
KNÁPEK, A.; GRMELA, L. Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer. In IMAPS CS International Conference 2010 - Proceedings. Brno: Brno University of Technology, 2010. p. 156-160. ISBN: 978-80-214-4138- 5.Detail
TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; GRMELA, L. Detection and localization of defects in monocrystalline silicon solar cell. Advances in Optical Technologies, 2010, vol. 2010, no. 805325, p. 8053251-8053255. ISSN: 1687-6393.Detail
KNÁPEK, A.; KRČÁL, O.; GRMELA, L. Schottky Nano- Tip Cathodes Fabrication and Diagnostics. ElectroScope - http://www.electroscope.zcu. cz, 2010, vol. 2010, no. 1, p. 1-4. ISSN: 1802- 4564.Detail | WWW
ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency. Materials structure and micromechanics of fracture. Brno: Vutium, 2010. p. 160-160. ISBN: 978-80-214-4112- 5.Detail
ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Microscale localization of low light emitting spots in reversed- biased silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2010, vol. 94, no. 12, p. 2358-2361. ISSN: 0927- 0248.Detail
HOLCMAN, V.; GRMELA, L.; LIEDERMANN, K. New Mixing Rules for Composite Polymer Materials. IEEJ Transactions on Electrical and Electronic Engineering, 2010, vol. 5, no. 4, p. 381-385. ISSN: 1931- 4973.Detail
TOMÁNEK, P.; MIKLÁŠ, J.; ABUBAKER, H.; GRMELA, L. Optical sensing of polarization states changes in meat due to the ageing. AIP conference proceedings, 2010, vol. 1288, no. 1, p. 127-131. ISSN: 0094- 243X.Detail
HRUŠKA, P.; GRMELA, L. Silicon- silicon dioxide nanostructure in electrostatic field. Acta Electrotechnica et Informatica, 2010, vol. 10, no. 3, p. 22-25. ISSN: 1335- 8243.Detail
ANDREEV, A.; GRMELA, L.; MORAVEC, P.; BOSMAN, G.; ŠIKULA, J. Investigation of excess 1/ f noise in CdTe single crystals. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2010, vol. 2010(25), no. 5, p. 1-7. ISSN: 0268- 1242.Detail
2009
HRUŠKA, P.; GRMELA, L. Behaviour of silicon nanostructure in electric field. In Proceedings of Physics of Materials 09, V. Lisý, D. Olčák (Eds). Košice, SK: Faculty of Electrical Engineering and Informatics, Technical University of Košice, 2009. p. 34-37. ISBN: 978-80-8086-122- 3.Detail
TOMÁNEK, P.; MIKLÁŠ, J.; BAJGAR, A.; GRMELA, L.; DOBIS, P.; BRÜSTLOVÁ, J. Sensor of back- scattered light polarization in body cells. In Optical sensors 2009, Francesco Baldini, Jiri Homola, Robert A. Lieberman (Eds)., SPIE Proceedings, vol. 7356. Proceedings of SPIE. Bellingham, USA: SPIE, 2009. p. 7356281-7356289. ISSN: 0277- 786X.Detail
HRUŠKA, P.; GRMELA, L. EMISSION OF QD IN ELECTROSTATIC FIELDS. In International Conference Technical Computing Prague 2009T - The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze. Praha: The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze, 2009. p. 39-44. ISBN: 978-80-7080-733- 0.Detail
KNÁPEK, A.; GRMELA, L. Fabrication and Noise Diagnostics of Schottky Nanotip Cathodes. Book of Abstracts, IMA 2009 Conference, Athens, October 2009. National and Kapodistrian University of Athens, 2009. p. 53-53. Detail
TOMÁNEK, P.; GRMELA, L.; BRÜSTLOVÁ, J.; DOBIS, P.; ABUBAKER, H. Measurement of diffused light polarization due to multiple backscattering in body cells. In 8th IMEKO TC 2 Symposium on Photonics in Measurements 2008. Proceedings. New York: Curran Associated, Inc., 2009. p. 152-157. ISBN: 978-1-61567-041- 3.Detail
ANDREEV, A.; GRMELA, L.; RAŠKA, M.; ŠIKULA, J. Experimental Analysis of Noise in CdTe Radiation Detectors. AIP conference proceedings, 2009, vol. 1129, no. 1, p. 313-317. ISSN: 0094- 243X.Detail
GRMELA, L.; TOMÁNEK, P. Ústav fyziky Fakulty elektrotechniky a komunikačních technologií Vysokého učení technického v Brně. Jemná mechanika a optika, 2009, vol. 54, no. 10, p. 271-272. ISSN: 0447- 6441.Detail
ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; CHVÁTAL, M.; RAŠKA, M. Bulk Resistance Decay in CdTe. In IEEE EUROCON 2009. St. Petersburg, Russia: Institute of Electrical and Electronics Engineers, St. Petersburg, 2009. p. 1181-1185. ISBN: 978-1-4244-3861-7.Detail
2008
GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS: Mn nanoparticles. In Materials Structure and Micromechanics of Fracture V. 567- 568. Zurich, Switzerland: ttp Trans Tech Publications, 2008. p. 421-424. ISBN: 978-0-87849-469- 9.Detail
HOLCMAN, V.; LIEDERMANN, K.; GRMELA, L.; RAŠKA, M. NEW MIXED RULES ON COMPOSITE MATERIALS. In Proceedings of 2008 International Symposium on Electrical Insulating Materials. IEEJ Transactions on Electrical and Electronic Engineering. 1. Japonsko, Yokkaichi: Proceedings of 2008 International Symposium on Electrical Insulating, 2008. p. 71-74. ISBN: 978-4-88686-006- 4. ISSN: 1931- 4973.Detail
TOMÁNEK, P.; GRMELA, L.; BRÜSTLOVÁ, J.; DOBIS, P. Measurement of diffused light polarization due to multiple scattering in body cells. In 18th IMEKO TC 2 SYMPOSIUM on Photonics in Measurements. Prague: Zeithamlová Milena, Ing. - Agentura Action M, 2008. p. 95-99. ISBN: 978-80-86742-24- 3.Detail
ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P. Nanooptics of locally induced photocurrent in Si solar cells. In Photonics Prague 2008. Prague: Zeithamlová Milena, Ing. - Agentura Action M, 2008. p. 96-97. ISBN: 978-80-86742-25- 0.Detail
TOMÁNEK, P.; GRMELA, L. Optics of nanoobjects. In Proceedings SPIE - Eighth International Conference on Correlation Optics. Proceedings of SPIE. 7008. Bellinhgham, USA: SPIE, 2008. p. 70081F01 (70081F11 p.)ISBN: 978-0-8194-7218- 2. ISSN: 0277-786X.Detail
ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P. Nanooptics of locally induced photocurrent in monocrystalline Si solar cells. In Photonics, Devices and Systems - Proceedings of SPIE vol. 7138. Proceedings of SPIE. Bellingham, USA: SPIE, 2008. p. 2901-2906. ISBN: 978-0-8194-7379- 0. ISSN: 0277-786X.Detail
GRMELA, L.; MACKŮ, R.; TOMÁNEK, P. Near-field measurement of ZnS:Mn nanocrystal and bulk thin- film electroluminescent devices. Journal of Microscopy, 2008, vol. 229, no. 2, p. 275-280. ISSN: 0022- 2720.Detail
GRMELA, L.; TOMÁNEK, P. Nové trendy v mikroelektronických systémech a nanotechnologiích (Workshop) 5. Moderní diagnostika materiálů a součástek, Mikrosyn 2007. Nové trendy v mikroelektronických systémech a nanotechnologií MSM 0021630503 - 2007. Mikrosyn. Brno: FEKT VUT, 2008. p. 1-104. ISBN: 978-80-7355-080- 6.Detail
2007
ANDREEV, A.; ZAJAČEK, J.; ŠIKULA, J.; GRMELA, L.; HOLCMAN, V. The Effect of Contacts Metal - Semiconductor on Low Frequency Noise. In 6th International Conference of PhD Students. 1. Miskolc, Hungary: Jozsef Vesza, 2007. p. 173-178. ISBN: 978-963-661-779- 0.Detail
GRMELA, L.; ZAJAČEK, J. The Sub- Band Decomposition of Fluctuated Signal for the Estimation of Power Spectra. In Conference Proceeeding Book. J.U Urena, J.U. Dominguez. New York: IEEE Spain, 2007. p. 327-332. ISBN: 1-4244-0829- 6.Detail
GRMELA, L.; TOMÁNEK, P. Near-field study of hot luminescence centers in ZnS: Mn nanocrystals. Brno: VUTIUM Brno, 2007. p. 158-158. Detail
UHDEOVÁ, N.; BRÜSTLOVÁ, J.; DOBIS, P.; GRMELA, L. Fyzikální Praktikum. Fyzikální praktikum. Brno: Ing. Zdeněk Novotný, 2007. p. 1-128. ISBN: 978-80-214-3458- 5.Detail
PAVELKA, J.; GRMELA, L. Fyzika pevné fáze 2. Elektronické skriptum FYZ 07- 017. Brno: VUT, 2007. p. 60-122. Detail
GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS: Mn nanoparticles. Materials Science Forum, 2007, vol. 2007, no. 567, p. 241-244. ISSN: 0255- 5476.Detail
GRMELA, L.; DOBIS, P.; BRÜSTLOVÁ, J.; TOMÁNEK, P. Optoelectronic noise and photocurrent measurement on GaAs/ AlGaAs laser diode with single quantum well. International Journal of Optomechatronics, 2007, vol. 1, no. 1, p. 73-80. ISSN: 1559- 9612.Detail
TOMÁNEK, P.; GRMELA, L.; ŠKARVADA, P. Optical fiber Bragg grating used in the sensing of surface plasmon resonance. In Optomechatronic Sensors and Instrumentation III, Proceedings of SPIE, Vol. 6716. Proceedings of SPIE. Bellingham, USA: SPIE, 2007. p. 215-223. ISBN: 978-0-8194-6864- 2. ISSN: 0277-786X.Detail
HAVRÁNEK, J.; PAVELKA, J.; ŠIKULA, J.; GRMELA, L. Temperature dependence of RTS noise - trap activation energy. In New trends in physics. Brno: VUT, 2007. p. 35-38. ISBN: 978-80-7355-078- 3.Detail
HAVRÁNEK, J.; ŠIKULA, J.; PAVELKA, J.; GRMELA, L. RTS noise - carrier capture and emission event duration. In New trends in Physics. VUT. Brno: VUT Brno, 2007. p. 31-34. ISBN: 978-80-7355-078- 3.Detail
ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V. Low Frequency Noise Measuring in Semiconductor Devices. In 6th International Conference of PhD Students. Dr. Laszlo Lehoczky. Miskolc, Hungary: Dr. Laszlo Lehoczky, 2007. p. 179-184. ISBN: 978-963-661-783- 7.Detail
ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; RAŠKA, M. Investigation of 1/ f Noise Sources in CdTe Radiation Detectiors. In New Trends in Physics. Pavel Dobis, Jitka Brustlova. Brno, Czech Republic: Ing. Zdenek Novotny CSc, 2007. p. 15-18. ISBN: 978-80-7355-078- 3.Detail
KOKTAVÝ, B.; KOKTAVÝ, P.; GRMELA, L. Study of crack behaviour during mechanical stressing of composite materials. In New trends in physics. -. Brno: Z. Novotný, Ing., CSc., 2007. p. 65-68. ISBN: 978-80-7355-078- 3.Detail
GRMELA, L.; TOMÁNEK, P. Near-field investigation of ZnS:Mn nanocrystal phosphors in thin- film electroluminescent device. In Nano´ 06. Brno: ČSNMT Praha, 2007. p. 307-310. ISBN: 80-214-3331- 0.Detail
TOMÁNEK, P.; GRMELA, L. Nanotechnology interactive course for Electrical Engineering undergraduate students. In Nano´ 06. Brno: ČSNMT Praha, 2007. p. 101-104. ISBN: 80-214-3331- 0.Detail
HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Fine structure of electron traps. In New Trends in Physics. Brno: Z. Novotný, 2007. p. 47-50. ISBN: 978-80-7355-078- 3.Detail
HRUŠKA, P.; GRMELA, L. The LambertW function and semiconductor diode I- U curve. In EDS 07 IMAPS CS International Conference Proceedings. Brno: Ing. Zdeněk Novotný, CSc. Brno, Ondráčkova 105, 2007. p. 126-128. ISBN: 978-80-214-3470- 7.Detail
ANDREEV, A.; GRMELA, L. Investigation of 1/f Noise of p- type CdTe Detectors. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 88-89. ISBN: 978-973-713-174- 4.Detail
ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J. Analysis of the CdTe Hole Concentration and the Hole Mobility. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 86-87. ISBN: 978-973-713-174- 4.Detail
ANDREEV, A.; GRMELA, L. Fermi Level Position in the Cadmium Telluride Detrector. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 84-85. ISBN: 978-973-713-174- 4.Detail
GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Noise Sources in the CdTe radiation detectors. In Noise and Fluctuation - 19-th International Conference on Noise and Fluctuations - ICNF 2007. M.Tacano, Y.Yamamoto, M. Nakao. Melville, USA: American Institute of Physics, 2007. p. 302-305. ISBN: 978-0-7354-0432- 8.Detail
2006
TOMÁNEK, P.; GRMELA, L. Nové trendy v mikroelektronických systémech a nanotechnologiích (Workshop) 5. Moderní diagnostika materiálů a součástek. Nové trendy v mikroelektronických systémech a nanotechnologiích (Workshop) 5. Moderní diagnostika materiálů a součástek. Mikrosyn. Brno: FEKT VUT Brno, 2006. p. 1-157. ISBN: 80-7355-062- 8.Detail
SEDLÁK, P.; MAJZNER, J.; GRMELA, L.; HASSE, L. Noise Spectral Density Computation Based on Finite Element Model of Piezoceramic Sensor. In Proceedings of the 30th International Conference of IMAPS Poland Chapter. Krakow: IMAPS Poland Chapter, 2006. p. 361 ( p.)ISBN: 83-917701-3- 3.Detail
GRMELA, L.; KALA, J.; TOMÁNEK, P. Local Optical Nanometrology of Artificial Molecules. In EOS Topical Meeting on Nanophotonics, Metamaterials and optical microcavity. Tome 3. Hannover: European Optical Society, 2006. p. 124-126. ISBN: 3-00-019-533- 4.Detail
ZAJAČEK, J.; GRMELA, L. Digitální analýza širokopásmového šumu v polovodičových strukturách. In Elektrotechnika a informatika 2006. Plzeň: Západočeská Univerzita v Plzni, 2006. p. 145 ( p.)ISBN: 80-7043-473- 2.Detail
GRMELA, L.; KALA, J.; TOMÁNEK, P. Local photoluminescence in InAs/ GaAs heterostructures with quantum dots and artificial molecules. Proceedings of SPIE, 2006, vol. 6180, no. 6180, p. 517-522. ISSN: 0277- 786X.Detail
HRUŠKA, P.; CHOBOLA, Z.; GRMELA, L. Diode I- U curve fitting with Lambert W function. In Proc. 25th Internationa Conference on Microelectronics. Niš: Serbia nad Montenegro IEEE Section, 2006. p. 501-504. ISBN: 1-4244-0116- X.Detail
TOMÁNEK, P.; GRMELA, L. Local detection of surface plasmon resonance for sensing applications. In ODF' 06. Nara, Japonsko: Optical Society of Japan, 2006. p. 245-246. Detail | WWW
GRMELA, L.; TOMÁNEK, P. Near-field investigation of ZnS:Mn nanocrystal phosphors in thin- film electroluminescent device. Brno: Vutium Brno, 2006. p. 84-84. Detail
TOMÁNEK, P.; GRMELA, L. Near- field optical measurement and sensing in Nanophotonics. Wroclaw, Poland: Wroclaw University of Technology, 2006. p. 40 ( p.)Detail | WWW
UHDEOVÁ, N.; BRÜSTLOVÁ, J.; DOBIS, P.; GRMELA, L.; VEVERKA, O. Fyzikální praktikum. Brno: FEKT VUT, 2006. p. 1 ( p.)ISBN: 80-214-3234- 9.Detail
GRMELA, L.; KALA, J.; TOMÁNEK, P. Near-field measurement of ZnS:Mn thin- film electroluminescent devices. In Near-field optics, Nanophotonics and Related Techniques. Lausanne, Switzerland: EPFL Lausanne, 2006. p. 326-328. Detail | WWW
HRUŠKA, P.; GRMELA, L.; CHOBOLA, Z. Diagnostika slunečních článků s podporou MATLABu. In Nové trendy v mikroelektronických systémech a nanotechnologiích. Brno: ing. Zdeněk Novotný, CSc., Ondráčkova 105 Brno, 2006. p. 107 ( p.)ISBN: 80-7355-062- 8.Detail
KOKTAVÝ, P.; ŠIKULA, J.; KOKTAVÝ, B.; GRMELA, L.; LIEDERMANN, K.; POLSTEROVÁ, H. Ireverzibilní procesy v elektroizolačních materiálech pro vysoké teploty, GAČR 102/03/0621, závěrečná zpráva. Brno: Grantová agentura ČR, 2006. p. 1-84. Detail
TOMÁNEK, P.; GRMELA, L. Near- field optical measurement and sensing in Nanophotonics. In Proc. of the Symposium on Photonics Technology for the 7th Framework Programme. Wroclaw, Poland: Wroclaw University of Technology, 2006. p. 51-54. ISBN: 83-7085-970- 4.Detail | WWW
2005
TOMÁNEK, P.; DOBIS, P.; BENEŠOVÁ, M.; GRMELA, L. Near-field study of carrier dynamics in InAs/ GaAs quantum dots grown on InGaAs layers. Materials Science Forum, 2005, vol. 482, no. 1, p. 151-155. ISSN: 0255- 5476.Detail
GRMELA, L.; TOMÁNEK, P. Local detection of electromagnetic energy transport below the diffraction limit in metal nanoparticle plasmon waveguides. Brno: Vysoké učení technické v Brně, Fakulta strojního inženýrství, 2005. p. 32-32. Detail
TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., BRÜSTLOVÁ, J., DOBIS, P. Local near- field scanning optical microscopy and spectroscopy of nanostructures. In Nano´ 04. Brno: Brno University of Technology, 2005. p. 188-193. ISBN: 80-214-2793- 0.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; GRMELA, L.; HÖSCHEL, P.; SITA, Z.; HASHIGUCHI, S.; TACANO, M. Noise and Carge Storage in Nb2O5 Thin Films. In Noise and Fluctuations. United States of America: American Institute of Physics, 2005. p. 135 ( p.)ISBN: 0-7354-0267- 1.Detail
HRUŠKA, P.; CHOBOLA, Z.; GRMELA, L. CF toolbox in solar cell diagnostics. In Technical Computing Prague 2005. Praha: 2005. p. 49 ( p.)ISBN: 80-7080-577- 3.Detail
GRMELA, L.; KALA, J.; TOMÁNEK, P. Near- field local detection of energy transport in metal thin film plasmon waveguides. In NANO' 05. Brno: Brno University of Technology, Faculty of Mechanical Engineering, 2005. p. 219-224. ISBN: 80-214-3085- 0.Detail
UHDEOVÁ, N.; VEVERKA, O.; DOBIS, P.; GRMELA, L.; BRÜSTLOVÁ, J. Fyzikální praktikum. Brno: FEKT VUT v Brně, 2005. p. 1 ( p.)ISBN: 80-214-2989- 5.Detail
HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Teaching Physics with Matlab. European physical society, 2005. p. 3- 5 ( p.)Detail
GRMELA, L.; KALA, J.; TOMÁNEK, P. Optical near-field investigations on GaAs/AlxGa1- XAs quantum dots. In Photonics Prague 2005. Prague: Zeithamlová Milena, Ing. - Agentura Action M, 2005. p. 163-164. ISBN: 80-86742-08- 3.Detail
HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Teaching Physics with Matlab. In 4th International Conference on Physics Teaching in Engineering Education PTEE 2006. Brno: European Physical Society, 2005. p. 3- 4 ( p.)ISBN: 80-903063-6- 5.Detail
HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. MAPLE in General Physics E- learning. In New Trends in Physics. Brno: Ing.Zdeněk Novotný,CSc., 2005. p. 316-319. ISBN: 80-7355-024- 5.Detail
GRMELA, L., ŠIKULA, J., ZAJAČEK, J., DOBIS, P., MORAVEC, P. Transport and Noise Characteristics of CdTe Sensors. In Electronic Devices and Systems. Brno: Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105, 2005. p. 288 ( p.)ISBN: 80-214-2990- 9.Detail
TOMÁNEK, P.; GRMELA, L. Local optical phenomena in InAs/ GaAs heterostructures with quantum dots and artificial molecules. Journal of the Korean Physical Society, 2005, vol. 47, no. 96, p. S162 (S165 p.)ISSN: 0374- 4884.Detail
GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Low Frequency Noise of the CdTe Crystals. In Noise and Fluctuations. Melville, USA: American Institute of Physics, 2005. p. 175-178. ISBN: 0-7354-0267- 1.Detail
2004
GRMELA, L.; DOBIS, P.; MAJZNER, J.; KALA, J.; ZAJAČEK, J. Automatic Noise Spectral Density Measuring Set- up. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, CSc., 2004. p. 32-35. ISBN: 80-7355-024- 5.Detail
HRUŠKA, P., GRMELA, L., KOKTAVÝ, P. MAPLE in General Physics e- Grading. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, CSc., 2004. p. 316 ( p.)ISBN: 80-7355-024- 5.Detail
ZAJAČEK, J., ŠIKULA, J., GRMELA, L. CONTACT AND SHEET RESISTANCE OF SOLAR CELLS. In Non- destructive testing. Brno: Institute of Physic, FAST, BUT, 2004. p. 243 ( p.)ISBN: 80-7204-371- 4.Detail
ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L. Conductivity mechanisms and breakdown of NbO capacitors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. p. 141 ( p.)ISSN: 0887- 7491.Detail
TOMÁNEK, P.; GRMELA, L. Near field photocurrent spectroscopy of crystalline GaAs solar cells. In CO-MAT-TECH 2004, Proceeding of 12. International Scientific Conference. Trnava: Vydavatelstvo STU Bratislava, 2004. p. 1365-1370. ISBN: 80-227-2117- 4.Detail
OTEVŘELOVÁ, D.; TOMÁNEK, P.; GRMELA, L. Local characterization of optical waveguide structure using Scanning near- field optical microscopy. In Applied physics on condensed matter APCOM – 2004. Bratislava: Slovak Technical University in Bratislava, 2004. p. 183-186. ISBN: 80-227-2073- 9.Detail
TOMÁNEK, P., GRMELA, L. Near field photocurrent spectroscopy of crystalline GaAs solar cells. CO-MAt-TECH 2004. Proceedings of the Abstracts. Trnava: Vydavatelstvo STU Bratislava, 2004. p. 207 ( p.)ISBN: 80-227-2121- 5.Detail
TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., BRÜSTLOVÁ, J., DOBIS, P. Near- field local optical spectrosccopy of nanostructured semiconductors. Nano ´ 04. Brno: VUTIUM Brno, 2004. p. 40 ( p.)ISBN: 80-214-2672- 1.Detail
TOMÁNEK, P., GRMELA, L. Local optical phenomena in InAs/GaAs heterostructures with doped quantum dots and artificial molecules (Seoul, Korea). The 8th International Conference on Near-field Nano Optics and Related Techniques (NFO-8). Seoul, Korea: Seoul National University, 2004. p. 248 ( p.)Detail
TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., GRMELA, L. Near-field optical measurement of carrier recombination in InAs/ GaAs quantum dots. Material structure & micromechanics of fracture. Brno: Vutium, Brno, 2004. p. 115 ( p.)ISBN: 80-214-26732- X.Detail
TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L. Local photoluminescence measurement of semiconductor InGaAs quantum dot excited states. Photonics Europe. SPIE, Europe, 2004. p. 178 ( p.)Detail
UHDEOVÁ, N., VEVERKA, O., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J. Fyzikální praktikum. Brno: VUT v Brně, 2004. p. 1 ( p.)ISBN: 80-214-2710- 8.Detail
TOMÁNEK, P.; GRMELA, L.; BRÜSTLOVÁ, J.; DOBIS, P. Polovodiče: lokální optické a elektrické vlastnosti (Projekt ME 544). 2004. Brno: MŠMT- Kontakt 544, 2004. p. 1-19. Detail
TOMÁNEK, P., GRMELA, L. Nanostruktury - optické a elektrické vlastnosti (Projekt COST 523.40). Brno: MŠMT: COST 523. 40, 2004. p. 1 ( p.)Detail
2003
ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., VRBA, R., MELKES, F., ROCAK, D., BELAVIC, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non- linearity of thick film resistors. In 23rd Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: 2003. p. 112 ( p.)ISSN: 0887- 7491.Detail
TOMÁNEK, P.; BENEŠOVÁ, M.; DOBIS, P.; OTEVŘELOVÁ, D.; GRMELA, L.; KAWATA, S. Near- field optical diagnostics of carrier dynamics in semiconductor with superresolution. Physics of low- dimensional structures, 2003, vol. 2003, no. 3/ 4, p. 131-137. ISSN: 0204- 3467.Detail
OTEVŘELOVÁ, D.; GRMELA, L.; TOMÁNEK, P.; BRÜSTLOVÁ, J. Photoluminescence scanning near-field optical microscopy in GaAlAs/ GaAs quantum wells. Proceedings of SPIE, 2003, vol. 5036, no. 5036, p. 640-644. ISSN: 0277- 786X.Detail
ŠIKULA, J.; VRBA, R.; GRMELA, L.; ZEDNÍČEK, T.; SITA, Z. Breakdown characteristics and low frequency noise of niobium based capacitors. Capacitor and Resistor Technology, 2003, vol. 2003, no. 4, p. 53 ( p.)ISSN: 0887- 7491.Detail
TOMÁNEK, P., GRMELA, L. Nanostruktury: optické a elektrické vlastnosti. Brno: MŠMT - COST 523. 40, 2003. p. 1 ( p.)Detail
TOMÁNEK, P., GRMELA, L. Polovodiče: lokální optické a elektrické vlastnosti. Brno: MŠMT- Kontakt 544, 2003. p. 1 ( p.)Detail
GRMELA, L., HRUŠKA, P., KOKTAVÝ, P. Mechanika-kmity- vlny. Brno: 2003. p. 1 ( p.)Detail
KOKTAVÝ, P., HRUŠKA, P., GRMELA, L. Optika a moderní fyzika. 2003. p. 1 ( p.)Detail
HRUŠKA, P., GRMELA, L., KOKTAVÝ, P. Elektřina, magnetizmus a termodynamika. ES. Brno: 2003. p. 1 ( p.)Detail
UHDEOVÁ, N., VEVERKA, O., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J. Fyzikální praktikum. Fyzikální praktikum. Brno: FEKT VUT v Brně, 2003. p. 1 ( p.)ISBN: 80-214-2442- 7.Detail
TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L., KAWATA, S. Near- field optical imaging of carrier dynamics in silicon with superresolution. In Scanning Probe Microscopy - 2003. Nizhniy Novgorod, Russia: Institute for Physics of microstructures RAS, 2003. p. 63-65. Detail
BENEŠOVÁ, M., TOMÁNEK, P., OTEVŘELOVÁ, D., DOBIS, P., GRMELA, L. Near field scanning optical microscopy as an imaging tool for carrier process in silicon. In Advanced engineering design. Praha: Process Engineering Publisher, 2003. p. F1. 3 (F1.7 p.)ISBN: 80-86059-35- 9.Detail
TOMÁNEK, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P. Local optical imaging of electronic characteristics in semiconductors. In Noise and fluctuation ICNF 2003. Brno: 2003. p. 445 ( p.)ISBN: 80-239-1005- 1.Detail
DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L., TOMÁNEK, P. Electrooptical Characterization of ZnS:Mn Thin- film Electroluminescent Devices. In The 10th EDS 2003 Electronic Devices and Systems Conference. Neuveden. Brno: Ing. Zdeněk Novotný, CSc., 2003. p. 287 ( p.)ISBN: 80-2142452- 4.Detail
TOMÁNEK, P., DOBIS, P., GRMELA, L. 1/f Noise in InAs/GaAs Quantum Dots and InGaAs/GaAs/ InGaP Quantum Well LEDs and in quantum well laser diodes. In CO-MAT-TECH 2003, 11th International scientific conference. Bratislava: MtF STU Trnava, 2003. p. 1063 ( p.)ISBN: 80-277-1949- 8.Detail
SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D. The effect of silver diffusion from contact electrode into thick film resistors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 201 ( p.)ISBN: 0887- 7491.Detail
ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T. Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 281 ( p.)ISBN: 0887- 7491.Detail
MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M. Critical role of near-field optics in the characterization of electro- optical devices. In Radioelektronika 2003 Conference proceedings. Brno: MJ Servis Ltd., 2003. p. 280 ( p.)ISBN: 80-214-2388- 8.Detail
GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise Spectroscopy of Thick Film Electroluminescent Lamps. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. p. 71 ( p.)ISBN: 80-238-9094- 8.Detail
2002
GRMELA, L. Experimentální metody nedestruktivního testování elektronických součástek a materiálů. Vědecké spisy Vysokého učení technického v Brně Edice Habilitační a inaugurační spisy, 2002, vol. 2002, no. sv. 90, p. 1 ( p.)ISSN: 1213- 418X.Detail
GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., TOMÁNEK, P., BENEŠOVÁ, M. Local photoluminescence scanning measurement on A3- B5 quantum dots. In Optics in computing - St. Petersburg. St. Petersburg, Russia: St. Petersburg Institute of fine Mechanics and Optics, 2002. p. 25 ( p.)Detail
SEDLÁKOVÁ, V., PAVELKA, J., GRMELA, L., ŠIKULA, J., ROČAK, D., HROVAT, M., BELAVIČ, D. NOISE AND NON-LINEARITY OF THICK- FILM RESISTORS. In Proceedings of European Microelectronics packaging & interconection Symposium. Krakow, Poland: IMAPS - Poland Chapter, 2002. p. 320 ( p.)ISBN: 83-904462-8- 6.Detail
GRMELA, L., MAJZNER, J., PAVELKA, J., ŠIKULA, J. Automatic noise spectral density measuring set- up. In Electronic devices and systems 02 - proceedings. Brno: Zdeněk Novotný, 2002. p. 114 ( p.)ISBN: 80-214-2180- 0.Detail
GRMELA, L., DOBIS, P., TOMÁNEK, P. Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW- GRIN Laser Diodes Reliability. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: Ing. Zdeněk Novotný, CSc., 2002. p. 129 ( p.)ISBN: 80-238-9094- 8.Detail
GRMELA, L., PAVELKA, J., HLÁVKA, J., SEDLÁK, S. Non- linearity testing of electrical contacts. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: Ing.Zdeněk Novotný, CSc., 2002. p. 103 ( p.)ISBN: 80-238-9094- 8.Detail
GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise spectroscopy of thick film. In Noise and Non- linearity Testing of Modern Electronic Componets. Brno: Ing.Zdeněk Novotný, CSc., 2002. p. 71 ( p.)ISBN: 80-2389094- 8.Detail
GRMELA, L., DOBIS, P., KOKTAVÝ, P., PAVELKA, J. Noise Tester for Electronic Components. In Noise and Non-linearity Testing of Modern Electronic Components - NNT. Brno: Ing.Zdeněk Novotný, CSc., 2002. p. 59 ( p.)ISBN: 80-238-9094- 8.Detail
TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L. Spectral measurements of semiconductor structures using optical near- field approach. In Joint COST- Action workgroup meeting on individual and assembled nanoparticles and quantum dots. Leuven, Belgie: KU Leuven, COST 523, 2002. p. P55 ( p.)Detail
UHDEOVÁ, N., GRMELA, L. The role of education technology in the new teaching concept of the General course of Physics at FEEC TU BRNO. In 10 rokov technológie vzdelávania. Nitra: SlovDidac, 2002. p. 205 ( p.)ISBN: 80-967746-6- 2.Detail
GRMELA, L., KOKTAVÝ, P., LIEDERMANN, K., ŠIKULA, J., PAVELKA, J., TOMÁNEK, P. Non Destructive Testing of Thinck Film Electroluminiscent Lamps. In 8-th ECNDT, Barcelona. Madrid: European Federation for Non- Destructive Testing, 2002. p. 214 ( p.)ISBN: 84-699-8573- 6.Detail
UHDEOVÁ, N., GRMELA, L., TOMÁNEK, P. Support of the self- work of Students in Physics. In Proceedings of the PTEE 2002 conference. Leuven, Belgium: Katoliket Universitet Leuven, 2002. p. P2 ( p.)ISBN: 90-5682-359- 0.Detail
OTEVŘELOVÁ, D., GRMELA, L., TOMÁNEK, P., UHDEOVÁ, N. Photoluminiscence scanning near-field optical microscopy in GaAlAs/ GaAs quantum wells. In Photonics Prague 2002. Praha: Techmarket, 2002. p. 148 ( p.)ISBN: 80-86114-46- 5.Detail
MAJZNER, J., GRMELA, L., KOKTAVÝ, P., ŠIKULA, J. Analogue model of human middle ear. In Electronic devices and systems 02 - Proceedings. Brno: Zdeněk Novotný, 2002. p. 132 ( p.)ISBN: 80-214-2180- 0.Detail
GRMELA, L., MAJZNER, J., PAVELKA, J. Automatic noise spectral density measuring set- up. In Electronic Devices and Systems 2002. Brno: VUT v Brně, 2002. p. 114 ( p.)ISBN: 80-214-2180- 0.Detail
GRMELA, L. Mechanika,kmity- IFY. 2002.Detail | WWW
GRMELA, L., MAJZNER, J. Laboratory 1. 2002.Detail | WWW
UHDEOVÁ, N., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., VEVERKA, O. Fyzikální praktikum. Fyzikální praktikum. Brno: Vysoké učení technické v Brně, 2002. ISBN: 80-214-2051- 0.Detail
TOMÁNEK, P., GRMELA, L. Polovodiče: lokální optické a elektrické vlastnosti, ME 544. Polovodiče: lokální optické a elektrické vlastnosti - výzkumná zpráva. neuvedeno. Brno: MŠMT, 2002.Detail
TOMÁNEK, P., GRMELA, L. Nanostruktury: Optické a elektrické vlastnosti, COST 523. 40. Nanostruktury: optické a elektrické vlastnosti. neuvedeno. Brno: MSMT, OC 523.40/ 2002, 2002.Detail
PAVELKA, J., ŠIKULA, J., GRMELA, L., TACANO, M., HASHIGUCHI, S. Noise and Self- Healing of Tantalum Capacitors. Capacitor and Resistor Technology, 2002, vol. 2002, no. 4/ 2002, p. 181 ( p.)ISSN: 0887- 7491.Detail
ŠIKULA, J.; HLÁVKA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; GRMELA, L.; TACANO, M.; HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. Active and Passive Electronic ComponentsISSN, 2002, vol. 25, no. 2, p. 161 ( p.)ISSN: 0882- 7516.Detail
ŠIKULA, J., PAVELKA, J., GRMELA, L., DOBIS, P., ZEDNÍČEK, T. Charge Carriers Transport and Noise of Niobium Capacitors. In CARTS-EUROPE 2002 Proceedings, 16th European Passive Components Conference. Swindon, England: Electronic Components Institute Internationale Ltd., 2002. p. 32 ( p.)Detail
2001
ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. The Tantalum Capacitor as a MIS Structure in Reverse Mode. In Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. p. 289 ( p.)ISBN: 0887- 7491.Detail
LÉTAL, P., GRMELA, L., TOMÁNEK, P. Studium lokálních charakteristik fotoproudu v blízkém poli. Československý časopis pro fyziku, 2001, vol. 51, no. 1, p. 69 ( p.)ISSN: 0009- 0700.Detail
GRMELA, L., LÉTAL, P., TOMÁNEK, P. Near-field photocurrent spectra in DQW- GRIN laser diodes. In Electronic Devices and Systems, EDS' Y2K. Brno: VUT v Brně, 2001. p. 213 ( p.)ISBN: 80-214-1780- 1.Detail
GRMELA, L., PAVELKA, J., HLÁVKA, J. Relay contacts quality screening by non- linearity tester. In Electronic Devices and Systems. Brno: VUT v Brně, 2001. p. 55 ( p.)ISBN: 80-214-1960- 1.Detail
GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise spectroscopy of thick film electroluminescent lamp. In Electronics Devices and System. Brno: Vysoké učení technické v Brně, 2001. p. 44 ( p.)ISBN: 80-214-1960- 1.Detail
BENEŠOVÁ, M., TOMÁNEK, P., DOBIS, P., GRMELA, L. A simplified local surface photoreflectance measurement. In Proceedings of Materials structure and micromechanics fracture. Brno: VUTIUM, 2001. p. 439 ( p.)ISBN: 80-214-1892- 3.Detail
TOMÁNEK, P., GRMELA, L., OTEVŘELOVÁ, D., DOBIS, P., BRÜSTLOVÁ, J. Projekt "Fyzikální základy optoelektroniky". In Nové trendy ve fyzice. sv. 2. Brno: Vysoké učení technické v Brně, Fakulta elektrotechniky a informatiky, 2001. p. 536-539. ISBN: 80-214-1992- X.Detail
PAVELKA, J., ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Thin Ta2O5 Amorphous Films. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 91 ( p.)ISBN: 981-02-4677- 3.Detail
GRMELA, L., PAVELKA, J. Automatic apparatus for noise spectral density measurement. In Electronic Devices and System - Noise and Non- Linearity Testing of Modern Electronics Components. Brno: Vysoké učení technické v Brně, 2001. p. 52 ( p.)ISBN: 80-214-1960- 1.Detail
OTEVŘELOVÁ, D., GRMELA, L. Digital imaging and image resolution in scanning probe microscopy. In CO-MAT- TECH 2001. Trnava: STU Bratislava, 2001. p. 273 ( p.)ISBN: 80-224-1591- 3.Detail
TOMÁNEK, P., GRMELA, L., UHDEOVÁ, N. Inovace kursu "Fyzikální základy optoelektroniky". IS0149. Brno: FRVŠ, 2001. p. 1 ( p.)Detail
GRMELA, L. Multiple multipole method for detection of evanescent field. In Radioelektronika 98. 2. Brno: VUT Brno, 2001. p. 258 ( p.)ISBN: 80-214- 098.Detail
GRMELA, L. Near field optical beam induced current measurements on heterostructures. 2001.Detail
ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. In Proceedings of CARTS- Euro 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. p. 81 ( p.)Detail
TOMÁNEK, P., GRMELA, L., UHDEOVÁ, N., DOBIS, P., BRÜSTLOVÁ, J. Optoelectronics and optical fiber sensors in engineering education. In CO-MAT- TECH 2001. sv. 2. Bratislava: STU Bratislava, 2001. p. 390 ( p.)ISBN: 80-227-1591- 3.Detail
UHDEOVÁ, N. a kol. Fyzikální praktikum. Fyzikální praktitkum. Brno: Ing. Zdeněk Novotný, 2001. ISBN: 80-214-1818- 4.Detail
TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., LÉTAL, P. Near field photoluminescence and photoreflectance measurements of semiconductor structures. In Nanomaterials: Fundamentals and applications. Limerick: MSSI, 2001. p. 59 ( p.)Detail
LÉTAL, P., TOMÁNEK, P., GRMELA, L. Near field optical beam induced current measurements on heterostructures. In Nové trendy ve fyzice (New trends in Physics). sv. 2. Brno: Vysoké učení technické v Brně, 2001. p. 387 ( p.)ISBN: 80-214-1992- X.Detail
TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P. Near- field optical microscopy diagnostics. In From quantum optics to photonics. Warszaw: Faculty of Physics, Warszaw University, 2001. p. 90 ( p.)ISBN: 83-913171-4- 5.Detail
TOMÁNEK, P., GRMELA, L. Nanostruktury: Optické a elektrické vlastnosti. Nanostruktury: optické a elektrické vlastnosti. 523.40/ 2000. Brno: MŠMT, 2001.Detail
2000
LÉTAL, P., TOMÁNEK, P., GRMELA, L. Near-field photocurrent spectroscopy: superresolving method for inspection of semiconductor interfaces. In 8th CO-MAT- TECH 2000. Trnava: 2000. p. 141 ( p.)ISBN: 80-227-1413- 5.Detail
GRMELA, L., TOMÁNEK, P. Optoelektronická zařízení: základní charakteristiky a automatizace měření. In Experiments and measurement in engineering physics education. Brno: Technical University of Brno, 2000. p. 30 ( p.)ISBN: 80-214- 122.Detail
UHDEOVÁ, N., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., VEVERKA, O. Fyzikální praktikum. Fyzikální praktikum. Brno: Vysoké učení technické v Brně, 2000. ISBN: 80-214-1521- 5.Detail
GRMELA, L.; LÉTAL, P. Near-field photocurrent spectroscopy: superresolving method for inspection of semiconductor interfaces. In CO-MAT-TECH 2000, 8. Medzinárodná vedecká konferencia, vol. 4. Bratislava: Slovenská technická univerzita v Bratislave, 2000. p. 141-146. ISBN: 80-227-1413- 5.Detail
1999
GRMELA, L., VAŠINA, P. Tester spolehlivosti luminiscenčních diod. In Electronic devices and systems. 2. Brno: Technical University of Brno, 1999. p. 312 ( p.)Detail
TOMÁNEK, P., BENEŠOVÁ, M., LÉTAL, P., GRMELA, L., DOBIS, P., BRÜSTLOVÁ, J. Lokální spektroskopie a lokální fluorescence dielektrických a polovodičových povrchů. In Transfer+ 99. Brno: Vysoké učení technické v Brně, 1999. p. H91 (H92 p.)ISBN: 80-214- 134.Detail
1998
LÉTAL, P., TOMÁNEK, P., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J. Chybí název. In Material structure and micromechanics of fracture (MSMF-2). Brno: Technical University of Brno, 1998. p. 62 ( p.)ISBN: 80-214- 118.Detail
LÉTAL, P., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., TOMÁNEK, P. Near-field and far- field spectroscopy of semiconductors. 2nd Int.Coll, MSMF- 2. Brno: 1998. p. 62 ( p.)ISBN: 80-214-1181- 3.Detail
GRMELA, L., TOMÁNEK, P. Analýza degradace a spolehlivosti LED. In Applied Optics and Optoelectronics. London: Institute of Physics, 1998. p. 334 ( p.)Detail
UHDEOVÁ, N., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., VEVERKA, O. Fyzikální praktitkum. Fyzikální praktikum. Brno: VUTIUM Brno, 1998. ISBN: 80-214-1215- 1.Detail
LÉTAL, P., TOMÁNEK, P., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J. Locally resolved topography and spectroscopy of semiconductors (with lateral resolution better than 250 nm). In Electronic devices and systems (EDS´98). Brno: Technical University of Brno, 1998. p. 169 ( p.)ISBN: 80-214- 119.Detail
LÉTAL, P., TOMÁNEK, P., DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L. Local spectroscopy by scanning near- field optical microscopy. Inženýrská mechanika - Engineering Mechanics, 1998, vol. 5, no. 3, p. 215 ( p.)ISSN: 1210- 2717.Detail
LÉTAL, P.; BRÜSTLOVÁ, J.; DOBIS, P.; GRMELA, L.; TOMÁNEK, P. Lokální spektroskopie pomocí řádkovacího optického mikroskopu pracujícího v blízkém poli. Inženýrská mechanika - Engineering Mechanics, 1998, vol. 5, no. 3, p. 215-217. ISSN: 1210- 2717.Detail
TOMÁNEK, P.; BRÜSTLOVÁ, J.; DOBIS, P.; GRMELA, L. Hybrid STM/r- SNOM with novel probe. Ultramicroscopy, 1998, vol. 71, no. 1- 4, p. 199-203. ISSN: 0304- 3991.Detail
LÉTAL, P., BRÜSTLOVÁ, J., TOMÁNEK, P., DOBIS, P., GRMELA, L. Locally resolved topography and spectroscopy of semiconductors (with lateral resolution better than of 250 nm). In Proc. of 5th Int.Conf. Electronic devices and systems 1998. Brno: 1998. p. 173 ( p.)ISBN: 80-214-1198- 8.Detail
1997
TOMÁNEK, P., GRMELA, L. Subwavelength lithography with reflection near field optical microscopy. In 5th CO-MAT- TECH 97. Bratislava: STU Bratislava, 1997. p. 157 ( p.)ISBN: 80-227- 097.Detail
UHDEOVÁ, N., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., VEVERKA, O. Fyzikální praktikum. Fyzikální praktikum. Brno: PC- DIR Brno, 1997. ISBN: 80-214-0903- 1.Detail
TOMÁNEK, P.; GRMELA, L.; BRÜSTLOVÁ, J.; DOBIS, P. Tunnel noise spectroscopy by reflection SNOM and STM. Proceedings of SPIE, 1997, vol. 3098, no. 1, p. 514 ( p.)ISSN: 0277- 786X.Detail
TOMÁNEK, P., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J. Vizualizace latentních obrazů pomocí optiky v blízkém poli. In Workshop 97. 3. Praha: CTU Publ. house Prague, 1997. p. 1021 ( p.)Detail
GRMELA, L., TOMÁNEK, P. Spolehlivost zařízení s jedním vstupem. In 5th Co-MAT- TECH 97. Bratislava: STU Bratislava, 1997. p. 109 ( p.)ISBN: 80-227- 097.Detail
1996
UHDEOVÁ, N., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., VEVERKA, O. Fyzikální praktikum I. Fyzikální praktikum I. Brno: PC- DIR Brno, 1996. ISBN: 80-214-0790- 5.Detail
UHDEOVÁ, N., BRÜSTLOVÁ, J., GRMELA, L., VEVERKA, O. Základy měření. Základy měření. Brno: PC- DIR Brno, 1996. ISBN: 80-214-0791- 3.Detail
1995
TOMÁNEK, P., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., UHDEOVÁ, N. Twinned STM/SNOM setup. EOS Topical Meeting, 1995, vol. 8, p. 78 ( p.)ISSN: 1167- 5357.Detail
TOMÁNEK, P., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., UHDEOVÁ, N. STM/ SNOM setup. In 1995.Detail
TOMÁNEK, P., DOBIS, P., GRMELA, L. Characterization of surface corrugation by near- field techniques. EOS Annual Meeting, 1995, vol. 2A, no. 2A, p. 101-102. ISSN: 1022- 0151.Detail
TOMÁNEK, P., GRMELA, L., BRÜSTLOVÁ, J. Versatile near-field and far- field optical microscope. EOS Annual Meeting, 1995, vol. 2A, no. 2A, p. 132 ( p.)ISSN: 1022- 0151.Detail
TOMÁNEK, P., DOBIS, P., GRMELA, L. Superrozlišující vlastnosti optických sysémů v blízkém poli. In Mezinárodní konference VŠB: Aplikovaná fyzika. 11. Ostrava: VŠB Ostrava, 1995. p. 331 ( p.)Detail
1994
TOMÁNEK, P., GRMELA, L. Signal-to- noise ratio in scanning tunneling optical microscopy using multimode fibre as probe. In Applied Optics and Optoelectronics. London: Institute of Physics, 1994. p. 382 ( p.)Detail
TOMÁNEK, P., GRMELA, L. Signal- to noise ration in scanning tunneling reflection optical microscopy. In Fluctuation phenomena in physical systems. Vilnius, Liuthania: Vilnius University Press, 1994. p. 345 ( p.)ISBN: 9986-19-078- 9.Detail
1993
TOMÁNEK, P., GRMELA, L. Celovláknový kompaktní mikroskop pracující v blízkém poli. Brno: Fakulta elektrotechniky a informatiky VUT, čj.10/ 9, 1993.Detail
TOMÁNEK, P.; GRMELA, L. Modal noise in multimode optical probes. In Near field optics 2. Raleigh: State University of North Carolina, 1993. p. 72-72. Detail
TOMÁNEK, P., GRMELA, L. Odstup signál/šum v řádkovací odrazné optické tunelové mikroskopii. In Fluctuation phenomena in physical systems. Vilnius: Vilnius University Press, 1993. p. 345-349. ISBN: 9986- 1907.Detail
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