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E-přihláška
Vyhledávání Vyhledat Zavřít
prof. Ing. RNDr.
DrSc.
FEKT, UFYZ – emeritní profesor
sikula@vut.cz
Odeslat VUT zprávu
2019
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O.; URRUTIA, L. A Simple Analytical Model of Capacity Fading for Lithium–Sulfur Cells. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, roč. 34, č. 6, s. 5779-5786. ISSN: 0885-8993.Detail | WWW
KNÁPEK, A.; ŠIKULA, J.; BARTLOVÁ, M. Fluctuations of focused electron beam in a conventional SEM. Ultramicroscopy, 2019, roč. 204, č. 1, s. 49-54. ISSN: 0304-3991.Detail | WWW
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O. Cycle life and degradation sources in Li-S cells. In Technical Digest of 13th Conference „Electron Technology” ELTE and 43rd International Microelectronics and Packaging IMAPS Poland Conference. Kraków, Poland: International Microelectronics and Packaging Society Poland Chapter, 2019. s. 83-84. ISBN: 978-83-932464-3-4.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Supercapacitor Degradation and Life-time. In Proceedings of 2nd Passive Components Networking Symposium. Brno: European Passive Components Institute s.r.o., 2019. s. 90-97. ISBN: 978-80-907447-0-7.Detail
2018
KNÁPEK, A.; HORÁČEK, M.; CHLUMSKÁ, J.; KUPAROWITZ, T.; SOBOLA, D.; ŠIKULA, J. PREPARATION AND NOISE ANALYSIS OF POLYMER GRAPHITE CATHODE. METROL MEAS SYST, 2018, roč. 25, č. 3, s. 451-458. ISSN: 0860-8229.Detail | WWW
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O. SOURCES OF DEGRADATION IN LI-S CELLS. In 39. Nekonvenční zdroje elektrické energie. 2018. s. 95-97. ISBN: 978-80-02-02786-7.Detail
2017
ŠKVARENINA, Ľ.; MACKŮ, R.; ŠKARVADA, P.; GAJDOŠ, A.; ŠIKULA, J. Noise fluctuation changes related to edge deletion of thin-film Cu(In,Ga)Se2 solar cells. In 2017 International Conference on Noise and Fluctuations (ICNF). Proceedings of a meeting held 20-23 June 2017, Vilnius, Lithuania: Institute of Electrical and Electronics Engineers ( IEEE ), 2017. s. 1-4. ISBN: 978-1-5090-2761-3.Detail | WWW
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; OSTRÝ, L. Equivalent model for AVX MLCC - FINAL REPORT - STAGE III. 2017. s. 1-49. Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; KUPAROWITZ, M. Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field. In PCSN 2017 Proceedings. Česká republika: Ing. Vladislav Pokorný - LITERA BRNO, Tábor 43a, 612 00 Brno, 2017. s. 128-136. ISBN: 978-80-905768-8-9.Detail
KUPAROWITZ, T.; SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Supercapacitor Degradation and Reliability. In Passive Components Networking days EPCI Passive Components Networking Symposium 2017. 2017. s. 63-68. ISBN: 978-80-905768-8-9.Detail
KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SEDLÁK, P.; ŠIKULA, J. Low frequency noise of electrochemical power sources. In 2017 International Conference on Noise and Fluctuations (ICNF). Vilnius, Lithuania: IEEE, 2017. s. 1-4. ISBN: 978-1-5090-2760-6.Detail | WWW
KNÁPEK, A.; HORÁČEK, M.; HRUBÝ, F.; ŠIKULA, J.; KUPAROWITZ, T.; SOBOLA, D. Noise behaviour of field emission cathode based on lead pencil graphite. In TECHNICAL DIGEST 2017 30th International Vacuum Nanoelectronics Conference (IVNC). Herzogssaal Regensburg, Germany: IEEE, 2017. s. 274-275. ISBN: 978-1-5090-3974-6.Detail | WWW
2016
SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T.; BUERGLER, B.; VAŠINA, P. Supercapacitor degradation assesment by power cycling and calendar life tests. METROL MEAS SYST, 2016, roč. 23, č. 3, s. 345-358. ISSN: 0860-8229.Detail
SZEWCZYK, A.; ŠIKULA, J.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T. Voltage dependence of supercapacitor capacitance. METROL MEAS SYST, 2016, roč. 23, č. 3, s. 403-411. ISSN: 0860-8229.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M. Supercapacitor Parameters Degradation Analysis by Energy Cycling and Calendar Life Tests. Space Passive Component Days. European Space Agency, 2016. s. 1-13. Detail | WWW
SEDLÁK, P.; KUBERSKÝ, P.; ŠKARVADA, P.; HAMÁČEK, A.; SEDLÁKOVÁ, V.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J. Current-fluctuation measurements of amperometric gas sensors prepared by three different technology procedures. Metrology and Measurement Systems, 2016, roč. 23, č. 4, s. 531-543. ISSN: 2300-1941.Detail | WWW | Plný text v Digitální knihovně
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M.; OSTRÝ, L. Equivalent model for AVX MLCC - FINAL REPORT - STAGE II. 2016. s. 1-70. Detail
2015
SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T.; BUERGLER, B.; VAŠINA, P. Supercapacitor equivalent electrical circuit model based on charges redistribution by diffusion. Journal of Power Sources, 2015, roč. 2015, č. 286, s. 58-65. ISSN: 0378-7753.Detail | WWW
SEDLÁK, P.; KUBERSKÝ, P.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J.; MACKŮ, R.; ŠKARVADA, P.; SEDLÁKOVÁ, V.; HAMÁČEK, A. Investigation of adsorption-desorption phenomenon by using current fluctuations of amperometric NO2 gas sensor. In Noise and Fluctuations (ICNF). IEEE, 2015. s. 1-4. ISBN: 978-1-4673-8335-6.Detail | WWW
KUBERSKÝ, P.; SEDLÁK, P.; HAMÁČEK, A.; NEŠPŮREK, S.; KUPAROWITZ, T.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V.; GRMELA, L.; SYROVÝ, T. Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors. Chemical Physics, 2015, roč. 456, č. 1, s. 111-117. ISSN: 0301-0104.Detail | WWW
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M. Equivalent model for AVX MLCC - FINAL REPORT - STAGE I. 2015. s. 1-53. Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T. Technical note 11: Modeling of supercapacitors ageing. 2015. s. 1-50. Detail
PAVELKA, J.; ŠIKULA, J.; CHVÁTAL, M.; TACANO, M. RTS Noise in MOSFETs: Mean Capture Time and Trap Position. In Noise and Fluctuations (ICNF). IEEE, 2015. s. 1-4. ISBN: 978-1-4673-8335-6.Detail | WWW
OHYA, H.; TACANO, M.; PAVELKA, J.; ŠIKULA, J.; MUSHA, T. Ultimate Absolute Hooge Parameter for Semiconductors and Graphene. In Noise and Fluctuations (ICNF). IEEE, 2015. s. 1-4. ISBN: 978-1-4673-8335-6.Detail | WWW
SEDLÁKOVÁ, V.; ŠIKULA, J.; VRBA, R.; MAJZNER, J.; SEDLÁK, P.; SANTO-ZARNIK, M.; BELAVIC, D. Noise in piezoresistive pressure sensors. In Noise and Fluctuation (ICNF). IEEE, 2015. s. 1-4. ISBN: 978-1-4673-8335-6.Detail | WWW
2014
KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SZEWCZYK, A.; HASSE, L.; SMULKO, J.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J. Supercapacitors – Charge Redistribution and Restoring Voltage. In Proceedings. Brno: Vysoké učení technické v Brně, 2014. s. 145-150. ISBN: 978-80-214-4985- 5.Detail
TOFEL, P.; ŠKARVADA, P.; ŠIKULA, J.; CSÉFALVAY, G. Microstructure and Defects Evaluation of Varistors by Ultrasonic Waves in Low Frequency Range. Key Engineering Materials (print), 2014, roč. 465, č. 1, s. 688-691. ISSN: 1013- 9826.Detail
KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SZEWCZYK, A.; HASSE, L.; SMULKO, J.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J. Charge Redistribution and Restoring voltage of Supercapacitors. ElectroScope - http://www.electroscope.zcu. cz, 2014, roč. 2014, č. 3, s. 1-7. ISSN: 1802- 4564.Detail | WWW
2013
ŠIK, O.; GRMELA, L.; ŠIKULA, J. Contacts charge transport and additional noise properties of semiconductor CdTe sensors. In Proceedings of the 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC). Bangkok, Thailand: IEEE Thailand Section, 2013. s. 1-4. ISBN: 978-1-4673-5694- 7.Detail | WWW
SERGEEV, E.; KNÁPEK, A.; GRMELA, L.; ŠIKULA, J. Noise Diagnostic Method of Experimental Cold Field- Emission Cathodes. 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N- USB. Montpellier: 2013. s. Th-P- 9 (Th-P-9 s.)ISBN: 978-1-4799-0670- 3.Detail
ANDREEV, A.; ŠIK, O.; GRMELA, L.; ŠIKULA, J. Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise. METROL MEAS SYST, 2013, roč. 2013, č. 3, s. 385-394. ISSN: 0860- 8229.Detail | WWW
SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; MAJZNER, J.; VONDRA, M.; KUBERSKÝ, P.; NEŠPŮREK, S.; HAMÁČEK, A. Noise in Amperometric NO2 Sensor. In Proceedings of 22nd International Conference on Noise and Fluctuations. Montpelier, France: IEEE, 2013. s. 1-4. ISBN: 978-1-4799-0670- 3.Detail
ŠIK, O.; ŠKARVADA, P.; GRMELA, L.; ELHADIDY, H.; VONDRA, M.; ŠIKULA, J.; FRANC, J. Contact Quality Analysis and Noise Sources Determination of CdZnTe- Based High Energy Photon Detectors. Physica Scripta, 2013, roč. 85, č. 03, s. 1-5. ISSN: 0031- 8949.Detail | WWW
PAVELKA, J.; ŠIKULA, J.; TACANO, M.; TANUMA, N. Activation energy of traps in GaN HFETs. In Proceedings of 22nd International Conference on Noise and Fluctuations ICNF 2013, IEEE Catalog Number: CFP1392N- POD. Montpellier: IEEE, 2013. s. 114-117. ISBN: 978-1-4799-0668- 0.Detail
SITA, Z.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J.; GRMELA, L. Analysis of noise and non-linearity of I- V characteristics of positive temperature coefficient chip thermistors. METROL MEAS SYST, 2013, roč. XX, č. 4, s. 635-644. ISSN: 0860- 8229.Detail
PAVELKA, J.; ŠIKULA, J.; TACANO, M.; CHVÁTAL, M.; DALLAEVA, D.; GRMELA, L. Noise sources in interface between mono- crystalline and amorphous semiconductors. In Proceedings of 8th solid state surfaces and interfaces. Bratislava: Comenius University, 2013. s. 128-129. ISBN: 978-80-223-3501- 0.Detail
VONDRA, M.; SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; MAJZNER, J.; SMULKO, J.; HASSE, L. A FPGA- Based Measurement System with QCM. In A FPGA- Based Measurement System with QCM. Žilina: EDIS - Publishing Institution of the University of Zilina, 2013. s. 13-15. ISBN: 978-80-554-0807- 1.Detail
SANTO-ZARNIK, M.; BELAVIC, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J. Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/ f Noise Measurements. Radioengineering, 2013, roč. 22, č. 1, s. 227-232. ISSN: 1210- 2512.Detail
SANTO-ZARNIK, M.; SEDLÁKOVÁ, V.; BELAVIC, D.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Estimation of the long-term stability of piezoresistive LTCC pressure sensors by means of low- frequency noise measurements. Sensors and Actuators, 2013, roč. 199, č. 1, s. 334-343. ISSN: 0924- 4247.Detail
ŠIK, O.; GRMELA, L.; ELHADIDY, H.; DĚDIČ, V.; ŠIKULA, J.; GRMELA, P.; FRANC, J.; ŠKARVADA, P.; HOLCMAN, V. Study of Electric Field Distribution and Low Frequency Noise of CdZnTe Radiation Detectors. Journal of Instrumentation, 2013, roč. 6, č. 23, s. 1-6. ISSN: 1748-0221.Detail | WWW
2012
SEDLÁK, P.; ŠIKULA, J.; MAJZNER, J.; VRŇATA, M.; FITL, P.; KOPECKÝ, D.; VYSLOUŽIL, F.; HANDEL, P. Adsorption– desorption noise in QCM gas sensors. Sensors and Actuators B: Chemical, 2012, roč. 166- 167, č. 1, s. 264-268. ISSN: 0925- 4005.Detail
ŠIK, O.; GRMELA, L.; ELHADIDY, H.; ŠIKULA, J.; FRANC, J. CONTACT QUALITY ANALYSIS AND NOISE SOURCES DETERMINATION OF CDTE BASED DETECTORS DETERMINATION OF CDTE BASED DETECTORS. The 3rd International Conference on the Physics of Optical Materials and Devices BOOK OF ABSTRACTS. 1. Belgrade: Agencija FORMAT, 2012. s. 120-120. ISBN: 978-86-7306-116- 0.Detail | WWW
SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; HOLCMAN, V.; ŠIKULA, J.; SANTO-ZARNIK, M.; BELAVIC, D.; HROVAT, M. Influence of Functional Resistors on Offset Voltage Noise in Thick- Film Pressure Sensors. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Slovinsko: MIDEM, 2012. s. 393-398. ISBN: 978-961-92933-2- 4.Detail
SANTO-ZARNIK, M.; BELAVIČ, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J. INTRINSIC RESOLUTION OF A PIEZORESISTIVE CERAMIC PRESSURE SENSOR. In EDS 2012 Proceedings. IMAPS CZ& SK, 2012. s. 251-256. ISBN: 978-80-214-4539- 0.Detail
SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; TEVEROVSKY, D.; ZEDNÍČEK, T. IONS ELECTROMIGRATION IN TANTALUM CAPACITORS. In EDS 2012 Proceedings. IMAPS CZ& SK, 2012. s. 343-348. ISBN: 978-80-214-4539- 0.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; CHVÁTAL, M.; PAVELKA, J.; TACANO, M.; TOITA, M. Noise in Submicron Metal-Oxide-Semiconductor Field Effect Transistors: Lateral Electron Density Distribution and Active Trap Position. Japanese Journal of Applied Physics, 2012, roč. 2012 (51), č. 1, s. 024105- 1 (024105-5 s.)ISSN: 0021- 4922.Detail
SEDLÁK, P.; MAJZNER, J.; ŠIKULA, J.; HÁJEK, K. Noise measurement setup for quartz crystal microbalance. Radioengineering, 2012, roč. 21, č. 1, s. 207-212. ISSN: 1210- 2512.Detail
CICHOSZ, J.; HASSE, L.; SZEWCZYK, A.; SEDLÁK, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Non-linear electro-ultrasonic spectroscopy of high- voltage varistors. In XI Krajowa Konferencja Elektroniki. Warszawa: Sigma- Not, 2012. s. 115-120. ISBN: 978-83-934712-0- 1.Detail
SEDLÁK, P.; ŠIKULA, J.; VONDRA, M.; SEDLÁKOVÁ, V.; MAJZNER, J.; HOLCMAN, V. Fluctuation-enhanced gas sensing using polypyrrole-based QCM and its adsorption- desorption kinetics. In Proceedings MIDEM 2012. Ljubljana: MIDEM, 2012. s. 399-404. ISBN: 978-961-92933-2- 4.Detail
SEDLÁK, P.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V. Model of Adsorpce- Desorption Noise in QCM Gas Sensors. In Proceedings of the conference New Trends in Physics. Brno: Ústav fyziky, FEKT, Vysoké učení technické v Brně, 2012. s. 187-190. ISBN: 978-80-214-4594- 9.Detail
ELHADIDY, H.; FRANC, J.; GRILL, R.; ŠIK, O.; ŠIKULA, J. Analysis of the numerical simulation of TEES glow chrve in CdTe radiation detectors. In Proc. of EDS IMAPS CS 2012. Brno. 1. Brno, Antonínská 548/ 1: Vysoké učení technické v Brně, 2012. s. 299-306. ISBN: 978-80-214-4539- 0.Detail
GRMELA, L.; ŠIK, O.; ŠIKULA, J. Noise Contact Study of CdTe Radiation Detectors. In Proceedings of the Scientific Conference Physics of Materials 2012. první. Košice, Slovensko: 2012. s. 99-104. ISBN: 978-80-553-1175- 3.Detail
SEDLÁK, P.; ŠIKULA, J.; VONDRA, M.; MAJZNER, J. Kinetics of Water Evaporation Measured by QCM Sensor. In Proceedings EDS 2012. Brno, Czech Republic: Brno University of Technology, 2012. s. 261-267. ISBN: 978-80-214-4539- 0.Detail
ŠIK, O.; GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; BELAS, E. Influence of CdTe material ageing on relaxation time and noise. Book of abstracts. Taipei: Academia Sinica, 2012. s. 1 (1 s.). Detail | WWW
ELHADIDY, H.; ŠIK, O.; DĚDIČ, V.; ŠIKULA, J.; FRANC, J. NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS. In Proc. of EDS IMAPS CS 2012. Brno. 1. Brno, Antonínská 548/ 1: Vysoké učení technické v Brně, 2012. s. 314-312. ISBN: 978-80-214-4539- 0.Detail
VONDRA, M.; SEDLÁK, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HOLCMAN, V. Equivalent circuit of polypyrrole-based QCM. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Lubljana Slovenia: 2012. s. 405-409. ISBN: 978-961-92933-2-4.Detail
KNÁPEK, A.; GRMELA, L.; ŠIKULA, J.; ŠIK, O. Cold field- emission cathode noise analysis. METROL MEAS SYST, 2012, roč. 2012, č. 2, s. 417-422. ISSN: 0860- 8229.Detail | WWW
SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; KOPECKÝ, M.; ŠIKULA, J.; SANTO-ZARNIK, M.; BELAVIC, D.; HROVAT, M. Evaluation of piezoresistive ceramic pressure sensors using noise measurements. Informacije MIDEM, 2012, roč. 42, č. 2, s. 109-114. ISSN: 0352- 9045.Detail
2011
PAVELKA, J.; ŠIKULA, J.; TACANO, M.; TOITA, M. Activation Energy of RTS Noise. Radioengineering, 2011, roč. 20, č. 1, s. 194-199. ISSN: 1210- 2512.Detail
TOFEL, P.; ŠIKULA, J.; HÁJEK, K.; TROJANOVÁ, Z.; BUMBÁLEK, L. Cracks detection in Mg alloy by electro- ultrasonic spectroscopy. Key Engineering Materials, 2011, roč. 465, č. 1, s. 350-353. ISSN: 1013- 9826.Detail
PAVELKA, J.; TACANO, M.; TANUMA, N.; ŠIKULA, J. 1/f noise models and low-frequency noise characteristics of InAlAs/ InGaAs devices. Physica Status Solidi C, 2011, roč. 8, č. 2, s. 303-305. ISSN: 1610- 1642.Detail
ELHADIDY, H.; ŠIKULA, J.; ŠIK, O.; GRMELA, L.; ZAJAČEK, J. Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals. In 21st International Conference on Noise and Fluctuations. Kanada: IEEE, 2011. s. 1-4. ISBN: 978-1-4577-0191- 7.Detail
KNÁPEK, A.; GRMELA, L.; ŠIKULA, J. Noise Characterization of Cold Emission Cathodes with Epoxy Coating. In Proceedings of 5th Annual Internation Travelling Conference for Young Researchers and PhD Students. Prešov: Harmony Apeiron, 2011. s. 521-526. ISBN: 978-80-89347-05- 6.Detail
ELHADIDY, H.; ŠIKULA, J.; FRANC, J. Symmetrical current–voltage characteristic of a metal–semiconductor– metal structure of Schottky contacts and parameter retrieval of a CdTe structure. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2011, roč. 27, č. 1, s. 1-6. ISSN: 0268- 1242.Detail
KNÁPEK, A.; GRMELA, L.; ŠIKULA, J.; HOLCMAN, V.; DELONG, A. Noise of Cold Emission Cathode. In ICNF2011: 2011 21st International Conference on Noise and Fluctuations. 1. Toronto, Kanada: IEEE, 2011. s. 84-87. ISBN: 978-1-4577-0191- 7.Detail
SEDLÁK, P.; MAJZNER, J.; ŠIKULA, J. Noise in Piezoelectric Ceramics at the low temperatures. Radioengineering, 2011, roč. 20, č. 1, s. 200-2003. ISSN: 1210- 2512.Detail
TOFEL, P.; ŠIKULA, J.; GRMELA, L.; SEDLÁK, P.; MAJZNER, J. Diagnostic of billet surface. In 9 th International Conference NDT 2011. Brno: 2011. s. 1-6. ISBN: 978-80-7204-774- 1.Detail
SEDLÁK, P.; TOFEL, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HASSE, L. Ultrasonics spectroscopy of silicon single crystal. METROL MEAS SYST, 2011, roč. 18, č. 4, s. 621-630. ISSN: 0860- 8229.Detail
2010
ANDREEV, A.; GRMELA, L.; MORAVEC, P.; BOSMAN, G.; ŠIKULA, J. Investigation of excess 1/ f noise in CdTe single crystals. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2010, roč. 2010(25), č. 5, s. 1-7. ISSN: 0268- 1242.Detail
PAVELKA, J.; TACANO, M.; TANUMA, N.; ŠIKULA, J. 1/f noise models and low-frequency noise characteristics of InAlAs/ InGaAs devices. The 37th International Symposium on Compound Semiconductors (ISCS 2010). Takamatsu, Japonsko: ISCS, 2010. s. 25-25. Detail
SEDLÁK, P.; ENOKI, M.; OGASAWARA, T.; ŠIKULA, J. Electromagnetic and Acoustic Emission in PEEK/ Carbon Nanotube Composites. In Proceedings of 29th European Conference on Acoustic Emission Testing 2010. Vídeň: NDT. net, 2010. s. 1-6. ISBN: 978-3-200-01956- 0.Detail
TOFEL, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; TRČKA, T. Electro Ultrasonic Spectroscopy of Magnesium Composites. Jemná mechanika a optika, 2010, roč. 55, č. 5/ 2010, s. 142-144. ISSN: 0447- 6441.Detail
2009
SEDLÁK, P.; HIROSE, Y.; ENOKI, M.; ŠIKULA, J. Arrival time detection in thin multilayer plates on the basis of Akaike information criterion. Journal of Acoustic Emission, 2009, roč. 26, č. 1, s. 182-188. ISSN: 0730- 0050.Detail | WWW
SEDLÁK, P.; HIROSE, Y.; KHAN, S.; ENOKI, M.; ŠIKULA, J. New automatic localization technique of acoustic emission signals in thin metal plates. ULTRASONICS, 2009, roč. 49, č. 2, s. 254-262. ISSN: 0041- 624X.Detail | WWW
ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; CHVÁTAL, M.; RAŠKA, M. Bulk Resistance Decay in CdTe. In IEEE EUROCON 2009. St. Petersburg, Russia: Institute of Electrical and Electronics Engineers, St. Petersburg, 2009. s. 1181-1185. ISBN: 978-1-4244-3861-7.Detail
SEDLÁK, P.; MAJZNER, J.; ŠIKULA, J. Nyquist relation and its validity for piezoelectric ceramics considering temperature. AIP conference proceedings, 2009, roč. 1129, č. 1, s. 141-144. ISSN: 0094- 243X.Detail
ANDREEV, A.; GRMELA, L.; RAŠKA, M.; ŠIKULA, J. Experimental Analysis of Noise in CdTe Radiation Detectors. AIP conference proceedings, 2009, roč. 1129, č. 1, s. 313-317. ISSN: 0094- 243X.Detail
TOFEL, P.; ŠIKULA, J. ELECTRO- ULTRASONIC SPECTROSCOPY FOR TESTING QUALITY OF RESISTIVES MATERIALS. In Student EEICT 2009. 2009. s. 171-175. ISBN: 978-80-214-3870- 5.Detail
CHVÁTAL, M.; ŠIKULA, J.; SEDLÁKOVÁ, V.; KNÁPEK, A. Measurements and Theoretical Approximations of VA Characteristics MOSFETs. Jemná mechanika a optika, 2009, roč. 54, č. 10, s. 278-279. ISSN: 0447- 6441.Detail
PAVELKA, J.; ŠIKULA, J.; TACANO, M.; TOITA, M. RTS šum v tranzistorech MOSFET. Jemná mechanika a optika, 2009, roč. 54, č. 10, s. 273-277. ISSN: 0447- 6441.Detail
PAVELKA, J.; TANUMA, N.; TACANO, M.; ŠIKULA, J.; HANDEL, P. Low-Frequency Noise Characteristics of InGaAs/ InAlAs Heterostructures. AIP conference proceedings, 2009, roč. 1129, č. 1, s. 183-186. ISSN: 0094- 243X.Detail
ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; PAVELKA, J.; TACANO, M.; TOITA, M. RTS in Submicron MOSFETs: Lateral Field Effect and Active Trap Position. AIP conference proceedings, 2009, roč. 1129, č. 1, s. 205-208. ISSN: 0094- 243X.Detail
2008
ŠIKULA, J.; HÁJEK, K.; SEDLÁKOVÁ, V.; TOFEL, P.; MAJZNER, J. Improved Signal to Noise Ratio of Electro- ultrasonic Spectroscopy. ElectroScope - http://www.electroscope.zcu. cz, 2008, roč. 2008, č. 6, s. 1-4. ISSN: 1802- 4564.Detail
TOFEL, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistor Testing by Electro - Ultrasonic Spectroscopy with DC Electric Signal. In Reliability and Life- time Prediction ISSE2008. 1. Hungary: 2008. s. 56-57. ISBN: 978-963-06-4915- 5.Detail
Sedlak, P., Sikula, J., Lokajicek T., Mori Y. Acoustic and electromagnetic emission as a tool for crack localization. Measurement Science and Technology, 2008, roč. 19, č. 4, s. 0-045701. ISSN: 0957- 0233.Detail | WWW
TOFEL, P.; ŠIKULA, J. INTERNAL FRICTION IN MAGNESIUM COMPOSITES BY RESONANCE SPECTROSCOPY. In 6th Workshop NDT 2008. Brno, Czech Republic: Marta Kořenská and Luboš Pazdera, 2008. s. 118-121. ISBN: 978-80-7204-610- 2.Detail
PAVELKA, J.; ŠIKULA, J.; TACANO, M.; TOITA, M. Charakteristiky RTS šumu v tranzistorech MOSFET. Slaboproudý obzor, 2008, roč. 64, č. 3- 4, s. 5-8. ISSN: 0037- 668X.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; TOFEL, P.; MAJZNER, J. Electro-ultrasonic spectroscopy of polymer- based thick film layers. Microelectronics Reliability, 2008, roč. 48, č. 6, s. 886-889. ISSN: 0026- 2714.Detail
2007
ŠIKULA, J.; HANDEL, P.; TRUONG, A. Quantum 1/f Noise in Bio- Chemical Resonant ZnO Sensors. In Noise and Fluctuations. USA: American Institute of Physics, 2007. s. 339-342. ISBN: 978-0-7354-0432- 8.Detail
ŠIKULA, J.; SEDLÁKOVÁ, V.; NAVAROVÁ, H.; HLÁVKA, J.; TACANO, M.; SITA, Z. Niobium Oxide and Tantalum Capacitors: Leakage Current and M-I- S Model Parameters. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies& Materials Association, 2007. s. 337-345. ISBN: 0-7908-0114- 0.Detail
TOFEL, P.; ŠIKULA, J.; HASSE, L. The Non-Linear Electro- Ultrasonic Spectroscopy. In 30th International Spring Seminar on Electronics Technology. Cluj-Napoca, Romania: Dan Pitica, 2007. s. 196-197. ISBN: 978-973-713-174- 4.Detail
HAVRÁNEK, J.; PAVELKA, J.; TOFEL, P.; ŠIKULA, J. NOISE IN SUBMICRON MOSFETS: RTS's AS THE ULTIMATE COMPONENTS OF THE 1/ f NOISE. In Proceedings of 6th international conference of PhD students. Hungary, MIskolc: University of Miskolc, 2007. s. 249-253. ISBN: 978-963-661-779- 0.Detail
TOFEL, P.; HAVRÁNEK, J.; ŠIKULA, J. DESCRIPTION OF A MATERIAL STRUCTURE BY NON-LINEAR ELECTRO- ULTRASONIC SPECTROSCOPY. In Proceedings of 6th international conference of PhD students. Miskolc, Hungary: Dr. Laszlo Lehoczky, 2007. s. 255-260. ISBN: 978-963-661-779- 0.Detail
ANDREEV, A.; ZAJAČEK, J.; ŠIKULA, J.; GRMELA, L.; HOLCMAN, V. The Effect of Contacts Metal - Semiconductor on Low Frequency Noise. In 6th International Conference of PhD Students. 1. Miskolc, Hungary: Jozsef Vesza, 2007. s. 173-178. ISBN: 978-963-661-779- 0.Detail
SEDLÁK, P.; MAJZNER, J.; ŠIKULA, J. Mathematical Model for Electrical Noise of Piezoelectric Sensor. In Noise and Fluctuations 19th International Conference on Noise and Fluctuations AIP CONFERENCE PROCEEDINGS 922. Melville, New York: American institute of physics, 2007. s. 335-338. ISBN: 978-0-7354-0432- 8.Detail | WWW
GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Noise Sources in the CdTe radiation detectors. In Noise and Fluctuation - 19-th International Conference on Noise and Fluctuations - ICNF 2007. M.Tacano, Y.Yamamoto, M. Nakao. Melville, USA: American Institute of Physics, 2007. s. 302-305. ISBN: 978-0-7354-0432- 8.Detail
TACANO, M.; TANUMA, N.; PAVELKA, J.; ŠIKULA, J. Hard electronics materials, device fabrications and their noise properties. In Proc. of EDS IMAPS CS 2007. Brno: IMAPS CS, 2007. s. XV (XXIV s.)ISBN: 978-80-214-3470- 7.Detail
TOFEL, P.; ŠIKULA, J. NELINEÁRNÍ ULTRAZVUKOVÁ SPEKTROSKOPIE NA ŽULOVÉM VZORKU. In Zvůle 2007. Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií, 2007. s. 194-197. ISBN: 978-80-214-3468- 4.Detail
ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; RAŠKA, M. Investigation of 1/ f Noise Sources in CdTe Radiation Detectiors. In New Trends in Physics. Pavel Dobis, Jitka Brustlova. Brno, Czech Republic: Ing. Zdenek Novotny CSc, 2007. s. 15-18. ISBN: 978-80-7355-078- 3.Detail
TOFEL, P.; ŠIKULA, J. NON-DESTRUCTIVE TESTING OF A ROCK SAMPLE BY NON- LINEAR ULTRASONIC SPECTROSCOPY. In NEW TRENDS IN PHYSICS 2007. Brno, Czech Republic: Ing. Zdeněk Novotný CSc, 2007. s. 142-145. ISBN: 978-80-7355-078- 3.Detail
HAVRÁNEK, J.; PAVELKA, J.; ŠIKULA, J.; GRMELA, L. Temperature dependence of RTS noise - trap activation energy. In New trends in physics. Brno: VUT, 2007. s. 35-38. ISBN: 978-80-7355-078- 3.Detail
TOFEL, P.; ŠIKULA, J.; TROJANOVÁ, Z. NONLINEAR ULTRASONIC SPECTROSCOPY OF MAGNESIUM COMPOSITES. In NEW TRENDS IN PHYSICS 2007. Brno, Czech Republic: Ing. Zdeněk Novotný CSc., 2007. s. 146-149. ISBN: 978-80-7355-078- 3.Detail
KOKTAVÝ, P.; ŠIKULA, J.; KOKTAVÝ, B.; LOKAJÍČEK, T. AE sources characterization by electromagnetic and acoustic emission. In New trends in physics. -. Brno: Z. Novotný, Ing., CSc., 2007. s. 69-73. ISBN: 978-80-7355-078- 3.Detail
HAVRÁNEK, J.; ŠIKULA, J.; PAVELKA, J.; GRMELA, L. RTS noise - carrier capture and emission event duration. In New trends in Physics. VUT. Brno: VUT Brno, 2007. s. 31-34. ISBN: 978-80-7355-078- 3.Detail
MAJZNER, J.; SEDLÁK, P.; ŠTRUNC, M.; ŠIKULA, J. Noise in Piezoceramics. In Noise and Fluctuation. 1. USA: american institute of physics, 2007. s. 347-350. ISBN: 978-0-7354-0432- 8.Detail
SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J. Noise and Electro- Ultrasonic Spectroscopy of Polymer Based Conducting Layers. In Noise and Fluctuations. USA: American Institute of Physics, 2007. s. 277-280. ISBN: 978-0-7354-0432- 8.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistors Testing by Electro- Ultrasonic Spectroscopy. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies& Materials Association, 2007. s. 321-328. ISBN: 0-7908-0114- 0.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J. Electro-Ultrasonic Spectroscopy - New Method for Ppolymer Based Conducting Layers Characterisation. In Proceedings of the conference New Trends in Physics. Brno, ČR: Ústav fyziky FEKT VUT v Brně, 2007. s. 130-133. ISBN: 978-80-7355-078- 3.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistors Testing by Electro- Ultrasonic Spectroscopy. 2007, roč. 2007, č. Nov/ Dec, s. 16-20. Detail
ŠIKULA, J.; PAVELKA, J.; HAVRÁNEK, J.; HLÁVKA, J.; TACANO, M.; TOITA, M. RTS and 1/ f Noise in Submicron MOSFETs. In Proc. ICNF 2007 AIP Conf. Proc. Vol. 922. Tokio: AIP, 2007. s. 71-74. ISBN: 978-0-7354-0432- 8.Detail
PAVELKA, J.; ŠIKULA, J.; TACANO, M. Non-Poisson Process in RTS- like noise. In Proc. ICNF 2007 AIP Conf. Proc. Vol. 922. Tokio: AIP, 2007. s. 111-114. ISBN: 978-0-7354-0432- 8.Detail
PAVELKA, J.; ŠIKULA, J.; TACANO, M. Non- Markov Characteristics of RTS Noise. In Proc. of EDS IMAPS CS 2007. Brno: IMAPS CS, 2007. s. 1-4. ISBN: 978-80-214-3470- 7.Detail
PAVELKA, J.; ŠIKULA, J.; CHVÁTAL, M.; TACANO, M. RTS noise in submicron devices. In New Trends in Physics. Brno: VUT, 2007. s. 114-117. ISBN: 978-80-7355-078- 3.Detail
ŠIKULA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; TACANO, M.; TOITA, M. RTS Noise and quantum transitions in submicron MOSFETs. In New Trends in Physics. Brno: VUT, 2007. s. 138-141. ISBN: 978-80-7355-078- 3.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; NAVAROVÁ, H.; PAVELKA, J.; HLÁVKA, J.; SITA, Z. Leakage Current, Noise and Reliability of NbO and Ta Capacitors. In Proceedings EMPC 2007. Finsko: IMAPS Nordic, 2007. s. 436-441. Detail
ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J. Analysis of the CdTe Hole Concentration and the Hole Mobility. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. s. 86-87. ISBN: 978-973-713-174- 4.Detail
2006
Josef Sikula, Jiri Majzner, Petr Sedlak and Yasuhiko Mori. Electromagnetic and Acoustic Emission Fine Spectra. In Acoustic Emission Testing. Cardiff, Wales, UK: Trans Tech Publications, 2006. s. 169 ( s.)ISBN: 0-87849-420- 0.Detail
Mori,Y., Sedlak, P., Sikula, J. Estimation of Rock In- situ Stress by Acoustic and Electromagnetic Emission. In Acoustic Emission Testing. Cardiff, Wales, UK: Trans Tech Publications, 2006. s. 357 ( s.)ISBN: 0-87849-420- 0.Detail
ŠIKULA, J., HÁJEK, K., SEDLÁKOVÁ, V., HEFNER, Š. ELECTRO- ULTRASONIC SPECTROSCOPY OF CONDUCTING SOLIDS. In Abstracts of 9th European Conference of NDT. Berlin: DGZIP, 2006. s. Fr.1.5. 2 ( s.)Detail
ŠIKULA, J., HEFNER, Š., SEDLÁKOVÁ, V., HÁJEK, K. Electro- Ultrasonic Spectroscopy of Conducting Solids. In DGZfP Proceedings BB 103- CD. Berlin: DGZfP, 2006. s. 150 ( s.)ISBN: 3- 931381.Detail
HASSE, L., ŠIKULA, J., BLÁHA, M. Analysis of non- linear efects as a diagnostic tool. Zeszyty Naukove Wydzialu Elektroniki i Automatyki Polytechniki Gdanskiej, 2006, roč. 22, č. 1, s. 63 ( s.)ISSN: 1425- 5766.Detail
ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z.; HÖSCHEL, P.; TACANO, M. Niobium Oxide and Tantalum Capacitors: Quantum Effects in Charge Carrier Transport. In Proceedings CARTS USA 2006 - The 26th Symposium for Passive Components. Orlando, Florida: Electronic Components, Assemblies and Materials Association, 2006. s. 421 ( s.)ISBN: 0-7908-0108- 6.Detail
ŠIKULA, J., HÁJEK, K., SEDLÁKOVÁ, V., HEFNER, Š. ELECTRO- ULTRASONIC SPECTROSCOPY OF CONDUCTING SOLIDS. In 9th European Conference of NDT. Berlín, Německo: DGZIP, 2006. s. Fr.1.5. 2 ( s.)ISBN: 3- 931381.Detail
ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z. Charge Carrier Transport in NbO and Ta Capacitors in Temperature Range 100 to 300 K. In Proceeding of CARTS Europe 2006 - 20th annual passive components symposium. Bad Homburg, Německo: Electronic Components, Assemblies and Materials Association, 2006. s. 189 ( s.)ISBN: 0-7908-0110- 8.Detail
ŠIKULA, J.; SEDLÁKOVÁ, V.; SITA, Z. Charge Carriers Transport and Noise in Niobium Oxide and Tantalum Capacitors. In EDS ' 06 IMAPS CS International Conference Proceedings. Brno, ČR: Ing. Zdeněk Novotný CSc., 2006. s. 154 ( s.)ISBN: 80-214-3246- 2.Detail
Stepan Hefner, Josef Sikula and Martin Blaha. Nonlinear Spectroscopy of Metallic and Rock Samples. In Junior Scientist Conference 2006. Wien: Vienna University of Technology, 2006. s. 123 ( s.)ISBN: 3-902463-05- 8.Detail
Petr Sedlak, Jiri Majzner Jan Havranek and Josef Sikula. Numerical Simulations of Electrical Characteristics of Piezoceramic Sensor. In Proceedings of The Junior Scientist Conference 2006. Vieanna, Austria: Vienna University of Technology, 2006. s. 69 ( s.)ISBN: 3-902463-05- 8.Detail
P. Sedlak, J. Majzner, J. Sikula and V. Sedlakova. Finite element model of noise in piezoceramic sensor. In Proceedings / EMPS 2006 - 4th European Microelectronics and Packaging Symposium with Table- Top Exhibition. Ljubljana, Slovenia: MIDEM, 2006. s. 325 ( s.)ISBN: 961-91023-4- 7.Detail
Jiri Majzner, Josef Sikula, Petr Sedlak and Yasuhiko Mori. Spectral Analysis of EME Signal. In Proceedings / EMPS 2006 - 4th European Microelectronics and Packaging Symposium with Table- Top Exhibition. Ljubljana, Slovenia: MIDEM, 2006. s. 315 ( s.)ISBN: 961-91023-4- 7.Detail
HAVRÁNEK, J., ŠIKULA, J., PAVELKA, J. Impacts of High and Low Field Effects in MOSFETs Scaling. In EMPS 2006 4th European Microelectronics and Packaging Symposium with Table-Top Exhibition and Satellite Workshop on Ferroelectric Thin- & Thick- films Processing and Their Applications in MEMS. Terme Čatež, Slovenia: IMAPS, 2006. s. 357 ( s.)ISBN: 961-91023-4- 7.Detail
SEDLÁKOVÁ, V., ŠIKULA, J. Charge carrier transport and noise in polymer based thick films. In 4th European Microelectronics and Packaging Symposium with Table-Top Exhibition - Proceedings. Slovinsko: MIDEM, 2006. s. 15 ( s.)ISBN: 961-91023-4- 7.Detail
Petr SEDLAK, Jiri MAJZNER, Pavel TOFEL and Josef SIKULA. PIEZOELECTRIC TRANSDUCERS: ELECTRICAL AND NOISE CHARACTERISTICS MODELLING. In Defektoskopie 2006 Proceeding. Brno: Czech Society for Nondestructive Testing, 2006. s. 217 ( s.)ISBN: 80-214-3290- X.Detail
SEDLÁKOVÁ, V.; SEDLÁK, P.; ŠIKULA, J.; HÁJEK, K. Application of Electro- Ultrasonic Spectroscopy for NDT of Electronic Components. In Defektoskopie 2006 Proceeding. Brno: Czech Society for Nondestructive Testing, 2006. s. 225 ( s.)ISBN: 80-214-3290- X.Detail
J. Majzner, P. Sedlak, J. Sikula. Spectral Analysis of EME Signal. In DGZfP Proceedings BB 103- CD. Berlin: DGZfP, 2006. s. 199 ( s.)ISBN: 3- 931381.Detail
PAVELKA, J., ŠIKULA, J., TACANO, M. Low frequency noise in submicron MOSFETs. In Proceedings of IMAPS CS International Conference Electronic Devices and Systems 2006. Brno: IMAPS CS, 2006. s. 148 ( s.)ISBN: 80-214-3246- 2.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; SPIRALSKI, L. Polymer Based Thick Films - Material Quality and Interface Resistance Evaluation. In XXX International Conference of IMAPS Poland Chapter Proceedings. Krakow, Poland: Institute of Electron Technology - Cracow Division, 2006. s. 95 ( s.)ISBN: 83-917701-3- 3.Detail
KOKTAVÝ, P.; ŠIKULA, J.; KOKTAVÝ, B.; GRMELA, L.; LIEDERMANN, K.; POLSTEROVÁ, H. Ireverzibilní procesy v elektroizolačních materiálech pro vysoké teploty, GAČR 102/03/0621, závěrečná zpráva. Brno: Grantová agentura ČR, 2006. s. 1-84. Detail
MORI, Y.; SEDLÁK, P.; ŠIKULA, J. Estimation of Rock In- situ Stress by Acoustic and Electromagnetic Emission. Advanced Materials Research, 2006, roč. 2, č. 13- 14, s. 357 ( s.)ISSN: 1022- 6680.Detail | WWW
HEFNER, Š.; ŠIKULA, J. Nelineneární ultrazvuková spektroskopie horninových vzorků. In Workshop NDT 2006, Non- destructive Testing in Engineering Practise. Brno: Brno University of Technology, 2006. s. 21-26. ISBN: 80-7204-487- 7.Detail
Josef Sikula, Jiri Majzner, Petr Sedlak and Yasuhiko Mori. Electromagnetic and Acoustic Emission Fine Spectra. Advanced Materials Research, 2006, roč. 2, č. 13- 14, s. 169 ( s.)ISSN: 1022- 6680.Detail | WWW
2005
GRILL, R. Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison. In 15th European Microelectronics and Packaging Conference Proceedings. Bruggy, Belgie: IMAPS Benelux, 2005. s. 540 ( s.)Detail
TACANO, M., ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V. RTS Noise in Submicron MOSFETs: Low and High Field Effects. In Proceedings of EDS'05 Electronic Devices and Systems IMAPS CS Int. Conf. Brno: VUT, 2005. s. XV ( s.)ISBN: 80-214-2990- 9.Detail
ŠIKULA, J.; HLÁVKA, J.; SEDLÁKOVÁ, V.; HÖSCHEL, P.; GRILL, R.; SITA, Z.; ZEDNÍČEK, T.; TACANO, M. Niobium Oxide and Tantalum Capacitors: M-I- S Model Parameters Comparison. In 25th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. s. 244 ( s.)ISSN: 0887- 7491.Detail
ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; HÖSCHEL, P.; SITA, Z.; ZEDNÍČEK, T.; TACANO, M.; HASHIGUCHI, S. Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors. In 25th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. s. 210 ( s.)ISSN: 0887- 7491.Detail
Sedlak Petr, Majzner Jiri and Josef Sikula. PIEZOCERAMIC SENSORS: FINITE ELEMENT MODELLING OF NOISE. In Proceedings of 5th iternational conference of phd students. Miskolc, Hungary: University of Miskolc, 2005. s. 403 ( s.)ISBN: 963-661-678- 7.Detail
P. Sedlak, J. Majzner and J. Sikula. Impedance Spectrum Simulation of Piezoelectric Element. In EDS 05 IMAPS CS International Conference 2005 Proceedings. Brno: Vysoké učení technické v Brně, Antonínská 548/ 1, 2005. s. 279 ( s.)ISBN: 80-214-2990- 9.Detail
Š. Hefner, T. Lokajíček and J. Šikula. Nonlinear Spectroscopy of Rock and Ceramic Samples. NDT Welding Bulletin. 2005. s. 15 ( s.)ISSN: 1213- 3825.Detail
Majzner J., Mori Y., Sedlak P., Sikula J. Spectral Analysis of EME Signal. NDT Welding Bulletin. 2005. s. 22 ( s.)ISSN: 1213- 3825.Detail
KOKTAVÝ, P., KOKTAVÝ, B., ŠIKULA, J. Partial Discharges and Acoustic Emission In Insulating Materials. In Proceedings of 3rd Workshop NDT in Progress, International Meeting of NDT Experts. Průhonice: Czech Society for Non- destructive Testing, 2005. s. 153 ( s.)ISBN: 80-214-2996- 8.Detail
Jan Havranek, Petr Sedlak, Josef Sikula, Aleš Bezrouk, Josef Hanuš, Jiří Záhora. Nonlinearity analysis of nitinol stents and wires. In Defektoskopie 2006. Znojmo: 2005. s. 17 ( s.)ISBN: 80-214-3053- 2.Detail
P. Sedlak, J. Majzner, J. Sikula and T. Lokajicek. VYUŽITÍ ELEKTROMAGNETICKÉ EMISE PŘI LOKALIZACI TRHLIN. In Defektoskopie 2005 - sborník příspěvků. Znojmo: Czech Society for Nondestructive Testing, 2005. s. 207 ( s.)ISBN: 80-214-3053- 2.Detail
J. Majzner, P. Sedlak, J. Sikula, S. Hefner and T. Lokajicek. CRACKS LOCALIZATION BY ELECTROMAGNETIC AND ACOUSTIC EMISSION. In NDT in Progress, IIIrd international workshop of NDT experts Proceedings. Brno: Brno University of Technology, 2005. s. 211 ( s.)ISBN: 80-214-2996- 8.Detail
SEDLÁKOVÁ, V., ŠIKULA, J. Charge Carrier Transport in Polymer- Based Thick Resistive Films. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. s. 93 ( s.)ISSN: 0887- 7491.Detail
PAVELKA, J., TACANO, M., TOITA, M., ŠIKULA, J., MUSHA, T. Zero cross analysis of RTS noise. In Noise and Fluctuations, 18th International Conference on Noise and Fluctuations - ICNF 2005, AIP Conference Proceedings 780. Salamanca, Španělsko: University of Salamanca, 2005. s. 217 ( s.)ISBN: 0-7354-0267- 1.Detail
PAVELKA, J., SEDLÁKOVÁ, V., ŠIKULA, J., HAVRÁNEK, J., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in Submicron MOSFETs: High Field Effects. In Noise and Fluctuations, 18th International Conference on Noise and Fluctuations - ICNF 2005, AIP Conference Proceedings 780. Salamanka, Španělsko: University of Salamanca, 2005. s. 339 ( s.)ISBN: 0-7354-0267- 1.Detail
TANUMA, N.; PAVELKA, J.; YAGI, S.; OKUMURA, H.; UEMURA, T.; TACANO, M.; HASHIGUCHI, S.; ŠIKULA, J. Hooge Noise Parameter of GaN HFETs on SiC. In Noise and Fluctuations, 18th International Conference on Noise and Fluctuations - ICNF 2005, AIP Conference Proceedings 780. Salamanka, Španělsko: University of Salamanca, 2005. s. 343 ( s.)ISBN: 0-7354-0267- 1.Detail
PAVELKA, J.; TANUMA, N.; TACANO, M.; ŠIKULA, J. Low frequency noise and trap spectroscopy of InGaAs/ InAlAs heterostructures. Research Bulletin of Meisei University – Physical Sciences and Engineering, 2005, roč. 41, č. 1, s. 147 ( s.)ISSN: 1346- 7239.Detail
GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Low Frequency Noise of the CdTe Crystals. In Noise and Fluctuations. Melville, USA: American Institute of Physics, 2005. s. 175-178. ISBN: 0-7354-0267- 1.Detail
GRMELA, L., ŠIKULA, J., ZAJAČEK, J., DOBIS, P., MORAVEC, P. Transport and Noise Characteristics of CdTe Sensors. In Electronic Devices and Systems. Brno: Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105, 2005. s. 288 ( s.)ISBN: 80-214-2990- 9.Detail
CHOBOLA, Z.; ŠIKULA, J. Third harmonic index (THI) and Low Frequency Noise (LFN) as a Reliability Tool for Silicon solar cells. In Workshop NDT 2005. Brno: Brno University of Technology, 2005. s. 41-46. ISBN: 80-7204-420- 6.Detail
TANUMA, N.; TACANO, M.; PAVELKA, J.; HASHIGUCHI, S.; ŠIKULA, J.; MATSUI, T. Hooge noise parameter of epitaxial n- GaN on sapphire. Solid State Electronics, 2005, roč. 49, č. 6, s. 865 ( s.)ISSN: 0038- 1101.Detail
SEDLÁKOVÁ, V.; ŠIKULA, J.; GRMELA, L.; HÖSCHEL, P.; SITA, Z.; HASHIGUCHI, S.; TACANO, M. Noise and Carge Storage in Nb2O5 Thin Films. In Noise and Fluctuations. United States of America: American Institute of Physics, 2005. s. 135 ( s.)ISBN: 0-7354-0267- 1.Detail
2004
SEDLÁKOVÁ, V., SEDLÁK, P., ŠIKULA, J., ROČAK, D., HROVAT, M., SANTO-ZARNIK, M., BELAVIC, D. Analysis of silver diffusion into thick film resistor layers. In Proceedings of 3rd European Microelectronics and Packaging Symposium with Table- Top Exhibition. Lanskroun: IMAPS CZ& SK Chapter, 2004. s. 660 ( s.)ISBN: 80-239-2835- X.Detail
ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L. Conductivity mechanisms and breakdown of NbO capacitors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. s. 141 ( s.)ISSN: 0887- 7491.Detail
HÁJEK, K., KOŘENSKÁ, M., ŠIKULA, J. Zvyšování praktické citlivosti nelineární ultrazvukové spektroskopie pro jeden budící signál. In Defektoskopie 2004. Brno: Brno University of Technology, 2004. s. 51 ( s.)ISBN: 80-214-2749- 3.Detail
KOKTAVÝ, P.; PAVELKA, J.; ŠIKULA, J. Characterization of acoustic and electromagnetic emission sources. Measurement Science and Technology, 2004, roč. 15, č. 1, s. 973-977. ISSN: 0957- 0233.Detail
KOKTAVÝ, P.; ŠIKULA, J. Physical model of electromagnetic emission in solids. In 26th European Conference on Acoustic Emission Testing. Berlin, Germany: Deutche Gesellschaft fur Zerstorungsfreie Prufung E.V., 2004. s. 1111 ( s.)ISBN: 3-931381-58- 7.Detail
HÁJEK, K., SEDLÁKOVÁ, V., MAJZNER, J., HEFNER, Š., ŠIKULA, J. Non-linearity and noise characterisation of thick- film resistors after high voltage stress. In Proceedings of the 3rd European Microelectronics and Packaging Symposium with Table Top Exhibition. Lanskroun: IMAPS CZ& SK Chapter, 2004. s. 421 ( s.)ISBN: 80-239-2835- X.Detail
SEDLÁKOVÁ, V., ŠIKULA, J. Thick film resistor characterisation by non- linearity and resistance change after high voltage stress. In New Trends in Physics - Proceedings of the Conference. Brno: Department of Physics FEEC, Brno University of Technology, 2004. s. 88 ( s.)ISBN: 80-7355-024- 5.Detail
SEDLÁKOVÁ, V., MELKES, F., DOBIS, P., ŠIKULA, J., TACANO, M., HASHIGUCHI, S. Non- lineartiy changes induced by current stress in thick film resistors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. s. 154 ( s.)ISSN: 0887- 7491.Detail
KOKTAVÝ, P., ŠIKULA, J., ŠTOURAČ, L. Local Avalanche Breakdowns in Semiconductor GaAsP Diodes. In MIEL 04. Nis, Serbia & Montenegro: University of Nis, 2004. s. 58 ( s.)ISBN: 0-7803-8166- 1.Detail
HEFNER, Š., MAJZNER, J., HAVRÁNEK, J., ŠIKULA, J. NOISE CHRACTERISTICS OF PIEZOCERAMICS SAMPLES. In New Trends in Physics. Brno: Ing. Zdenek Novotny CSc, Dndrackova 105, Brno, 2004. s. 36 ( s.)ISBN: 80-7355-024- 5.Detail
ZAJAČEK, J., ŠIKULA, J., GRMELA, L. CONTACT AND SHEET RESISTANCE OF SOLAR CELLS. In Non- destructive testing. Brno: Institute of Physic, FAST, BUT, 2004. s. 243 ( s.)ISBN: 80-7204-371- 4.Detail
ŠTRUNC, M., ŠIKULA, J. Stochastic resonance in the sound perception process. Physical basis. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, CSc, Ondráčkova 105, Brno, 2004. s. 94 ( s.)ISBN: 80-7355-024- 5.Detail
ŠTRUNC, M.; ŠIKULA, J. Stochastic resonance in the sound perception process. Benefit of noise. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno, 2004. s. 100-104. ISBN: 80-7355-024- 5.Detail
PAVELKA, J., TANUMA, N., TACANO, M., ŠIKULA, J., MUSHA, T. Temperature dependence of 1/f noise in p- and n-InGaAs/ InAlAs heterostructures. Research Bulletin of Meisei University – Physical Sciences and Engineering, 2004, roč. 40, č. 1, s. 87 ( s.)ISSN: 1346- 7239.Detail
KOŘENSKÁ, M., ŠIKULA, J., HÁJEK, K. Nonlinear Ultrasonic Spectroscopy of Fired Roof Tiles. In 16th World Conference on Nondestructive Testing, Book of Abstracts. Montreal: CINDE, 2004. s. 42 ( s.)Detail
MORI, Y., OBATA, Y., PAVELKA, J., ŠIKULA, J. AE Kaiser effect and electromagnetic emission in the deformation of rock sample. Journal of Acoustic Emission, 2004, roč. 22, č. 1, s. 91 ( s.)ISSN: 0730- 0050.Detail
ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P. Noise and Non- Linearity as Reliability Indicators of Electronic Devices. Informacije MIDEM, 2004, roč. 2003, č. 4, s. 213-221. ISSN: 0352- 9045.Detail
ŠIKULA, J., PAVELKA, J., SEDLÁKOVÁ, V., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in submicron MOSFETs and quantum dots. In Proceedings of SPIE - Noise and Information in Nanoelectronics, Sensors, and Standards II. United States of America: The Society of Photo- Optical Instrumentation Engineers, 2004. s. 64 ( s.)ISBN: 0-8194-5394- 3.Detail
MORI, Y., OBATA, Y., PAVELKA, J., ŠIKULA, J., LOKAJÍČEK, T. AE Kaiser Effect and Electromagnetic Emission in the Deformation of Rock Sample. In Proceedings of 26th European Conference on Acoustic Emission Testing. Berlin: DGZfP, 2004. s. 167 ( s.)ISBN: 3-931381-58- 7.Detail
HÁJEK, K., KOŘENSKÁ, M., ŠIKULA, J. Zvyšování praktické citlivosti nelineární ultrazvukové spektroskopie pro jeden budící signál. In Sborník příspěvků 34. mezinárodní konference DEFEKTOSKOPIE 2004. Praha: Czech Society for Non- destruktive Testing, 2004. s. 51 ( s.)ISBN: 80-214-2749- 3.Detail
ŠIKULA, J. Stochastic resonance in the sound perception process. Benefit of noise. In New Trends in Physics. Brno: Ing. Zdeněk Novotný,CSc., Ondráčkova 105, Brno, 2004. s. 100 ( s.)ISBN: 80-7355-024- 5.Detail
ŠIKULA, J.; HLÁVKA, J.; SEDLÁKOVÁ, V.; HÖSCHEL, P.; ZEDNÍČEK, T.; SITA, Z. Charge Carrier Transport and Storage in NbO Capacitors. In Proceedings of 18th European Passive Components Conference. United Kingdom: ECA - Electronic Components, Assemblies & Materials Association, 2004. s. 178 ( s.)Detail
CHOBOLA, Z.; HASSE, L.; ŠIKULA, J.; SPIRALSKI, L. Noise Spectroscopy of Semiconductor Parth II. Elektronika, 2004, roč. 2, č. 2, s. 7 ( s.)ISSN: 0033- 2089.Detail
2003
MAJZNER, J., ŠTRUNC, M., ŠIKULA, J., HÁJEK, K. Šumové charakteristiky snímačů AE. In DEFEKTOSKOPIE 2003 SBORNÍK PŘÍSPĚVKŮ. Praha: Brno University of Technology, 2003. s. 133 ( s.)ISBN: 80-214-2499- 0.Detail
ŠIKULA, J.; VRBA, R.; GRMELA, L.; ZEDNÍČEK, T.; SITA, Z. Breakdown characteristics and low frequency noise of niobium based capacitors. Capacitor and Resistor Technology, 2003, roč. 2003, č. 4, s. 53 ( s.)ISSN: 0887- 7491.Detail
SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non- linearity of thick film resistors. In Proceedings of 14th European Microelectronics and Packaging Conference. Německo: IMAPS Germany, 2003. s. 127 ( s.)Detail
SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D. The effect of silver diffusion from contact electrode into thick film resistors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. s. 201 ( s.)ISBN: 0887- 7491.Detail
SEDLÁKOVÁ, V., BRÜSTLOVÁ, J., ŠIKULA, J., HLÁVKA, J., COCKER, J., ADAMS, K., GREENHILL, D. Noise of carbon/ graphite thick conducting films. In Proceedings of the 17th International Conference Noise and Fluctuations. Czech Republic: CNRL s.r.o., 2003. s. 201 ( s.)ISBN: 80-239-1005- 1.Detail
KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J., LOKAJÍČEK, T. Characterization of Acoustic and electromagnetic Emission Sources. In International Meeting of NDT Experts IInd Workshop "NDT in PROGRESS". Prague: ČNDT, 2003. s. 129 ( s.)ISBN: 80-214-2475- 3.Detail
HÁJEK, K., ŠIKULA, J., SEDLÁK, P. Experimentální metody pro nelineární ultrazvukovou spektroskopii(analýza a aplikace). In DEFEKTOSKOPIE 2003 SBORNÍK PŘÍSPĚVKŮ. Praha: Brno University of Technology, 2003. s. 65 ( s.)ISBN: 80-214-2475- 3.Detail
ŠIKULA, J., DOBIS, P., SEDLÁKOVÁ, V. Noise and non- linearity as reliability indicators of electronic devices. In MIDEM 2003 Conference Proceedings. Slovenia: MIDEM Slovenia, 2003. s. 3 ( s.)ISBN: 961-91023-1- 2.Detail
SEDLÁKOVÁ, V., DOBIS, P., ŠIKULA, J., HOSCHL, P., SITA, Z., ZEDNÍČEK, T. Low Frequency Noise of Nb2O5 Thin Insulating Films. In Proceedings of the 17th International Nonference Noise and Fluctuations ICNF 2003. Czech Republic: CNRL s.r.o., 2003. s. 141 ( s.)ISBN: 80-239-1005- 1.Detail
SEDLÁKOVÁ, V., BRÜSTLOVÁ, J., ŠIKULA, J., HLÁVKA, J., COCKER, J., ADAMS, K., GREENHILL, D. Noise of carbon/ graphite thick conducting films. In Noise and Fluctuations. Brno: CNRL, 2003. s. 201 ( s.)ISBN: 80-239-1005- 1.Detail
ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T. Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. s. 281 ( s.)ISBN: 0887- 7491.Detail
ŠIKULA, J., PAVELKA, J., TACANO, M., HASHIGUCHI, S. RTS in Quantum Dots: Experimental Set-up with Long- tim Stability and Magnetic Fields Compensation. In Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices. USA: Kluwer, 2003. s. 227 ( s.)ISBN: 1-4020-2169- 0.Detail
ŠIKULA, J., HASHIGUCHI, S., OHKI, M., TACANO, M. Some Considerations fo the Construction of Low- noise Amplifiers in Very Low Frequency Region. In Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices. Brno: CNRL, 2003. s. 23 ( s.)Detail
ŠIKULA, J., TACANO, M., HASHIGUCHI, S., YOKOKURA, S. New Tools for Fast and Sensitive Noise Measurements. In Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices. Brno: CNRL, 2003. s. 51 ( s.)Detail
MAJZNER, J., ŠTRUNC, M., ŠIKULA, J., HÁJEK, K. Šumové charakteristiky snímačů AE. In Defektoskopie 2003. Brno: Brno University of Technology, 2003. s. 133 ( s.)ISBN: 80-214-2499- 0.Detail
ŠIKULA, J., ŠTRUNC, M., MAJZNER, J., HÁJEK, K. Electrical noise and sensitivity of piezoceramic sensors. In NDT in Progress, 2nd International Workshop of NDT Experts - Proceedings. Brno: Brno University of Technology, 2003. s. 249 ( s.)ISBN: 80-214-2475- 3.Detail
ŠIKULA, J., PAVELKA, J., KOKTAVÝ, P., MAJZNER, J. Acoustic and electromagnetic emission sources characterization. In Workshop NDT CMC 2003 - Non-Destructive Testing of Civil Materials and Constructions - Proceedings. Brno: Technical University of Brno, 2003. s. 151 ( s.)ISBN: 80-7204-318- 8.Detail
ŠIKULA, J. Noise and Non- Linearity Testing of Electronic Components. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 18 ( s.)ISBN: 80-238-9094- 8.Detail
BELAVIC, D., ROCAK, D., SEDLÁKOVÁ, V., HROVAT, M., ŠIKULA, J., PAVELKA, J. An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick- Film Resistors. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 40 ( s.)ISBN: 80-238-9094- 8.Detail
HASHIGUCHI, S., TAKI, C., KITAHARA, A., OHKI, M., TACANO, M., ŠIKULA, J. Active Shielding fo Low Frequency Magnetic Field. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 44 ( s.)ISBN: 80-238-9094- 8.Detail
YOKOKURA, S., TANUMA, N., TACANO, M., HASHIGUCHI, S., ŠIKULA, J. Fully Computer-controlled Battery Power Source for Low- frequency Noise Measurements. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 48 ( s.)ISBN: 80-238-9094- 8.Detail
HÁJEK, K., ŠIKULA, J. Electrical Filters for Acoustic Emission Ultra- low Noise Amplifiers. In Noise nad Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 52 ( s.)ISBN: 80-238-9094- 8.Detail
HLÁVKA, J., ŠIKULA, J. Third Harmonic Voltage Measurement of Layered Structures. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 65 ( s.)ISBN: 80-238-9094- 8.Detail
NEŠPŮREK, S., ŠIKULA, J. Electrical Noise in Thin Films of Metal- free Phthalocyanine. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 66 ( s.)ISBN: 80-238-9094- 8.Detail
GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise Spectroscopy of Thick Film Electroluminescent Lamps. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 71 ( s.)ISBN: 80-238-9094- 8.Detail
HÁJEK, K., ŠIKULA, J. Passive Component Non- linearity and a Quality of Electrical Filters. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 72 ( s.)ISBN: 80-238-9094- 8.Detail
KOKTAVÝ, P., KOKTAVÝ, B., ŠIKULA, J. Microplasma Noise in Semiconductor GaAsP Diodes. In Noise nad Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 85 ( s.)ISBN: 80-238-9094- 8.Detail
HÁJEK, K., ŠIKULA, J. Universal Low Noise PC Controllable Amplifier 0.03 HZ -- 1 MHZ. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 108 ( s.)ISBN: 80-238-9094- 8.Detail
KOKTAVÝ, P., ŠIKULA, J., KOKTAVÝ, B. An Electromagnetic Emission SIgnal Generated by A Moving Crack in Solids. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 134 ( s.)ISBN: 80-238-9094- 8.Detail
KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Characterisation of Acoustic and Electromagnetic Emission Sources. In NDT in Progress. Prague: Brno University of Technology, 2003. s. 129 ( s.)ISBN: 80-214-2475- 3.Detail
PAVELKA, J., TANUMA, N., TACANO, M., ŠIKULA, J., MUSHA, T. Hooge Parameter of InGaAs Heterostructures Experimental Support for 1/ f Energy Patrition Model. In Noise and Fluctuations. Prague: CNRL, 2003. s. 123 ( s.)ISBN: 80-239-1005- 1.Detail
ŠIKULA, J., DOBIS, P., PAVELKA, J., TACANO, M., HASHIGUCHI, S. Stochastic model for random tegraph signals in MOSFETS. In Proceeding of the 18th Forum of Science and Technology of Fluctuations. Tokyo: Meisei University Tokyo, 2003. s. 1 ( s.)Detail
ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., VRBA, R., MELKES, F., ROCAK, D., BELAVIC, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non- linearity of thick film resistors. In 23rd Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: 2003. s. 112 ( s.)ISSN: 0887- 7491.Detail
NÁDENÍČEK, P., MORNSTEIN, V., ŠIKULA, J., GREC, P. Low-frequency Acoustic Signal Analysis -- A New Method for Detection of Cavitation. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 95 ( s.)ISBN: 80-238-9094- 8.Detail
TACANO, M., TANUMA, N., PAVELKA, J., TANIZAKI, H., YAGI, S., TOMISAWA, K., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T., MUSHA, T. Transport Properties and Hooge Noise Parameter of N- GaN. In Noise and Fluctuations. Prague: CNRL, 2003. s. 117 ( s.)ISBN: 80-239-1005- 1.Detail
ŠIKULA, J., DOBIS, P. Noise and Non- linearity as Reliability Indicators of Electronic Devices. In MIDEM Cenference 2003 Proceedings. Slovenia: MIDEM - Society for Microelectronics, Electronic components and Materials, 2003. s. 3 ( s.)ISBN: 961-91023-1- 2.Detail
MAJZNER, J., ŠTRUNC, M., ŠIKULA, J. 1/ f noise in piezoceramic samples. In Proceedings of the 17th International Conference Noise and Fluctuations ICNF 2003. 1. Czech Republic: CNRL s.r.o., 2003. s. 851 ( s.)ISBN: 80-239-1005- 1.Detail
2002
PAVELKA, J., MAJZNER, J., ŠIKULA, J. Electromagnetic emission frequency spectra. In Electronic devices and systems 02 - Proceedings. Brno: Zdeněk Novotný, 2002. s. 90 ( s.)ISBN: 80-214-2180- 0.Detail
HÁJEK, K., ŠIKULA, J. Passive Component Non- Linearity and a Quality of Electrical filters. In Proceedings of CARTS 2002. Huntsville, Alabama: Components Technology Institute, Inc., 2002. s. 95 ( s.)ISBN: 0887- 7491.Detail
MAJZNER, J., PAVELKA, J., ŠTRUNC, M., ŠIKULA, J. Noise to signal ratio for piezoceramic sensors. In Electronic devices and systems 02 - Proceedings. Brno: Zdeněk Novotný, 2002. s. 107 ( s.)ISBN: 80-214-2180- 0.Detail
GRMELA, L., KOKTAVÝ, P., LIEDERMANN, K., ŠIKULA, J., PAVELKA, J., TOMÁNEK, P. Non Destructive Testing of Thinck Film Electroluminiscent Lamps. In 8-th ECNDT, Barcelona. Madrid: European Federation for Non- Destructive Testing, 2002. s. 214 ( s.)ISBN: 84-699-8573- 6.Detail
KOKTAVÝ, P., KOKTAVÝ, B., ŠIKULA, J. Microplasma Noise in Semiconductor GaAsP diodes. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: Ing. Zdeněk Novotný, CSc., 2002. s. 85 ( s.)ISBN: 80-238-9094- 8.Detail
KOKTAVÝ, P.; ŠIKULA, J.; KOKTAVÝ, B. Electromagnetic Emission Signal Generated by a Moving Crack in Solids. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: Ing. Zdeněk Novotný, CSc., 2002. s. 134 ( s.)ISBN: 80-238-9094- 8.Detail
KOKTAVÝ, P., ŠIKULA, J. Non- destructive Testing of Luminescent Diodes by Noise. In 8- th ECNDT. Madrid: European Federation for Non- Destructive Testing, 2002. s. 247 ( s.)ISBN: 84-699-8573- 6.Detail
GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise spectroscopy of thick film. In Noise and Non- linearity Testing of Modern Electronic Componets. Brno: Ing.Zdeněk Novotný, CSc., 2002. s. 71 ( s.)ISBN: 80-2389094- 8.Detail
KOKTAVÝ, P.; ŠIKULA, J. Reverse Biased P- N Junction Noise in GaAsP Diodes with Avalanche Breakdown Induced Microplasmas. Fluctuation and Noise Letters, 2002, roč. 2, č. 2, s. 65 ( s.)ISSN: 0219- 4775.Detail
GRMELA, L., MAJZNER, J., PAVELKA, J., ŠIKULA, J. Automatic noise spectral density measuring set- up. In Electronic devices and systems 02 - proceedings. Brno: Zdeněk Novotný, 2002. s. 114 ( s.)ISBN: 80-214-2180- 0.Detail
SEDLÁKOVÁ, V., PAVELKA, J., GRMELA, L., ŠIKULA, J., ROČAK, D., HROVAT, M., BELAVIČ, D. NOISE AND NON-LINEARITY OF THICK- FILM RESISTORS. In Proceedings of European Microelectronics packaging & interconection Symposium. Krakow, Poland: IMAPS - Poland Chapter, 2002. s. 320 ( s.)ISBN: 83-904462-8- 6.Detail
PAVELKA, J., ŠIKULA, J., GRMELA, L., TACANO, M., HASHIGUCHI, S. Noise and Self- Healing of Tantalum Capacitors. Capacitor and Resistor Technology, 2002, roč. 2002, č. 4/ 2002, s. 181 ( s.)ISSN: 0887- 7491.Detail
HÁJEK, K., ŠIKULA, J., TACANO, M., HASHIGUCHI, S. Comparision of Preamplifiers for AE Measuring Sysyems. In Proc. of the Electronics Devices and Systems. Brno: BUT, 2002. s. 99 ( s.)ISBN: 80-214-2180- 0.Detail
HÁJEK, V., ŠIKULA, J., TACANO, M., HASHIGUCHI, S. Signal to Noise Ratio and Preamplifier Noise of AE Measuring Systems. In Proc. of the 25- th European Conference on Acoustic Emission Testing. Prague: CNDT Prague, 2002. s. 11 ( s.)ISBN: 80-214-2174- 6.Detail
SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., ROČAK, D., BELAVIČ, D., TACANO, M. Effect of Contact Electrode on Noise and Nonlinearity of Thick-Film Resistor. In Proc. of 16th Symp. CARTS Europe 2002. Nice, France: 2002. s. 171 ( s.)ISBN: 0887- 7491.Detail
SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D. Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity. In Proc. of 38th International Conference on Microelectronics, Devices and Materials. Lipica, Slonenia: 2002. s. 245 ( s.)ISBN: 961-91023-0- 4.Detail
ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetics of the Cracks Creation in Granite Under Ramp Loading. NDT Welding Bulletin, 2002, roč. 2002, č. 2, s. 17 ( s.)ISSN: 1213- 3825.Detail
PAVELKA, J., TACANO, M., ŠIKULA, J. Noise and non- linearity in passive components as reliability indicators. In Proceedings of 17th ASATEF. Sendai, Japonsko: Tohoku University, 2002. s. 5 ( s.)Detail
PAVELKA, J., ŠIKULA, J., TACANO, M. Noise in Passive Components - Resistors and Capacitors. In Proceedings of the 13th Symposium on Advanced Materials. Tokio: Meisei University, 2002. s. 110 ( s.)Detail
VAŠINA, P.; ZEDNÍČEK, T.; ŠIKULA, J.; PAVELKA, J. Failure modes of tantalum capacitors made by different technologies. Microelectronics Reliability, 2002, roč. 42, č. 6, s. 849 ( s.)ISSN: 0026- 2714.Detail
PAVELKA, J.; ŠIKULA, J.; VAŠINA, P.; SEDLÁKOVÁ, V.; TACANO, M.; HASHIGUCHI, S. Noise and transport characterisation of tantalum capacitors. Microelectronics Reliability, 2002, roč. 42, č. 6, s. 841 ( s.)ISSN: 0026- 2714.Detail
ŠIKULA, J., PAVELKA, J., DOBIS, P., ZEDNÍČEK, T. Charge carrier transport and noise of niobium capacitors. In Proceeding of CARTS 2002 - 16th European Passive Components Conference. SWINDON, England: Electronic Components Institute Internationale, Ltd., 2002. s. 32 ( s.)Detail
ŠIKULA, J.; HÁJEK, K.; MAJZNER, J. The effective frequency band of AE measuring setup. In Defektoskopie 2002 Proceedings. Praha: BETIS, spol. r r.o. Areál VÚ Praha - Běchovice, 2002. s. 289 ( s.)ISBN: 80-214-2247- 5.Detail
ŠIKULA, J., ŠTRUNC, M., MAJZNER, J., KOKTAVÝ, P., PAVELKA, J., HÁJEK, K. Electrical Noise of Piezoceramic Sensors. In EWGAE 2002 - 25th European Conference on Acoustic Emission Testing. Prague: Brno University of Technology, 2002. s. 171 ( s.)ISBN: 80-214-2174- 6.Detail
ŠIKULA, J., PAVELKA, J., MAJZNER, J., DOBIS, P. Cracks Characterisation by Acoustic and Electromagnetic Emission. In EWGAE 2002 Proceegings. Brno: Czech Society for Non- destructive Testing, 2002. s. II/ 164 ( s.)ISBN: 80-214-2174- 6.Detail
ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetics of the Cracks Creation in Granite Under Ramp loading. NDT Welding Bulletin, 2002, roč. 2002, č. 12, s. 4 ( s.)ISSN: 1213- 3825.Detail
ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetika vzniku trhlin v žule při rostoucím zatěžování. NDT Welding Bulletin, 2002, roč. 2002, č. 2, s. 17 ( s.)ISSN: 1213- 3825.Detail
ŠIKULA, J., PAVELKA, J., GRMELA, L., DOBIS, P., ZEDNÍČEK, T. Charge Carriers Transport and Noise of Niobium Capacitors. In CARTS-EUROPE 2002 Proceedings, 16th European Passive Components Conference. Swindon, England: Electronic Components Institute Internationale Ltd., 2002. s. 32 ( s.)Detail
ŠIKULA, J., ŠTRUNC, M., HÁJEK, K. Fluctuation of Electrical Polarisation in Piezoceramic Sensors. In Noise and Non-Linearity Testing of Modern Electronic Components - NNT 2001. Brno: Zdeněk Novotný, Brno, 2002. s. 99 ( s.)ISBN: 80-238-9094- 8.Detail
ŠIKULA, J.; HLÁVKA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; GRMELA, L.; TACANO, M.; HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. Active and Passive Electronic ComponentsISSN, 2002, roč. 25, č. 2, s. 161 ( s.)ISSN: 0882- 7516.Detail
ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V. Low-Frequency Noise of Thick- Film Resistors as Quality and Reliability Indicator. Microelectronics Reliability, 2002, roč. 41, č. 4, s. 531-542. ISSN: 0026- 2714.Detail
MAJZNER, J., GRMELA, L., KOKTAVÝ, P., ŠIKULA, J. Analogue model of human middle ear. In Electronic devices and systems 02 - Proceedings. Brno: Zdeněk Novotný, 2002. s. 132 ( s.)ISBN: 80-214-2180- 0.Detail
2001
KOKTAVÝ, P., ŠIKULA, J., KOKTAVÝ, B., LIEDERMANN, K. Šumová diagnostika vysokoteplotních elektroizolačních materiálů. In Proceedings of Diagnostika 01. Plzeň: Západočeská univerzita v Plzni, 2001. s. 25 ( s.)ISBN: 80-7082-742- 4.Detail
KOKTAVÝ, P., ŠIKULA, J. PN Junction Local Avalanche Breakdown Induced Microplasma Noise In Semiconductor GaAsP Diodes. In Proceedings of ICNF 2001. Gainesville, Florida, USA: University of Florida, Gainesville, Florida, USA, 2001. s. 193 ( s.)ISBN: 981-02-4677- 3.Detail
IBRAHIM, A., CHOBOLA, Z., ŠIKULA, J. Non- linearity and Noise as a Quality indicators for Silicon Solar Cells. In Proceedings of 16th International Confrence on Noise in Physical Systems and 1/ f Fluctuations. Florida: University of Technology, 2001. s. 739 ( s.)Detail
IBRAHIM, A., ŠIKULA, J., CHOBOLA, Z. Non- linearity and Noise as a Quality Indicators for Silicon Solar Cells. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: University of Florida, 2001. s. 739 ( s.)Detail
ŠTRUNC, M., ŠIKULA, J., HÁJEK, K. Fluctuation of Electrical Polarisation in Piezoceramic Sensors. International Workshop "Noise and Non-Linearity Testing of Modern Electronics Components", 2001. Proceedings of International Workshop 2001. Brno: Z. Novotný, Brno, 2001. s. 19 ( s.)ISBN: 80-214-1960- 1.Detail
ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. The Tantalum Capacitor as a MIS Structure in Reverse Mode. In Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. s. 289 ( s.)ISBN: 0887- 7491.Detail
ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. In Proceedings of CARTS- Euro 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. s. 81 ( s.)Detail
ŠIKULA, J., SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J., MAJZNER, J. Electromagnetic and acoustic emission in solids. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. s. 123 ( s.)ISBN: 80-214-1992- X.Detail
ŠIKULA, J. Acoustic Emission in Civil Engineering. In Proceedings of NDT in Progress. Třešť: DGZfP a ČNDT, 2001. s. 5 ( s.)ISBN: 80-238-7263- X.Detail
SPIRALSKI, L., HASSE, L., ŠIKULA, J., CWILEWICZ, R. Nondestructive Investigations of Materials and Mechanical Objects by Means of the Random Phenomena Analysis. In Physics and Materials Science. Vídeň: Scientific centre of the Polish Academy of Sciences, Vienna, Austria, 2001. s. 86 ( s.)ISBN: 83-88443-75- 5.Detail
PAVELKA, J., ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Thin Ta2O5 Amorphous Films. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. s. 91 ( s.)ISBN: 981-02-4677- 3.Detail
SEDLÁKOVÁ, V.; PAVELKA, J.; ŠIKULA, J.; ROČAK, D.; HROVAT, M.; BELAVIČ, D. Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. s. 747 ( s.)ISBN: 981-02-4677- 3.Detail
TACANO, M., TANUMA, N., YOKOKURA, S., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T. Evaluation of Ni/n- SiC ohmic contacts by current noise measurements. In Proceedings of the 16th Int Conf Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, USA: World Scientific, 2001. s. 119 ( s.)ISBN: 981-02-4677- 3.Detail
YOKOKURA, S., TANUMA, N., TACANO, M., HASHIGUCHI, S., ŠIKULA, J. Fully computer-controlled battery power source for low- frequency noise measurements. In Proceedings of the 16th Int. Conf. Noise in Physical Systems and 1/ f Noise Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. s. 721 ( s.)ISBN: 981-02-4677- 3.Detail
ALIWI, I., CHOBOLA, Z., ŠIKULA, J. Non- linearity and Noise as a Quality Indicators for Silicon Solar Cells. In Proceedings of the 16th Int. Conf. Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. s. 739 ( s.)ISBN: 981-02-4677- 3.Detail
VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J. Failure Modes of Tantalum Capacitors Made by Different Technologies. In Proceedings of CARTS- Europe 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. s. 76 ( s.)Detail
GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise spectroscopy of thick film electroluminescent lamp. In Electronics Devices and System. Brno: Vysoké učení technické v Brně, 2001. s. 44 ( s.)ISBN: 80-214-1960- 1.Detail
KOKTAVÝ, P., ŠIKULA, J., KOKTAVÝ, B., LIEDERMANN, K. Noise Diagnostics of Insulating Materials for Operation at High Temperature. In Proceedings of ICNF 2001. Gainesville, Florida, USA: University of Florida, Gainesville, Florida, USA, 2001. s. 759 ( s.)ISBN: 981-02-4677- 3.Detail
KOKTAVÝ, P., ŠIKULA, J., KOKTAVÝ, B. A Model for an Electromagnetic Emission Signal Generated by Crack Creation. In Proceedings of NDT in Progress. Praha: Czech Society for Non-Destructive Testing, German Society for Non- Destructive Testing, 2001. s. 283 ( s.)ISBN: 80-238-7263- X.Detail
KOKTAVÝ, P., KOKTAVÝ, B., ŠIKULA, J. Electromagnetic Emission Signal Generated by Crack Creation. In Sborník příspěvků konference NTF. Brno: Ústav fyziky FEKT VUT v Brně, 2001. s. 94 ( s.)ISBN: 80-214-1992- X.Detail
REYNOLDS, C., VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J. Failure Modes of Tantalum Capacitors Made by Different Technologies. In Proceedings of 21st Capacitor and Resistor Technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. s. 271 ( s.)ISBN: 0887- 7491.Detail
TANUMA, N., YASUKAWA, S., YOKOKURA, S., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T., TACANO, M. Electron Cyclotron Resonance Plasma Etching of n-SiC and Evaluation of Ni/n- SiC Contacts by Current Noise Measurements. Japanese Journal of Applied Physics, 2001, roč. 40, č. 6A, s. 3979 ( s.)ISSN: 0021- 4922.Detail
SCHAUER, P., ŠIKULA, J. Transport and Noise properties of CdTe(Cl) Crystals. Microelectronics Reliability, 2001, roč. 41, č. 3, s. 431 ( s.)ISSN: 0026- 2714.Detail
2000
CHOBOLA, Z., KOŘENSKÁ, M., PAZDERA, L., SMUTNÝ, J., ŠIKULA, J., WEBER, Z. Non-destructive testing nethod- acoustic emission with generated load. In Proceedings of International Workshop. Bratislava: University of Technology, 2000. s. 63 ( s.)ISBN: 80-227-1364- 3.Detail
HRUŠKA, P., KOLÁŘOVÁ, R., ŠIKULA, J. Burst noise with normal distribution of characteristic times in sub-micron ultra-thin-oxide MOSFET´ s. In Proceedings of 22nd International conference on microelectronics. Niš: IEEE, 2000. s. 387 ( s.)ISBN: 0-7803-5235- 1.Detail
ANDO, M., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T. Dependence of Hooge parameter of InAs heterostructure on temperature. Microelectronics Reliability, 2000, roč. 40, č. 11, s. 1921 ( s.)ISSN: 0026- 2714.Detail
ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; KOKTAVÝ, P.; SEDLÁKOVÁ, V.; LOKAJÍČEK, T.; TACANO, M.; HASHIGUCHI, S. Cracks Detection by Electromagnetic and Acoustic Emission. In Proc. of the 15th World Conf. on Non-Destructive Testing WCNDT, October 15-21, Rome, Italy, (2000). 2000. s. 397-400. Detail
BELAVIČ, D.; ROČAK, D.; ŠIKULA, J.; HROVAT, M.; KOKTAVÝ, B.; PAVELKA, J. Investigation of a possible correlation between current noise and long-term stability of thick- film resistors. In Proc. European Microelectronics, Packaging and Interconnection Symposium. Praha: IMAPS, 2000. s. 464 ( s.)ISBN: 80-238-5509- 3.Detail
1999
ŠIKULA, J. Chybí název. In CARTS 99. Huntsville, USA: Components Technology Institute, Inc., 1999. s. 292 ( s.)ISBN: 80-01- 0195.Detail
ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/ f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. s. 130 ( s.)ISBN: 1-874612- 2.Detail
ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; ROČAK, D.; BELAVIČ, D.; TACANO, M. Low Frequency Noise of Thick Conducting Films. In Proc. of 15th Int. Conf. on Noise in Physical Systems and 1/f Fluctuations ICNF, Hong Kong August 1999, ed. C. Surya. Hong Kong: Bentham Press, 1999. s. 154-157. ISBN: 1-874612-28- 5.Detail
ŠIKULA, J. Chybí název. In Acoustic Emission 99. Brno: VUT Brno, 1999. s. 253 ( s.)ISBN: 80-214- 130.Detail
ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; SEDLÁKOVÁ, V.; ROČAK, D.; BELAVIČ, D.; TACANO, M. Charge transport and noise sources in thick conducting films. In Proceedings of 13th European Passive Components Symposium CARTS-Europe ' 99. UK: Electronic Components Institute Internationale Ltd., 1999. s. 163 ( s.)Detail
ŠIKULA, J., KOKTAVÝ, B., KOŠÍKOVÁ, I., PAVELKA, J., LOKAJÍČEK, T. Electromagnetic Emission From Polycrystalline Solids. In Proceedings of International Conference Acoustic Emission ' 99. Brno: VUT Brno, 1999. s. 259 ( s.)ISBN: 80-214-1303- 4.Detail
ŠIKULA, J. Chybí název. In CARTS- EUROPE 99. East Sussex, England: ECII Ltd., 1999. s. 163 ( s.)ISBN: 80-01- 0195.Detail
ŠIKULA, J. Chybí název. In CARTS- EUROPE 99. East Sussex, England: ECII Ltd., 1999. s. 147 ( s.)ISBN: 80-01- 0195.Detail
ŠIKULA, J. Chybí název. In Acoustic Emission 99. Brno: VUT Brno, 1999. s. 259 ( s.)ISBN: 80-214- 130.Detail
ŠIKULA, J. Chybí název. In DEFEKTOSKOPIE 99. Hradec Králové: Česká společnost pro nedestruktivní testování, 1999. s. 67 ( s.)ISBN: 80-01- 0195.Detail
ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. s. 111 ( s.)ISBN: 80-214- 143.Detail
ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. s. 93 ( s.)ISBN: 80-214- 143.Detail
ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. s. 89 ( s.)ISBN: 80-214- 143.Detail
ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. s. 5 ( s.)ISBN: 80-214- 143.Detail
ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/ f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. s. 218 ( s.)ISBN: 1-874612- 2.Detail
ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/ f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. s. 150 ( s.)ISBN: 1-874612- 2.Detail
1998
ŠIKULA, J.; PAVELKA, J.; ROČAK, D.; BELAVIČ, D. Low Frequency Noise in Film Resistors. In AIP Conference Proceedings 466. USA: AIP, 1998. s. 42-47. ISBN: 1-56396-854- 1.Detail
KOŘENSKÁ, M., ŠIKULA, J. Statistical parameters of the acoustic emission signals. In Research Activities of Physical Departments of Civil Enginee. Brno: Vysoké učení technické v Brně, 1998. s. 61 ( s.)ISBN: 80-214- 114.Detail
ŠIKULA, J.; KOKTAVÝ, B.; KOKTAVÝ, P.; PAVELKA, J.; ROČAK, D.; BELAVIČ, D. Nonlinearity and noise of thick film resistors as reliability indicators. In Proceedings of 12th European Passive Components Symposium CARTS-Europe ' 98. UK: Electronic Components Institute Internationale Ltd., 1998. s. 56 ( s.)Detail
KOŘENSKÁ, M., ŠIKULA, J., VAŠINA, P. Threshold sensitivity and background noise of acoustic emission sensors. In Acoustic Emission Testing. Vídeň: TUV Austria, 1998. s. 255 ( s.)Detail
1997
ŠIKULA, J., KOKTAVÝ, B., HRUŠKA, P., VAŠINA, P., KOKTAVÝ, P., HÁJEK, K. Noise Spectral Density and Reliability of Tantalum Capacitors. In 17th Capacitor and Resistor Technology Symposium CARTS’ 97. Florida, USA: 1997. s. 298 ( s.)Detail
SCHAUER, P., ŠIKULA, J. Prognóza spolehlivosti rezistorů z měření nízkofrekvenčního šumu. In Výskumné aktivity katedier fyziky na stavebných fakultách v. Bratislava: Slovenská technická univerzita v Bratislave, 1997. s. 113 ( s.)Detail
1996
CHOBOLA, Z., VAŠINA, P., ŠIKULA, J., JURÁNKOVÁ, V., SIMOEN, E. 1/ f Noise and DLTS in LEDS. In Proceedings Third ELEN Workshop Leuven. Belgium: University of Technology, 1996. s. 32 ( s.)Detail
1995
HRUŠKA, P., CHOBOLA, Z., PAZDERA, L., JURÁNKOVÁ, V., ŠIKULA, J. Analysis of Solar Cell Transport Properties. In Proceeding of the International NODITO Workshop. Brno: University of Technology, 1995. s. 216 ( s.)Detail
CHOBOLA, Z., ŠIKULA, J., VAŠINA, P., PAZDERA, L., JURÁNKOVÁ, V., ŘEHÁK, D. Analysis of Noise Properitef of R1 Solar Cells. In Proceedings of the International NODITO Workshop. Brno: University of Technology, 1995. s. 220 ( s.)ISBN: 80-214-0663- 1.Detail
HRUŠKA, P., CHOBOLA, Z., ŠIKULA, J. Transport Reliability Indicators for Solar Cells. In Proceedings of Second ELEN conference. France: University of Technology, 1995. s. 506/ 1 ( s.)Detail
CHOBOLA, Z., HRUŠKA, P., PAZDERA, L., JURÁNKOVÁ, V., ŠIKULA, J. Noise Reliability Indicators for Solar Cells. In Procedings of Second ELEN conerence. Grenoble: University of Technology, 1995. s. 505/ 1 ( s.)Detail
1994
CHOBOLA, Z., PAZDERA, L., ŠIKULA, J., VAŠINA, P. Noise in NiPt Schottky Diodes. In Proceedings of ELEN Workshop. Montpellier: University of technology, 1994. s. 126 ( s.)Detail
HRUŠKA, P., KOKTAVÝ, B., VAŠINA, P., NAVAROVÁ, H., JURÁNKOVÁ, J., ŠIKULA, J. Transport and noise quality indicators for PN junction diodes. In 5th European Symposium on Reliability of Electron Devives, Failure Physics and Analysis. Glasgow, Scotland: QaRel, 1994. s. 581 ( s.)Detail
ŠIKULA, J., SCHAUER, P., VAŠINA, P., ŠIKULOVÁ, M., KOKTAVÝ, B., CHOBOLA, Z., NAVAROVÁ, H., PAZDERA, L. 1/ f Noise in Metallic Thin Films. In Proceedings of the Sixth Van der Ziel Symposium on Quantum 1/ f Noise and other Low Frequency Fluctuations in Electronic Devices. Missouri: University of Technology, 1994. s. 11 ( s.)Detail
CHOBOLA, Z., ŠIKULA, J., VAŠINA, P. Šum v NiPt Schotkyho diodách. In ELEN Workshop. Montpellier: University of Montpellier II, 1994. s. 85-91. Detail
ŠIKULA, J., KOKTAVÝ, B., VAŠINA, P., CHOBOLA, Z., SCHAUER, P., KOŘENSKÁ, M. Noise Diagnostics of PN- Junction Power Devices. In Proceedings of Conference ESREF 94. Scotland: University of Technology, 1994. s. 217 ( s.)Detail
1993
ŠIKULA, J., KOKTAVÝ, B., VAŠINA, P., CHOBOLA, Z., JURÁNKOVÁ, V. Noise Reliability Indicators. In Procedings of the 4th European Symposium on Reliability of Electron Devices. Bordeaux - France: University of Technology, 1993. s. 341 ( s.)Detail
CHOBOLA, Z., VAŠINA, P., ŠIKULA, J. RTS Noise in Integrated Circuits. In Proceedings of the 12th International Conference on Noise in Physical Systems and 1/ f Fluctuations. Missouri USA: University of Technology, 1993. s. 212 ( s.)ISBN: 96-305-5778- 9.Detail
1992
JURÁNKOVÁ, V., ŠIKULA, J., VAŠINA, P., CHOBOLA, Z., JANOVSKÝ, P. 1/f Noise and L-V Characteristics of GaAsP LEDs. In Proceedings of International Symp. Fluctuation in Solids. Brno: University of technology, 1992. s. 87 ( s.)Detail
1989
CHOBOLA, Z.; ŠIKULA, J.; VAŠINA, P. Application of Frequency Inspection to Assessing the Condition of Fired Roofing Tiles Manufactured Using and LD Technology. In Noise in Physics Systems. 0. St. Luis, USA: University of Missouri, 1989. s. 212 ( s.)Detail
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