Project detail

Electron transport, Noise and Diagnostic of Shottky and Autoemission Cathodes

Duration: 01.01.2011 — 31.12.2013

Funding resources

Czech Science Foundation - Standardní projekty

- whole funder (2011-01-01 - not assigned)

On the project

The project deals with transport, fluctuation phenomena and non-destructive diagnostics in autoemission cathodes. The aim is to study properties and behavior of oxide layers on tungsten and allied metals formed by etching. The project focuses on the stability of electron emission, V?A and noise characteristics and emission divergence. The methodology is based on the analysis of noise spectral density at different vacuum levels, temperatures and electric field strengths. AEC feature some advantages overthermionic cathodes, as high current densities, good divergence and low costs; hence, they contribute to the development of vacuum electron sources for electron microscopes with submicron resolution. Their performance depends on oxide thickness, tip dimensions, electric field strength and vacuum level. Results will include an analysis of band diagrams, identification of sources of the emission current noise in relation to reliability, a model for optimal tip dimensions and development of optimal conditions for oxide layer growth in correlation with maximum emissivity and lifetime.

Keywords
Cold emission Physical model Band diagram 1/f noise Ions diffusion,Oxide layer

Mark

GAP102/11/0995

Default language

English

People responsible

Units

Department of Physics
- beneficiary (2011-01-01 - not assigned)

Results

KNÁPEK, A.; GRMELA, L.; ŠIKULA, J. Noise Characterization of Cold Emission Cathodes with Epoxy Coating. In Proceedings of 5th Annual Internation Travelling Conference for Young Researchers and PhD Students. Prešov: Harmony Apeiron, 2011. p. 521-526. ISBN: 978-80-89347-05-6.
Detail

ŠTRBKOVÁ, L. Methodics of characterisation for the cold field-emission sources intended for electron microscopy. In Proceedings of the 19th Conference STUDENT EEICT 2013 Volume 2. Brno: LITERA, 2013. p. 120-122. ISBN: 978-80-214-4694-6.
Detail

ŠIK, O.; GRMELA, L. Charge transport properties and low frequency noise of Cadmium-Telluride based radiation detectors. In Proceedings of 5th Annual International Travelling Conference for Young Researchers and PhD Students. Prešov: Harmony Apeiron, 2011. p. 179-184. ISBN: 978-80-89347-05-6.
Detail

GRMELA, L.; ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R.; SMITH, S. Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2012, vol. 96, no. 1, p. 108-111. ISSN: 0927-0248.
Detail

GRMELA, L.; ŠKARVADA, P.; MACKŮ, R.; TOMÁNEK, P. Near-field Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Inventi Rapid: Energy & Power, 2011, vol. 2011, no. 2, p. 1-4. ISSN: 2229-7774.
Detail

KNÁPEK, A.; GRMELA, L.; ŠIKULA, J.; HOLCMAN, V.; DELONG, A. Noise of Cold Emission Cathode. In ICNF2011: 2011 21st International Conference on Noise and Fluctuations. 1. Toronto, Kanada: IEEE, 2011. p. 84-87. ISBN: 978-1-4577-0191-7.
Detail

KNÁPEK, A.; GRMELA, L. Stability Analysis of Cold-Emission Cathodes with Epoxy Coating. ElectroScope - http://www.electroscope.zcu.cz, 2011, vol. 2011, no. 2, p. 1-5. ISSN: 1802-4564.
Detail

ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Influence of laser cutting on p-n junction behavior of solar cell. VDI Berichte, 2011, vol. 2156, no. 2156, p. 291-296. ISSN: 0083-5560.
Detail

KNÁPEK, A. Current Stability Analysis of Cold-Emission Epoxy-Coated Cathodes. In Student EEICT, Proceedings of the 17th Conference, Volume 3. 2011. p. 346-350. ISBN: 978-80-214-4273-3.
Detail

SITA, Z.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J.; GRMELA, L. Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors. METROL MEAS SYST, 2013, vol. XX, no. 4, p. 635-644. ISSN: 0860-8229.
Detail

DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; TALU, M.; GRMELA, L. AFM imaging and fractaí analysis of surface roughness of AlN epilayers deposited on saphire substrate. In Proceedings of 8th Solid State Surfaces and Interfaces. Bratislava: Comenius University, 2013. p. 33-34. ISBN: 978-80-223-3501-0.
Detail

ŠKARVADA, P.; KOKTAVÝ, P.; SMITH, S.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; TOMÁNEK, P.; GRMELA, L. Microstructure defects in silicon solar cells. In Proceedings of 8th Solid state surfaces and intefaces. 1. Bratislava: Comenius University Bratislava, 2013. p. 168-169. ISBN: 978-80-223-3501-0.
Detail

ELHADIDY, H.; ŠIKULA, J.; ŠIK, O.; GRMELA, L.; ZAJAČEK, J. Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals. In 21st International Conference on Noise and Fluctuations. Kanada: IEEE, 2011. p. 1-4. ISBN: 978-1-4577-0191-7.
Detail

ŠIK, O.; GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; BELAS, E. Influence of CdTe material ageing on relaxation time and noise. Book of abstracts. Taipei: Academia Sinica, 2012. p. 1 (1 s.).
Detail

ELHADIDY, H.; ŠIKULA, J.; FRANC, J. Symmetrical current–voltage characteristic of a metal–semiconductor–metal structure of Schottky contacts and parameter retrieval of a CdTe structure. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2011, vol. 27, no. 1, p. 1-6. ISSN: 0268-1242.
Detail

HRUŠKA, P.; GRMELA, L. Simulování chování kvantové tečky v elektrostatickém poli. Jemná mechanika a optika, 2011, roč. 56, č. 7-8, s. 216-219. ISSN: 0447-6441.
Detail

BILALOV, B.; SAFARALIEV, G.; KARDASHOVA, G.; SOBOLA, D.; EUBOV, S. Technical features of creation new synthesis technologies of nano-, micro- and monocrystalline SiC film at 1000 oC. In International conference INNOVATIKA 2011. Machachkala: Dagestan State University, 2011. s. 116-118.
Detail

BILALOV, B.; KARDASHOVA, G.; GITIKCHIEV, M.; SOBOLA, D.; ABDURAZAKOV, A. Magnetron sputtering of (SiC)1-x(AlN)x solid solution thin films. In International conference INNOVATIKA 2011. Machachkala: State Dagestan University, 2011. s. 138-139.
Detail

BILALOV, B.; KARDASHOVA, G.; ABDURAZAKOV, A.; SOBOLA, D.; ARKHIPOV, A. Peculiarities of the obtaining process of silicon carbide and aluminum nitride. In Proceedings of Internationalscientific conference: Advanced technologies, equipment and analytical systems for material sciences and nanomaterials. K.V.Kozitov. Kursk: Southwest state university, 2011. s. 829-831. ISBN: 978-5-7681-0642-3.
Detail

DALLAEVA, D. Innovacionnyj podhod i modernizacija uchebnogo processa dlja podgotovki specialistov v oblasti skanirujuwej zondovoj mikroskopii. In the World of Scientific Discoveries, 2012, roč. 2.3(26), č. 02.2012, s. 31-43. ISSN: 2072-0831.
Detail

KNÁPEK, A. Emission Current Fluctuations vs. Beam Lightning of the Field-Emission Cathode. In Student EEICT - Proceedings of the 18th Conference vol.3. Brno: Litera Brno, 2012. p. 263-267. ISBN: 978-80-214-4462-1.
Detail

DALLAEVA, D. Morphology and structural investigation of silicon carbide layers formated by sublimation. In Proceedings of the 18th Conference STUDENT EEICT, vol. 3. vol.3. Brno: LITERA Brno, Tabor 43a, 612 00 Brno, 2012. p. 239-243. ISBN: 978-80-214-4462-1.
Detail

KNÁPEK, A.; GRMELA, L.; ŠIKULA, J.; ŠIK, O. Cold field-emission cathode noise analysis. METROL MEAS SYST, 2012, vol. 2012, no. 2, p. 417-422. ISSN: 0860-8229.
Detail

ELHADIDY, H.; ŠIK, O.; DĚDIČ, V.; ŠIKULA, J.; FRANC, J. NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS. In Proc. of EDS IMAPS CS 2012. Brno. 1. Brno, Antonínská 548/1: Vysoké učení technické v Brně, 2012. p. 314-312. ISBN: 978-80-214-4539-0.
Detail

DALLAEVA, D.; BILALOV, B.; SAFARALIEV, G.; KARDASHOVA, G.; TOMÁNEK, P.; ARKHIPOV, A. Investigation of the ion sputtering process of the (SiC)1-x(AlN)x ceramic target. In IMAPS CS International Conference. Electronic Devices and Systems. EDS'12. Proceedings. FIRST. LITERA, Tabor 43a, 61200 Brno: Vysoke uceni technicke v Brne, 2012. p. 49-53. ISBN: 978-80-214-4539-0.
Detail

DALLAEVA, D.; SAFARALIEV, G.; BILALOV, B.; KARDASHOVA, G.; TOMÁNEK, P. Formation and study of SiC and AlN epilayers. In IMAPS CS International Conference. Electronic Devices and Systems. EDS'12. Proceedings. LITERA, Tabor 43a, 61200 Brno: Vysoke uceni technicke v Brne, 2012. p. 111-115. ISBN: 978-80-214-4539-0.
Detail

ABUBAKER, H.; TOMÁNEK, P. Backward nultiscattering and transport of photons in biological tissue: Experiment and simulation. Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk), 2012, vol. 10, no. 2, p. 115-119. ISSN: 1804-3119.
Detail

KNÁPEK, A.; MIKMEKOVÁ, Š.; BRÜSTLOVÁ, J.; TRČKA, T.; KLAMPÁR, M. Surface Examination of Ultra-sharp Cold Field-Emission Cathode. In New Trends in Physics, NTF2012, Proceedings of the conference. první. Brno: 2012. p. 51-56. ISBN: 978-80-214-4594-9.
Detail

SERGEEV, E.; KNÁPEK, A.; GRMELA, L. Ultrasharp Field-Emission Cathodes with Epoxy Coating. In New Trends in Physics, NTF 2012, Proceedings of the conference. první. Brno: 2012. p. 161-165. ISBN: 978-80-214-4594-9.
Detail

DALLAEVA, D.; TOMÁNEK, P.; RAMAZANOV, S. Scanning tunneling microscopy of high-resistance SiC-AlN solid solutions. In New trends in physics 2012. Brno: Vysoke uceni technicke v Brne, Fakulta elektrotechniky a komunikacnich technologii, Ustav fyziky, 2012. p. 149-152. ISBN: 978-80-214-4594-9.
Detail

SERGEEV, E.; KNÁPEK, A.; MIKMEKOVÁ, Š.; GRMELA, L.; KLAMPÁR, M. Material Characterization of the Epoxy-Coated Cold-Field-Emission Cathodes. In Proceedings of the Scientific Conference Physics of Materials 2012. první. Košice, Slovensko: 2012. p. 109-112. ISBN: 978-80-553-1175-3.
Detail

DALLAEVA, D.; TOMÁNEK, P.; BILALOV, B. Scanning electron microscopy of the thin layers of silicon carbide-aluminum nitride solid solution formatted by sublimation epitaxy. In Optics and Measurement 2012. first edition. Prague 8: Institute of Plasma Physics AS CR, v.v.i. - TOPTEC, 2012. p. 5-8. ISBN: 978-80-87026-02-1.
Detail

DALLAEVA, D.; ARKHIPOV, A. Izgotovlenie keramicheskih mishenej metodom elektroimpulsnogo spekanija dlja synteza nanorazmernyh sloev. In Conference proceedings Relevant problems of physics. first. Southern Federal University: PUBLISHING of the Southern Federal University, 2012. s. 57-58. ISBN: 978-5-9275-1008-5.
Detail

TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S. Local investigation of defects in monocrystalline silicon solar cells. Conference Record of the IEEE Photovoltaic Specialists Conference, 2012, vol. 2012, no. 1, p. 1686-1690. ISSN: 0160-8371.
Detail

DALLAEVA, D.; ŠKARVADA, P.; TOMÁNEK, P.; SMITH, S.; SAFARALIEV, G.; BILALOV, B.; GITIKCHIEV, M.; KARDASHOVA, G. Structural properties of Al2O3/AlN thin film prepared by magnetron sputtering of Al in HF-activated nitrogen plasma. Thin Solid Films, 2013, vol. 526, no. 526, p. 92-96. ISSN: 0040-6090.
Detail

GRMELA, L.; HRUŠKA, P. Simulation of quantum dot in electrostatic fields. In Mathematical Methods in Electromagnetic Theory. Kharkiv, Ukraine: 2012. p. 193-196. ISBN: 978-1-4673-4479-1.
Detail

GRMELA, L.; HRUŠKA, P. Simulation of electrostatic field near the surface of very thin tungsten microcathode. In Mathematical Methods in Electromagnetic Theory. Kharkiv, Ukraine: 2012. p. 353-356. ISBN: 978-1-4673-4479-1.
Detail

LIEDERMANN, K.; HOLCMAN, V.; KLAMPÁR, M.; SPOHNER, M. DIELECTRIC RELAXATION SPECTROSCOPY OF CCTO CERAMICS MODIFIED WITH TRANSITION METALS AND LANTHANIDES. In New Trends in Physics 2012, Nové trendy ve fyzice NTF 2012. první. Brno: Brno University of Technology, 2012. p. 61-64. ISBN: 9788021445949.
Detail

NOVOTNÁ, V.; KNÁPEK, A.; TOMÁNEK, P.; ŠAFÁŘOVÁ, Š. Scanning Probe Microscopy as a Tool for Investigation of Biomaterials. Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk), 2012, vol. 10, no. 5, p. 350-354. ISSN: 1804-3119.
Detail

GRMELA, L. Nedestruktivní spektroskopické metody testování optoelektronických součástek a materiálů. Vědecké spisy Vysokého učení technického v Brně Edice Habilitační a inaugurační spisy, 2012, roč. 2012, č. 401, s. 1-35. ISSN: 1213-418X.
Detail

ANDREEV, A.; ŠIK, O.; GRMELA, L.; ŠIKULA, J. Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise. METROL MEAS SYST, 2013, vol. 2013, no. 3, p. 385-394. ISSN: 0860-8229.
Detail

DALLAEVA, D.; TOMÁNEK, P.; BILALOV, B.; KOROSTYLEV, E. SEM a AFM studie morfologie tenkých vrstev tuhého roztoku SiC-AlN. Jemná mechanika a optika, 2013, roč. 58, č. 3, s. 75-77. ISSN: 0447-6441.
Detail

ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; DALLAEVA, D. Lokální optoelektronická diagnostika mikroskopických vad v solárním křemíkovém článku. Jemná mechanika a optika, 2013, roč. 2013, č. 3, s. 81-84. ISSN: 0447-6441.
Detail

TOMÁNEK, P.; ŠKARVADA, P.; DALLAEVA, D.; GRMELA, L.; MACKŮ, R.; SMITH, S. Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells. WORLD JOURNAL OF ENGINEERING, 2013, vol. 10, no. 2, p. 119-124. ISSN: 1708-5284.
Detail

DALLAEVA, D. Morphology and structural investigation of aluminum nitride layers prepared by magnetron sputtering. In Proceedings of the 19th Conference Student EEICT 2013. první. Brno University of Technology: Litera, Tabor 43a, 61200 Brno, 2013. p. 134-138. ISBN: 978-80-214-4695-3.
Detail

KNÁPEK, A. Methods of Preparation and Characterisation of Experimental Field-Emission Cathodes. Brno: Vysoké učení technické v Brně, Edice PhD Thesis, sv. 699, 2013. p. 1-30.
Detail

DALLAEVA, D.; KOROSTYLEV, E.; BILALOV, B.; TOMÁNEK, P. Scanning proximal microscopy study of the thin layers of silicon carbide aluminum nitride solid solution manufactured by fast sublimation epitaxy. EPJ Web of Conferences, 2013, vol. 48, no. 1, p. 1-4. ISSN: 2100-014X.
Detail

PROKOPYEVA, E.; TOMÁNEK, P.; KOCOVÁ, L.; PALAI-DANY, T.; BALÍK, Z.; ŠKARVADA, P.; GRMELA, L. Comparison of optical and electrical investigations of meat ageing. Proceedings of SPIE, 2013, vol. 8774, no. 8774, p. 84471L1 (84471L8 p.)ISSN: 0277-786X.
Detail

KNÁPEK, A.; SERGEEV, E.; GRMELA, L. Electrical Characterization of Cold Field-Emission Cathodes based on Fowler-Nordheim Analysis. In Electronic Devices and Systems - IMAPS CS International Conference 2013. Brno: Vysoké učení technické v Brně, 2013. p. 104-108. ISBN: 978-80-214-4754-7.
Detail

GRMELA, L.; ŠIK, O. Metal-Semiconductor Junction Role in CdTe Detectors. Acta Electrotechnica et Informatica, 2013, vol. 13, no. 1, p. 22-25. ISSN: 1335-8243.
Detail

KNÁPEK, A.; GRMELA, L. Technologie výroby studenoemisních katod na bázi wolframu s tenkou povrchovou vrstvou epoxidu. Chemické listy, 2013, roč. 2013, č. 107, s. 545-549. ISSN: 1213-7103.
Detail

SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; MAJZNER, J.; VONDRA, M.; KUBERSKÝ, P.; NEŠPŮREK, S.; HAMÁČEK, A. Noise in Amperometric NO2 Sensor. In Proceedings of 22nd International Conference on Noise and Fluctuations. Montpelier, France: IEEE, 2013. p. 1-4. ISBN: 978-1-4799-0670-3.
Detail

SERGEEV, E.; KNÁPEK, A.; GRMELA, L.; ŠIKULA, J. Noise Diagnostic Method of Experimental Cold Field-Emission Cathodes. 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB. Montpellier: 2013. p. Th-P-9 (Th-P-9 p.)ISBN: 978-1-4799-0670-3.
Detail

BOGATYREVA, N.; BARTLOVÁ, M.; AUBRECHT, V. Absorpční vlastnosti plazmatu směsí SF6 a PTFE. In TVVI 2013. Praha: CEMC, 2013. s. 1-5. ISBN: 978-80-85990-22-5.
Detail

ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Optical and electrical detection and localization of solar cell defects on microscale. Proceedings of SPIE, 2013, vol. 8825, no. 8825, p. 8825071-88255077. ISSN: 0277-786X.
Detail

DALLAEVA, D.; TOMÁNEK, P. Substrate Preparation for Manufacturing of Aluminum Nitride Layers. ElectroScope - http://www.electroscope.zcu.cz, 2013, vol. 2013, no. 5, p. 1-5. ISSN: 1802-4564.
Detail

HOLCMAN, V.; MACKŮ, R.; ŠKARVADA, P.: Autoclav-01; Systém řízení Autoklávu s PLC AMIT. UFYZ - FEKT VUT. URL: http://www.ufyz.feec.vutbr.cz/veda-a-vyzkum/produkty. (software)
Detail

TRČKA, T.; ŠIK, O.; GRMELA, L.; KNÁPEK, A.: Katody_2013; Software pro analýzu transportu nosičů náboje u autoemisních katod. Ústav fyziky, FEKT, VUT v Brně. URL: http://www.ufyz.feec.vutbr.cz/veda-a-vyzkum/produkty/. (software)
Detail

ŠKARVADA, P.; KNÁPEK, A.; HOLCMAN, V.: ESAI; Elektronický ovládací systém pro přesné zanořování. www.ufyz.feec.vutbr.cz. URL: http://www.ufyz.feec.vutbr.cz/index.php?lang=1&page=86. (funkční vzorek)
Detail

TOMÁNEK, P.; TOMÁNEK, P.: ICCE-20 The twentieth annual international conference on composites or nano engineering. Beijing (22.07.2012)
Detail