Publications

• 2022

  SEDLÁK, P.; KASPAR, P.; SOBOLA, D.; GAJDOŠ, A.; MAJZNER, J.; SEDLÁKOVÁ, V.; KUBERSKÝ, P. Solvent Evaporation Rate as a Tool for Tuning the Performance of a Solid Polymer Electrolyte Gas Sensor. Polymers, 2022, vol. 14, no. 21, p. 1-17. ISSN: 2073-4360.
  Detail | WWW | Full text in the Digital Library

• 2020

  SEDLÁK, P.; GAJDOŠ, A.; MACKŮ, R.; MAJZNER, J.; HOLCMAN, V.; SEDLÁKOVÁ, V.; KUBERSKÝ, P. The effect of thermal treatment on ac/dc conductivity and current fluctuations of PVDF/NMP/[EMIM][TFSI] solid polymer electrolyte. Scientific Reports, 2020, vol. 10, no. 1, p. 1-12. ISSN: 2045-2322.
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  SEDLÁK, P.; KUBERSKÝ, P.; GAJDOŠ, A.; MAJZNER, J.; SEDLÁKOVÁ, V.; MACKŮ, R.; HOLCMAN, V. Effect of the Different Crystallinity of Ionic Liquid Based Solid Polymer Electrolyte on the Performance of Amperometric Gas Sensor. Proceedings of 7th International Electronic Conference on Sensors and Applications, 15–30 November 2020. Engineering Proceedings. MDPI, 2020. p. 37-37. ISSN: 2673-4591.
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• 2019

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O.; URRUTIA, L. A Simple Analytical Model of Capacity Fading for Lithium–Sulfur Cells. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, vol. 34, no. 6, p. 5779-5786. ISSN: 0885-8993.
  Detail | WWW

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O. Cycle life and degradation sources in Li-S cells. In Technical Digest of 13th Conference „Electron Technology” ELTE and 43rd International Microelectronics and Packaging IMAPS Poland Conference. Kraków, Poland: International Microelectronics and Packaging Society Poland Chapter, 2019. p. 83-84. ISBN: 978-83-932464-3-4.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Supercapacitor Degradation and Life-time. In Proceedings of 2nd Passive Components Networking Symposium. Brno: European Passive Components Institute s.r.o., 2019. p. 90-97. ISBN: 978-80-907447-0-7.
  Detail

• 2018

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O. SOURCES OF DEGRADATION IN LI-S CELLS. In 39. Nekonvenční zdroje elektrické energie. 2018. p. 95-97. ISBN: 978-80-02-02786-7.
  Detail

• 2017

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; OSTRÝ, L. Equivalent model for AVX MLCC - FINAL REPORT - STAGE III. 2017. p. 1-49.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; KUPAROWITZ, M. Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field. In PCSN 2017 Proceedings. Česká republika: Ing. Vladislav Pokorný - LITERA BRNO, Tábor 43a, 612 00 Brno, 2017. p. 128-136. ISBN: 978-80-905768-8-9.
  Detail

  KUPAROWITZ, M.; SEDLÁKOVÁ, V.; GRMELA, L. LEAKAGE CURRENT DEGRADATION DUE TO ION DRIFT AND DIFFUSION IN TANTALUM AND NIOBIUM OXIDE CAPACITORS. METROL MEAS SYST, 2017, vol. 24, no. 2, p. 255-264. ISSN: 0860-8229.
  Detail | WWW

  KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SEDLÁK, P.; ŠIKULA, J. Low frequency noise of electrochemical power sources. In 2017 International Conference on Noise and Fluctuations (ICNF). Vilnius, Lithuania: IEEE, 2017. p. 1-4. ISBN: 978-1-5090-2760-6.
  Detail | WWW

  KUPAROWITZ, T.; SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Supercapacitor Degradation and Reliability. In Passive Components Networking days EPCI Passive Components Networking Symposium 2017. 2017. p. 63-68. ISBN: 978-80-905768-8-9.
  Detail

• 2016

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M.; OSTRÝ, L. Equivalent model for AVX MLCC - FINAL REPORT - STAGE II. 2016. p. 1-70.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M. Supercapacitor Parameters Degradation Analysis by Energy Cycling and Calendar Life Tests. Space Passive Component Days. European Space Agency, 2016. p. 1-13.
  Detail | WWW

  SEDLÁK, P.; KUBERSKÝ, P.; ŠKARVADA, P.; HAMÁČEK, A.; SEDLÁKOVÁ, V.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J. Current-fluctuation measurements of amperometric gas sensors prepared by three different technology procedures. Metrology and Measurement Systems, 2016, vol. 23, no. 4, p. 531-543. ISSN: 2300-1941.
  Detail | WWW | Full text in the Digital Library

  SZEWCZYK, A.; ŠIKULA, J.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T. Voltage dependence of supercapacitor capacitance. METROL MEAS SYST, 2016, vol. 23, no. 3, p. 403-411. ISSN: 0860-8229.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T.; BUERGLER, B.; VAŠINA, P. Supercapacitor degradation assesment by power cycling and calendar life tests. METROL MEAS SYST, 2016, vol. 23, no. 3, p. 345-358. ISSN: 0860-8229.
  Detail

• 2015

  SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T.; BUERGLER, B.; VAŠINA, P. Supercapacitor equivalent electrical circuit model based on charges redistribution by diffusion. Journal of Power Sources, 2015, vol. 2015, no. 286, p. 58-65. ISSN: 0378-7753.
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  SEDLÁKOVÁ, V.; ŠIKULA, J.; VRBA, R.; MAJZNER, J.; SEDLÁK, P.; SANTO-ZARNIK, M.; BELAVIC, D. Noise in piezoresistive pressure sensors. In Noise and Fluctuation (ICNF). IEEE, 2015. p. 1-4. ISBN: 978-1-4673-8335-6.
  Detail | WWW

  KUBERSKÝ, P.; SEDLÁK, P.; HAMÁČEK, A.; NEŠPŮREK, S.; KUPAROWITZ, T.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V.; GRMELA, L.; SYROVÝ, T. Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors. Chemical Physics, 2015, vol. 456, no. 1, p. 111-117. ISSN: 0301-0104.
  Detail | WWW

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M. Equivalent model for AVX MLCC - FINAL REPORT - STAGE I. 2015. p. 1-53.
  Detail

  SEDLÁK, P.; KUBERSKÝ, P.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J.; MACKŮ, R.; ŠKARVADA, P.; SEDLÁKOVÁ, V.; HAMÁČEK, A. Investigation of adsorption-desorption phenomenon by using current fluctuations of amperometric NO2 gas sensor. In Noise and Fluctuations (ICNF). IEEE, 2015. p. 1-4. ISBN: 978-1-4673-8335-6.
  Detail | WWW

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T. Technical note 11: Modeling of supercapacitors ageing. 2015. p. 1-50.
  Detail

• 2014

  HASSE, L.; BABICZ, S.; KACZMAREK, L.; SMULKO, J.; SEDLÁKOVÁ, V. Quality assessment of ZnO-based varistors by 1/f noise. Microelectronics Reliability, 2014, vol. 54 (2014), no. 1, p. 192-199. ISSN: 0026-2714.
  Detail

  KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SZEWCZYK, A.; HASSE, L.; SMULKO, J.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J. Charge Redistribution and Restoring voltage of Supercapacitors. ElectroScope - http://www.electroscope.zcu. cz, 2014, vol. 2014, no. 3, p. 1-7. ISSN: 1802- 4564.
  Detail | WWW

  KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SZEWCZYK, A.; HASSE, L.; SMULKO, J.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J. Supercapacitors – Charge Redistribution and Restoring Voltage. In Proceedings. Brno: Vysoké učení technické v Brně, 2014. p. 145-150. ISBN: 978-80-214-4985- 5.
  Detail

• 2013

  SITA, Z.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J.; GRMELA, L. Analysis of noise and non-linearity of I- V characteristics of positive temperature coefficient chip thermistors. METROL MEAS SYST, 2013, vol. XX, no. 4, p. 635-644. ISSN: 0860- 8229.
  Detail

  SANTO-ZARNIK, M.; BELAVIC, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J. Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/ f Noise Measurements. Radioengineering, 2013, vol. 22, no. 1, p. 227-232. ISSN: 1210- 2512.
  Detail

  SANTO-ZARNIK, M.; SEDLÁKOVÁ, V.; BELAVIC, D.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Estimation of the long-term stability of piezoresistive LTCC pressure sensors by means of low- frequency noise measurements. Sensors and Actuators, 2013, vol. 199, no. 1, p. 334-343. ISSN: 0924- 4247.
  Detail

  VONDRA, M.; SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; MAJZNER, J.; SMULKO, J.; HASSE, L. A FPGA- Based Measurement System with QCM. In A FPGA- Based Measurement System with QCM. Žilina: EDIS - Publishing Institution of the University of Zilina, 2013. p. 13-15. ISBN: 978-80-554-0807- 1.
  Detail

  SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; MAJZNER, J.; VONDRA, M.; KUBERSKÝ, P.; NEŠPŮREK, S.; HAMÁČEK, A. Noise in Amperometric NO2 Sensor. In Proceedings of 22nd International Conference on Noise and Fluctuations. Montpelier, France: IEEE, 2013. p. 1-4. ISBN: 978-1-4799-0670- 3.
  Detail

• 2012

  SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; KOPECKÝ, M.; ŠIKULA, J.; SANTO-ZARNIK, M.; BELAVIC, D.; HROVAT, M. Evaluation of piezoresistive ceramic pressure sensors using noise measurements. Informacije MIDEM, 2012, vol. 42, no. 2, p. 109-114. ISSN: 0352- 9045.
  Detail

  SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; HOLCMAN, V.; ŠIKULA, J.; SANTO-ZARNIK, M.; BELAVIC, D.; HROVAT, M. Influence of Functional Resistors on Offset Voltage Noise in Thick- Film Pressure Sensors. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Slovinsko: MIDEM, 2012. p. 393-398. ISBN: 978-961-92933-2- 4.
  Detail

  KOPECKÝ, M.; SEDLÁKOVÁ, V.; HOLCMAN, V.; PETTERSSON, H. Analysis of transport mechanisms for the Ta2O5 layers for low temperature range 80 K to 300 K. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Slovinsko: MIDEM, 2012. p. 145-150. ISBN: 978-961-92933-2- 4.
  Detail

  SANTO-ZARNIK, M.; BELAVIČ, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J. INTRINSIC RESOLUTION OF A PIEZORESISTIVE CERAMIC PRESSURE SENSOR. In EDS 2012 Proceedings. IMAPS CZ& SK, 2012. p. 251-256. ISBN: 978-80-214-4539- 0.
  Detail

  VONDRA, M.; SEDLÁK, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HOLCMAN, V. Equivalent circuit of polypyrrole-based QCM. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Lubljana Slovenia: 2012. p. 405-409. ISBN: 978-961-92933-2-4.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; CHVÁTAL, M.; PAVELKA, J.; TACANO, M.; TOITA, M. Noise in Submicron Metal-Oxide-Semiconductor Field Effect Transistors: Lateral Electron Density Distribution and Active Trap Position. Japanese Journal of Applied Physics, 2012, vol. 2012 (51), no. 1, p. 024105- 1 (024105-5 p.)ISSN: 0021- 4922.
  Detail

  CICHOSZ, J.; HASSE, L.; SZEWCZYK, A.; SEDLÁK, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Non-linear electro-ultrasonic spectroscopy of high- voltage varistors. In XI Krajowa Konferencja Elektroniki. Warszawa: Sigma- Not, 2012. p. 115-120. ISBN: 978-83-934712-0- 1.
  Detail

  SEDLÁK, P.; ŠIKULA, J.; VONDRA, M.; SEDLÁKOVÁ, V.; MAJZNER, J.; HOLCMAN, V. Fluctuation-enhanced gas sensing using polypyrrole-based QCM and its adsorption- desorption kinetics. In Proceedings MIDEM 2012. Ljubljana: MIDEM, 2012. p. 399-404. ISBN: 978-961-92933-2- 4.
  Detail

  SEDLÁK, P.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V. Model of Adsorpce- Desorption Noise in QCM Gas Sensors. In Proceedings of the conference New Trends in Physics. Brno: Ústav fyziky, FEKT, Vysoké učení technické v Brně, 2012. p. 187-190. ISBN: 978-80-214-4594- 9.
  Detail

  SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; TEVEROVSKY, D.; ZEDNÍČEK, T. IONS ELECTROMIGRATION IN TANTALUM CAPACITORS. In EDS 2012 Proceedings. IMAPS CZ& SK, 2012. p. 343-348. ISBN: 978-80-214-4539- 0.
  Detail

• 2011

  SEDLÁK, P.; TOFEL, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HASSE, L. Ultrasonics spectroscopy of silicon single crystal. METROL MEAS SYST, 2011, vol. 18, no. 4, p. 621-630. ISSN: 0860- 8229.
  Detail

  KOPECKÝ, M.; CHVÁTAL, M.; SEDLÁKOVÁ, V. Electron Transport in Ta Nanolayers: Application to Tantalum Capacitors. In Polymer Electronics and Nanotechnologies: towards System Integration. first. Koszykowa 75, 00 662 , Warsaw, Poland: Piotr Firek, Ryszard Kisiel, 2011. p. 137-139. ISBN: 978-83-7207-874- 2.
  Detail

• 2010

  SEDLÁKOVÁ, V. Non- destructive testing of passive electronic components. Brno: Vysoké učení technické v Brně, 2010. p. 1-117.
  Detail

  KOPECKÝ, M.; CHVÁTAL, M.; SEDLÁKOVÁ, V. Charge Carrier Transport in Ta2O5 Oxide Nanolayers. ElectroScope - http://www.electroscope.zcu. cz, 2010, vol. 2010, no. 3, p. 1-4. ISSN: 1802- 4564.
  Detail

  TOFEL, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; TRČKA, T. Electro Ultrasonic Spectroscopy of Magnesium Composites. Jemná mechanika a optika, 2010, vol. 55, no. 5/ 2010, p. 142-144. ISSN: 0447- 6441.
  Detail

  SEDLÁKOVÁ, V. NON- DESTRUCTIVE TESTING OF PASSIVE ELECTRONIC COMPONENTS. Vědecké spisy vysokého učení technického v Brně, 2010. p. 1-38.
  Detail

• 2009

  ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; PAVELKA, J.; TACANO, M.; TOITA, M. RTS in Submicron MOSFETs: Lateral Field Effect and Active Trap Position. AIP conference proceedings, 2009, vol. 1129, no. 1, p. 205-208. ISSN: 0094- 243X.
  Detail

  CHVÁTAL, M.; ŠIKULA, J.; SEDLÁKOVÁ, V.; KNÁPEK, A. Measurements and Theoretical Approximations of VA Characteristics MOSFETs. Jemná mechanika a optika, 2009, vol. 54, no. 10, p. 278-279. ISSN: 0447- 6441.
  Detail

  SEDLÁKOVÁ, V. Závěrečná zpráva k řešení grantového projektu č. 102/07/ P482. 2009.
  Detail

• 2008

  SEDLÁKOVÁ, V.; ŠIKULA, J.; TOFEL, P.; MAJZNER, J. Electro-ultrasonic spectroscopy of polymer- based thick film layers. Microelectronics Reliability, 2008, vol. 48, no. 6, p. 886-889. ISSN: 0026- 2714.
  Detail

  ŠIKULA, J.; HÁJEK, K.; SEDLÁKOVÁ, V.; TOFEL, P.; MAJZNER, J. Improved Signal to Noise Ratio of Electro- ultrasonic Spectroscopy. ElectroScope - http://www.electroscope.zcu. cz, 2008, vol. 2008, no. 6, p. 1-4. ISSN: 1802- 4564.
  Detail

  TOFEL, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistor Testing by Electro - Ultrasonic Spectroscopy with DC Electric Signal. In Reliability and Life- time Prediction ISSE2008. 1. Hungary: 2008. p. 56-57. ISBN: 978-963-06-4915- 5.
  Detail

  SEDLÁKOVÁ, V. Dílčí zpráva k řešení grantového projektu č.102/07/ P482. 2008.
  Detail

• 2007

  SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J. Noise and Electro- Ultrasonic Spectroscopy of Polymer Based Conducting Layers. In Noise and Fluctuations. USA: American Institute of Physics, 2007. p. 277-280. ISBN: 978-0-7354-0432- 8.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistors Testing by Electro- Ultrasonic Spectroscopy. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies& Materials Association, 2007. p. 321-328. ISBN: 0-7908-0114- 0.
  Detail

  SEDLÁKOVÁ, V. Electro- ultrasonic Spectroscopy of Polymer Based and Cermet Thick Film Resistors. In Proceedings EMPC 2007. Finsko: IMAPS Nordic, 2007. p. 450-455.
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  SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J. Electro-Ultrasonic Spectroscopy - New Method for Ppolymer Based Conducting Layers Characterisation. In Proceedings of the conference New Trends in Physics. Brno, ČR: Ústav fyziky FEKT VUT v Brně, 2007. p. 130-133. ISBN: 978-80-7355-078- 3.
  Detail

  ŠIKULA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; TACANO, M.; TOITA, M. RTS Noise and quantum transitions in submicron MOSFETs. In New Trends in Physics. Brno: VUT, 2007. p. 138-141. ISBN: 978-80-7355-078- 3.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; NAVAROVÁ, H.; PAVELKA, J.; HLÁVKA, J.; SITA, Z. Leakage Current, Noise and Reliability of NbO and Ta Capacitors. In Proceedings EMPC 2007. Finsko: IMAPS Nordic, 2007. p. 436-441.
  Detail

  ŠIKULA, J.; SEDLÁKOVÁ, V.; NAVAROVÁ, H.; HLÁVKA, J.; TACANO, M.; SITA, Z. Niobium Oxide and Tantalum Capacitors: Leakage Current and M-I- S Model Parameters. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies& Materials Association, 2007. p. 337-345. ISBN: 0-7908-0114- 0.
  Detail

  MAJZNER, J.; SEDLÁKOVÁ, V.; TOFEL, P.; SEDLÁK, P. NOISE IN ULTRASONIC TRANSDUCER. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, 2007. p. 94-97. ISBN: 978-80-7355-078- 3.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistors Testing by Electro- Ultrasonic Spectroscopy. 2007, vol. 2007, no. Nov/ Dec, p. 16-20.
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• 2006

  SEDLÁKOVÁ, V., ŠIKULA, J. Charge carrier transport and noise in polymer based thick films. In 4th European Microelectronics and Packaging Symposium with Table-Top Exhibition - Proceedings. Slovinsko: MIDEM, 2006. p. 15 ( p.)ISBN: 961-91023-4- 7.
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  SEDLÁKOVÁ, V.; SEDLÁK, P.; ŠIKULA, J.; HÁJEK, K. Application of Electro- Ultrasonic Spectroscopy for NDT of Electronic Components. In Defektoskopie 2006 Proceeding. Brno: Czech Society for Nondestructive Testing, 2006. p. 225 ( p.)ISBN: 80-214-3290- X.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; SPIRALSKI, L. Polymer Based Thick Films - Material Quality and Interface Resistance Evaluation. In XXX International Conference of IMAPS Poland Chapter Proceedings. Krakow, Poland: Institute of Electron Technology - Cracow Division, 2006. p. 95 ( p.)ISBN: 83-917701-3- 3.
  Detail

  P. Sedlak, J. Majzner, J. Sikula and V. Sedlakova. Finite element model of noise in piezoceramic sensor. In Proceedings / EMPS 2006 - 4th European Microelectronics and Packaging Symposium with Table- Top Exhibition. Ljubljana, Slovenia: MIDEM, 2006. p. 325 ( p.)ISBN: 961-91023-4- 7.
  Detail

  ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z.; HÖSCHEL, P.; TACANO, M. Niobium Oxide and Tantalum Capacitors: Quantum Effects in Charge Carrier Transport. In Proceedings CARTS USA 2006 - The 26th Symposium for Passive Components. Orlando, Florida: Electronic Components, Assemblies and Materials Association, 2006. p. 421 ( p.)ISBN: 0-7908-0108- 6.
  Detail

  ŠIKULA, J., HÁJEK, K., SEDLÁKOVÁ, V., HEFNER, Š. ELECTRO- ULTRASONIC SPECTROSCOPY OF CONDUCTING SOLIDS. In 9th European Conference of NDT. Berlín, Německo: DGZIP, 2006. p. Fr.1.5. 2 ( p.)ISBN: 3- 931381.
  Detail

  ŠIKULA, J., HEFNER, Š., SEDLÁKOVÁ, V., HÁJEK, K. Electro- Ultrasonic Spectroscopy of Conducting Solids. In DGZfP Proceedings BB 103- CD. Berlin: DGZfP, 2006. p. 150 ( p.)ISBN: 3- 931381.
  Detail

  ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z. Charge Carrier Transport in NbO and Ta Capacitors in Temperature Range 100 to 300 K. In Proceeding of CARTS Europe 2006 - 20th annual passive components symposium. Bad Homburg, Německo: Electronic Components, Assemblies and Materials Association, 2006. p. 189 ( p.)ISBN: 0-7908-0110- 8.
  Detail

  ŠIKULA, J.; SEDLÁKOVÁ, V.; SITA, Z. Charge Carriers Transport and Noise in Niobium Oxide and Tantalum Capacitors. In EDS ' 06 IMAPS CS International Conference Proceedings. Brno, ČR: Ing. Zdeněk Novotný CSc., 2006. p. 154 ( p.)ISBN: 80-214-3246- 2.
  Detail

  ŠIKULA, J., HÁJEK, K., SEDLÁKOVÁ, V., HEFNER, Š. ELECTRO- ULTRASONIC SPECTROSCOPY OF CONDUCTING SOLIDS. In Abstracts of 9th European Conference of NDT. Berlin: DGZIP, 2006. p. Fr.1.5. 2 ( p.)
  Detail

• 2005

  SEDLÁKOVÁ, V., ŠIKULA, J. Charge Carrier Transport in Polymer- Based Thick Resistive Films. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. p. 93 ( p.)ISSN: 0887- 7491.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; GRMELA, L.; HÖSCHEL, P.; SITA, Z.; HASHIGUCHI, S.; TACANO, M. Noise and Carge Storage in Nb2O5 Thin Films. In Noise and Fluctuations. United States of America: American Institute of Physics, 2005. p. 135 ( p.)ISBN: 0-7354-0267- 1.
  Detail

  P. Dobis, J. Brüstlová, V. Sedláková. Europhysics Conference Abstracts, Vol. 29G: Learning and Tutorial Supports for Bachelor Physics at Brno University of Technology. Europhysics Conference Abstracts, Vol. 29G. 4th International Conference on Physics Teaching in Engineering Education - PTEE 2005. Europhysics Conference Abstracts, Vol. 29G. Brno: European Physical Society, 2005. p. 7- 2 ( p.)ISBN: 2-914771-28- 2.
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  P. Dobis, J. Brüstlová, V. Sedláková. Learning and Tutorial Supports for Bachelor Physics at Brno University of Technology. In Proceedings of the 4th International Conference on Physics Teaching in Engineering Education - PTEE 2005. Brno: European Physical Society and European Society for Engineering Education, 2005. p. 72 ( p.)ISBN: 80-903063-6- 5.
  Detail

  ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; HÖSCHEL, P.; SITA, Z.; ZEDNÍČEK, T.; TACANO, M.; HASHIGUCHI, S. Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors. In 25th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. p. 210 ( p.)ISSN: 0887- 7491.
  Detail

  GRILL, R. Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison. In 15th European Microelectronics and Packaging Conference Proceedings. Bruggy, Belgie: IMAPS Benelux, 2005. p. 540 ( p.)
  Detail

  TACANO, M., ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V. RTS Noise in Submicron MOSFETs: Low and High Field Effects. In Proceedings of EDS'05 Electronic Devices and Systems IMAPS CS Int. Conf. Brno: VUT, 2005. p. XV ( p.)ISBN: 80-214-2990- 9.
  Detail

  ŠIKULA, J.; HLÁVKA, J.; SEDLÁKOVÁ, V.; HÖSCHEL, P.; GRILL, R.; SITA, Z.; ZEDNÍČEK, T.; TACANO, M. Niobium Oxide and Tantalum Capacitors: M-I- S Model Parameters Comparison. In 25th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. p. 244 ( p.)ISSN: 0887- 7491.
  Detail

  PAVELKA, J., SEDLÁKOVÁ, V., ŠIKULA, J., HAVRÁNEK, J., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in Submicron MOSFETs: High Field Effects. In Noise and Fluctuations, 18th International Conference on Noise and Fluctuations - ICNF 2005, AIP Conference Proceedings 780. Salamanka, Španělsko: University of Salamanca, 2005. p. 339 ( p.)ISBN: 0-7354-0267- 1.
  Detail

• 2004

  SEDLÁKOVÁ, V., SEDLÁK, P., ŠIKULA, J., ROČAK, D., HROVAT, M., SANTO-ZARNIK, M., BELAVIC, D. Analysis of silver diffusion into thick film resistor layers. In Proceedings of 3rd European Microelectronics and Packaging Symposium with Table- Top Exhibition. Lanskroun: IMAPS CZ& SK Chapter, 2004. p. 660 ( p.)ISBN: 80-239-2835- X.
  Detail

  HÁJEK, K., SEDLÁKOVÁ, V., MAJZNER, J., HEFNER, Š., ŠIKULA, J. Non-linearity and noise characterisation of thick- film resistors after high voltage stress. In Proceedings of the 3rd European Microelectronics and Packaging Symposium with Table Top Exhibition. Lanskroun: IMAPS CZ& SK Chapter, 2004. p. 421 ( p.)ISBN: 80-239-2835- X.
  Detail

  SEDLÁKOVÁ, V., ŠIKULA, J. Thick film resistor characterisation by non- linearity and resistance change after high voltage stress. In New Trends in Physics - Proceedings of the Conference. Brno: Department of Physics FEEC, Brno University of Technology, 2004. p. 88 ( p.)ISBN: 80-7355-024- 5.
  Detail

  ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L. Conductivity mechanisms and breakdown of NbO capacitors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. p. 141 ( p.)ISSN: 0887- 7491.
  Detail

  ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P. Noise and Non- Linearity as Reliability Indicators of Electronic Devices. Informacije MIDEM, 2004, vol. 2003, no. 4, p. 213-221. ISSN: 0352- 9045.
  Detail

  ŠIKULA, J., PAVELKA, J., SEDLÁKOVÁ, V., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in submicron MOSFETs and quantum dots. In Proceedings of SPIE - Noise and Information in Nanoelectronics, Sensors, and Standards II. United States of America: The Society of Photo- Optical Instrumentation Engineers, 2004. p. 64 ( p.)ISBN: 0-8194-5394- 3.
  Detail

  ŠIKULA, J.; HLÁVKA, J.; SEDLÁKOVÁ, V.; HÖSCHEL, P.; ZEDNÍČEK, T.; SITA, Z. Charge Carrier Transport and Storage in NbO Capacitors. In Proceedings of 18th European Passive Components Conference. United Kingdom: ECA - Electronic Components, Assemblies & Materials Association, 2004. p. 178 ( p.)
  Detail

  SEDLÁKOVÁ, V., MELKES, F., DOBIS, P., ŠIKULA, J., TACANO, M., HASHIGUCHI, S. Non- lineartiy changes induced by current stress in thick film resistors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. p. 154 ( p.)ISSN: 0887- 7491.
  Detail

• 2003

  SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non- linearity of thick film resistors. In Proceedings of 14th European Microelectronics and Packaging Conference. Německo: IMAPS Germany, 2003. p. 127 ( p.)
  Detail

  SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D. The effect of silver diffusion from contact electrode into thick film resistors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 201 ( p.)ISBN: 0887- 7491.
  Detail

  SEDLÁKOVÁ, V., BRÜSTLOVÁ, J., ŠIKULA, J., HLÁVKA, J., COCKER, J., ADAMS, K., GREENHILL, D. Noise of carbon/ graphite thick conducting films. In Proceedings of the 17th International Conference Noise and Fluctuations. Czech Republic: CNRL s.r.o., 2003. p. 201 ( p.)ISBN: 80-239-1005- 1.
  Detail

  ŠIKULA, J., DOBIS, P., SEDLÁKOVÁ, V. Noise and non- linearity as reliability indicators of electronic devices. In MIDEM 2003 Conference Proceedings. Slovenia: MIDEM Slovenia, 2003. p. 3 ( p.)ISBN: 961-91023-1- 2.
  Detail

  ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., VRBA, R., MELKES, F., ROCAK, D., BELAVIC, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non- linearity of thick film resistors. In 23rd Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: 2003. p. 112 ( p.)ISSN: 0887- 7491.
  Detail

  BELAVIC, D., ROCAK, D., SEDLÁKOVÁ, V., HROVAT, M., ŠIKULA, J., PAVELKA, J. An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick- Film Resistors. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. p. 40 ( p.)ISBN: 80-238-9094- 8.
  Detail

  SEDLÁKOVÁ, V., BRÜSTLOVÁ, J., ŠIKULA, J., HLÁVKA, J., COCKER, J., ADAMS, K., GREENHILL, D. Noise of carbon/ graphite thick conducting films. In Noise and Fluctuations. Brno: CNRL, 2003. p. 201 ( p.)ISBN: 80-239-1005- 1.
  Detail

  ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T. Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 281 ( p.)ISBN: 0887- 7491.
  Detail

  SEDLÁKOVÁ, V., DOBIS, P., ŠIKULA, J., HOSCHL, P., SITA, Z., ZEDNÍČEK, T. Low Frequency Noise of Nb2O5 Thin Insulating Films. In Proceedings of the 17th International Nonference Noise and Fluctuations ICNF 2003. Czech Republic: CNRL s.r.o., 2003. p. 141 ( p.)ISBN: 80-239-1005- 1.
  Detail

• 2002

  SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J. Partial Discharges and Acoustic Emission in M-I- M Structures. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: Ing. Zdeněk Novotný, CSc., 2002. p. 140 ( p.)ISBN: 80-238-9094- 8.
  Detail

  SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th Conference STUDENT EEICT 2002. Brno: Ing. Zdeněk Novotný, CSc., 2002. p. 244 ( p.)ISBN: 80-214-2115- 0.
  Detail

  SEDLÁKOVÁ, V., PAVELKA, J., GRMELA, L., ŠIKULA, J., ROČAK, D., HROVAT, M., BELAVIČ, D. NOISE AND NON-LINEARITY OF THICK- FILM RESISTORS. In Proceedings of European Microelectronics packaging & interconection Symposium. Krakow, Poland: IMAPS - Poland Chapter, 2002. p. 320 ( p.)ISBN: 83-904462-8- 6.
  Detail

  SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th ECNDT. Leganes, Madrid: Spanish Society for NDT AEND, 2002. p. 215 ( p.)ISBN: 84-699-8573- 6.
  Detail

  SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., ROČAK, D., BELAVIČ, D., TACANO, M. Effect of Contact Electrode on Noise and Nonlinearity of Thick-Film Resistor. In Proc. of 16th Symp. CARTS Europe 2002. Nice, France: 2002. p. 171 ( p.)ISBN: 0887- 7491.
  Detail

  ŠIKULA, J.; HLÁVKA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; GRMELA, L.; TACANO, M.; HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. Active and Passive Electronic ComponentsISSN, 2002, vol. 25, no. 2, p. 161 ( p.)ISSN: 0882- 7516.
  Detail

  ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V. Low-Frequency Noise of Thick- Film Resistors as Quality and Reliability Indicator. Microelectronics Reliability, 2002, vol. 41, no. 4, p. 531-542. ISSN: 0026- 2714.
  Detail

  ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetics of the Cracks Creation in Granite Under Ramp loading. NDT Welding Bulletin, 2002, vol. 2002, no. 12, p. 4 ( p.)ISSN: 1213- 3825.
  Detail

  ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetika vzniku trhlin v žule při rostoucím zatěžování. NDT Welding Bulletin, 2002, vol. 2002, no. 2, p. 17 ( p.)ISSN: 1213- 3825.
  Detail

  ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetics of the Cracks Creation in Granite Under Ramp Loading. NDT Welding Bulletin, 2002, vol. 2002, no. 2, p. 17 ( p.)ISSN: 1213- 3825.
  Detail

  PAVELKA, J.; ŠIKULA, J.; VAŠINA, P.; SEDLÁKOVÁ, V.; TACANO, M.; HASHIGUCHI, S. Noise and transport characterisation of tantalum capacitors. Microelectronics Reliability, 2002, vol. 42, no. 6, p. 841 ( p.)ISSN: 0026- 2714.
  Detail

  SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D. Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity. In Proc. of 38th International Conference on Microelectronics, Devices and Materials. Lipica, Slonenia: 2002. p. 245 ( p.)ISBN: 961-91023-0- 4.
  Detail

• 2001

  SEDLÁKOVÁ, V.; PAVELKA, J.; ŠIKULA, J.; ROČAK, D.; HROVAT, M.; BELAVIČ, D. Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 747 ( p.)ISBN: 981-02-4677- 3.
  Detail

  SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J. Acoustic emission and partial discharges in M-I- M capacitors. In Proceedings of NDT in Progress. Třešť: DGZfP a ČNDT, 2001. p. 291 ( p.)ISBN: 80-238-7263- X.
  Detail

  SEDLÁKOVÁ, V. Noise Spectroscopy of Thick Film Resistors. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. p. 117 ( p.)ISBN: 80-214-1992- X.
  Detail

  PAVELKA, J., ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Thin Ta2O5 Amorphous Films. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 91 ( p.)ISBN: 981-02-4677- 3.
  Detail

  ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. The Tantalum Capacitor as a MIS Structure in Reverse Mode. In Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. p. 289 ( p.)ISBN: 0887- 7491.
  Detail

  PAVELKA, J., KOKTAVÝ, P., SEDLÁKOVÁ, V. Acoustic Emission Generated by Partial Discharges in Insulating Materials. In Proceedings of 31st International Conference Defektoskopie 2001. Praha: Česká společnost pro nedestruktivní testování, 2001. p. 215 ( p.)ISBN: 80-214-2002- 2.
  Detail

  ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. In Proceedings of CARTS- Euro 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. p. 81 ( p.)
  Detail

  ŠIKULA, J., SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J., MAJZNER, J. Electromagnetic and acoustic emission in solids. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. p. 123 ( p.)ISBN: 80-214-1992- X.
  Detail

• 2000

  ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; KOKTAVÝ, P.; SEDLÁKOVÁ, V.; LOKAJÍČEK, T.; TACANO, M.; HASHIGUCHI, S. Cracks Detection by Electromagnetic and Acoustic Emission. In Proc. of the 15th World Conf. on Non-Destructive Testing WCNDT, October 15-21, Rome, Italy, (2000). 2000. p. 397-400.
  Detail

• 1999

  ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; SEDLÁKOVÁ, V.; ROČAK, D.; BELAVIČ, D.; TACANO, M. Charge transport and noise sources in thick conducting films. In Proceedings of 13th European Passive Components Symposium CARTS-Europe ' 99. UK: Electronic Components Institute Internationale Ltd., 1999. p. 163 ( p.)
  Detail

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